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Harmonic Balance Nonlinear Identification of A Capacitive Dual-Backplate MEMS Microphone
Harmonic Balance Nonlinear Identification of A Capacitive Dual-Backplate MEMS Microphone
Harmonic Balance Nonlinear Identification of A Capacitive Dual-Backplate MEMS Microphone
3, JUNE 2008
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LIU et al.: IDENTIFICATION OF A CAPACITIVE DUAL-BACKPLATE MEMS MICROPHONE 699
a larger dynamic range, and a broader bandwidth over single- thickness and radius of the diaphragm are 2.25 µm and 230 µm,
backplate capacitive microphones [4]. respectively. The 5-µm radius holes in the backplates enable
The dual-backplate capacitive MEMS microphone consid- the incident acoustic pressure to pass through the backplates
ered in this paper was fabricated by using the SUMMiT V and load the diaphragm. In addition, a large cavity beneath the
process at Sandia National Laboratories [8]. The performance bottom backplate is vented to the ambient air, resulting in an
of this microphone is expected to be further improved via ac measurement device and reducing the sensitivity loss of the
the implementation of a force-feedback controller [16]. The microphone.
development of such a controller requires an accurate model The structural plates of the microphone are made of
of the microphone. In particular, the electrostatic force between phosphorous-doped polysilicon to make them conductive,
the diaphragm and backplate of the microphone is inherently which provides two capacitors between the diaphragm and
nonlinear, and the mechanical restoring force of the diaphragm top/bottom backplates. The capacitance value of both is al-
becomes nonlinear for large displacements. The mechanical tered when an acoustic wave impinges on the microphone
and electrostatic nonlinearities can also generate unwanted and deflects the diaphragm. Finally, the differential capacitance
harmonic distortion. An additional consideration is that the change is converted to an output voltage through various types
microphone system must be designed such that it does not of interface electronics [23]. To further understand the relation
operate in regions of pull-in instability that could potentially between the input pressure and the output voltage, a model of
result in device failure. Therefore, a thorough understanding the microphone needs to be developed.
of the microphone dynamics becomes important for device The microphone is a multienergy domain (acoustical, me-
design and operation. An early work to study and identify the chanical, and electrical) transducer system, and the microphone
nonlinear behavior of general dynamic systems includes both dynamics are usually governed by a set of coupled nonlinear
nonparametric and parametric identification schemes [17], [18]. partial differential equations [24], [25], which are difficult and
Recently, several parametric methods are developed to identify complex to study in practice. One alternative for analyzing
nonlinear model parameters for microstructures; however, they the design coupled-domain transducer systems is through the
are all based on responses in the frequency domain [19], [20]. construction of lumped-element models. In general, LEM is
The authors’ previous work has focused on the development of based on the assumption that the largest device length scale
a nonlinear dynamic model and comparisons of the microphone of interest is much smaller than the characteristic length scales
experimental transient response with an analytical multiple (for example, acoustic wavelength) of the governing physical
scales analysis in the time domain [21], [22]. This paper, phenomena [23], [26]. Therefore, the model based on this
however, focuses on the experimental steady-state response of quasi-static technique holds only up to frequencies just beyond
the microphone. More specifically, a harmonic balance non- the first fundamental natural frequency of the microphone [23],
linear identification approach is applied to extract the system [26]. However, this limitation is appropriate for the measure-
parameters of the microphone based on the time-domain data. ment bandwidth of the microphone and the analyses employed
This paper is organized as follows. The next section describes in this paper.
the microphone and presents a model for the equations that
govern the response behavior under harmonic excitation. An ap-
proximate solution for the nonlinear governing equation is then A. Nonlinear Dynamics Model
obtained by using a harmonic balance approach in Section III.
A simplified lumped-element model of the microphone is
In Section IV, numerical studies are performed to ensure the
presented in this section. The microphone structure is modeled
validity of the approximate analytical solution. Details of the
via conjugate power variables in the mechanical energy domain,
experimental study are provided in Section V. The details
where force is the effort variable and velocity is the flow
of the experimental characterization results are presented in
variable [23].
Section VI, and concluding remarks are provided in the final
To construct a lumped-element model of the microphone, a
section.
reference point must first be defined. In the case of a circular
diaphragm, the center is chosen as a reference location because
the center velocity and displacement of the diaphragm can be
II. M ICROPHONE M ODEL
physically measured in the experiments described in the follow-
This section describes the structure and operating principles ing. The distributed-displacement diaphragm is then replaced
of the dual-backplate microphone. A nonlinear model for the by a rigid rectilinear piston that moves with the center deflection
microphone dynamics is then developed from lumped-element of the diaphragm and possesses an equivalent compliance,
modeling (LEM), and final expressions are given for the case of mass, and area over a frequency range from dc to below the
applying a harmonic excitation voltage. natural frequency of the diaphragm.
A top-view optical microscope photograph of the micro- By using LEM, the microphone is represented by a single-
phone of interest is shown in Fig. 1(a). The electrical con- degree-of-freedom (SDOF) second-order nonlinear system.
nections are realized by the bond pads between the backplates Fig. 2(a) shows a physical model of the microphone, and
and diaphragm. A 3-D cross-sectional schematic view of the Fig. 2(b) shows a lumped-element dynamic model of the
microphone structure is shown in Fig. 1(b). The microphone microphone. The development of the lumped-element model
has three circular parallel plates, namely: the middle solid for the microphone is presented in [22] and is summarized
diaphragm and the top and bottom perforated backplates. The later for completeness. The top and bottom backplates of the
gap between each backplate and the diaphragm is 2 µm. The microphone are assumed to be rigid and have the same area
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700 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 17, NO. 3, JUNE 2008
Fig. 2. Models of a dual backplate capacitive MEMS microphone. (a) Physical model. (b) Lumped-element nonlinear dynamic model.
as the diaphragm. Each backplate is separated by a nominal backplates, respectively. The porosity of the bottom and top
gap d0 from the diaphragm. The diaphragm is modeled by a backplates is given by Abp and Atp , respectively.
Duffing spring with linear k1 nonlinear k3 spring constants and It should be pointed out that the vent resistance is not
a lumped mass Mme with an effective area Ame . In particular, included in the lumped-element model because the microphone
the expressions of these lumped-element parameters are given operates beyond the 3-dB cut-on frequency. In general, the top
in the following [22], [27]: and bottom backplates are biased with respect to the middle
diaphragm by two electrical signals ±V (t) with equal magni-
64Dπ tude and opposite polarity, and the microphone is loaded by an
k1 = (1)
3a2 incident acoustic pressure p(t). Finally, the dynamic governing
10.044Dπ equation of motion with p(t) = 0 is [22]
k3 = (2)
a2 h2 Mme ẍ + bẋ + (k1 + kc )x + k3 x3
1 ε0 Ame V (t)2 V (t)2
Mme = πa2 hρd (3) =− − (7)
5 2 (d0 + x)2 (d0 − x)2
1 where x represents the center displacement of the diaphragm (a
Ame = πa2 (4)
3 downward motion is assumed to be positive), ε0 is the dielectric
constant of the air gap, and a parallel-plate assumption is used
where D = (Eh3 /12(1 − ν 2 )) is the flexural rigidity of the to calculate two electrostatic forces.
diaphragm. ν, E, h, a, and ρd are the Poisson’s ratio, Young’s Equation (7) represents a nonautonomous system with cou-
modulus, thickness, radius, and density of the diaphragm, pled cubic mechanical and electrostatic nonlinearities that can
respectively. be rewritten as
The lumped stiffness of the cavity kc of the microphone is
given by [22], [28] ẍ + 2ξω0 ẋ + ω02 x + βx3
ε0 Γ V (t)2 V (t)2
πρa c20 a2c =− − (8)
kc = (5) 2 (d0 + x)2 (d0 − x)2
dc
where the resonant frequency ω0 is given by
where c0 is the isentropic speed of sound in air, ρa is the density
of air, and ac and dc are the radius and depth of the cavity k1 + kc
ω0 = (9)
cylinder, respectively. Mme
The lumped viscous damping coefficient b of the microphone
is defined as [22], [29] ξ is the damping ratio
b
4µπa4 4µπa4 ξ= (10)
b= f (Abp ) + f (Atp ) 2Mme ω0
3
3nbp d0 3ntp d30
β is the nonlinear stiffness parameter and is defined as
8µπhbp nbp 8µπhtp ntp
+ + (6) k3
A2bp A2tp β= (11)
Mme
where f (X) = 1/4 ln(1/X) − (3/8) + (1/2)X − (1/8)X 2 . and Γ is the ratio of lumped area over lumped mass
µ is the dynamic viscosity of air. nbp and ntp are the total
number of holes in the bottom and top backplates, respectively. Ame
Γ= . (12)
hbp and htp are the thicknesses of the bottom and top Mme
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LIU et al.: IDENTIFICATION OF A CAPACITIVE DUAL-BACKPLATE MEMS MICROPHONE 701
As seen from (8), for given electrical and pressure inputs, tic force acts on the diaphragm and forces it to vibrate; the
the dynamic characteristics of the microphone are determined governing equation is
by system parameters such as ξ, ω0 , β, and Γ. Therefore,
identifying these system parameters is the focus of this pa- ε0 Γ V02 cos2 (Ωt)
ẍ + 2ξω0 ẋ + ω02 x + βx3 = . (15)
per. Although these parameters can be estimated from LEM, 2 (d0 − x)2
some approximations are usually required. For example, in
the actual device, the two compliant backplates have slightly The square of the sinusoidal input contains both constant and
different areas. In addition, variations in physical dimensions harmonic terms
and material properties, which are usually caused by the fab- V02 V2
rication process, and nonideal boundary conditions could al- V02 cos2 (Ωt) = + 0 cos(2Ωt). (16)
2 2
ter the device model parameters. Therefore, characterization
experiments are required to obtain the actual system parame- With the introduction of the nondimensional center displace-
ters and evaluate the accuracy of the assumptions employed ment, (15) is nondimensionalized as
in the theoretical model. In practice, there are several ways
F0 + F0 cos(2Ωt)
to calibrate microphones, for example, a pressure-reciprocity ÿ + α1 ẏ + α2 y + α3 y 3 = (17)
calibration with two microphones in a coupler [30]. For a (1 − y)2
capacitive microphone, considering that it is a reciprocal and
where
conservative electromechanical transducer [15], it can be elec-
trically self-calibrated in a quiescent acoustic field as indi- x
y= (18)
cated in (7). Based on this approach, system parameters are d0
extracted from the steady-state response of the microphone α1 = 2ξω0 (19)
when excited by a sinusoidal electrical signal. The mathemat- α2 = ω02 (20)
ical background of the governing equation is discussed in the
α3 = βd20 (21)
following section. The detailed derivation of the formulas used
to extract system parameters and details of the characterization ε0 ΓV02
F0 = . (22)
experiments will be provided in Section III and Section V, 4d30
respectively.
The further rearrangement of (17) results in
ÿ + α1 ẏ + α2 y + α3 y 3 (1−y)2 = F0 [1 + cos(2Ωt)] . (23)
B. Governing Equation for Harmonic Excitation
During the characterization experiments, no acoustic wave Equation (23) represents a nonautonomous second-order
was incident on the diaphragm, and a designed electrical signal nonlinear system which does not have a known closed-form
V (t) was applied directly to either the top or bottom backplate solution [31]. However, the work of the next section provides a
with the diaphragm and the other backplate was electrically methodology for obtaining an approximate analytical solution.
grounded. Physically, the designed signal has 60 sinusoidal
cycles in three-quarters of its period and is equal to zero for
III. A PPROXIMATE S OLUTION BY H ARMONIC
the remainder of the period. The time duration of the applied
B ALANCE M ETHOD
60 sinusoidal cycles was selected such that the system reached
a steady-state response during that interval. In addition, the time Previous LEM has shown that the microphone system studied
interval for the zero voltage input signal was set to ensure that in this paper is a weakly nonlinear system with low damping
the transient response of the system completely died out. The [22]. Furthermore, as seen from (16), a harmonic term is gener-
mathematical expression for the designed excitation signal is ated due to the electrostatic nonlinearity when the microphone
given by is excited by an input sinusoidal signal. Therefore, an intuitive
way to obtain an approximate analytical solution to (23) is via
V0 cos [Ω(t − nT )] , nT ≤ t < nT + 3T 4 the harmonic balance method. The approximate steady-state
V (t) = n = 0, 1, 2, . . . solution of (23) is assumed to be a truncated Fourier series
0, nT + 3T4 ≤ t < (n + 1)T in the harmonic balance method [31]. Considering that (23)
(13) represents a weakly nonlinear system with low damping, the
where V0 is the voltage amplitude and T is the period. Consid- approximate steady-state solution is assumed to be
ering that there are 60 sinusoidal cycles in three-quarters of T ,
the angular sinusoidal excitation frequency Ω is y = A0 + A2 cos(2Ωt + ϕ)
A2 i(2Ωt+ϕ)
= A0 + e + e−i(2Ωt+ϕ) (24)
80 2
Ω = 2π . (14)
T where A0 and A2 are the amplitudes of the constant and second
harmonic terms, respectively, and φ is the phase of the second
During the time nT + 3T /4 ≤ t < (n + 1)T , no electro- harmonic term with respect to the input sinusoidal signal. The
static force acts on the diaphragm, and the diaphragm freely validity of the truncation employed in (24) will be assessed in
vibrates. During the time nT ≤ t < nT + 3T /4, an electrosta- Section IV.
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702 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 17, NO. 3, JUNE 2008
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LIU et al.: IDENTIFICATION OF A CAPACITIVE DUAL-BACKPLATE MEMS MICROPHONE 703
Fig. 3. Block diagram of experimental setup showing that the microphone was placed on a microscope stage and a laser vibrometer was used to measure the
center displacement of the diaphragm.
Fig. 4. Laser beam spot hits the diaphragm through the center hole of the top backplate. (a) Isometric view in a schematic. (b) Zoom-in top view in an actual
optical image. Note although the actual laser spot size is less than 1 µm [34], the spot size in the picture appears larger due to scattering.
Further numerical study shows that as the THD in the output data from both reference and velocity channels in the laser
displacement increases, the maximum difference between the vibrometer are acquired by an external PC. In the experiments,
theoretical input and numerically identified system parameters a sampling rate of 2.56 MHz was used to record the velocity
also increases, which indicates that the approximate solution for 6.4 ms; 100 ensemble averages were used to minimize
in (24) is less accurate [32]. Further analysis shows that the the noise in the measured velocity data [22]. To measure the
approximate solution in (24) holds, with a maximum difference center velocity response of the diaphragm, the laser beam was
of 9.5%, for the system parameters when the THD in the output shone through the center hole of the top backplate, as shown
displacement is 10.6% [32]. schematically in the side view of Fig. 3 and in the isometric
view of Fig. 4(a) and (b), shows an experimental picture (zoom-
in top view), with the laser beam positioned right inside the
V. E XPERIMENTAL S TUDY
center hole of the top backplate [22].
The characterization of the microphone was conducted by When the characterization experiments for the bottom back-
using a laser Doppler vibrometer (Polytec MSV 300). The plate excitation are conducted, the middle diaphragm and the
development of the experiment setup is presented in [22] and top backplate are electrically grounded. The designed signal
is summarized in the following for completeness. defined by (7) and (8) is directly applied to the bottom backplate
As shown in Fig. 3, a test microphone is positioned on the of the microphone, and the dynamic response of the center
stage of a microscope (OLYMPUS BX60), with a 100× objec- velocity of the diaphragm is recorded. As mentioned previ-
tive lens. The output of an external function generator (Agilent ously, two tests need to be conducted to extract the system
33220 A) is used to provide the previously designed electrical parameters of the microphone. For the first test, the sinusoidal
signal to excite the microphone. The data acquisition process excitation frequency was chosen to be approximately half of
is triggered by the output “Sync” signal from the function the fundamental resonant frequency of the diaphragm, and
generator. The laser vibrometer generates the input laser beam the excitation frequency of the second test was chosen to be
and receives the resulting interference optical signal from the close to the frequency of the first test so that each system
microscope. The resulting optical signal is converted into an parameter is not significantly changed. It should be pointed out
electrical signal by the photodetector inside the vibrometer and that the excitation frequencies are carefully selected such that
subsequently decoded to generate the velocity output [34]. The the diaphragm velocity signal amplitude is larger and easier to
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704 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 17, NO. 3, JUNE 2008
Fig. 5. Measured steady-state center velocity response for a sinusoidal excitation with an input frequency of 114.4 kHz (a) in the time domain and (b) in the
frequency domain. Note the frequency doubling.
Fig. 6. Comparison of the (asterisk) steady-state integrated and (solid line) curve-fitting center displacement results for a sinusoidal excitation with a frequency
of 114.4 kHz (a) in the time domain and (b) in the frequency domain.
measure in practice and that the quasi-static lumped-element A. Bottom Backplate Excitation Results
assumption still holds.
For the first test, the amplitude of sinusoidal excitation is
Similarly, during the characterization experiments using the
9 V, and its frequency is 114.4 kHz. Shown in Fig. 5(a)
top backplate for excitation, the designed signal was directly
is the measured steady-state time history of the ensemble-
applied to the top backplate of the microphone, and two tests
averaged center velocity, and Fig. 5(b) shows the fast Fourier
are conducted with the middle diaphragm and bottom back-
transform (FFT) analysis result for the time-domain data [36].
plate being electrically grounded, respectively. The details of
As shown in Fig. 5(b), there is a dominant single harmonic tone
the experimental results and extracted system parameters are
(228.8 kHz) located at twice the excitation frequency due to the
provided in the next section.
electrostatic nonlinearity as shown in (16). The corresponding
time response of the integrated center displacement in the
steady state is shown in Fig. 6(a).
VI. R ESULT , A NALYSIS , AND D ISCUSSION
By using (18) and (24), a nonlinear least squares curve-fitting
In this section, the experimental results are presented and dis- technique is implemented in MATLAB to extract the parame-
cussed. The system parameters of the microphone are extracted ters A0 , A2 , and ϕ from the steady-state center displacement
from the experimental data based on the harmonic balance response. The curve-fit center displacement response is also
solution presented in Section III. Considering that the approx- shown in Fig. 6(a), and the curve-fit parameters are summarized
imate solution in (31) is a displacement-based one, the center in Table II. Moreover, Fig. 6(b) shows the comparison of
displacement of the diaphragm is required. The trapezoidal rule the integrated and curve-fit center displacement results in the
is applied to numerically integrate the measured average center frequency domain by carrying out the FFT analysis for the
velocity to yield the center displacement [35]. Because the time corresponding time-domain data in Fig. 6(a). The amplitudes
step is small (0.39 µs), the numerical integration error is on the and locations for the two peaks (constant and second harmonic
order of 10−20 m and is neglected in the following analysis. terms) agree well with each other, respectively. The difference
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LIU et al.: IDENTIFICATION OF A CAPACITIVE DUAL-BACKPLATE MEMS MICROPHONE 705
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706 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 17, NO. 3, JUNE 2008
TABLE IV
EXPERIMENTALLY IDENTIFIED SYSTEM PARAMETERS
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LIU et al.: IDENTIFICATION OF A CAPACITIVE DUAL-BACKPLATE MEMS MICROPHONE 707
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MEMS capacitive microphone design,” in Proc. Int. Conf. MEMS, NANO Urbana–Champaign, and Ph.D. degree in electrical and computer engineering
Smart Syst., Baniff, AB, Canada, 2003, pp. 297–302. from the University of Illinois in 1988.
[41] M. I. Younis and A. H. Nayfeh, “A study of the nonlinear response of He is currently a member of the Interdisciplinary Microsystems Group and an
a resonant microbeam to an electric actuation,” Nonlinear Dyn., vol. 31, Associate Professor with the Department of Electrical and Computer Engineer-
no. 1, pp. 91–117, Jan. 2003. ing, University of Florida, Gainesville, where he is also an Affiliate Associate
[42] M. I. Younis, E. M. Abdel-Rahman, and A. H. Nayfeh, “A Professor with the Department of Mechanical and Aerospace Engineering. He
reduced-order model for electrically actuated microbeam-based is the holder of five U.S. patents. His current research interests include solid-
MEMS,” J. Microelectromech. Syst., vol. 12, no. 5, pp. 672–680, state physical sensors and actuators, transducer noise, strained semiconductor
Oct. 2003. devices, and reliability physics of semiconductor devices.
[43] E. M. Abdel-Rahman, M. I. Younis, and A. H. Nayfeh, “Char- Dr. Nishida is a Distinguished Lecturer for the IEEE Electron Devices
acterization of the mechanical behavior of an electrically actuated Society. He, with his colleagues and students, received three Best Paper Awards.
microbeam,” J. Micromech. Microeng., vol. 12, no. 6, pp. 759–766, He is also the recipient of the 2003 College of Engineering Teacher of the Year
Nov. 2002. Award.
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708 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 17, NO. 3, JUNE 2008
Louis N. Cattafesta, III received the B.S. degree Brian P. Mann received the B.S. degree from
in mechanical engineering from The Pennsylvania the University of Missouri in 1996 and the M.S.
State University, University Park, in 1986, the M.S. and Ph.D. degrees from Washington University in
degree in aeronautics from Massachusetts Insti- 1998 and 2003, respectively, all in mechanical
tute of Technology, Cambridge, in 1988, and the engineering.
Ph.D. degree in mechanical engineering from The He is currently an Assistant Professor in the De-
Pennsylvania State University in 1992. partment of Mechanical Engineering and Materials
He is currently an Associate Professor in the De- Science, Duke University, Durham, NC. His primary
partment of Mechanical and Aerospace Engineering, research interests are in applied nonlinear dynamics
University of Florida (UF), Gainesville. His primary and vibration utilizing analytical, numerical, and ex-
research interests are experimental fluid dynamics, perimental techniques. Prior to joining Duke in 2007,
particularly active flow control, and aeroacoustics. Prior to joining UF in April he had previous academic appointments at the University of Missouri and the
1999, he was a Senior Research Scientist at High Technology Corporation, University of Florida.
Hampton, VA, where he was the group leader of the Experimental and In-
strumentation Group. In 1992, he joined High Technology Corporation as a
Research Scientist at NASA Langley Research Center.
Dr. Cattafesta is a Senior Member of the American Society of Mechanical
Engineers (ASME).
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