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ML For LTE - Device Readiness Forecasting
ML For LTE - Device Readiness Forecasting
The framework evaluating the device readiness is illustrated in Fig. 4.13. The model
representing the readiness of a device for market based on one or more key
ReadinessIndexKPI ¼
KPIMeasured@Day t _ KPIBM
KPIAcceptance _ KPIBM
____
____
when KPIDay t _ KPIBM
0 when KPIDay t < KPIBM
8<
:
ð4:2Þ
KPIDay_t _ KPIBM, indicates that the KPI measured at day t is better than the KPI
benchmark value.
The standard sigmoid function is represented as Eq. 4.3. However, the sigmoid
curve of Time To Market Maturity (TTMM) model may not correspond precisely to
the standard sigmoid curve. Hence, a DRI function can be represented as:
where A denotes a maximum value of DRI, B denotes the curvature of the sigmoid
curve. In a circular function, B can be termed as a phase of the sigmoid curve, and C
denotes an inflection point of the sigmoid curve. In this model, if the maximum value
of the DRI is known to be 1, we have ReadinessIndexMax ¼ 1, and get A ¼ 1.
Assuming that the time between when a device is safe for network and when testing
is complete is assumed to be 182 days. The inflection point can be determined to be
the 91st day. Accordingly, we have Eq. 4.5, and get Eq. 4.6 after transforming:
Both t and B are nonnegative in this model, we assume that RIKPI ¼ 0 and t ¼ 0. It
can be interpreted that at day 0 that DRI is also 0. When the model is initialized by
the model, the model assumes that the testing work performed by the OEM in day
1 completes 1/182 of overall testing work, which is represented by 1/182 of DRI.
Therefore, assuming that RIKPI ¼ 1/182, we have:
Thus, t ¼ 91-(5.198/B) ¼ 1 day. Accordingly, it can be determined in this
example that B ¼ 0.5776. Finally, the TTMM model can be represented by the
function group below and Eq. 4.2:
tKPI ¼ 91 _
ln 1
RIKPI _ 1
__
0:5776 ð4:8Þ
TimeToMarketKPI ¼ Day xKPI þ ð182 _ tKPI Þ ð4:9Þ
The model could perform the following steps to construct the model. At first, the
model may compute a DRI value for a particular KPIi. The DRI value for the
particular KPIi may be computed as:
for kpi from 1 to i {
Get i-th kpi’s benchmark value KPIiBM;
Get i-th kpi’s acceptance value KPIiAcceptance;
Get i-th kpi’s measured value at DayX KPIiMeasured@Dayx;
if KPIi Measured@Dayx >= KPIiBM{
ReadinessIndexkpii = abs((KPIiMeasured@Dayx - KPIiBM)/KPIiAcceptance-
KPIiBM)
} else {
ReadinessIndexkpii = 0;
}
}
Once the model has computed a DRI value for a particular KPIi, the model can
compute tKPI and days to market for KPIi. The tKPI and days to market for KPIi can
be computed as:
for kpi from 1 to i
f
ReadinessIndexKPI ¼
KPIMeasured@Day t _ KPIBM
KPIAccep tan ce _ KPIBM
____
____
when KPIDay t _ KPIBM
0 when KPIDay t < KPIBM
8<
:
tKPI ¼ 91 _
ln
1
RIKPI _ 1
__
0:05776
TimetoMarketKPI ¼ Day xKPI þ ð182 _ tKPIÞ
g
After tKPI and days to market are calculated for KPI_i, the model can select a
maximum amount of time to market for KPI1 to KPI_i. The DRI value may be
computed as:
for kpi from 1 to i
f TimetoMarket ¼ MaxfTimetoMarketKPI ig ¼ MaxfDay xKPI i þ ð182 _ tKPI iÞg
g
After creating the forecasting model, Fig. 4.14 illustrates the readiness curves
LARK, NIGHT OWL and REGULAR BIRD associated with different OEMs. The
vertical axis indicates Device Readiness Indicator (DRI) values. The horizontal axis
is a temporal axis and indicates days in a manufacturing cycle of a device (e.g., the
mobile station). Curve fitting is a process of constructing a curve or mathematical
function that has the best fit to a series of data points, possibly subject to constraints.
Curve fitting can involve either interpolation, where an exact fit to the data is
required, or smoothing, in which a “smooth” function is constructed that approximately
fits the data. Inflection point identifier can compute differences between each
true value and fitted value (obtained by a sigmoid curve). An inflection point of the
curve can be identified by the inflection point identifier based on the computed
differences by the inflection point identifier. The inflection point represents a point
on the curve at which curvature of the curve changes sign. As an illustrative
example, the inflection point of an S-curve may be identified as a point
corresponding to the 91st day out of 182 day manufacturing cycle of the mobile
station.
Clustering
We define an upper bound of cluster number u based on domain experience to
choose the optimal number of clusters, k. We iterate k from 2 to u and perform
K-Medoids clustering in each iteration. The optimal k is selected, such that the intracluster
error is minimized and the inter-cluster distance is maximized as follows
0:7 _ IntraSumOfErrorkþ1
IntraSumOfErrork
_1
0:7 _ IntraSumOfErrorkþ2
IntraSumOfErrorkþ1
_1
0:7 _ IntraSumOfErrorkþ3
IntraSumOfErrorkþ2
_1
8
5.3.4 Regression
We pack the POLQA scores into different bins, and dynamically adjust window size
for each local set by the distribution density of each bin. Based on domain experience
in voice assessment in POLQA, we set 9 bins according to the POLQA scale:
Bin0 ¼ [0,0.5], Bin1 ¼ (0.5,1), Bin2 ¼ [1,1.5], ..., Bin8 ¼ (4.5,5]. We set an initial
window width to 1/100 of range of sample points, and plot the scatterplot of all
measured POLQA scores in an ascending order. Let f(x) denotes the scatterplot
function, where x is from 1 to the number of POLQA sample points. First, for each
Bina, we compute its distribution density by integrating the value of the scatterplot
function in its range as follows:
ya ¼
f ð _1ð0:5aþ0:5Þ
f _1ð0:5aÞ
f ðxÞdx ði ¼ 0; _ _ _; 8Þ ð5:5Þ
After that, we sort ya in ascending order. Let S(ya) min represent the bin with
minimum ya, S(ya) med represent the bin with median value of ya, and S(ya) max
represent the bin with maximum ya, we dynamically calculate the window size by
the sorting results, as follows:
win size ¼
0:5 þ 0:125 _ S
100
_ N if ðS ¼ 0; _ _ _; 4Þ
1 þ 0:25 _ ðS _ 4Þ
100
_ N if ðS ¼ 5; _ _ _; 8Þ