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Finite Element Modeling Analysis and Lif
Finite Element Modeling Analysis and Lif
Finite Element Modeling Analysis and Lif
Keywords: PV module, life prediction, low cycle fatigue, finite element, viscoelasticity
1 Introduction Upon cooling, each material tends to contract but all of them are
restricted to one another due to adhesion of the encapsulant. The
The demand for electricity, in the near future, is predicted to
differences in the CTE of all components induce thermomechani-
increase due to the global population growth and industrialization.
cal stresses within them. Hence, a PV module is prestressed before
Studies show that the world’s net electricity generation was
its service. During operation, it experiences temperature cycles of
expected to rise from 20,261 terawatt-hours in 2008 to 24,400
day and night due to which each component is further stressed
terawatt-hours (an increase of 20.4%) in 2015 and 33,300
within the laminate, which may lead to failure.
terawatt-hours (an increase of 64.4%) in 2030 [1]. Currently, a
Failure is defined as the change in properties of a structure,
large share of electricity is produced by conventional energy
machine or machine part that makes it inept to perform its
resources for both domestic and industrial sector. But it is well
intended functions. The occurrence of such failure is through
known that their usage is the prime cause of environmental pollu-
physical means which are known as failure modes [4]. In the case
tion. For example, the emissions of carbon dioxide and mercury
of PV modules, failure may be stated as when the module is not
are expected to increase by 35% and 8%, respectively, by the year
capable of producing power as per its specification due to degra-
2020 due to the expected increase in electricity generation [2].
dation caused by failure modes. While operating at the field, a PV
Furthermore, these resources are on their way to depletion
module is subjected to various loading conditions. A number of
because of their excessive usage. As a solution to the problem,
failures have been reported during the course of its operation.
renewable energy resources should pave their way toward elec-
Wohlgemuth et al. [5] have gathered commercial PV module
tricity production. The most common of all renewable resources is
returns under warranty of BP Solar/Solarex from 1994 to 2005.
the production of electricity through solar light. Light is converted
Each product was examined and the cause of failure was found
into electricity through a PV process. The use of PV systems for
which is summarized by Fig. 2. It is seen that corrosion and cell/
electricity generation started in the seventies of the 20th century
interconnect breakage have the highest part in failure. Wohlge-
and is currently growing rapidly worldwide. The PV industry is
muth and Cunningham [6] have concluded that cell breakage dur-
growing even in times of economic crisis. The global solar elec-
ing operation is due to predamaged cells during soldering. Wiese
tricity market is currently more than $10 billion/year and the
et al. [7,8] have attributed interconnect breakage to fatigue as a
industry is rising at a rate of greater than 30% per annum [3].
result of thermocycling. Such failures deteriorate PV module
Nowadays, research and development of PV technology focus on
performance, ultimately affecting its life.
increasing its efficiency and reliability.
The lifetime of today’s PV module is expected to be 25 yr with
As shown in Fig. 1, a PV module consists of layers of different
20% reduction in its power output over this period, and this is usu-
materials (glass, interconnects, cells, and back sheet) that are
ally guarantee of the manufacturer. In accordance with such
bound together through an encapsulant polymer. This single lami-
requirements, the module must withstand mechanical loads reli-
nate of various materials is formed by the lamination process, in
ably. Its high reliability will help it to reach grid parity. Qualifica-
which the encapsulant is placed between each layer and melted at
tion standards, such as ASTM E1171-09 [9], are good to identify
its curing temperature. Polymer chains are cross-linked after
the initial design flaws or infant mortality but cannot validate a
curing and the whole laminate is cooled to room temperature.
25 yr life of a PV module [10]. Irrespective of the operating condi-
tions, the standards constitute a fixed temperature cycle, and thus
Contributed by the Solar Energy Division of ASME for publication in the
JOURNAL OF SOLAR ENERGY ENGINEERING. Manuscript received December 20, 2012;
are not appropriate for life prediction.
final manuscript received November 3, 2013; published online December 19, 2013. Literature shows some recent efforts in modeling and studying
Assoc. Editor: Santiago Silvestre. the structural behavior of PV module through FE Analysis. Chen
Here, feg ¼ fex ey ez cxy cyz cxz gT is the total strain vector, feel g LF LO 1 DL
is the elastic strain vector, and feth g is the thermal strain vector. In aðTO; TÞ ¼ ¼ : (7)
LO ðT TO Þ LO DT
a three dimensional case, thermal strain vector can be given as
G1
/1 ¼
Go
By substituting Eq. (17) in Eq. (16) for each data point of the mas-
ter curve, the value of instantaneous shear modulus (Go) can be
calculated. For a proper curve fit, this value will be almost same
for each data point otherwise an average may be taken. The in-
stantaneous shear modulus can then be used to calculate the in-
stantaneous Young’s modulus for EVA (to be used in FE
package) by below equation:
Eo ¼ 2Go ð1 þ tÞ (18)
Poisson’s ratio ðtÞ for EVA was taken as 0.4. All viscoelastic ma-
terial properties for EVA are mentioned in Table 2.
Glass 4000
Cell 200
Encapsulant 1200
Backsheet 350
Interconnector 129
Dep
¼ e0f ð2Nf Þc (20)
2
Dr
¼ r0f ð2Nf Þb (21)
2
where Dep =2 is the plastic strain amplitude and Dr=2 is the stress
amplitude. For the case of PV module, fatigue properties of cop-
per were taken from Ref. [30], given in Table 7.
In this work, life of PV module was predicted operating under
the atmospheric conditions of Jeddah, Saudi Arabia. From the
Fig. 15 Max von-Mises stress and first principal stress through
the thickness of the module at lowest temperature on Day 4 irradiance and ambient temperature data for one year, four repre-
sentative days were chosen to represent varying condition of irra-
diance throughout the year. The chosen days had the following
characteristics:
De r0f
¼ ð2Nf Þb þ e0f ð2Nf Þc (19) • Day 1: first day was chosen out of January which represented
2 E low irradiance and low temperature.
• Day 2: the second one was out of July representing hot
where De=2 is the total strain amplitude, r0f is the fatigue strength
weather and smooth irradiance/not cloudy.
coefficient, e0f is the fatigue ductility coefficient, E is the Young’s
• Day 3: the third one was from October and was partially
modulus of elasticity, Nf is number of cycles to crack initiation, b
clouded with average ambient temperatures.
is the fatigue strength exponent, and c is the fatigue ductility
• Day 4: the fourth one was chosen from December and had an
exponent. The total strain amplitude (De=2) is actually the half of
extremely overcast sky with low temperatures.
the strain range within the loading cycle. For evaluating parame-
ters required for life estimation, there are certain testing methods The maximum and minimum principle strains for each of the
discussed in Ref. [29]. Equation (19) is actually the combination four days were evaluated from FE simulation. Then time (number
of the Coffin–Manson relationship and Basquin’s equation given of loading cycles) to crack initiation of copper interconnects was
by Eqs. (20) and (21), respectively. Coffin–Manson model was calculated through Eq. (19) under the assumption that the PV
proposed independently by Coffin and Manson in 1954. This module continues to function under the same load cycle of the
model accounts for such low-cycle fatigue conditions where plas- day.
1 104 27 38.5
2 99.8 16.6 41.6
3 102 6.8 47.6
4 105 59.2 22.9
Fig. 19 Transient change in von-Mises stress and first princi- 7.2 Stress Analysis on the Basis of Worst Day Conditions.
pal stress for Day 3 on copper interconnect. A represents the Out of the four days simulated, it was found that stresses are the
time of max. stress, min. temperature and B represents the time highest during December. This month constitutes the lowest tem-
of min. stress, max. temperature. peratures of the whole year which makes the PV module to oper-
ate farthest from its stress-free state. As the edges of the module
are fixed to simulate the presence of frame, the nature of stresses
is tensile over the whole laminate and hence, the third principal
temperature. Cooling causes the encapsulant to solidify and stress is almost zero. Figure 15 shows the variation of maximum
adhere to all components. This process was simulated and the von-Mises stress through the thickness of the laminate on worst
module was cooled to 21 C. At this temperature, von-Mises stress day condition at lowest temperature. It is seen that the maximum
is almost constant over the whole interconnector strip and is about von-Mises stress and the maximum first principal stress are almost
95.8 MPa. They undergo plastic deformation just after the curing equal. Thus, the overall nature of stresses on all the components is
process and this phenomenon has also been discussed in Ref. [14]. almost tensile. Glass and the interconnects have almost the same
From the experiments performed in Ref. [7], it is found that the first principal stress (around 103 MPa) which is highest amongst
yield stress of copper is around 94 MPa at room temperature. The all. The high stress in glass is due to fixed boundary condition
contours for von-Mises stress and von-Mises plastic strain in the applied at its edges. Whereas, cells have a lower stress of 60 MPa
interconnects between two adjacent cells are given in Fig. 14 at as they are not directly constrained and their thermomechanical
21 C. It should be noted that the shaded 3D view of the region movements are aided due to the compliancy of the encapsulant
for which the contours are displayed are merely for understand- material. The interconnects, on the other hand, are directly bound
ing. The results displayed are from the solution of the 2D shell to cells causing them to yield. Lowest stress can be seen in the
model. encapsulant as it is the least stiff material as compared to others.
Day i Max total strain, emax Min total strain, emin Cycles, Nf Weight, Wday i Life, Lday_i (yr)
Figure 16 shows the first principal stress contours of all the sections. Thus, it can be said that the temperature range of a day
components of the laminate. Highest stress on glass can be seen has a direct impact on the life of a PV module. To assign weights,
along the interconnect region and is around 112 MPa. It is because total of average ambient temperatures (Ttotal) was calculated
of less encapsulant material present at that portion along the thick- according to below equation:
ness. The segment of glass which is void of cells and intercon-
nects beneath it has the least stress of 99.4 MPa. The majority area Xn
Tmax i þ Tmin i
of glass is over the cells and has an intermediate value of stress Ttotal ¼ (25)
around 106 MPa. There is no significant variation of stresses in i¼1
2
backsheet but is less than that of glass (about 33 MPa) for having
a lesser value Young’s modulus of elasticity. The corners of the where Tmax i is the maximum ambient temperature of day i, Tmin i
cells have the highest stress value of 63.4 MPa. This can be attrib- is the minimum ambient temperature of day i and n is the total
uted to the lack of material present at the location due to rounded number of days in a year. Weight for each representative day is
corners. Stress of 60 MPa covers the major region of cells and is simply estimated by dividing the average temperature of the day
higher than the portions representing the interconnect areas. The by Ttotal. The average life (Lavg) can then be given by Eq. (26) and
reason being that the effect of high CTE of glass as compared to is calculated to be 26.63 yr.
cells is barred by the presence of the interconnect material in
between. In the case of interconnects (shown in Fig. 17), it can be X4
Wday i Lday i
seen that the maximum stress is on the corner of the connection Lavg ¼ (26)
i¼1
Wtotal
between adjacent cells and is 106 MPa as the contraction of cop-
per is restricted by silicon. Rest of the portion of interconnects has
almost a constant stress of 103 MPa. where Wday i is the weight of the ith representative day, Lday i is
Figure 18 gives the stress variation along the longitudinal and the life of the ith representative day, and Wtotal is the sum of the
transverse paths neglecting the backsheet and glass cover. Path weights of four representative days. The weights for the four days
AB displays maximum stresses is over the interconnect regions are given in Table 9.
between adjoining cells. Lowest stress suggests the area of the
encapsulant material which is the same in path CD. It is also seen
8 Conclusions
that the stresses in cells are 13 MPa higher in the transverse direc-
tion than in the longitudinal direction, with almost the same prin- Within the presented work, FE analysis was used to determine
cipal and von-Mises stress. Stresses in interconnects in both the behavior of the components of PV module under operating
direction are the same around 103 MPa. conditions. A comprehensive structural model was formed and
Figure 19 shows the relation of von-Mises and first principle which was coupled to a thermal model. Starting from the lamina-
stress with time and temperature for Day 3. Location A represents tion procedure and then by using meteorological data, the follow-
maximum stress at minimum temperature whereas location B rep- ing conclusions have been drawn out of this work.
resents minimum stress at maximum temperature. Thus, by seeing • The high failure percentage of copper interconnects, given in
the figure, it can be said that the temperature change of 10 C the literature, is justified through its yielding during cooling
causes a stress change of 85 MPa. after the lamination process. The plastic deformation makes it
Table 8 shows the difference of the stress amplitudes for all the a subject of low-cycle fatigue.
four days at a point over the interconnect region. As already • Glass exhibits a dominating behavior due to its large thick-
mentioned that the maximum stress is during Day 4 but later in ness. As the contraction of glass was fixed, all the compo-
Table 9, it will be seen that the conditions of Day 4 also give max- nents of PV module had induced tensile stress within them.
imum life for PV module. The reason is attributed to its least Glass also bears the maximum stress amongst all of the com-
stress amplitude which can be seen according to Eq. (21). Thus, ponents as it bears most of the area of constraint, which was
life or time to crack initiation is majorly affected by stress ampli- made to provide frame effect.
tude rather than its magnitude. • Silicon cells operate within a safe temperature range as the
stresses induced in it are way below their yield stress; unless
7.3 Life Prediction. The maximum and minimum total strain they are precracked due to their manufacturing and soldering
is given in Table 9. From them, their respective strain amplitudes procedure.
(half of the difference between maximum and minimum strain) is • Average life of a PV module has been estimated through its
evaluated. By using the material properties of copper in Table 7 dominant mode of failure which is the breakage of copper
and Eq. (19), the number of cycles is calculated for the four days interconnects and is found out to be 26.63 yr. It is quite close
and the number of years to crack initiation was determined. to the 25-yr warranty given my most of the PV module
Now, to get the average life of a PV module operating in Jed- manufacturers.
dah, weights were assigned to each representative day according • The numerical procedure developed is inclusive of operating
to their impact over the whole year. It was seen that at the maxi- conditions and has the ability to predict proper behavior and
mum and minimum temperature of the day, the total strain was life under operation with reasonable accuracy. It can be used
vice-versa of temperature. It is because the zero strain temperature as a tool to anticipate the effects of design changes in the
of the simulation was set to 150 C as mentioned in the previous form of stress distribution and life.