Project Work

[Based on Nano Technology]

Education & Working Institute 

Malviya Institute Of Technology
Jaipur 

Object : To find the characteristics of solar cell of hard

silicon substrate at nano level with the help of
SPM/AFM (Atomic Force Microscope),X-RD(x
ray diffraction) anf FESEM/(FESEM with
EDS)/EBSD.
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Machines Used homogenized, and average bulk

composition is determined.
[Based on Nano Technology]

1.X-RD: X-ray powder

diffraction (XRD) is a rapid
analytical technique primarily
used for phase identification of
a crystalline material and can
provide information on unit cell
dimensions. The analyzed
material is finely ground,

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Source:Google

2.FESEM: Scanning Electron

Microscopy - SEM - is a powerful
technique in the examination of
materials. It is used widely in
metallurgy, geology, biology and
medicine, to name just a few.

The user can obtain high

magnification images, with a good
depth of field, and can also analyse
individual crystals or other features.
A high-resolution SEM image can
show detail down to 25 Angstroms,
or better. When used in conjunction
with the closely-related technique of
energy-dispersive X-ray
microanalysis (EDX, EDS, EDAX),
the composition of individual crystals
or features can be determined.

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Source:Google ~~FESEM Of GEMINI

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3. AFM: AFM is a type more than 1000 times better than

the 
optic
al

diffraction limit. The

information is
gathered by "feeling"
or "touching" the
surface with a
mechanical
probe. Piezoelectric el
ements that facilitate
tiny but accurate and
precise movements
on (electronic)
command enable
precise scanning.
of scanning probe
microscopy (SPM), with
demonstrated resolution on the
order of fractions of a nanometer,

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