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Strain Measurement Without Expensive Signal Conditioning
Strain Measurement Without Expensive Signal Conditioning
Using the 4-wire Resistance function in the 6 ½ digit mode, you can measure a 350 ohm
strain gauge with an accuracy of ±64 µε (±0.045 ohms) with a resolution of 1.5 µε. In the
5 ½ digit mode, the accuracy is ±79 µε (±0.055 ohms) with a resolution of 15 µε. The
strain gauge resistance to strain formula is:
The conversion is simple. First measure the unstrained resistance R0. Then measure the
resistance again when the DUT (Device Under Test) is strained and calculate the strain
from the resistance change (∆R). The gauge factor (GF) is a characteristic of the strain
gauge and is supplied by the strain gauge manufacturer. For most strain gauges, GF is
nearly equal to 2. However, 1000 ohm strain gauges are becoming more readily
available; these increase the strain measurement sensitivity allowing higher accuracy and
resolution measurements.
The 4-wire resistance measurement technique eliminates all lead resistance errors which
can be difficult to deal with and add to the complexity with conventional bridge strain
signal conditioning. Even greater accuracy and resolution can be obtained using more
expensive 7 ½ or 8 ½ digit laboratory DMM’s. The only limitation is measurement speed
which is required for dynamic strain measurement applications which require a high
speed sampling A/D with amplification and filtering per channel as well as Wheatstone
bridge signal conditioning and very stable, low noise, isolated DC voltage excitation
sources. However, there are many static strain measurement applications where this
direct strain measurement technique is the best choice.