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Ellesmere Linux Board Production Suite Reference

Guide

Copyright © Advanced Micro Devices, Inc.


Contents

1 Ellesmere Linux Board Production Suite Reference Guide 1


1.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.3 SuiteInstallation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.4 SuiteUsage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.5 TestResultReporting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

2 AG (PCI Express Suite) 5


2.1 Test AG020: PCIE link quality test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2.1.1 Variation AG020.003: PCIE Nak counter check initialize . . . . . . . . . . . . . . . . . . . 5
2.1.2 Variation AG020.004: PCIE Nak counter check test . . . . . . . . . . . . . . . . . . . . . 5
2.1.3 Variation AG020.005: PCIE Link Quality check initialize . . . . . . . . . . . . . . . . . . . 5
2.1.4 Variation AG020.006: PCIE Link Quality check test . . . . . . . . . . . . . . . . . . . . . 6
2.1.5 Variation AG020.008: PCIE Link Width Check . . . . . . . . . . . . . . . . . . . . . . . . 6
2.1.6 Variation AG020.010: PCIE Link Speed Check . . . . . . . . . . . . . . . . . . . . . . . . 6

3 AJ (PCIE Phy Suite) 7


3.1 Test AJ015: PCIE PHY Dynamic Link Speed Switching Test (Bridge Initiated) . . . . . . . . . . . . 7
3.1.1 Variation AJ015.001: Link speed change between Gen1 and Gen1 . . . . . . . . . . . . . 7
3.1.2 Variation AJ015.002: Link speed change between Gen1 and Gen2 . . . . . . . . . . . . . 7
3.1.3 Variation AJ015.003: Link speed change between Gen1 and Gen3 . . . . . . . . . . . . . 7
3.1.4 Variation AJ015.004: Link speed change between Gen2 and Gen2 . . . . . . . . . . . . . 7
3.1.5 Variation AJ015.005: Link speed change between Gen2 and Gen3 . . . . . . . . . . . . . 7
3.1.6 Variation AJ015.006: Link speed change between Gen3 and Gen3 . . . . . . . . . . . . . 7
3.2 Test AJ018: PCIE PHY Dynamic Link Width Switching Test (Up/Down Config) . . . . . . . . . . . 8
3.2.1 Variation AJ018.001: Link width change between x1 and x1 . . . . . . . . . . . . . . . . . 8
3.2.2 Variation AJ018.003: Link width change between x1 and x4 . . . . . . . . . . . . . . . . . 8
3.2.3 Variation AJ018.004: Link width change between x1 and x8 . . . . . . . . . . . . . . . . . 8
3.2.4 Variation AJ018.006: Link width change between x1 and x16 . . . . . . . . . . . . . . . . 8
3.2.5 Variation AJ018.012: Link width change between x4 and x4 . . . . . . . . . . . . . . . . . 8
3.2.6 Variation AJ018.013: Link width change between x4 and x8 . . . . . . . . . . . . . . . . . 8
3.2.7 Variation AJ018.015: Link width change between x4 and x16 . . . . . . . . . . . . . . . . 8
iv CONTENTS

3.2.8 Variation AJ018.016: Link width change between x8 and x8 . . . . . . . . . . . . . . . . . 8


3.2.9 Variation AJ018.018: Link width change between x8 and x16 . . . . . . . . . . . . . . . . 8
3.2.10 Variation AJ018.021: Link width change between x16 and x16 . . . . . . . . . . . . . . . 8
3.3 Test AJ020: PCIE PHY Symbol Per Clock Switching Test . . . . . . . . . . . . . . . . . . . . . . 8
3.3.1 Variation AJ020.001: SPC mode change between Gen1 1SPC and Gen2 1SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.2 Variation AJ020.002: SPC mode change between Gen1 1SPC and Gen2 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.3 Variation AJ020.003: SPC mode change between Gen1 2SPC and Gen2 1SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.4 Variation AJ020.004: SPC mode change between Gen1 2SPC and Gen2 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.5 Variation AJ020.005: SPC mode change between Gen1 1SPC and Gen3 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.6 Variation AJ020.006: SPC mode change between Gen1 2SPC and Gen3 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.7 Variation AJ020.007: SPC mode change between Gen2 1SPC and Gen2 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.8 Variation AJ020.008: SPC mode change between Gen2 1SPC and Gen3 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3.9 Variation AJ020.009: SPC mode change between Gen2 2SPC and Gen3 2SPC with End-
point Initiated . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

4 AK (Memory Controller Suite) 11


4.1 Test AK010: Write mask (CP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.1.1 Variation AK010.001: 1024x768 @ 32bpp, 32 bit data pattern . . . . . . . . . . . . . . . . 15
4.2 Test AK308: Horizontal Blt Walkbit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.2.1 Variation AK308.006: 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.3 Test AK309: Horizontal Blt Walkpat . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.3.1 Variation AK309.007: DRMDMA:1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . 16
4.4 Test AK311: Horizontal Blt Randbit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.4.1 Variation AK311.007: DRMDMA:1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . 16
4.5 Test AK312: Horizontal Blt Randmask . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.5.1 Variation AK312.006: 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.6 Test AK321: Random Blt Walkpat . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.6.1 Variation AK321.005: 1024x768 @ 16bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.6.2 Variation AK321.006: 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.7 Test AK401: SLT functional . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.7.1 Variation AK401.001: 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.8 Test AK403: Board functional . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.8.1 Variation AK403.001: Non-AGP: 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . 17
4.9 Test AK404: Board stress . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.9.1 Variation AK404.001: Qualification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

Copyright © Advanced Micro Devices, Inc.


CONTENTS v

4.10 Test AK600: Memfa testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17


4.10.1 Variation AK600.001: using 3D engine . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.11 Test AK751: Mixed: Classic Moving Blt Walkbit, Walkpat, Randbit . . . . . . . . . . . . . . . . . . 17
4.11.1 Variation AK751.406: VM8: Mixed Sysmem/FB Random BigK/4K - Alternating Snooped/←-
NonSnooped 4K GFX 1024x768 @ 32bpp . . . . . . . . . . . . . . . . . . . . . . . . . . 18

5 DOUT (Display Output Suite) 19


5.1 Test DOUT899: Autodetecting display output visual test . . . . . . . . . . . . . . . . . . . . . . . 19

6 PK (PM4 Player Suite) 21


6.1 Test PK006: 3DMark06: Canyon Flight . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.1.1 Variation PK006.032: Ellesmere . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.2 Test PK016: Unigine: Heaven . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.2.1 Variation PK016.032: Ellesmere . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

7 PM (Power Management Suite) 23


7.1 Test PM001: Miscellanous Test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
7.1.1 Variation PM001.030: Max required VDDC under limits . . . . . . . . . . . . . . . . . . . 23
7.2 Test PM013: Thermal Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
7.2.1 Variation PM013.008: CTF Trigger Test - GPIO19 . . . . . . . . . . . . . . . . . . . . . . 23
7.2.2 Variation PM013.016: Get Temperature Via SMBUS from GPU . . . . . . . . . . . . . . . 24
7.2.3 Variation PM013.017: Get Temperature Via SMBUS from External LM96163(0x98)|EM←-
C2103(0x5C)|EMC1402|ADM1032 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.3 Test PM014: Fan Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.3.1 Variation PM014.001: Report Fan RPM . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.3.2 Variation PM014.007: Zero RPM Fan Control Test . . . . . . . . . . . . . . . . . . . . . . 25
7.4 Test PM031: BACO test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.4.1 Variation PM031.005: Enable and Disable in one test. No 3D. . . . . . . . . . . . . . . . . 25
7.5 Test PM070: I2C Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7.5.1 Variation PM070.001: I2C Read from LM96163 . . . . . . . . . . . . . . . . . . . . . . . 26

8 SAM (Secure Asset Management (SAM) Suite) 27


8.1 Test SAM001: SAM Basic Functionality. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
8.1.1 Variation SAM001.009: SAM Secure Memory Validation . . . . . . . . . . . . . . . . . . . 27
8.1.2 Variation SAM001.010: SAM Kernel Soft Reset Validation . . . . . . . . . . . . . . . . . . 28
8.2 Test SAM007: SAM Crypto SHA encryption. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
8.2.1 Variation SAM007.003: SAM crypto SHA-256 encryption. . . . . . . . . . . . . . . . . . . 28
8.3 Test SAM008: SAM Crypto DMA encryption/decryption. . . . . . . . . . . . . . . . . . . . . . . . 28
8.3.1 Variation SAM008.011: SAM crypto DMA XTS encryption. . . . . . . . . . . . . . . . . . 28
8.3.2 Variation SAM008.012: SAM crypto DMA XTS decryption. . . . . . . . . . . . . . . . . . 28
8.4 Test SAM009: SAM Crypto ODD encryption/decryption. . . . . . . . . . . . . . . . . . . . . . . . 28
8.4.1 Variation SAM009.001: SAM crypto ODD ECB encryption. . . . . . . . . . . . . . . . . . 29

Copyright © Advanced Micro Devices, Inc.


vi CONTENTS

8.4.2 Variation SAM009.006: SAM crypto ODD ECB decryption. . . . . . . . . . . . . . . . . . 29


8.5 Test SAM010: SAM Crypto RSA encryption/decryption. . . . . . . . . . . . . . . . . . . . . . . . 29
8.5.1 Variation SAM010.003: SAM crypto RSA encryption - 2048bit. . . . . . . . . . . . . . . . 29
8.5.2 Variation SAM010.004: SAM crypto RSA decryption - 2048bit. . . . . . . . . . . . . . . . 29

9 SDMA (SDMA Suite) 31


9.1 Test SDMA006: Test linear to tiled sub-window copy . . . . . . . . . . . . . . . . . . . . . . . . . 31
9.1.1 Variation SDMA006.001: Test linear to tiled sub-window copy using sDMA0 . . . . . . . . 31

10 STD (Stress3D Suite) 33


10.1 Test STD001: Food store scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10.1.1 Variation STD001.001: TGL renderer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10.2 Test STD002: Mountain range scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10.2.1 Variation STD002.001: TGL renderer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10.3 Test STD003: Furry orb scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.3.1 Variation STD003.001: TGL renderer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.4 Test STD004: Pet cabaret scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.4.1 Variation STD004.001: TGL renderer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.4.2 Variation STD004.002: TGL renderer at 4K UHD resolution . . . . . . . . . . . . . . . . . 34
10.5 Test STD005: HairMark scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.5.1 Variation STD005.003: Optimized hairmark without initial current spike . . . . . . . . . . . 34

11 UVD (Unified Video Decoder (UVD) Suite) 35


11.1 Test UVD002: UVD Register Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
11.1.1 Variation UVD002.006: UVD registers test SAFE Mix of IB and RB . . . . . . . . . . . . . 35
11.2 Test UVD011: VC1 Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
11.2.1 Variation UVD011.001: VC1-HD 1920x1080p Boston Harbor . . . . . . . . . . . . . . . . 36
11.2.2 Variation UVD011.002: VC1-HD 1920x1080p Leaves . . . . . . . . . . . . . . . . . . . . 36
11.2.3 Variation UVD011.003: VC1-HD 1920x1080p MainStreet . . . . . . . . . . . . . . . . . . 36
11.2.4 Variation UVD011.004: VC1-HD 1920x1080p TooGoodPond . . . . . . . . . . . . . . . . 36
11.3 Test UVD012: MPEG4 Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
11.3.1 Variation UVD012.001: MPEG4-HD 1920x1080p Boston Harbor . . . . . . . . . . . . . . 36
11.3.2 Variation UVD012.002: MPEG4-HD 1920x1080p Leaves . . . . . . . . . . . . . . . . . . 36
11.3.3 Variation UVD012.003: MPEG4-HD 1920x1080p MainStreet . . . . . . . . . . . . . . . . 36
11.3.4 Variation UVD012.004: MPEG4-HD 1920x1080p TooGoodPond . . . . . . . . . . . . . . 36
11.4 Test UVD013: MPEG2-VLD Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
11.4.1 Variation UVD013.001: MPEG2-VLD-HD 1920x1080p Boston Harbor . . . . . . . . . . . 37
11.4.2 Variation UVD013.002: MPEG2-VLD-HD 1920x1080p Leaves . . . . . . . . . . . . . . . 37
11.4.3 Variation UVD013.003: MPEG2-VLD-HD 1920x1080p MainStreet . . . . . . . . . . . . . 37
11.4.4 Variation UVD013.004: MPEG2-VLD-HD 1920x1080p TooGoodPond . . . . . . . . . . . . 37
11.5 Test UVD014: MPEG2-IDCT Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

Copyright © Advanced Micro Devices, Inc.


CONTENTS vii

11.5.1 Variation UVD014.001: MPEG2-IDCT-HD 1920x1080p Boston Harbor . . . . . . . . . . . 37


11.5.2 Variation UVD014.002: MPEG2-IDCT-HD 1920x1080p Leaves . . . . . . . . . . . . . . . 37
11.5.3 Variation UVD014.003: MPEG2-IDCT-HD 1920x1080p MainStreet . . . . . . . . . . . . . 37
11.5.4 Variation UVD014.004: MPEG2-IDCT-HD 1920x1080p TooGoodPond . . . . . . . . . . . 37
11.6 Test UVD016: H264 Performance Mode Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . 37
11.6.1 Variation UVD016.001: Performance Mode H264-HD 1920x1080p Boston Harbor . . . . . 37
11.6.2 Variation UVD016.002: Performance Mode H264-HD 1920x1080p Leaves . . . . . . . . . 37
11.6.3 Variation UVD016.003: Performance Mode H264-HD 1920x1080p MainStreet . . . . . . . 37
11.6.4 Variation UVD016.004: Performance Mode H264-HD 1920x1080p TooGoodPond . . . . . 38
11.7 Test UVD017: 4K H264 Performance Mode Bitstream Tests . . . . . . . . . . . . . . . . . . . . . 38
11.7.1 Variation UVD017.001: Performance Mode H264 4K 4096x2160 . . . . . . . . . . . . . . 38
11.7.2 Variation UVD017.002: Performance Mode H264 4K 4096x2304 . . . . . . . . . . . . . . 38
11.7.3 Variation UVD017.003: Performance Mode H264 4K 3840x2160 . . . . . . . . . . . . . . 38
11.7.4 Variation UVD017.004: Performance Mode H264 1920x1088 . . . . . . . . . . . . . . . . 38
11.8 Test UVD019: H265 Decoding Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
11.8.1 Variation UVD019.003: H265-HD 4096x2160 Boston Harbor . . . . . . . . . . . . . . . . 38
11.8.2 Variation UVD019.004: H265-HD 3840x2160 Boston Harbor rate control . . . . . . . . . . 38
11.8.3 Variation UVD019.005: H265-HD 1920x1080p Boston Harbor . . . . . . . . . . . . . . . . 38
11.8.4 Variation UVD019.009: H265-HD 1280x720p Boston Harbor . . . . . . . . . . . . . . . . 38
11.8.5 Variation UVD019.013: H265-SD 720x480p Boston Harbor . . . . . . . . . . . . . . . . . 38
11.8.6 Variation UVD019.103: H265-HD 10-bit 4096x2160 Boston Harbor p010_mode msb_mode 38
11.8.7 Variation UVD019.106: H265-HD 10-bit 1920x1080p Leaves p010_mode msb_mode . . . 39
11.8.8 Variation UVD019.111: H265-HD 10-bit 1280x720p MainStreet p010_mode msb_mode . . 39
11.8.9 Variation UVD019.116: H265-SD 10-bit 720x480p TooGoodPond p010_mode msb_mode . 39
11.8.10 Variation UVD019.120: H265-HD 10-bit 3840x2160 Boston Harbor rate control p010_mode
lsb_mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
11.8.11 Variation UVD019.124: H265-HD 10-bit 1920x1080p TooGoodPond p010_mode lsb_mode 39
11.8.12 Variation UVD019.127: H265-HD 10-bit 1280x720p MainStreet p010_mode lsb_mode . . . 39
11.8.13 Variation UVD019.130: H265-SD 10-bit 720x480p Leaves p010_mode lsb_mode . . . . . 39
11.8.14 Variation UVD019.201: H265-HD 10-bit Grand Bend Patio 4096x2160 dithering trunction . 39
11.8.15 Variation UVD019.209: H265-HD 9bitY_9bitC Grand Bend Patio 4096x2160 dithering
roundingA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
11.8.16 Variation UVD019.216: H265-HD 10bitY_8bitC Grand Bend Patio 4096x2160 dithering
roundingB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
11.8.17 Variation UVD019.223: H265-HD 8bitY_10bitC Grand Bend Patio 4096x2160 dithering fixed 39
11.8.18 Variation UVD019.230: H265-HD 8bitY_9bitC Grand Bend Patio 4096x2160 dithering random 39
11.9 Test UVD030: Tier-1 MJPEG decoder Bitstream Tests . . . . . . . . . . . . . . . . . . . . . . . . 39
11.9.1 Variation UVD030.001: MJPEG decoding 1920x1088 4:2:0 . . . . . . . . . . . . . . . . . 39
11.9.2 Variation UVD030.002: MJPEG decoding 1920x1088 4:2:2 YYUV . . . . . . . . . . . . . 39
11.9.3 Variation UVD030.003: MJPEG decoding 1920x1088 4:2:2 YYYYUUVV . . . . . . . . . . 39
11.9.4 Variation UVD030.004: MJPEG decoding 1280x720 4:2:0 . . . . . . . . . . . . . . . . . . 39

Copyright © Advanced Micro Devices, Inc.


viii CONTENTS

11.9.5 Variation UVD030.005: MJPEG decoding 1280x720 4:2:2 YYUV . . . . . . . . . . . . . . 39


11.9.6 Variation UVD030.006: MJPEG decoding 1280x720 4:2:2 YYYYUUVV . . . . . . . . . . . 39
11.9.7 Variation UVD030.013: MJPEG decoding 8192x16 4:2:0 . . . . . . . . . . . . . . . . . . 40
11.9.8 Variation UVD030.014: MJPEG decoding 8192x16 4:2:2 YYUV . . . . . . . . . . . . . . . 40
11.9.9 Variation UVD030.015: MJPEG decoding 8192x16 4:2:2 YYYYUUVV . . . . . . . . . . . 40
11.9.10 Variation UVD030.016: MJPEG decoding 16x8192 4:2:0 . . . . . . . . . . . . . . . . . . 40
11.9.11 Variation UVD030.017: MJPEG decoding 16x8192 4:2:2 YYUV . . . . . . . . . . . . . . . 40
11.9.12 Variation UVD030.018: MJPEG decoding 16x8192 4:2:2 YYYYUUVV . . . . . . . . . . . 40
11.9.13 Variation UVD030.019: MJPEG decoding 3840x2160 4:2:0 . . . . . . . . . . . . . . . . . 40
11.9.14 Variation UVD030.020: MJPEG decoding 3840x2160 4:2:2 YYUV . . . . . . . . . . . . . 40
11.9.15 Variation UVD030.021: MJPEG decoding 3840x2160 4:2:2 YYYYUUVV . . . . . . . . . . 40
11.9.16 Variation UVD030.022: MJPEG decoding 8192x8192 4:2:0 . . . . . . . . . . . . . . . . . 40
11.9.17 Variation UVD030.023: MJPEG decoding 8192x8192 4:2:2 YYUV . . . . . . . . . . . . . 40
11.9.18 Variation UVD030.024: MJPEG decoding 8192x8192 4:2:2 YYYYUUVV . . . . . . . . . . 40
11.10Test UVD408: UVD Bitstream H265 Tiled Stream Tests . . . . . . . . . . . . . . . . . . . . . . . 40
11.10.1 Variation UVD408.001: H265-HD 4096x2160 Boston Harbor . . . . . . . . . . . . . . . . 40

12 VCE (Video Compression Encoding) 41


12.1 Test VCE100: H.264 bit-stream encoding from memory . . . . . . . . . . . . . . . . . . . . . . . 41
12.1.1 Variation VCE100.008: H.264 baseline @ level 4.1 1280x720x30FPS . . . . . . . . . . . 41
12.2 Test VCE402: AVC speed up test - FW Offloading . . . . . . . . . . . . . . . . . . . . . . . . . . 41
12.2.1 Variation VCE402.010: H.264 baseline @ level 4.1 3840x2160x30FPS . . . . . . . . . . . 41
12.3 Test VCE601: Basic HEVC encoder test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.1 Variation VCE601.001: 64x64 encoding . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.2 Variation VCE601.002: 256x128 encoding . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.3 Variation VCE601.004: 352x240 encoding . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.4 Variation VCE601.005: 640x480 encoding . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.5 Variation VCE601.006: 720x576 encoding . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.6 Variation VCE601.007: 1280x720 encoding . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.7 Variation VCE601.008: 1920x1080 encoding . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.8 Variation VCE601.009: 3840x2160 encoding . . . . . . . . . . . . . . . . . . . . . . . . 42
12.3.9 Variation VCE601.010: 4096x2160 encoding . . . . . . . . . . . . . . . . . . . . . . . . 42

Copyright © Advanced Micro Devices, Inc.


Chapter 1

Ellesmere Linux Board Production Suite Reference


Guide

1.1 Introduction

The purpose of this document is to specify the overall functionality and test definitions for the AMD Board Production
Diagnostic Test Suite.

1.2 Overview

The Board Production Diagnostic Test suite contains functional/stress tests for validating external connec-
tions/components (such as bus interfaces, display connectors, memory, and power), latency incurred by external
connections/ components to the GPU internal functionalities, and workmanship.The test suite assumes a work-
ing(qualified) GPU,and is used primarily as a tool for testing manufacturing quality on the production line.The test
suite is used by both internal and external customers. The test suite is not intended to be used for looping or for the
product qualification process(the Board Qulification Diagnostic Test Suite serves that purpose).The test suite has
several options for test coverage which have to be manually specified-these use cases are covered in the "Suite
Usage" section below.

1.3 SuiteInstallation

Download the Board Production Diagnostic Test Suite from the ORC.

If the system used for downloading is not the test system, copy the diagnostic suite over to the test system
using the network or a USB key/drive.It is NOT recommended to extract the suite in Windows and then copy
the files over to a Linux system!

Extract the diagnostic suite using the command tar xvfz suitename.tar.gz

(Optional) Delete the .tar.gz suite file to save hard drive space.

Please use the original tool with the suite to do the diagnostics, any other tool copied to this suite is not verified
and could cause potential issue.
2 Ellesmere Linux Board Production Suite Reference Guide

1.4 SuiteUsage

There are five typical use cases for the AMD Board Production Diagnostic Test Suite:

1)Quick Manufacturing Test(quickmfg)

WHAT: The quick manufacturing suite is the recommended minimum test coverage for a graphics board on
the manufacturing line. This test option executes several general test blocks with default options and specified
guardband (varies from GPU to GPU). Set to Exit without pause on error.

HOW: ./tserver -boardtest=quickmfg if run on Linux, tserver.exe -boardtest=extmfg if run on windows

NOTES AND IMPORTANT FLAGS: (1)-boardtest=quickmfg is intended only for PCIe Gen3 platforms as it will
run some Gen3 verification tests. To test in a Gen2 system, the flag -boardtest=quickmfg2 should be used
instead. Type ./tserver -boardtest=quickmfg2 (2) The Margin is added by default in quickmfg (typically +2%
eng and +2% mem but it can vary from GPU to GPU). The margin can be manually specified by adding the
flag -suitemargin= x, y (i.e. ./tserver -boardtest=quickmfg -suitemargin=1,1 will add 1% to engine speed, and
1% to memory speed based on highest state of perf mode). For MBA test,please use command ./tserver
-boardtest=mba, it will add 1% margin by default

2)Extended Manufacturing Test (extmfg)

WHAT: The extended manufacturing test executes a custom set of tests (which can include all of the tests
in the Quick Manufacturing Test) in addition to several additional tests. Guardband is optional (i.e. can add
standard guardband margins, or no guardband), and the error reporting method is not fixed (i.e. can chose to
exit, pause, or continue on error). Basically, this gives the tester a little bit more flexibility with regards to the
test environment and coverage.

HOW: ./tserver -boardtest=extmfg if run on Linux, tserver.exe -boardtest=extmfg if run on windows to config
test block and execute the selected tests

3)System Integration Test

WHAT: The System Integration test is a quick verification test that basically ensures the graphics card has been
properly installed in the PCI Express slot. A quick 3D test, memory test are run, and the total coverage takes
less than 1 minute. This test is intended for Assembly-Line production (after the graphics boards have gone
through full quick manufacturing test r coverage during the manufacturing process).

./tserver -boardtest=sitquick if run on Linux, tserver.exe -boardtest=sitquick if run on windows

Copyright © Advanced Micro Devices, Inc.


1.5 TestResultReporting 3

4)Memory Failure Test(memfa)

WHAT: Runs the memory failure analysis tool on the graphics board under test. Please consult with applicable
training documentation for the proper use of this tool.

HOW: ./tserver -boardtest=memfa if run on Linux, tserver.exe -boardtest=memfa if run on windows

5)Individual Test Execution

WHAT: Runs an individual diagnostic test (from the suite). This is a typical use case to reproduce failures and
check for test dependencies, etc.

HOW:SET CLOCKS(appropriate clocks must be set for the test being run), RUN TEST (using ./tserverlite
-test=IDxxx.yy if run on Linux, tserverlite.exe -test=IDxxx.yy if run on windows) -d=gpu.∗

1.5 TestResultReporting

1)Test result on screen

Beginning with Baffin time frame (Oct2015) logging outputs were simplified down to two files: log.yml and log.←-
txt. Their contents are raw log stream data which includes multi-thread test data, time stamps, thermal events,
and many other forms of data.

These files are available for post-processing analysis, without requiring binary recompiles or re-release of
Suites. For Release and other builds, YAML parsing support was added into the Perl libraries, to be used by
post-processing scripts if desired.

For the detailed usuage, please refer to logging_readme.txt in the suite.

If it defines eofe flag in tserver.cf or command line, the test suite will exit immediately when any error happens,
including event handler failure, test case failure, tools command failure and so on. It will print a big red "FAIL"
on screen. And if entire test suite pass without any error, it will show a big green "PASS" instead.

2)Test ID log

With -tid flag, it will generate testid.log which records test result for each test case. There will NO testid.log from
Baffin time frame (Oct2015) logging during suites running by default.

3)Log files

Copyright © Advanced Micro Devices, Inc.


4 Ellesmere Linux Board Production Suite Reference Guide

With -log flag, the detailed test result is logged into log.txt. The content of log information depends on different
log levels. You can get more detailed log information with -v=debug. Please note test result Pass+/Skip+/←-
Fail+/Abort+ means a real failure for end user. "+" means event handler failures. And please check the detailed
error message to understand which kind of event handler failures it is.

Copyright © Advanced Micro Devices, Inc.


Chapter 2

AG (PCI Express Suite)

Overview

The PCIE bus suite checks for link quality by monitoring the NAKs, detects, recoveries occurred during the
normal bus operations. PCIE link width speed are also monitored during the course of the testing. Usually
PCIE tests are run in conjunction with memory and 3D tests in order to simulate normal bus operations.

2.1 Test AG020: PCIE link quality test

Introduction

This test validates the PCIE link quality.

2.1.1 Variation AG020.003: PCIE Nak counter check initialize


Introduction

Initializes the GPU PCIE performance counters to monitor NAK received or generated events from the GPU
endpoint device. This test is normally run prior to running 3D or memory tests.

Failcase

This test is designed to always pass.

2.1.2 Variation AG020.004: PCIE Nak counter check test


Introduction

Verifies the NAKs received and generated by the GPU endpoint device are below the threshold value. The
default threshold value is 0, but the user can overwrite the setting by using the "pcienaks" parameter.

Failcase

NAKs generated or received by the asic are above the threshold value.

2.1.3 Variation AG020.005: PCIE Link Quality check initialize

Introduction

Initializes the GPU PCIE performance counters to monitor PCIE link detect or recovery events from the GPU
endpoint device. This test is normally run prior to running 3D or memory tests.

Failcase

PCIE Link detects or recovers occurred during the normal asic bus operations.
6 AG (PCI Express Suite)

2.1.4 Variation AG020.006: PCIE Link Quality check test

Introduction

Verifies there are no PCIE Link detect or recovery events recorded in the GPU endpoint device.

Failcase

PCIE Link detects or recovers occurred during the normal asic bus operations

2.1.5 Variation AG020.008: PCIE Link Width Check


Introduction

Verifies the asic is running at requested PCIE link width.

Failcase

The current PCIE link width does not match with therequested PCIE link width.

2.1.6 Variation AG020.010: PCIE Link Speed Check

Introduction

Verifies the asic is running at requested PCIE link speed.

Failcase

The current PCIE link speed does not match with the requested PCIE link speed.

Copyright © Advanced Micro Devices, Inc.


Chapter 3

AJ (PCIE Phy Suite)

Overview

PCIE phy suite tests features associated with PCIE physical link layer.

3.1 Test AJ015: PCIE PHY Dynamic Link Speed Switching Test (Bridge Initiated)

Introduction

These tests validate the stability of the PCIE link during PCIE link speed switching.

Passcase

The requested PCIE link speed switching is successful without any errors.

Failcase

1) The requested PCIE link speed is not supported by endpoint or bridge device.

2) PCIE link NAKs received and generated are above the threshold values.

3) PCIE link Detects are above the threshold value.

4) PCIE link width is not same before and after PCIE link speed switching.

3.1.1 Variation AJ015.001: Link speed change between Gen1 and Gen1

3.1.2 Variation AJ015.002: Link speed change between Gen1 and Gen2

3.1.3 Variation AJ015.003: Link speed change between Gen1 and Gen3

3.1.4 Variation AJ015.004: Link speed change between Gen2 and Gen2

3.1.5 Variation AJ015.005: Link speed change between Gen2 and Gen3

3.1.6 Variation AJ015.006: Link speed change between Gen3 and Gen3
8 AJ (PCIE Phy Suite)

3.2 Test AJ018: PCIE PHY Dynamic Link Width Switching Test (Up/Down Config)

Introduction

These tests validate the stability of the PCIE link during PCIE link width switching.

Passcase

The requested PCIE link width switching is successful without any errors.

Failcase

1) The requested PCIE link width is not supported by endpoint or bridge device.

2) PCIE link NAKs received and generated are above the threshold values.

3) PCIE link Detects are above the threshold value.

4) PCIE link speed is not same before and after PCIE link width switching.

3.2.1 Variation AJ018.001: Link width change between x1 and x1

3.2.2 Variation AJ018.003: Link width change between x1 and x4

3.2.3 Variation AJ018.004: Link width change between x1 and x8

3.2.4 Variation AJ018.006: Link width change between x1 and x16

3.2.5 Variation AJ018.012: Link width change between x4 and x4

3.2.6 Variation AJ018.013: Link width change between x4 and x8

3.2.7 Variation AJ018.015: Link width change between x4 and x16

3.2.8 Variation AJ018.016: Link width change between x8 and x8

3.2.9 Variation AJ018.018: Link width change between x8 and x16

3.2.10 Variation AJ018.021: Link width change between x16 and x16

3.3 Test AJ020: PCIE PHY Symbol Per Clock Switching Test

Introduction

These tests validate the stability of the PCIE link during symbol per clock (SPC) mode switching.

Passcase

Link speed switch loop is successful without error.

Failcase

1) Link speed switch loop is failed or error happens.

2) Restore link speed to default link speed failed.

Copyright © Advanced Micro Devices, Inc.


3.3 Test AJ020: PCIE PHY Symbol Per Clock Switching Test 9

3.3.1 Variation AJ020.001: SPC mode change between Gen1 1SPC and Gen2 1SPC with Endpoint Initiated

3.3.2 Variation AJ020.002: SPC mode change between Gen1 1SPC and Gen2 2SPC with Endpoint Initiated

3.3.3 Variation AJ020.003: SPC mode change between Gen1 2SPC and Gen2 1SPC with Endpoint Initiated

3.3.4 Variation AJ020.004: SPC mode change between Gen1 2SPC and Gen2 2SPC with Endpoint Initiated

3.3.5 Variation AJ020.005: SPC mode change between Gen1 1SPC and Gen3 2SPC with Endpoint Initiated

3.3.6 Variation AJ020.006: SPC mode change between Gen1 2SPC and Gen3 2SPC with Endpoint Initiated

3.3.7 Variation AJ020.007: SPC mode change between Gen2 1SPC and Gen2 2SPC with Endpoint Initiated

3.3.8 Variation AJ020.008: SPC mode change between Gen2 1SPC and Gen3 2SPC with Endpoint Initiated

3.3.9 Variation AJ020.009: SPC mode change between Gen2 2SPC and Gen3 2SPC with Endpoint Initiated

Copyright © Advanced Micro Devices, Inc.


10 AJ (PCIE Phy Suite)

Copyright © Advanced Micro Devices, Inc.


Chapter 4

AK (Memory Controller Suite)

Overview

The memory diagnostic tests are used in external diagnostic suites to validate the memory between the GPU
memory controller and memory chips on the board. The tests use different test patterns and graphics engines
to generate different noise levels in the memory interface and DRAMs.

There are two important groups of memory tests (BLIT tests and CB tog tests) that will be described in this
section rather than test by test. This is because the tests are very closely related, and in addition, tests in these
two groups are often leveraged by other memory tests.

Group 1: BLIT tests [AK301-AK330]

The main purpose of this group of tests is to use bit BLITs to stress the memory interface from the ASIC to the
memory chips. The BLITs can be further grouped based on two types of variations:
• Data pattern used (e.g. Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask)
• Direction or movement of the BLITs (e.g. Horizontal, Diagonal, Random) The data patterns are used
primarily to test the data lines. The direction or movement of the blits, (i.e., the source and destination
coordinates of the blits) are mostly designed to test the address lines.

There are five subgroups of BLIT tests to cover all BLIT direction and data pattern variations.

Group 1A: Moving BLIT tests [AK301-AK306]


• The data pattern is drawn on the upper left quarter of the display. This pattern is then moved down, right,
up, left, then diagonally
• Data patterns tested: Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask

Group 1B: Horizontal BLIT tests [AK307-AK312]


• The data pattern is moved side to side multiple times
• Data patterns tested: Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask

Group 1C: Diagonal BLIT tests [AK313-AK318]


• The data pattern is moved diagonally across the display area
• Data patterns tested: Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask
12 AK (Memory Controller Suite)

Group 1D: Random BLIT tests [AK319-AK324]


• A pattern which is a quarter of the display resolution in dimension is moved to a random destination within
the display resolution’s perimeter
• Data patterns tested: Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask

Group 1E: Full Memory BLIT tests [AK325-AK330]


• These tests will move the data pattern diagonally down the entire video memory
• Data patterns tested: Colorbar, Walkbit, Walkpat, Maskpat, Randbit, and Randmask

A description of the six data patterns used in the blit tests follows.

1. Colorbar

The lower half contains the primary (red, green, blue) and complementary (cyan, magenta, yellow) colors in
their full intensity (0xFF for 32bpp) while the upper half are about half the maximum intensity (0x9E for 32bpp).
There are also the black and white colors and shades of gray.

1. Walkbit

Copyright © Advanced Micro Devices, Inc.


13

This pattern is intended to generate SSO pattern operations. In the presence of a DBI signal (i.e., GDDR4), it
will make the DBI signal toggle instead. Without a DBI signal (as is the case internally in the ASIC), this pattern
will generate SSO on all bits most of the time.

1. Walkpat

This pattern will generate SSO patterns even with the presence of a DBI signal. However, not all bits will be
doing SSO at the same time but rather the data bits with SSO operations will shift temporally as the pattern
walks down vertically.

1. Maskpat

Copyright © Advanced Micro Devices, Inc.


14 AK (Memory Controller Suite)

This pattern is composed of a foreground and a background color. This pattern is intended to be used for color
compare blits to transfer only the foreground color. As such, this is a good pattern to test the write mask (byte
enable bits) when transferring data.

1. Randbit

This pattern is also intended to generate SSO operations like the walkbit pattern. Basically, it contains data with
a single bit randomly turned or data with single bit randomly turned off. The sequence of whether it is a single
bit on or single bit off data is also in pseudo-random order.

1. Randmask

This pattern is similar to the Maskpat pattern. The only difference is in the sequence of the foreground and
background colors which is in pseudo-random order.

Group 2: CB Tog tests [AK347-AK366]

CB Tog is a set of memory tests which uses the 3D engine to perform BLIT operations. These tests are more
stressful than CP, DMA or CPU operations.

Group 2A: CB tog wr (write) [AK347-AK350]


• Draw patterns using 2D PaintMulti operations. The draw is not done in a single draw operation but rather
in multiple strips

Copyright © Advanced Micro Devices, Inc.


4.1 Test AK010: Write mask (CP) 15

• The pattern drawn is transferred to a temporary buffer using a single 2D BitBltMulti operation
• This pattern in the temporary buffer is then checked by xor-ing it with the original patterns using another
2D PaintMulti operation. This should clear (set to zero) the data unless there are anomalies
• The xor-ed data are then transferred to a result buffer using another 2D BitBltMulti operation, this time
or-ing it with the destination pattern. This way, all anomalies will be or-ed together

Group 2B: CB tog rd (read) [AK351-AK354]


• These tests are similar to CB tog wr tests. The difference is that the pattern is transferred to the temporary
buffer using multiple 2D BitBltMulti operations with smaller dimensions. The main objective is to do more
read operations in the test

Group 2C: CB tog rmw (read-modify-write) [AK355-AK358]


• These tests are similar to CB tog wr tests. The difference is that there are read-modify-write operations in
between steps 1 and 2

Group 2D: CB tog copy [AK359-AK362]


• These tests are similar to CB tog rmw tests. The difference is that instead of read-modify-write operations,
copy operations are performed

Group 2E: CB tog mask [AK363-AK366]


• These tests are similar to CB tog rd tests. The difference is in step 2. That is, the pattern is transferred to
the temporary buffer using a bunch of multiple 2D TransBitBlt operations. The main objective is to check
the write mask bit

4.1 Test AK010: Write mask (CP)

Introduction

This test is similar to the Write Mask (HDP) test except it uses the CP DMA to do the byte, word, and dword
data transfer. It exercises the write mask bits or data mask commands for GDDR5.

Failcase

Fail if any error in the resulting data

4.1.1 Variation AK010.001: 1024x768 @ 32bpp, 32 bit data pattern

4.2 Test AK308: Horizontal Blt Walkbit


Introduction

For a test description, please refer to the section in the Introduction entitled: Group 1B: Horizontal BLIT tests
[AK307-AK312]

4.2.1 Variation AK308.006: 1024x768 @ 32bpp

4.3 Test AK309: Horizontal Blt Walkpat

Introduction

For a test description, please refer to the section in the Introduction entitled: Group 1B: Horizontal BLIT tests
[AK307-AK312]

Copyright © Advanced Micro Devices, Inc.


16 AK (Memory Controller Suite)

4.3.1 Variation AK309.007: DRMDMA:1024x768 @ 32bpp

4.4 Test AK311: Horizontal Blt Randbit


Introduction

For a test description, please refer to the section in the Introduction entitled: Group 1B: Horizontal BLIT tests
[AK307-AK312]

4.4.1 Variation AK311.007: DRMDMA:1024x768 @ 32bpp

4.5 Test AK312: Horizontal Blt Randmask


Introduction

For a test description, please refer to the section in the Introduction entitled: Group 1B: Horizontal BLIT tests
[AK307-AK312]

4.5.1 Variation AK312.006: 1024x768 @ 32bpp

4.6 Test AK321: Random Blt Walkpat

Introduction

For a test description, please refer to the section in the Introduction entitled: Group 1D: Random BLIT tests
[AK319-AK324]

4.6.1 Variation AK321.005: 1024x768 @ 16bpp

4.6.2 Variation AK321.006: 1024x768 @ 32bpp

4.7 Test AK401: SLT functional


Introduction

This test does a basic sanity check to the full video memory. A pass in this test means that the GMC can
correctly complete basic read and write transactions for the whole frame buffer (FB). This test is based on Fill
Memory test (AK001) except that it does not exercise all the addressable memory, instead in skips every 65
dword address.

Failcase

Fail if any data mismatch found in sequential check or reverse-sequential check.

4.7.1 Variation AK401.001: 1024x768 @ 32bpp

4.8 Test AK403: Board functional


Introduction

This is a basic memory test. It fills full memory with sequential 32-bit values, inverse of sequential 32-bit values,
and a few content 32-bit patterns. It reads back the full memory content to check for errors after each fill. The
fills are done by simple DMA. No 2D or 3D engine is involved. It intends to catch workmanship issue, stuck
memory cells, and memory configuration issue.

Copyright © Advanced Micro Devices, Inc.


4.9 Test AK404: Board stress 17

Failcase

Readback of memory content contains errors after any memory fills.

4.8.1 Variation AK403.001: Non-AGP: 1024x768 @ 32bpp

4.9 Test AK404: Board stress


Introduction

This is a memory interface stress test. It does stressful mix of memory reads and writes of stressful data
patterns. To achieve a very high level of stress, 3D engine is used to generate tight sequences of memory
read/write mix. It intends to catch signaling issues on the memory interface.

This test is a combination of the following Moving Blit tests:

• AK301.6 Colorbar
• AK305.6 Randbit
• AK302.6 Walkbit
• AK303.6 Walkpat
• AK306.6 Randmask

The major difference is that these tests are first run multiple times without checking the result. The purpose of
this step is to pre-saturate the MC clients rather than starting from an idle state. Afterwards, the actual tests
are then run and results are checked.

Failcase

The test pattern that is used in the blits is preserved throughout each blit movements within the tests. As such,
the test patterns as well as background are checked for consistency at the end of the test.

4.9.1 Variation AK404.001: Qualification

4.10 Test AK600: Memfa testing

Introduction

This is a memory failure analysis test. It does a stressful mix of memory reads and writes of stressful data
patterns and intends to determine the problematic memory channels as well as DRAMs.

Passcase

The connectivity between the board’s ASIC and DRAMs are good.

Failcase

The connectivity between the board’s ASIC and DRAMs may have issues. The failure analysis personnel should
also ensure there is acceptable noise in the power supplies.

4.10.1 Variation AK600.001: using 3D engine

4.11 Test AK751: Mixed: Classic Moving Blt Walkbit, Walkpat, Randbit

Copyright © Advanced Micro Devices, Inc.


18 AK (Memory Controller Suite)

4.11.1 Variation AK751.406: VM8: Mixed Sysmem/FB Random BigK/4K - Alternating Snooped/NonSnooped
4K GFX 1024x768 @ 32bpp

Copyright © Advanced Micro Devices, Inc.


Chapter 5

DOUT (Display Output Suite)

Overview

The display output (DP) suite tests the functionality of the various display output blocks on the GPU. These
include DAC (a.k.a VGA), DVI/HDMI, LVDS, and DisplayPort, in various configurations depending on the GPU
and board design.

5.1 Test DOUT899: Autodetecting display output visual test

Introduction

This test is intended for verifying the display outputs on a graphics board by way of visual inspection.
20 DOUT (Display Output Suite)

Copyright © Advanced Micro Devices, Inc.


Chapter 6

PK (PM4 Player Suite)

Overview

The PM4 player plays back the contents of a PM4 trace file that was captured from the production graphics
driver as it was rendering a 3D application. The PM4 trace contains command packets for drawing geometric
primitives as well as graphics resources such as textures, vertex buffers and shader programs stored in binary
format. The player reads the graphics resources from the PM4 trace and uploads them into system and video
memory. It then reads the command packets from the PM4 trace and submits them to the GPU where they are
processed by the graphics core to re-create a scene from the 3D application. The PM4 player suite contains
one test per captured 3D application and one variation per supported GPU variant in each test.

6.1 Test PK006: 3DMark06: Canyon Flight

Introduction

This test is captured from the Canyon Flight graphics test of the 3DMark06 Direct3D 9.0c benchmark.

Failcase

This test will fail if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

6.1.1 Variation PK006.032: Ellesmere

6.2 Test PK016: Unigine: Heaven

Introduction

This test is captured from the Heaven Direct3D 11.0 benchmark based on the Unigine 3D engine.

Failcase

This test will fail if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

6.2.1 Variation PK016.032: Ellesmere


22 PK (PM4 Player Suite)

Copyright © Advanced Micro Devices, Inc.


Chapter 7

PM (Power Management Suite)

Overview

The Power Management (PM) suite deals with features related to power saving and Chip Pervasive Logic (CPL)
functionality.

7.1 Test PM001: Miscellanous Test.


Introduction

Miscellanous Test is a set of tests for different features. These features include reg read/write, pcc, display
timer, 3d sanity check, evv, etc.

7.1.1 Variation PM001.030: Max required VDDC under limits

Passcase

This test passes if max required VDDC is under or equal Max Voltage limits.

Failcase

This test fails if max required VDDC is over Max Voltage limits.

7.2 Test PM013: Thermal Protection


Introduction

This test ensures that the Thermal Critical Temperature Fault (CTF) feature is working properly. The purpose of
the CTF feature is to shut down the system in case the GPU temperature has reached levels that are dangerous
for the GPU to operate. The feature is tested by artificially introducing and verifying the CTF condition using
GPIO pin GPIO19. The board is expected to hang after the CTF test is run; additionally, an LED will be turned
on if this test is executed on a board where CTF is actually connected to the voltage regulator on the board.
The system should be restarted after this test is run, therefore, it is recommended that this test be run at the
end of any test suite.

7.2.1 Variation PM013.008: CTF Trigger Test - GPIO19

Passcase

GPU board powered off, CTF LED light up and fan run at full speed
24 PM (Power Management Suite)

Failcase

CTF doesn’t tigger or DIP switch on board configured to bypass CTF

Introduction

This test need command line parameter: -v=info -skiptextbuffering=1. This test is to test GPU(ASIC) CTF works
or not. After the test, system need to reboot.

7.2.2 Variation PM013.016: Get Temperature Via SMBUS from GPU

TBD

TBD

7.2.3 Variation PM013.017: Get Temperature Via SMBUS from External LM96163(0x98)|EMC2103(0x5C)|E←-
MC1402|ADM1032

TBD

TBD

7.3 Test PM014: Fan Test


Introduction

This test validates the correct operation of the fan in regulating the asic temperature.

Guide

Fan has to be 4-wire for RPM diag.

7.3.1 Variation PM014.001: Report Fan RPM

Introduction

Read Fan RPM through TACH line

Passcase

Fan is spinning normally, read back RPM normally and static fan drive mode works

Failcase

two-wire fan

Fan tach line is broken

Fan gets stuck

Fan RPM read back is less than 0.9 ∗ MinRPM in VBIOS

Copyright © Advanced Micro Devices, Inc.


7.4 Test PM031: BACO test 25

Fan MaxRPM in VBIOS is 0

Skipcase

No Fan in VBIOS

7.3.2 Variation PM014.007: Zero RPM Fan Control Test


Introduction

This test is to verify the Zero RPM Fan control is working and should be run under enabled Powerplay function.
During the test, Expected Behaviour If GPU temperature goes below a certain value (“Fan stop temperature”),
SMU turns off the fan. The fan will not be turned on again until the GPU temperature has gone up by a certain
value (determined by “Fan start temperature”). It is expected that by the time the GPU temp gets to “Fan stop
temperature”, the AFC has already reduced the PWM to its minimum value or close to it, so change in the
acoustics and cooling capacity will not be significant and will not cause a sudden rise in GPU temp. These
temperature values should be adjusted for each heatsink design. Also, for each heatsink design, it should
be tested whether the design at 0-rpm can support the idle power of the GPU (not every heatsink has that
capability, e.g., blower heatsink design cannot support this feature).

Passcase

if the fan rpm go to zero when current_temp is less than fan_stop_temperature and if the fan rpm is not zero
when current_temp is bigger than fan_start_temperature

Failcase

any of the pass case scenario not meet.

7.4 Test PM031: BACO test


Introduction

This test validates BACO (Bus Alive Chip Off) feature .

Most baco test will switch PCIE land in parallel . However, some platforms(or PCIE slots on that) don’t support
PCIE lane up/down switch, in that case, test case will skip. But you can specify "-q" option to let case go on
without switching PCIE lane. The "-q" option is not recommanded, you should test these cases on right platform
with right PCIE slot.

7.4.1 Variation PM031.005: Enable and Disable in one test. No 3D.


Passcase

BACO can be enabled and disabled w/o hanging.

Failcase

1. Current PCIE slot doesn’t support up/down switch

1. Board shows incorrect state, or hangs.

7.5 Test PM070: I2C Test


Introduction

This test is used to Read/Write I2C devices

Copyright © Advanced Micro Devices, Inc.


26 PM (Power Management Suite)

Passcase

I2C finish Read/Write without any errors

Failcase

NACK/TIMEOUT/ABORTED during transition

7.5.1 Variation PM070.001: I2C Read from LM96163

Copyright © Advanced Micro Devices, Inc.


Chapter 8

SAM (Secure Asset Management (SAM) Suite)

Overview

Secure Asset Management (SAM) unit is a collection of hardware blocks responsible for accelerating various
security algorithms. The purpose this suite is to verify each blocks of hardware for their correct functionality.

Hardware blocks or capabilities that this suite verifies are as follows:

• Basic operations (FWV, mem-to-mem copy, etc.)

• Basic AM32 instructions (SRBM register access, MLA, Montgomery exponentiation, big number multipli-
cation, all instuctions user app, etc.)

• Crypto Engine (DMA, ODD, etc.)

The tests will either pass or fail if the block exists, and if the intended block does not exist the test will skip.

Note: When SAM FWV has failed, system has to be power cycled before SAM FWV can pass again.

8.1 Test SAM001: SAM Basic Functionality.

Introduction

SAM1.∗ tests verify the basic functionality of SAM unit.

8.1.1 Variation SAM001.009: SAM Secure Memory Validation

Passcase

This test will pass when Data copied to and read from Secure Memory is successful and uncorrupted.

Failcase

This test will fail when either Data read/write from/to Secure Memory is unsuccessful or data read from Secure
Memory does not match the original.
28 SAM (Secure Asset Management (SAM) Suite)

8.1.2 Variation SAM001.010: SAM Kernel Soft Reset Validation


Passcase

This test will pass when soft reset handshake with kernel is successful and the reset is performed.

Failcase

This test will fail when soft reset is not successful or the reset is not performed.

8.2 Test SAM007: SAM Crypto SHA encryption.

Introduction

SAM7.∗ tests verifies SHA algorithm of Crypto Engine.

8.2.1 Variation SAM007.003: SAM crypto SHA-256 encryption.

Passcase

This test passes when the encrypted result matches the expected golden result.

Failcase

This test fails when the encrypted result does not match the expected golden result.

8.3 Test SAM008: SAM Crypto DMA encryption/decryption.

Introduction

SAM8.∗ tests verifies DMA mode of Crypto Engine.

8.3.1 Variation SAM008.011: SAM crypto DMA XTS encryption.

Passcase

This test passes when the decrypted result matches the expected golden result.

Failcase

This test fails when the decrypted result does not match the expected golden result.

8.3.2 Variation SAM008.012: SAM crypto DMA XTS decryption.

Passcase

This test passes when the decrypted result matches the expected golden result.

Failcase

This test fails when the decrypted result does not match the expected golden result.

8.4 Test SAM009: SAM Crypto ODD encryption/decryption.

Introduction

SAM9.∗ tests verifies ODD mode of Crypto Engine.

Copyright © Advanced Micro Devices, Inc.


8.5 Test SAM010: SAM Crypto RSA encryption/decryption. 29

8.4.1 Variation SAM009.001: SAM crypto ODD ECB encryption.

Passcase

This test passes when the encrypted result matches the expected golden result.

Failcase

This test fails when the encrypted result does not match the expected golden result.

8.4.2 Variation SAM009.006: SAM crypto ODD ECB decryption.

Passcase

This test passes when the decrypted result matches the expected golden result.

Failcase

This test fails when the decrypted result does not match the expected golden result.

8.5 Test SAM010: SAM Crypto RSA encryption/decryption.

Introduction

SAM7.∗ tests verifies RSA algorithm of Crypto Engine.

8.5.1 Variation SAM010.003: SAM crypto RSA encryption - 2048bit.

Passcase

This test passes when the encrypted result matches the expected golden result.

Failcase

This test fails when the encrypted result does not match the expected golden result.

8.5.2 Variation SAM010.004: SAM crypto RSA decryption - 2048bit.

Passcase

This test passes when the decrypted result matches the expected golden result.

Failcase

This test fails when the decrypted result does not match the expected golden result.

Copyright © Advanced Micro Devices, Inc.


30 SAM (Secure Asset Management (SAM) Suite)

Copyright © Advanced Micro Devices, Inc.


Chapter 9

SDMA (SDMA Suite)

Overview

The sdma suite checks for issues in SDMA. It tests the functionality of copying surface between system and
local memory. Usually, the sdma suite contains 2 variations. One is for SDMA0, the other is for SDMA1.
We use parameter "SdmaEngine" to separate them. SdmaEngine = 0, 1, 2, 3, 4, 5 stand for SDMA0_GFX,
SDMA0_RLC0, SDMA0_RLC1, SDMA1_GFX, SDMA1_RLC0, SDMA1_RLC1.

9.1 Test SDMA006: Test linear to tiled sub-window copy

Introduction

The test test linear to tiled sub-window copy.

Passcase

Content in tiled buffer is identical to the content in destination buffer sub-window

Failcase

sDMA engine hang or Linear to tiled Copy sub-window command doesn’t complete Content in tiled buffer is not
identical to the content in destination buffer sub-window

9.1.1 Variation SDMA006.001: Test linear to tiled sub-window copy using sDMA0
32 SDMA (SDMA Suite)

Copyright © Advanced Micro Devices, Inc.


Chapter 10

STD (Stress3D Suite)

Overview

The Stress3D suite is a set of graphics/compute stress tests that model typical 3D applications such as bench-
marks and games. Each test renders a different animated 3D scene. The stress level generated by a particular
test depends on the scene on which the test is based.

10.1 Test STD001: Food store scene

Introduction

This test renders a scene consisting of static food store meshes, animated spaceships and buses, and one
animated light.

Failcase

This test fails if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

10.1.1 Variation STD001.001: TGL renderer

10.2 Test STD002: Mountain range scene

Introduction

This test renders a scene consisting of static mountain meshes, animated skulls, trucks, an animated food store
and highway, and one animated light.

Failcase

This test fails if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

10.2.1 Variation STD002.001: TGL renderer


34 STD (Stress3D Suite)

10.3 Test STD003: Furry orb scene

Introduction

This test renders one scene to a texture and then applies that texture to a plane in another scene. The first scene
consists of static mountain meshes, animated skulls, trucks, a food store and a highway, and one animated light.
The second scene consists of a growing sphere with a fur material applied, an animated plane containing the
first scene, and one animated light.

Failcase

This test fails if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

10.3.1 Variation STD003.001: TGL renderer

10.4 Test STD004: Pet cabaret scene


Introduction

This test renders a scene consisting of some animals with normal 3D models, teapot and elepant models with
tessellation, and one animated light.

Failcase

This test fails if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

10.4.1 Variation STD004.001: TGL renderer

10.4.2 Variation STD004.002: TGL renderer at 4K UHD resolution

10.5 Test STD005: HairMark scene


Introduction

This test renders a scene with a hairy torus.

Failcase

This test fails if the actual CRC of any rendered frame does not match the corresponding expected CRC.
A failure could be caused by a defective GPU graphics core or memory controller, defective graphics board
components (e.g. memory chips, voltage regulators), or a defective power supply.

10.5.1 Variation STD005.003: Optimized hairmark without initial current spike

Copyright © Advanced Micro Devices, Inc.


Chapter 11

UVD (Unified Video Decoder (UVD) Suite)

Overview

The Unified Video Decoder, previously called Universal Video Decoder, or UVD in short, is a video decoding
unit that supports hardware decoding. The formats supported include:
• Full VC-1 and H.264 decoding (UVD 1)
• Frequency transformation and motion compensation in MPEG-2 (UVD 2)
• Full decoding support for MVC, MPEG-2, and MPEG-4/DivX/Xvid (UVD 3)
• Full decoding support for WMV9 (UVD 4) Each test is composed of approximately 30 frames, each with
a pair of bitstream data/decode messages. A decoding session in the UVD hardware will output to a
memory buffer in YUV format, one image for each decoded frame. The HW CRC delivered by UVD
FirmWare (FW) is used to validate the decoding process (and to determine if the test passed or failed)

11.1 Test UVD002: UVD Register Tests

Introduction

These tests verify the access of UVD registers through various access methods.

Guide

This test requires no user intervention.

Passcase

Read back of the registers under test are matching the expected values written by the test.

Failcase

Read back of the registers under test do not match expected values written by written by the test.

11.1.1 Variation UVD002.006: UVD registers test SAFE Mix of IB and RB

11.2 Test UVD011: VC1 Bitstream Tests


Introduction

These tests verify UVD decoding of VC1 streams.

Guide

This test requires no user intervention.


36 UVD (Unified Video Decoder (UVD) Suite)

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.2.1 Variation UVD011.001: VC1-HD 1920x1080p Boston Harbor

11.2.2 Variation UVD011.002: VC1-HD 1920x1080p Leaves

11.2.3 Variation UVD011.003: VC1-HD 1920x1080p MainStreet

11.2.4 Variation UVD011.004: VC1-HD 1920x1080p TooGoodPond

11.3 Test UVD012: MPEG4 Bitstream Tests


Introduction

These tests verify UVD decoding of MPEG4 streams.

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.3.1 Variation UVD012.001: MPEG4-HD 1920x1080p Boston Harbor

11.3.2 Variation UVD012.002: MPEG4-HD 1920x1080p Leaves

11.3.3 Variation UVD012.003: MPEG4-HD 1920x1080p MainStreet

11.3.4 Variation UVD012.004: MPEG4-HD 1920x1080p TooGoodPond

11.4 Test UVD013: MPEG2-VLD Bitstream Tests


Introduction

These tests verify UVD decoding of MPEG2-VLD streams.

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

Copyright © Advanced Micro Devices, Inc.


11.5 Test UVD014: MPEG2-IDCT Bitstream Tests 37

11.4.1 Variation UVD013.001: MPEG2-VLD-HD 1920x1080p Boston Harbor

11.4.2 Variation UVD013.002: MPEG2-VLD-HD 1920x1080p Leaves

11.4.3 Variation UVD013.003: MPEG2-VLD-HD 1920x1080p MainStreet

11.4.4 Variation UVD013.004: MPEG2-VLD-HD 1920x1080p TooGoodPond

11.5 Test UVD014: MPEG2-IDCT Bitstream Tests


Introduction

These tests verify UVD decoding of MPEG2-IDCT streams.

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.5.1 Variation UVD014.001: MPEG2-IDCT-HD 1920x1080p Boston Harbor

11.5.2 Variation UVD014.002: MPEG2-IDCT-HD 1920x1080p Leaves

11.5.3 Variation UVD014.003: MPEG2-IDCT-HD 1920x1080p MainStreet

11.5.4 Variation UVD014.004: MPEG2-IDCT-HD 1920x1080p TooGoodPond

11.6 Test UVD016: H264 Performance Mode Bitstream Tests


Introduction

These tests verify UVD decoding of H264 streams.

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.6.1 Variation UVD016.001: Performance Mode H264-HD 1920x1080p Boston Harbor

11.6.2 Variation UVD016.002: Performance Mode H264-HD 1920x1080p Leaves

11.6.3 Variation UVD016.003: Performance Mode H264-HD 1920x1080p MainStreet

Copyright © Advanced Micro Devices, Inc.


38 UVD (Unified Video Decoder (UVD) Suite)

11.6.4 Variation UVD016.004: Performance Mode H264-HD 1920x1080p TooGoodPond

11.7 Test UVD017: 4K H264 Performance Mode Bitstream Tests


Introduction

These tests verify UVD decoding of 4K resolution H264 streams with H264 performance mode

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.7.1 Variation UVD017.001: Performance Mode H264 4K 4096x2160

11.7.2 Variation UVD017.002: Performance Mode H264 4K 4096x2304

11.7.3 Variation UVD017.003: Performance Mode H264 4K 3840x2160

11.7.4 Variation UVD017.004: Performance Mode H264 1920x1088

11.8 Test UVD019: H265 Decoding Tests

Introduction

These tests verify UVD decoding of H265 streams, including 10-bit decoder and dithering

Guide

This test requires no user intervention.

Passcase

UVD MIF CRCs collected from FW feedback structure must match the reference

Failcase

UVD MIF CRCs collected from FW feedback structure do not match the reference

11.8.1 Variation UVD019.003: H265-HD 4096x2160 Boston Harbor

11.8.2 Variation UVD019.004: H265-HD 3840x2160 Boston Harbor rate control

11.8.3 Variation UVD019.005: H265-HD 1920x1080p Boston Harbor

11.8.4 Variation UVD019.009: H265-HD 1280x720p Boston Harbor

11.8.5 Variation UVD019.013: H265-SD 720x480p Boston Harbor

11.8.6 Variation UVD019.103: H265-HD 10-bit 4096x2160 Boston Harbor p010_mode msb_mode

Copyright © Advanced Micro Devices, Inc.


11.9 Test UVD030: Tier-1 MJPEG decoder Bitstream Tests 39

11.8.7 Variation UVD019.106: H265-HD 10-bit 1920x1080p Leaves p010_mode msb_mode

11.8.8 Variation UVD019.111: H265-HD 10-bit 1280x720p MainStreet p010_mode msb_mode

11.8.9 Variation UVD019.116: H265-SD 10-bit 720x480p TooGoodPond p010_mode msb_mode

11.8.10 Variation UVD019.120: H265-HD 10-bit 3840x2160 Boston Harbor rate control p010_mode lsb_mode

11.8.11 Variation UVD019.124: H265-HD 10-bit 1920x1080p TooGoodPond p010_mode lsb_mode

11.8.12 Variation UVD019.127: H265-HD 10-bit 1280x720p MainStreet p010_mode lsb_mode

11.8.13 Variation UVD019.130: H265-SD 10-bit 720x480p Leaves p010_mode lsb_mode

11.8.14 Variation UVD019.201: H265-HD 10-bit Grand Bend Patio 4096x2160 dithering trunction

11.8.15 Variation UVD019.209: H265-HD 9bitY_9bitC Grand Bend Patio 4096x2160 dithering roundingA

11.8.16 Variation UVD019.216: H265-HD 10bitY_8bitC Grand Bend Patio 4096x2160 dithering roundingB

11.8.17 Variation UVD019.223: H265-HD 8bitY_10bitC Grand Bend Patio 4096x2160 dithering fixed

11.8.18 Variation UVD019.230: H265-HD 8bitY_9bitC Grand Bend Patio 4096x2160 dithering random

11.9 Test UVD030: Tier-1 MJPEG decoder Bitstream Tests


Introduction

These tests verify the decode operation of the UVD MJPEG engine

Guide

This test requires no user intervention.

Passcase

YUV generated frames are a match against reference decoder, make sure YUV looks good visuallly.

Failcase

YUV generated frames are different than the one generated by reference decoder, ouptut YUV show corruption
on vissual inspection.

11.9.1 Variation UVD030.001: MJPEG decoding 1920x1088 4:2:0

11.9.2 Variation UVD030.002: MJPEG decoding 1920x1088 4:2:2 YYUV

11.9.3 Variation UVD030.003: MJPEG decoding 1920x1088 4:2:2 YYYYUUVV

11.9.4 Variation UVD030.004: MJPEG decoding 1280x720 4:2:0

11.9.5 Variation UVD030.005: MJPEG decoding 1280x720 4:2:2 YYUV

11.9.6 Variation UVD030.006: MJPEG decoding 1280x720 4:2:2 YYYYUUVV

Copyright © Advanced Micro Devices, Inc.


40 UVD (Unified Video Decoder (UVD) Suite)

11.9.7 Variation UVD030.013: MJPEG decoding 8192x16 4:2:0

11.9.8 Variation UVD030.014: MJPEG decoding 8192x16 4:2:2 YYUV

11.9.9 Variation UVD030.015: MJPEG decoding 8192x16 4:2:2 YYYYUUVV

11.9.10 Variation UVD030.016: MJPEG decoding 16x8192 4:2:0

11.9.11 Variation UVD030.017: MJPEG decoding 16x8192 4:2:2 YYUV

11.9.12 Variation UVD030.018: MJPEG decoding 16x8192 4:2:2 YYYYUUVV

11.9.13 Variation UVD030.019: MJPEG decoding 3840x2160 4:2:0

11.9.14 Variation UVD030.020: MJPEG decoding 3840x2160 4:2:2 YYUV

11.9.15 Variation UVD030.021: MJPEG decoding 3840x2160 4:2:2 YYYYUUVV

11.9.16 Variation UVD030.022: MJPEG decoding 8192x8192 4:2:0

11.9.17 Variation UVD030.023: MJPEG decoding 8192x8192 4:2:2 YYUV

11.9.18 Variation UVD030.024: MJPEG decoding 8192x8192 4:2:2 YYYYUUVV

11.10 Test UVD408: UVD Bitstream H265 Tiled Stream Tests


Introduction

These tests verify UVD H265 tiled decoding

Guide

This test requires no user intervention.

Passcase

UVD HW CRCs collected from FW feedback structure must match the reference

Failcase

UVD HW CRCs collected from FW feedback structure do not match the reference

11.10.1 Variation UVD408.001: H265-HD 4096x2160 Boston Harbor

Copyright © Advanced Micro Devices, Inc.


Chapter 12

VCE (Video Compression Encoding)

Overview

The VCE suite tests the functionality of Video Compression Encoding block on the GPU designed to encode
raw video data (YUV 4:2:0) to various compression standards, including H.264, H.263, and MPEG-4.

12.1 Test VCE100: H.264 bit-stream encoding from memory

Introduction

In all the regular encoder tests, YUV data and encode parameters are feed in, the encoder will output the
bitstreams of types specified for each test. The tests use the golden CRC references for validation. The input
YUV data will be encoded and collected H/W CRC are compared.

Passcase

Tests pass if CRC references and H/W CRC are identical.

Failcase

Tests fail if CRC references and H/W CRC are not identical.

12.1.1 Variation VCE100.008: H.264 baseline @ level 4.1 1280x720x30FPS

12.2 Test VCE402: AVC speed up test - FW Offloading

Introduction

In all the regular encoder tests, YUV data and encode parameters are feed in, the encoder will output the
bitstreams of types specified for each test. The tests use the golden CRC references for validation. The input
YUV data will be encoded and collected H/W CRC are compared.

Passcase

Tests pass if CRC references and H/W CRC are identical.

Failcase

Tests fail if CRC references and H/W CRC are not identical.

12.2.1 Variation VCE402.010: H.264 baseline @ level 4.1 3840x2160x30FPS


42 VCE (Video Compression Encoding)

12.3 Test VCE601: Basic HEVC encoder test


Introduction

HEVC encode is new codec type in UVD hardware, this test is for basic HEVC protocol

Passcase

Tests pass if CRC references and H/W CRC are identical.

Failcase

Tests fail if CRC references and H/W CRC are not identical.

12.3.1 Variation VCE601.001: 64x64 encoding

12.3.2 Variation VCE601.002: 256x128 encoding

12.3.3 Variation VCE601.004: 352x240 encoding

12.3.4 Variation VCE601.005: 640x480 encoding

12.3.5 Variation VCE601.006: 720x576 encoding

12.3.6 Variation VCE601.007: 1280x720 encoding

12.3.7 Variation VCE601.008: 1920x1080 encoding

12.3.8 Variation VCE601.009: 3840x2160 encoding

12.3.9 Variation VCE601.010: 4096x2160 encoding

Copyright © Advanced Micro Devices, Inc.

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