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MET 487 Instrumentation and Automatic Control
MET 487 Instrumentation and Automatic Control
Lecture 15
References:
• Chapter 8 – Data Acquisition, Introduction to Mechatronics and Measurement
Systems, by David G. Alciatore and Michael B. Histand, 3rd edition, published by
McGraw-Hill, 2007
8.1
• Sampling
• Digitized signal
• Sampling Theorem
• Sampling Rate
• Nyquist frequency
• Aliasing
References
• National Instruments
o Products and Services, http://www.ni.com/products/
o Measurement and Instrumentation,
http://www.ni.com/academic/measurements.htm
o NI ELVIS Guided Tour, http://zone.ni.com/wv/app/doc/p/id/wv-654
o Control Design, Simulation, and Mechatronics,
http://www.ni.com/academic/controls.htm
• Microchip,
http://www.microchip.com/stellent/idcplg?IdcService=SS_GET_PAGE&nodeId=
69
• Mathworks, http://www.mathworks.com/
• Sensors Magazine, http://www.sensorsmag.com/
• Electronics Manufacturers
o Motion Sensors, http://www.electronics-
manufacturers.com/Safety_and_surveillance_electronics/Motion_sensors/
o Electromagnetic Sensors, http://www.electronics-
manufacturers.com/Safety_and_surveillance_electronics/Electromagnetic_
sensors/