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GATE A - Readings For All Beams: Chapter 7. Working in TOP View (Optional Feature)
GATE A - Readings For All Beams: Chapter 7. Working in TOP View (Optional Feature)
GATE A - Readings For All Beams: Chapter 7. Working in TOP View (Optional Feature)
• 1A%A, 2A%A Amplitude (as a % of full-screen height) of the echo in gate A for the data sample selected by
cursor 1 or 2 respectively.1SA, 2SA Soundpath of the echo in gate A for the data sample
selected by cursor 1 or 2 respectively.
• 1DA, 2DA The volume corrected depth of the reflector in gate A for the data sample selected by cursor
or 2 respectively.
• 1PA, 2PA Project distance from the specified origin of the reflector in gate A for the data sample
selected by cursor 1 or 2 respectively
• 1ZA, 2ZA Uncorrected depth of the reflector in gate A for the data sample selected by cursor 1 or 2
respectively.
• OTA Percentage over gate A threshold for all samples in the top view scan
• OTPA Percentage over gate A threshold for samples between position cursors
• OTCA Percentage over gate A threshold for samples between both position and beam cursors
• C21_B2B1 Distance between beams. Available for probe scans of straight beam (0-degree) linear scans.
GATE B - Readings for all beams
• 1A%B, 2A%B Amplitude (as a % of full-screen height) of the echo in gate B for the data sample selected by
cursor 1 or 2 respectively.
• 1SB, 2SB Soundpath of the echo in gate B for the data sample selected by cursor 1 or 2 respectively.
• 1DB, 2DB The volume corrected depth of the reflector in gate B for the data sample selected by cursor 1
or 2 respectively.
• 1PB, 2PB Project distance from the specified origin of the reflector in gate B for the data sample selected
by cursor 1 or 2 respectively
• 1ZB, 2ZB Uncorrected depth of the reflector in gate B for the data sample selected by cursor 1 or 2
respectively.
• OTB Percentage over gate B threshold for all samples in the top view scan
• OTPB Percentage over gate B threshold for samples between position cursors
• OTCB Percentage over gate B threshold for samples between both position and beam cursors