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12.A Low-Power Dynamic-Range Relaxed Analog Front End For Wearable Heart Rate and Blood Oximetry Sensor BASE
12.A Low-Power Dynamic-Range Relaxed Analog Front End For Wearable Heart Rate and Blood Oximetry Sensor BASE
fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
Journal
1558-1748 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
Journal
RLED Reg.
Only Vac/Vdc
LED 8-bit [7:0] fCounter Vac(IR) (R/IR)
IRLED Counter
Driver DAC PPG SpO2
fTimer:
TX 100 Hz
Clocks
Analog Front End Generator
VREF: 1.2 V VDD: 2.5 V
fChopper:
10 kHz
Fig. 2. System block diagram of the proposed pulse oximeter in this study.
A. Receiver Channel
The proposed RX circuit shown in Fig. 2 consists of Fig. 4. Implemented amplifier in the TIA.
TIA, switched low-pass RC-filter, high-pass filter(HPF), and
variable gain amplifier(VGA). Fig. 3 gives the detail imple-
mentation, the transfer function of TIA(for a high open-loop where Iph is the PD current, s is the Laplace operator, Rf
gain of amplifier) can be approximated as is the transimpedance gain, and Cf is the feedback capacitor.
Iph RF Considering the junction capacitance of the photodiode, the
VO ≈ , (1) value of Cf should be carefully chosen to stabilize the TIA
sRF CF + 1
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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
Journal
VDD
fr
fr
R IR
Vo
Amp
fr
fsw
fr
fsw
Rf Cf Cd Vref
ILED
fsw
Amp
fr
M0
B Vo 0
(2 h) 1
(2 h)
Fig. 5. Small-signal model for the noise analysis. 7
(2 h)
fcount D0 D0
Vref Vo
D1 D0 D0
Counter D0
[18]. The main amplifier in the TIA has a two-stage fold- D7 i=0
cascode structure [19], as shown in Fig. 4, the large open- i=1
i=7
loop gain of Amp ensures the accuracy of the TIA. Moreover,
8-bit DAC
the differential input pairs that use both NMOS and PMOS
transistors achieve a rail-to-rail input common-mode voltage
range. Miller compensation, which is composed of capacitor
Fig. 6. Circuit implementation of TX.
Cm and resistor Rm , is implemented to ensure the stability.
One important feature of the TIA is its DR, which can
LED(R) on
be enhanced by increasing the sensitivity; i.e., the TIA must
have less noise. A simplified small-signal model of TIA is LED(IR) on
used for the noise analysis, as shown in Fig. 5. Cd is the
R IR R IR
junction capacitance of the LED. The main noise sources fclkA: Sample LED(R/IR)
are the thermal noise of Rf and and the equivalent input Amb Amb Amb Amb
fclkB: (R) (IR) (R) (IR) Sample ambient
2
noise sources of the amplifier In,amp 2
and Vn,amp . Then, the
2
total input thermal noise current spectral density In,in can be fclk1 Convert ambient(IR)
calculated as [19]
fclk2 Convert ambient(R)
2 2
2
Vn,amp · [1 + sCt Rf ]2 2
In,in = In,amp + + In,R fclk3 Convert LED(R)
Rf2
fclk4 Convert LED(IR)
(2πf Ct )2 4kT γ 4kT
≈ 4kT γ
Amb Amb Amb Amb
+ 2 + , (2) (IR) R (R) IR (IR) R (R) IR
gm Rf gm Rf ADC1
DC signal conversion
(R/IR/Ambient)
R IR R IR
AC signal conversion
where k is Boltzmann’s constant, γ(= 2/3) is the white noise
ADC2 (R/IR)
parameter for long transistors, Ct = Cf + Cd , and gm is the Pulse Repetition Period
transconductance of the MOS transistor. The thermal noise can
be reduced by designing a large gm . Thus, large input tran-
Fig. 7. Timer program implemented in the AFE.
sistors are used in the Amp, which also decreases the flicker
noise. Additionally, a chopping modulation is implemented in
the amplifier to suppress the input noise and the input offset
the switched operation. Note that VA is connected to an RC-
[20].
filter that performs the high-pass function and blocks the DC
The photocurrent pulses from the PD are converted to a signal, and that the values of CH and RH determine the cut-
voltage using a TIA; then, it is demodulated using the switched off frequency. Then, the baseline wander is removed, and the
RC low-pass filter. The low-pass corner can be given by [17] AC component of PPG signal is coupled to the VGA, which
D is implemented with a non-inverting architecture; the output
f−3dB = . (3) swing of the VGA must satisfy only the gained AC signal
2πRL CL
requirement. In this way, the AC and DC portions of the
where D is the duty cycle of the sampling pulse. Thus, the PPG signal are separated by a high-pass structure, and then
filter cutoff can be controlled by adjusting the width of the converted by ADC1 and ADC2, respectively. This operation
sampling pulse to further reduce any noise aliasing that occurs relaxes the DR requirement of the RX channel.
at the output of the TIA.
Using the clock modulation, the TIA realizes two outputs:
VA and VB . VA includes both the LED(R and IR) light B. Transmitter Channel
signal and the ambient light signal, whereas VB is only the From Fig. 2, an LED driver that can drive dual LEDs
sampled ambient light signal; the separation is realized using is controlled by an 8-bit DAC and a counter to the MCU,
1558-1748 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
Journal
Management
duty cycle of the LED can be adjusted by changing the duty
Power
cycle of fsw . To optimize the noise power performance of RX
the driver output current, the differential pair of the two-stage
fold cascode op-amp is chopped to remove the low-frequency
noise. The LED current ILED can be programmable using an
8-bit DAC and an 8-bit counter, which is controlled by the
clock fcounter . The binary-weighted current sink transistors (a)
Mi(i=0∼7) are used for the 8-bit DAC implementation. The
gate-source voltage of Mi is controlled by the logical unit PPG
signal
B. When digital input bit Di(i=0∼7) equals 1, the gate-source
voltage is connected to Vref , Mi is operated at the saturation
region for the current generation. When Di equals 0, the
transistor turns off. Then, ILED is expressed as
∑7 ( )
W
ILED = Di 2i µn Cox (Vref − Vth )2 , (4)
i=0
L
where µn is the electron mobility, Cox is the oxide capacitance
per unit area, W/L is the size of transistor, and Vth is the (b)
threshold voltage. ILED can be programmable by choosing
different digital bits, the maximum value of ILED is 50 mA.
Fig. 8. Proposed AFE:(a) chip micrograph; (b) demonstration of PPG
C. Timer Module measurement.
1558-1748 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
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FLUKE Simulator
R
IR
R
IR
LEDs AFE Chip 678 mV 422 mV
& PD
(a)
HR &
FLUKE
(b)
LEDs & PD AFE Chip MCU &
Simulator LCD
120
Fig. 9. (a) Test setup for the proposed AFE; (b) framework implementation
of test setup.
90
60
VA
30
VAC(R) 0.5 1 1.5 2 2.5
VoAC
Input frequency (Hz)
VAC(IR) (a)
100
Zoom in
Measured SpO2 (%)
R IR 97
94
R 91
IR 88
85
Maximum Error < 1.5%
82
79
78 80 82 84 86 88 90 92 94 96 98 100
Fig. 10. Experimental output waveforms of the AFE. Fluck simulator SpO2 (%)
(b)
of R measured using our AFE is recorded according to the Fig. 12. Demonstrated results:(a) heart rate; (b) SP O2 .
input SP O2 value generated from the FLUKE Simulator. The
experiment is implemented on five values of SP O2 (80%, 85%,
90%, 95%, 100%), each point is tested in 10 samples, and the
mean of R is obtained. With the collected curve-fitting data, approximately 6.45 pA(0.5-10 Hz).
the exact linear function shown in Eq. (7) can be plotted. Table I summarizes the characteristics of our AFE com-
After calibrating our pulse oximeter, we measure HR and pared with those of published state-of-the art systems. The
SP O2 , and the results are compared with those generated comparison reveals that the proposed AFE enables HR and
from the FLUKE Simulator. Fig. 12 shows the measured SP O2 monitoring, the implementation eliminates the dynamic
performance, each data point reflects the average of five tests at DC component of the PPG signal without the additional DAC
each target, and each test is implemented for 30 seconds. Fig. in the feedback operation that is implemented in [10], [14],
12(a) provides the measured HR when the input frequency of [16], [17]. While [11]–[13] also implement HR and SP O2
the PPG signal is swept within 0.67-2.5 Hz. Fig. 12(b) presents measurements without DAC implementation, but they con-
the SP O2 measurements, where the maximum standard error sume more power dissipation. The proposed circuit performs
is less than 1.5%. better in terms of power consumption. Moreover, the chopping
The experimental input current noise density is shown in modulation ensures the circuit performs low input noise with
Fig. 13, with the chopping modulation, the integrated value is the low transimpedance gain(= 40 kΩ).
1558-1748 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
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TABLE I
C OMPARISON WITH OTHER STATE - OF - THE - ART AFE S FOR PPG ACQUISITION .
This work Ref. [10] Ref. [11] Ref. [12] Ref. [13] Ref. [14] Ref. [16] Ref. [17]
Process 0.18 µm 0.18 µm 0.35 µm 1.5 µm 0.35 µm 0.18 µm 0.18 µm 0.13 µm
Supply voltage (V)a 2.5 3.3 2.5 5 3.3 1.8 1.2 1.5
Power (µW)a 180 1980b 600b 400 363 216c 171.6c 68.7c
Integrated noise (pArms ) 6.45 3.2 2200 N/A 890 600 486 4
Bandwidth (Hz) 10 20 6 10 10 10 5
Sampling frequency (Hz) 100 100 100 100 100 165 128 100
Rf (Ω) 40k 500k 2k N/A 500k 1M 50k 100k
LED peak current (mA) 50 100 N/A 15 7.1 25.6 0.036 50
LED duty cycle 25% 25% 10% 3% 4% 0.7% N/A 20%
DAC implementation for No Yes No No No Yes Yes Yes
dynamic DC cancellation
Application HR & SP O2 HR & SP O2 HR SP O2 HR & SP O2 HR & SP O2 HR HR
a Exclude LED and power management.
b Only RX.
c Include ADC.
[6] P.M. Mohan, V. Nagarajan, and S.R. Das, “Stress measurement from
Input noise density (pA√Hz)
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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI 10.1109/JSEN.2018.2872083, IEEE Sensors
Journal
1558-1748 (c) 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.