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All rights reserved © 2018 OMMIC

OMMIC GaN Technology


D01GH GaN on HR-Si(111)

Confidential Information GaN for Microwave Applications – March 22th 2018 1


Outline

• Overview of OMMIC processes


• Keys to success for GaN
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• D01GH Process
• Electrical Performances & Guaranteed PCM
• D01GH MMICs
• Development of new GaN Process

Confidential Information GaN for Microwave Applications – March 22th 2018 2


Overview

OMMIC Processes
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Since 2016, OMMIC proposes a new process based on GaN/Si : D01GH

Confidential Information GaN for Microwave Applications – March 22th 2018 3


Overview

• What is (not) OMMIC GaN :

• Replacement of Si solutions to improve the power efficiency


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• Replacement of LDMOS solutions


• 0.5µm high power FETS or powerbars
• Rectifier Schottky diodes
• S, L, C, (X) band very high power amplifiers

Confidential Information GaN for Microwave Applications – March 22th 2018 4


Overview

Objective : Replace GaAs/InP technology with GaN technology


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Improve output power and robustness of microwave and


millimeter-wave circuits with the same performances
Confidential Information GaN for Microwave Applications – March 22th 2018 5
Overview

Objective : Replace GaAs/InP technology with GaN technology


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Improve output power and robustness of microwave and


millimeter-wave circuits with the same performances
Confidential Information GaN for Microwave Applications – March 22th 2018 6
Keys to success
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Why OMMIC GaN on Si


technology is the best one ?

Confidential Information GaN for Microwave Applications – March 22th 2018 7


Keys to success

• Epitaxial structure
• In situ passivation to avoid trapping / memory effects
• Thin AlN barrier to mitigate short channel effect
• AlGaN back barrier to improve electron confinement
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1a – in-situ passivation 1b – thin AlN barrier layer

GaN n++ GaN n++


GaN channel

AlGaN buffer 1c – AlGaN back barrier

HR-Si(111) substrate

Confidential Information GaN for Microwave Applications – March 22th 2018 8


Keys to success

• Technological structure
• Short gate length and short gate-source distance (250nm) to
increase RF performances
• Regrown ohmic contact to minimize access resistance
(Rc < 0.1 ohm.mm and RON < 1 ohm.mm)
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2 – Short gate length and


short gate-source distance 3 – Regrown ohmic contact

GaN n++ GaN n++


GaN channel

AlGaN buffer

HR-Si(111) substrate

Confidential Information GaN for Microwave Applications – March 22th 2018 9


OMMIC D01GH Process
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Via holes (Bosch process), air-bridges, NiCr & GaN resistors, SiN &
SiO2 MIM capacitors to allow mm-wave designs.
No metal layer of passive components directly on substrate.

Confidential Information GaN for Microwave Applications – March 22th 2018 10


OMMIC D01GH Process
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SEM observation of a 8*50µm GaN HEMT (end of process)

Confidential Information GaN for Microwave Applications – March 22th 2018 11


OMMIC D01GH Process
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SEM observation of a MIM capacitor (end of process)

Confidential Information GaN for Microwave Applications – March 22th 2018 12


OMMIC D01GH Process
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SEM observation of a NiCr resistor (end of process)

Confidential Information GaN for Microwave Applications – March 22th 2018 13


OMMIC D01GH Process
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SEM observation of via-holes (back side process)

Confidential Information GaN for Microwave Applications – March 22th 2018 14


Electrical Performances

OMMIC D01GH main characteristics


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Confidential Information GaN for Microwave Applications – March 22th 2018 15


Electrical Performances

OMMIC D01GH electrical characteristics


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Current vs Voltage characteristics (2*50µm GaN HEMT)

Confidential Information GaN for Microwave Applications – March 22th 2018 16


Electrical Performances

OMMIC D01GH electrical characteristics


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Transconductance characteristics (2*50µm GaN HEMT)

Confidential Information GaN for Microwave Applications – March 22th 2018 17


Electrical Performances

OMMIC D01GH electrical characteristics


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Breakdown Voltage characteristics (2*50µm GaN HEMT)

Confidential Information GaN for Microwave Applications – March 22th 2018 18


PCM and Guarantees

• OMMIC delivers wafers with electrical properties guaranteed by the measurement


of specific test modules (PCM).
• A Process Control Monitor (PCM) is a group of test modules fabricated on the wafer
at the same time as the circuits.
• Nine identical PCM sites are uniformly distributed across the wafer.
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• Each electrical parameter is measured on 9 sites over a wafer.


• An electrical parameter is "good" if 7 measurements or more (out of 9) meet the
specifications.
• The wafer is released if all guaranteed electrical parameters are "good".
Confidential Information GaN for Microwave Applications – March 22th 2018 19
PCM and Guarantees
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List of guaranteed PCM patterns Example of PCM pattern repeated 9


times across the wafer

Confidential Information GaN for Microwave Applications – March 22th 2018 20


PCM and Guarantees

Description of some guaranteed PCM modules


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Confidential Information GaN for Microwave Applications – March 22th 2018 21


PCM and Guarantees

Description of some guaranteed PCM modules


All rights reserved © 2018 OMMIC

Confidential Information GaN for Microwave Applications – March 22th 2018 22


PCM and Guarantees

Description of some guaranteed PCM modules


All rights reserved © 2018 OMMIC

Confidential Information GaN for Microwave Applications – March 22th 2018 23


PCM and Guarantees

Description of some guaranteed PCM modules


All rights reserved © 2018 OMMIC

Confidential Information GaN for Microwave Applications – March 22th 2018 24


PCM and Guarantees

Description of some guaranteed PCM modules


All rights reserved © 2018 OMMIC

Confidential Information GaN for Microwave Applications – March 22th 2018 25


PCM and Guarantees

Description of some guaranteed PCM modules


All rights reserved © 2018 OMMIC

Confidential Information GaN for Microwave Applications – March 22th 2018 26


PCM and Guarantees
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Summary list of guaranteed parameters


Confidential Information GaN for Microwave Applications – March 22th 2018 27
D01GH MMICs
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• 3 stages
• Self bias, single 8V VDD

Example of X-band LNA • Series source feedback


• LR series stabilization
• 2.5x1.5 mm2
Confidential Information GaN for Microwave Applications – March 22th 2018 28
D01GH MMICs

X-band LNA test results


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• Gain : 20 dB
CW on-wafer test
8V / 180mA • Noise figure : 1.2 dB
• P2dB : 21 dBm
• High robustness (40 dBc)
Confidential Information GaN for Microwave Applications – March 22th 2018 29
D01GH MMICs
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• 3 stages
• 3.2 mm gate periphery for
the last stage
• VDD 12 V / 0.7 W/mm DC
Example of 6 W Ka-band PA (small signal)
• 4.5x3.5 mm2

Confidential Information GaN for Microwave Applications – March 22th 2018 30


D01GH MMICs

6 W Ka-band PA test results

CW in-package test
VDD 12V
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• Gain > 20 dB
• Power : 37.5 dBm
• PAE : 30%

Confidential Information GaN for Microwave Applications – March 22th 2018 31


D01GH MMICs

6 W Ka-band PA Linearity (IM3)


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Confidential Information GaN for Microwave Applications – March 22th 2018 32


D01GH MMICs

Linearity Comparison : OMMIC 6 W Ka-band PA vs QORVO TGA2594


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@10dB back-off

Confidential Information GaN for Microwave Applications – March 22th 2018 33


D01GH MMICs

• 3 stages
• 3.2 mm gate periphery for the
last stage
• VDD 12 V & 15 V / 0.7 W/mm
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DC (small signal)
• 4.5x3.5 mm2
Example of 10 W Ka-band PA

Confidential Information GaN for Microwave Applications – March 22th 2018 34


D01GH MMICs

10 W Ka-band PA test results


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• Output Power : 40 dBm @12V


• PAE : 35%
• Gain : 20dB
• Output Power > 41 dBm @15V

Confidential Information GaN for Microwave Applications – March 22th 2018 35


D01GH MMICs
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• Output Power : 37 dBm @12V


• PAE : 20%
• Gain : 30dB
Example of 40GHz PA
Confidential Information GaN for Microwave Applications – March 22th 2018 36
D01GH MMICs
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Example of 30GHz T/R Chip


(LNA + PA + Switch)

Confidential Information GaN for Microwave Applications – March 22th 2018 37


D01GH MMICs

30 GHz T/R Chip test results

on-wafer pulsed test on-wafer pulsed test


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Competition (IMS2017)
is 4.5dB

Confidential Information GaN for Microwave Applications – March 22th 2018 38


D01GH MMICs

16 W – 40 GHz PA test results

• Gain > 20 dB
• Power : 12.5 W @12V
• Power : 16 W @15V
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• PAE : 30%

on-wafer test
pulsed mode

Confidential Information GaN for Microwave Applications – March 22th 2018 39


D01GH MMICs

4 W – 47 GHz PA test results

• Gain : 18 dB
• Power : 37.5 dBm
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• PAE : 18%

on-wafer test
pulsed mode

Confidential Information GaN for Microwave Applications – March 22th 2018 40


Development of new GaN process

• D006GH GaN/Si(C) substrate


• 2 W/mm @94GHz with PAE of 12% and Gp of 4dB for GaN/Si
and Nfmin = 1.6 dB @40GHz
• 2.3 W/mm @94GHz with PAE of 15% and Gp of 6dB for GaN/SiC
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and Nfmin = 1.4 dB @40GH

Confidential Information GaN for Microwave Applications – March 22th 2018 41


Development of new GaN process

500 mW – 94 GHz D006GH PA (in progress)


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Confidential Information GaN for Microwave Applications – March 22th 2018 42


Development of new GaN process

Co-integration of Enhancement and Depletion Modes of


GaN-based transistors for next generation RF
communication circuits [ED01GH]
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Confidential Information GaN for Microwave Applications – March 22th 2018 43


Development of new GaN process

• Ids max ≈ 1 A/mm


• gm max ≈ 600 mS/mm
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• Vt ≈ 0 V
• RON ≈ 1.3 Ω.mm

Current vs Voltage characteristics


(1*25µm GaN N-OFF HEMT)

Confidential Information GaN for Microwave Applications – March 22th 2018 44


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END

Confidential Information GaN for Microwave Applications – March 22th 2018 45

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