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Cable Impedances Calculation
Cable Impedances Calculation
A. Calculation Conditions:
1) Reference Standard IEC 60287 & Electric Cable Handbook BICC 3rd Ed.
2) System Volatage [kV]
3) Frequency [Hz]
4) Maximum Operating Conductor Temperature [°C]
5) Nominal Conductor Cross Section Area [mm²]
6) Conductor Material
7) Sheath Bonding Method Cross bonding
8) Cable Arrangement Flat Formation
9) Axial Cable Distance of Phase
B. Calculation Procedure:
where,
R 20 : DC resistance of conductor at 20 °C [Ω/m]
a : Temperature coefficient of conductor
θmax : Maximum conductor temperature [°C]
λs =
𝜆𝑠 = (𝑋_𝑠^4)/(192+0.8𝑋_𝑠^4 )
𝜆𝑠 = −0.136−0.0177𝑋𝑠+0.563 𝑋_𝑠^2
For Xs ˃ 3.8
𝜆𝑠 = 0.354𝑋𝑠− 0. 733
Where,
𝑓 : System frequency [Hz]
Ks : Factor used in calculating skin effect
Xs :
Where,
d1 : Conductor diameter [mm]
Kp : Factor used in calculating proximity effect
S : Axial distance of the conductor [mm]
Where,
𝑓 : System frequency [Hz]
L : Inductance between conductors [mH/km]
𝐿 =0.2 ln〖 (2𝑆/𝑑)+𝐾 〗
[mH/km]
K : Constant factor
S : Axial Spacing between conductors
For Flat Formation S is multiplied by 1.26 [mm]
d1 : Conductor diameter [mm]
Where,
Rac : AC resistance of conductor [Ω/km]
XL : Inductive reactance between conductors [Ω/km]
4) Zero Sequence Resistance per phase
4.1) AC Resistance of Conductor at 20°C
for Zero sequence proximity effect is neglected
where,
𝑅𝑥=𝑅20 [ 1+ 𝛼(𝜃𝑚𝑎𝑥 −20)] ∴𝑅𝑥=𝑅20
Since at 20°C therefore
R 20 : DC resistance of conductor at 20 °C [Ω/m]
λs : Skin Effect
[Ω/m]
Where,
acws : Temperature coefficient of copper wire shield
θcws : Copper wire shield temperature [°C]
dcws : Diameter of copper wire shield [m]
Ncws : Number of copper wire shield [Nos]
rcws : Resistivity of copper wire shield [Ω.m]
dn : Mean diameter of Copper wire shield [m]
Ln : Lay Length of Copper wire shield [m]
[Ω/m]
Where,
aCT : Temperature coefficient of copper tape [°C]
θCT : Copper Tape temperature [°C]
wCT : Width of Copper tape [m]
tCT : Thickness of Copper Tape [m]
rcws : Resistivity of Copper Tape [Ω.m]
dn1 : Mean diameter of Copper Tape [m]
Ln1 : Lay Length of Copper Tape [m]
4.2.3) Combined Resistance of Copper wire shield and Copper tape at 20°C
𝑅_𝑇=(𝑅_𝑐𝑤𝑠×𝑅_𝐶𝑇)/ [Ω/m]
(𝑅_𝑐𝑤𝑠+𝑅_𝐶𝑇 )
Where,
aLS : Temperature coefficient of Lead Sheath
θLS : Lead Sheath temperature [°C]
d LS1
2
: Inner Diameter of Lead Sheath [mm]
d LS2
2
: Outer Diameter of Lead Sheath [mm]
rLS : Resistivity of Lead Sheath [Ω.m]
𝑅_0=𝑅_𝐴𝐶+𝑅_𝑆 [Ω/km]
Where,
𝑓 : System frequency [Hz]
L : Inductance between conductors [mH/km]
𝐿 =0.2 ln〖 (𝐷/𝑑)+𝐾 〗
[mH/km]
K : Constant factor
D : Mean Diameter of Sheath (CWS&LEAD) [mm]
𝐷=𝐷_𝑜𝑢𝑡𝐿𝐸𝐴𝐷−𝑡_(𝐶𝑊𝑆&𝐿𝐸𝐴𝐷)
𝑡_(𝐶𝑊𝑆&𝐿𝐸𝐴𝐷)= (𝐷_𝑜𝑢𝑡𝐿𝐸𝐴𝐷−𝐷_𝑖 )∕2 [mm]
DoutLEAD : Outer Diameter of Lead Sheath [mm]
d1 : Conductor diameter [mm]
6) Zero Sequence Impedance per phase
𝑍_0=√(𝑅_0^2+𝑋_0^2 )
[Ω/km]
Where,
R0 : Zero sequence resistance per phase [Ω/km]
X0 : Zero Sequence reactance per phase [Ω/km]
7) Surge Impedance
𝑍_ =(60/√𝜀)×ln(𝐷_𝑖/𝑑_𝑐𝑠 )
[Ω]
Where,
Ɛ : Relative permitivity of Insulation
Di : External diameter of insulation [mm]
dcs : Diameter of conductor screen [mm]
1.15E-05
0.201
2.01E-01
3.640081
0.189524
6.789
50
0.62 New Value taken From IEC 60287 1-1 Table 2 Revision 2014
2.606
2.25E-03
4.052
54.8
0.37 Value Taken from IEC 60287 1-1 Table 2
600
1.38E-05
0.224592
50
0.7149
0.2254
0.0140
0.2250
1.08E-05
9.00E-06
0.201
5.78E-05
8.99E-05
3.93E-03
20
0.002
68
1.724E-08
0.1123
0.72
2.10E-01
3.93E-03
20
0.0025
0.0001
1.724E-08
0.1144
0.125
8.98E-05
1.62E-04
4.00E-03
20
116.3
123.3
2.14E-07
5.78E-05
6.87E-02
0.063401
50
2.02E-01
2.02E-01
0.0514
116.25
7.05
123.3
54.8
0.0934
0.0690
0.0630
21.818
2.5
105.2
59.2
[Ω/km]
[Ω/km]
[Ω]
CALCULATION OF CABLE IMPEDANCES (Trefoil Formation)
A. Calculation Conditions:
1) Reference Standard IEC 60287 & Electric Cable Handbook BICC 3rd Ed.
2) System Volatage [kV]
3) Frequency [Hz]
4) Maximum Operating Conductor Temperature [°C]
5) Nominal Conductor Cross Section Area [mm²]
6) Conductor Material
7) Sheath Bonding Method Cross bonding
8) Cable Arrangement Trefoil Formation
9) Axial Cable Distance of Phase [mm]
B. Calculation Procedure:
where,
R 20 : DC resistance of conductor at 20 °C [Ω/m]
a : Temperature coefficient of conductor
θmax : Maximum conductor temperature [°C]
λs =
𝜆𝑠 = (𝑋_𝑠^4)/(192+0.8𝑋_𝑠^4 )
𝜆𝑠 = −0.136−0.0177𝑋𝑠+0.563 𝑋_𝑠^2
For Xs ˃ 3.8
𝜆𝑠 = 0.354𝑋𝑠− 0. 733
Where,
𝑓 : System frequency [Hz]
Ks : Factor used in calculating skin effect
Xs :
Where,
d1 : Conductor diameter [mm]
Kp : Factor used in calculating proximity effect
S : Axial distance of the conductor [mm]
Where,
𝑓 : System frequency [Hz]
L : Inductance between conductors [mH/km]
𝐿 =0.2 ln〖 (2𝑆/𝑑)+𝐾 〗
[mH/km]
K : Constant factor
S : Axial Spacing between conductors [mm]
d1 : Conductor diameter [mm]
Where,
Rac : AC resistance of conductor [Ω/km]
XL : Inductive reactance between conductors [Ω/km]
4) Zero Sequence Resistance per phase
4.1) AC Resistance of Conductor at 20°C
for Zero sequence proximity effect is neglected
where,
𝑅𝑥=𝑅20 [ 1+ 𝛼(𝜃𝑚𝑎𝑥 −20)] ∴𝑅𝑥=𝑅20
Since at 20°C therefore
R 20 : DC resistance of conductor at 20 °C [Ω/m]
λs : Skin Effect
[Ω/m]
Where,
acws : Temperature coefficient of copper wire shield
θcws : Copper wire shield temperature [°C]
dcws : Diameter of copper wire shield [m]
Ncws : Number of copper wire shield [Nos]
rcws : Resistivity of copper wire shield [Ω.m]
dn : Mean diameter of Copper wire shield [m]
Ln : Lay Length of Copper wire shield [m]
[Ω/m]
Where,
aCT : Temperature coefficient of copper tape [°C]
θCT : Copper Tape temperature [°C]
wCT : Width of Copper tape [m]
tCT : Thickness of Copper Tape [m]
rcws : Resistivity of Copper Tape [Ω.m]
dn1 : Mean diameter of Copper Tape [m]
Ln1 : Lay Length of Copper Tape [m]
4.2.3) Combined Resistance of Copper wire shield and Copper tape at 20°C
𝑅_𝑇=(𝑅_𝑐𝑤𝑠×𝑅_𝐶𝑇)/ [Ω/m]
(𝑅_𝑐𝑤𝑠+𝑅_𝐶𝑇 )
Where,
aLS : Temperature coefficient of Lead Sheath
θLS : Lead Sheath temperature [°C]
d LS1
2
: Inner Diameter of Lead Sheath [mm]
d LS2
2
: Outer Diameter of Lead Sheath [mm]
rLS : Resistivity of Lead Sheath [Ω.m]
𝑅_0=𝑅_𝐴𝐶+𝑅_𝑆 [Ω/km]
Where,
𝑓 : System frequency [Hz]
L : Inductance between conductors [mH/km]
𝐿 =0.2 ln〖 (𝐷/𝑑)+𝐾 〗
[mH/km]
K : Constant factor
D : Mean Diameter of Sheath (CWS&LEAD) [mm]
𝐷=𝐷_𝑜𝑢𝑡𝐿𝐸𝐴𝐷−𝑡_(𝐶𝑊𝑆&𝐿𝐸𝐴𝐷)
𝑡_(𝐶𝑊𝑆&𝐿𝐸𝐴𝐷)= (𝐷_𝑜𝑢𝑡𝐿𝐸𝐴𝐷−𝐷_𝑖 )∕2 [mm]
DoutLEAD : Outer Diameter of Lead Sheath [mm]
d1 : Conductor diameter [mm]
6) Zero Sequence Impedance per phase
𝑍_0=√(𝑅_0^2+𝑋_0^2 )
[Ω/km]
Where,
R0 : Zero sequence resistance per phase [Ω/km]
X0 : Zero Sequence reactance per phase [Ω/km]
7) Surge Impedance
𝑍_ =(60/√𝜀)×ln(𝐷_𝑖/𝑑_𝑐𝑠 )
[Ω]
Where,
Ɛ : Relative permitivity of Insulation
Di : External diameter of insulation [mm]
dcs : Diameter of conductor screen [mm]
1.15E-05
0.201
2.01E-01
3.640081
0.189524
6.789
50
0.62 New Value taken From IEC 60287 1-1 Table 2 Revision 2014
2.606
4.45E-02
4.052
54.8
0.37 Value Taken from IEC 60287 1-1 Table 2
136
1.43E-05
0.116811
50
0.371822
0.1178
0.0140
0.1170
1.08E-05
9.00E-06
0.201
5.78E-05
8.99E-05
3.93E-03
20
0.002
68
1.724E-08
0.1123
0.72
2.10E-01
3.93E-03
20
0.0025
0.0001
1.724E-08
0.1144
0.125
8.98E-05
1.62E-04
4.00E-03
20
116.3
123.3
2.14E-07
5.78E-05
6.87E-02
0.063401
50
2.02E-01
2.02E-01
0.0514
116.25
7.05
123.3
54.8
0.0934
0.0690
0.0630
21.818
2.5
105.2
59.2
[Ω/km]
[Ω/km]
[Ω]