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ISO-14000 Certified
ISO-17025 Certified
ADVANTECH CO., LTD.

QA Test Report
DES-SE01

(Product Reliability Test)

Report Date: Apr 13, 2016

_______________________ _____________________ ___________________

Elton Wang Allen.Hung Willie,Wu
Manager Approval Test Engineer
1.01 Thermal Stress Test
Test Date: Apr 08~11, 2016
Test Site: Advantech QA Laboratory
Performed By: Willie.Wu

1.01.1.01 Test Purpose:

Evaluate the design limit of the EUT with thermal stress test to maintain operated stable.

1.01.1.02 Test Standard:

Reference to the Advantech HALT SOP (Doc. QAL-PC028)

1.01.1.03 Test Equipment:

1. Programmable Temperature & Humidity Chamber
K.SON Co. Ltd
Model: THS-D4T-150
S/N: 5629K
Date of Calibration: 2016/01/21
Next Calibration date: 2017/01/20

1.01.1.04 Sample Configuration & Quantity Under Test:

Using One piece of DES-SE01 with the following options installed:
1. M/B: DES-SE01 Rev.A101-2
2. CPU: Intel N270 1.6GHz
3. RAM:Apacer 1GB DDR2 533
4. CFast: SQF-P10S2-8G-ETE
5. BIOS: V1.13
6. Power adapter: S-150-24 (DC24V)
7. Display:ViewSonic (connected with one sample and put outside the chamber)

1.01.1.05 Test Condition:

1. High temperature: 65C ( the highest to 150C of chamber ability)
2. Temperature gradient: 0.5C/min
3. OS: WinXP 32bit
4. Test software : Running PassMark Burn-in test 7.0 (2D,3D,serial port, usb, CPU,
RAM,video play back, disk and network 100% loading).
5. External Loading : +12V /2.0A

2
Test Result : Pass

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1.02 Thermal Stress Test
Test Date: Apr 11~12, 2016
Test Site: Advantech QA Laboratory
Performed By: Willie.Wu

1.02.1.01 Test Purpose:

Evaluate the design limit of the EUT with thermal stress test to maintain operated stable.

1.02.1.02 Test Standard:

Reference to the Advantech HALT SOP (Doc. QAL-PC028)

1.02.1.03 Test Equipment:

1. Programmable Temperature & Humidity Chamber
K.SON Co. Ltd
Model: THS-D4T-150
S/N: 5629K
Date of Calibration: 2016/01/21
Next Calibration date: 2017/01/20

1.02.1.04 Sample Configuration & Quantity Under Test:

Using One piece of DES-SE01 with the following options installed:
1. M/B: DES-SE01 Rev.A101-2
2. CPU: Intel N270 1.6GHz
3. RAM:Apacer 1GB DDR2 533
4. CFast: SQF-P10S2-8G-ETE
5. BIOS: V1.13
6. Power adapter: S-150-12 (DC12V)
7. Display: ViewSonic (connected with one sample and put outside the chamber)

1.02.1.05 Test Condition:

1. High temperature: 65C ( the highest to 150C of chamber ability)
2. Temperature gradient: 0.5C/min
3. OS: WinXP 32bit
4. Test software : Running PassMark Burn-in test 7.0 (2D,3D,serial port, usb, CPU,
RAM,video play back, disk and network 100% loading)
5. External Loading : +12V /2.0A

4
1.02.1.06 Test Result : Pass

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1.03 Power ON/OFF Test
Test Date:Apr 6~7, 2016
Test Site: Advantech QA Laboratory
Performed By: Willie.Wu

1.03.1.01 Test Purpose:

Evaluate whether the power ON/OFF functions are maintained in a stable condition in
different environment condition.

1.03.1.02 Test Standard:

Please refer to the following documents:
1. IEC 60068-2-1 Testing procedures Test Ab: Cold Test.
2. IEC 60068-2-2 Testing procedure Test Bb: Dry Heat Test.

1.03.1.03 Sample Configuration & Quantity Under Test:

Using One piece of DES-SE01 with the following options installed:
1. M/B: DES-SE01 Rev.A101-2
2. CPU: Intel N270 1.6GHz
3. RAM:Apacer 1GB DDR2 533
4. CFast: SQF-P10S2-8G-ETE
5. BIOS: V1.13
6. Power adapter: S-150-24 (DC24V)
7. Display: ViewSonic

1.03.1.04 Test Condition:

1. Test temperature: 25C
2. Total test time: each temperature 1000 times
3. OS: DOS
4. Power ON / OFF time interval curve
5. External Loading : Dynamic +12V /0.5A~4.0A

Power ON

Power OFF

Power ON time Power ON time

Power OFF time Power OFF time

1.03.1.05 Evaluation Criteria:

1. The system continues to operate as intended after the test
2. There should be no any time failed during 1000 times testing.

1.03.1.06 Test Result: Pass

6
 Test temperature Test times Test Result
25 ℃ 1000 times 1000 times pass
1. There is no any time failure during testing.
2. There is no damage in electronic and mechanical functions.
3. Degradation has not been found.
4. Performance is maintained with no incurable physical damage or degradation.

1.03.1.07 Conclusion: Passed

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1.04 Power ON/OFF Test
Test Date:Apr 7~8, 2016
Test Site: Advantech QA Laboratory
Performed By: Willie.Wu

1.04.1.01 Test Purpose:

Evaluate whether the power ON/OFF functions are maintained in a stable condition in
different environment condition.

1.04.1.02 Test Standard:

Please refer to the following documents:
1. IEC 60068-2-1 Testing procedures Test Ab: Cold Test.
2. IEC 60068-2-2 Testing procedure Test Bb: Dry Heat Test.

1.04.1.03 Sample Configuration & Quantity Under Test:

Using One piece of DES-SE01 with the following options installed:
1. M/B: DES-SE01 Rev.A101-2
2. CPU: Intel N270 1.6GHz
3. RAM:Apacer 1GB DDR2 533
4. CFast: SQF-P10S2-8G-ETE
5. BIOS: V1.13
6. Power adapter: S-150-12 (DC12V)
7. Display: ViewSonic

1.04.1.04 Test Condition:

1. Test temperature: 25C
2. Total test time: each temperature 1000 times
3. OS: DOS
4. Power ON / OFF time interval curve
5. External Loading : Dynamic +12V /0.5A~4.0A

Power ON

Power OFF

Power ON time Power ON time

Power OFF time Power OFF time

1.04.1.05 Evaluation Criteria:

1. The system continues to operate as intended after the test
2. There should be no any time failed during 1000 times testing.

1.04.1.06 Test Result: Pass

Test temperature Test times Test Result

8
 25 ℃ 1000 times 1000 times pass
1. There is no any time failure during testing.
2. There is no damage in electronic and mechanical functions.
3. Degradation has not been found.
4. Performance is maintained with no incurable physical damage or degradation.

1.04.1.07 Conclusion: Passed