Professional Documents
Culture Documents
PDR DDV Integrating Photometer System - Cnri
PDR DDV Integrating Photometer System - Cnri
PHOTOMETER SYSTEMS
ABSTRACT
Radiated luminous flux, its spatial distribution and colour temperature of light sources (lamps) are
basic parameters for photometric characterization of electric light sources (lamps). Due to this reason,
possibilities of simple integrating photometer systems creation, using closed spaces in the shape of
cube, parallelepiped or cylinder (instead of the Ulbricht’s sphere) in order to measure the luminous flux
are analyzed in this paper. The System of Interreflection Equations of the Luminous Flux and known
characteristics of luminous flux etalons (references) are used for the theoretical analysis of the
experimental model. The cube is used as the closed integrating space for the experimental model.
LMT Photometer B 510 with photometer head P 30 SC0 is used for illuminance measurement on the
experimental model.
Key words: Integrating Photometer Systems, Integrating cube, Integrating cube factor, Luminous
flux, Light source, Direct and indirect illuminance, Lambertian surface.
1. INTRODUCTION
Measurement of the lamps’ radiated flux is one of the basic measurements which is
unavoidable in the research and development phases as well as in regular controlling
phases of electric light sources producing processes. Luminous flux measurement is
also significant for indirect measurement of the materials’ reflectance parameters.
Various systems for direct luminous flux measurement are created for this purpose
consisting of:
Closed space which interior is illuminated by the light source;
Photometer whose sensor is mounted in the wall of the closed space;
Screen; and
Power supply and equipment for control measurements of electric parameters
Interior surface of closed space is ideally uniformly diffuse painted, i.e. represents
Lambertian surface. The most known and the most used Luminous fluxmeter
systems are systems that are using the integrating spheres (Ulbricht’s sphere) of
different radiuses for closed space. It is obvious that problem of the Integrating
photometer system construction is considered a lot in the technical literature ([1], [2]).
The construction of the Integrating photometer system (Luminous fluxmeter) has
started in Laboratory for Electrical installation and Illumination engineering at the
Faculty of Electronic Engineering of Niš. LMT Photometer B 510 with photometer
head P 30 SC0 was acquired for that purpose. For the last few months it has been
worked on the cube, parallelepiped and cylinder closed space models, due to the
lack of funds and a lot of difficulties for precise integrating sphere construction.
The aim of this paper is to present some experiences in measurement of the
luminous flux with developing laboratory model of the measuring system which is
using the cube as the closed integrating space.
2. THEORETICAL BACKGROUND OF THE MEASURING SYSTEM
where: k - is the total luminous flux which is falling on the k-th surface (i.e. the sum
of the direct 0 k and indirect luminous flux ind k , k 0k ind k , k 1, 2, ..., N ),
i - is the reflectance of the i-th surface, i 1, 2, ..., N , and f ik ( S k / S i ) f ki - are form
factors of i-th and k-th surfaces which satisfy following condition:
N
f
k 1
ik 1 , i 1, 2, ..., N . (2)
If the closed space is cube and its interior surface is uniformly ideally diffuse painted,
i.e. i , i 1, 2, ..., 6 , then:
Form factors are directly reciprocal, f ik f ki as well as f kk 0 ;
Form factors of any contiguous surfaces are equal, f ik f 0.200043776 ;
Form factors of any opposite surfaces are equal, f ik F 0.199824897 .
For coefficients f and F equation (2) becomes
4 f F 1. (3)
Using (1) - (3), solutions for total and indirect luminous flux distribution are:
1 C ( F/f 1) C 1 C
k 2 2
0 0k
1 C ( F/f 1) 1 1 C ( F/f 1) 2
2
1 C
C ( F/f 1) 0, k* , i 1, 2, ..., 6 , (4a)
1 C ( F/f 1) 2
2
1 C ( F/f 1) C 1 C
ind k 2 2
0 ( 1) 0k
1 C ( F/f 1) 1 1 C ( F/f 1) 2
2
1 C
C ( F/f 1) 0, k* , i 1, 2, ..., 6 , (4b)
1 C ( F/f 1) 2
2
where 0, k * represents direct luminous flux on the opposite surface related to the k-
th surface, and C is the factor given by the expression C f /(1 f ) .
Due to ( 1 F / f ) 0 , equations (4a) and (4b) can be simplified as:
C
k 0 (1 C ) 0 k , k 1, 2, ..., 6 , (5a)
1
C
ind k 0 C 0 k , k 1, 2, ..., 6 . (5b)
1
If (5) is divided by S k S a 2 , the following
1
3 equations are obtained:
4
C/S 1 C
Ek k / S k 0 0 k , k 1, 2, ..., 6 , (6a)
P2 a 1 S
2 C/S C
5 Eind k ind k / S k 0 0 k , k 1, 2, ..., 6 , (6b)
6 1 S
where E k and E ind k are mean values of the total and
Fig. 1: Illustration of the
integrating cube indirect illuminances of the k-th surface, respectively.
Expressions (6a) and (6b) show the light source
luminous flux 0 measurement possibility, using the illuminance measurement in the
privileged points (e.g. the vicinity of the point P2 , i.e. the center of the second surface
according to Fig. 2).
Total illuminance of the point P2 vicinity, E2 ( P2 ) , is proportional to the mean value
of E 2 . This value is, according to (6a), proportional to the total flux 0 as well as to
the direct flux 02 . The direct flux 02 is also unknown and during the measurement
is creating the methodical error that is proportional to the constant (1 C ).
Indirect illuminance component of the point P2 vicinity, E ind 2 ( P2 ) , is also
proportional to the mean indirect illuminance of the second surface E ind 2 . This
illuminance is proportional to the total flux 0 as well as to the direct flux 02 , but in
this case it is proportional to the constant C , C 1 . During this measurement
additional methodical error has been included by placing screen in front of the
photometer sensor. This error can be minimized by the selection of the screen size
as well as of the screen place.
Based on the previous theoretical consideration, the equation (6b) can be simplified
further and approximately expressed by the following expression
1
0 S [C 2 Eind 2 ( P2 )] C c Eind 2 ( P2 ) , (7)
C
where: C 2 - is a new unknown factor, and C c - is the Integrating Cube Factor (ICF).
Last expression represents the base for the experimental model of the integrating
cube and the whole fluxmeter system.
PP 2 x 1.5 mm2
50 cm
2 mm 10 mm
lz
100 cm
P2 dz
A
50 cm
LMT B 510
100 cm
lx _
U =110 : 230 Vdc
Fig. 2: Schematic illustration of the laboratory model of the fluxmeter system with
integrating cube.
4. MEASURING RESULTS
For the experiment performing authors had on the disposal the etalons (references)
of light sources OSRAM, on which control measurements were performed in the
Laboratory of the Federal Bureau of Measures and Precious Metals (FBM-PM, [4]).
For experiment performing authors also had standard lamps produced by TESLA
Pančevo, on which luminous flux measurements were performed in the Laboratory
for photometry of the lamps factory TESLA Pančevo ([5]).
Authors have addressed the Laboratory for photometry of the lamps factory TESLA
Pančevo, to perform the measurements of the luminous flux of the sample lamps
from production process and get sample lamps for the experiment. For
measurements performed in the Laboratory TESLA, the integrating sphere was used,
as well as the DC voltage U = 230 Vdc. Measurements of the same sample lamps
were performed using the proposed experimental model, with the same supplying
conditions. Calculated mean values of the ICF (values from Table 1) were used for
luminous flux calculation of the sample lamps. Measured values of the luminous flux
in the Laboratory TESLA were considered as exact and the relative error was
calculated based on these values.
From values arranged in Table 2 it can be concluded that relative error in those
cases is substantially greater, but
does not exceed 15%. For the error
increasing, for sure can be
emphasized some important reasons:
- the ICF is determined for the etalon
colour temperature of TCE 2800 K
(supplying voltage 110 Vdc); - colour
temperature of the sample light
sources is unknown; - considering that
the different supplying voltage of the
sample light sources (=230 Vdc),
causes that their colour temperature is
most probably different from the colour
Fig. 3: Photo of the experimental model temperature of the etalons.
Table 1: Experimental determination of the ICF for two positions of different screens using the light source etalons and the
calculation of the luminous flux of the etalons based on the mean value of ICF as well as on the measured values of the
indirect illuminance of the point P2 vicinity. Colour temperature of all etalon light sources is TCE 2800 K .
Table 2: Determination of the luminous flux of standard lamps based on the determined mean value of ICF from Table 1 and the
measured values of the indirect illuminance of the point P2 vicinity. Colour temperature of etalons is TCE 2800 K .
Colour temperature of the samples is unknown.
5. CONCLUSIONS
6. ACKNOWLEDGEMENTS:
7. REFERENCES
[1] CIE Publication: “The measurement of Luminous Flux”, CIE Technical Report, CIE Pub. No. 84, -
1st Edition, 1989.
[2] IESNA, Ed.: Rea M.S.: Lighting Handbook - Reference & Application, IESNA 8th Edition, New
York, 1993, Reprinted 1995.
[3] RANČIĆ P.D.: “Supplements to the Lighting Engineering Characterizations - Illumination of
Closed Spaces”, University of Niš, Faculty of Electronic Eng., Niš, 1997. (in Serbian).
[4] Federal Bureau of Measures and Precious Metals (FBM-PM): “Data of the control luminous flux
measurements of the etalons OSRAM”, July, Beograd 2002.
[5] Laboratory for photometry of the lamps factory TESLA Pančevo: “Data of the luminous flux
measurements of light sources”, July, Pančevo 2002.