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Digital system Design

Class: ECE III C Faculty: Mr. P.Jayakrishna

Unit 4 - Assignment 4

Set 1
VSAQ(2M)
1. Explain about the following types of faults:
(i) stuck at faults (ii) Bridge faults (iii) temporary faults
2. Explain how kohavi algorithm is useful in the detection of faults in digital circuits.

SAQ (3M)
3. Draw the circuit which realizes the function f(x) = x x + x x using AND-OR gates
1 2 3 4
using Boolean difference method obtain the test set to detect SAo fault on input line x1 of
the circuit.
4. Apply D-algorithm to detect h SAO fault in the given circuit and derive the test vectors.

LAQ (10M)
5. Determine the output function of the circuit of figure for the following faults:
a. AND bridge between inputs of gate G1
b. The multiple fault{ x3 s-a-1, x2 s-a-0}

6. Using the path –sensitization method and Boolean difference method find the test vectors
for SAO fault on input line 1 and SA1 Fault on the internal line 2 of the circuit shown
below
Set 2
VSAQ(2M)
1. Describe the algorithmic steps involved in PODEM.
2. With an example, explain the transition count testing method.

SAQ (3M)
3. What is the significance of Kohavi Algorithm? Explain how it detects multiple faults in a
two-level networks with a simple example.
4. Prove that in a combinational circuit two faults functionally equivalent under a complete
location test set are functionally equivalent. Also, Prove that in a combinational circuit, if
two faults dominate each other then they are functionally equivalent.

LAQ (10M)
5. For the circuit shown below find tests to detect the faults h SAO and hSA1,K SAO and K
SA1. Find tests to distinguish between the above faults.

6. For the circuit in the figure


a) Find the set of all tests that detect the fault c s-a-1.
b) Find the set of all tests that detect the fault a s-a-0.
C) Find the set of all tests that detect the multiple fault {c s-a-1, a s=a=0}.

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