INTERNATIONAL STANDARD | INTERNATIOUAL ORGANIZATION FOR STANDARDIZATION ORGANISATION INTERNATIONALE DE NORMALISATION. MEXAYHAPORHAR OPTAHUSALMA NO CTAHAAPTHSALWH Osa Preparation of steel substrates before application of paints and related products — Surface roughness characteristics of blast-cleaned steel substrates — Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile — Focusing microscope procedure Préparation des subjects d‘acir avant application de peintures de produits assimilés — Coractérisiques 0 1agasté des subjectiee d'ecier décapés — Parti 3: Méthode pour étalonner les Echantilons de comparaison viso-tecil (SO et pour ‘euractériser un prof! de surface — Utilsation d'un microscope optique COPIA LEGAL AUTORIZADA por convenio con IRAM nstituto Argentino de Normalizacién CENTRO DE DOCUMENTACION Iso 8503-3 Fits et 1988.02.01 Reference numer 130 8509.3: 1988 (8)Foreword |80 (the Internetionat Organization for Standardization) Is 2 worldwide federation of ational standards bodies (ISO member bodes). The work of preparing interretional Standards is normally cariad out through {SO technical committees. Each member Dodi interested in a subject for which a tochnical committes has boon established has ‘tho Fight to be represented on that comrttee. International organizations, govern ‘mental and non-govermmental, in liaicon with ISO, algo take part in the work. Draft intemational Standards adopted by the technical commictoes are circulated to ‘the member bodies for approve before theit acceptance as Intemational Standards by ‘tho ISO Council. They are approved in accordance with ISO procedures requiing at least 75 % approval by the member bodies voting. Intemational Standard ISO 8503.8 was prepared by Technical Committee ISO/TC 35, Paints and varnishes. Users should note that all internetional Standards undergo revision from time to time ‘and that any reference made herein to any other International Standard implis ies latest ecition, unless otherwise stated. © International Organization for Standardization, 1988 © Printed in SvtzetandINTERNATIONAL STANDARD 1SO 8503-3 : 1988 (E) Preparation of steel substrates before application of pi characte: Part 3: ts and related products — Surface roughness tics of blast-cleaned steel substrates — Method for the calibration of [SO surface profile comparators and for the determina Focusing microscope procedure 0 Introduction ‘The porformance of protective coatings of paint and related products plied to steel is sigificantlyaffactod by the stata of the steel surface immediately prior to painting. The principal ‘actors that are known to influgnes this performance are a} the presence of rust and mill sle; i) the prasonce of surface contaminants, including salts, dust, ols and greases; €} the surface profilo. Intemational Standards ISO 8501, ISO 8602 end ISO 8603 have been prepared to provide methods of assessing these factors, while ISO 8504 provides guidance on the preperation methods that are available for cleaning steel substrates, indicating the capabilities of each in attaining specified lavels of cieaninass. ‘These Intemetional Standards do not contain recommends tions for the protective coating systems to be applied to the steel surface. Nelther do they contain recommendations for the surface quay requirements for specific situations even though ‘surface quality can have a direct influence on the choice of protective coating to be applied and on its performance. Such recommendations are found in other documents euch as rational standards and codes of practice. It will be necessary for the users of theae International Standards to onaure that the uals specified are —_ compatible and appropriste both for the environment conditions to which the steel will be exposed and for the protective coating system to be used; — within the eapebilty of the cleaning pracedure spesi- fied. ‘The four International Standards referred to above desl with the folowing aspects of preparation of steel substrates = 180 8501 — Visual assessment of surface cleanliness; in of surface profile — 180 8602 ~ Tests for the assessment of surface oeon fess; 180 8503 — Surface roughness choractoristics of blast- cleaned steel substrates; 180 8504 — Sutace preparation methods. Each of these Intemational Standards isin turn dlvided into separate parts, ‘The optical microscope Is one of the mast widely used in strumants for measuring surface profile. The mathod can be used by any laboratory equipped with a good microscope that has a calibrated focusing machanism meating the requirements ‘of 5.1. This procedure may also be usod to determine the pro- fil ofa subsite after abrasive blet-cleaningcither directly oF ‘rom 8 replica This mathod is based on that developed in the USA by the Steel Structures Painting Counc. It ental avereging a aries of maximum peak-to-valey measurements obtained by focus ing a specified microscope — frst on the highest peak and then ‘on the lowest valley in the samo fold of view, noting the distance of movement of the stage (or objective) This method has the disadvantage of requiring a seties of tedious measurements, but good precision and agreement bo- ‘ween laboratories and betwoen oporators can be obtained by specifying closely the Meld of view and depth of fled of tha microscope, To avold a widespread divergence in measuring profile within and between laboratories, this method requires significant number of moasurements at well as correct calib tion, proper focus movernent, standardized depth of feid and fiold diameter of the microscope necessary to measure properiy both coarse ond fine profiles under a single sot of conditions. 180 8503-4 describes the procadure using @ stylus instrument, 180 8503-1 specifies the requirements for ISO surface profile ‘comparators and ISO 8503.2 describes their usa, Tha meny abrasive blast-clsaning procedures in common uso are dasorib ed in 180 8504-21S0 8503-3: 1988 (E) 1 Scope and field of application 11.1 This part of ISO 8608 spocties the focusing microscope ‘and describes the procedure for calrating ISO surface profile ‘comparators complying with the requirements of 180 8503-1. 1.2 This part of ISO 8503 is also applicable to the determina tion of the surface protile, within the range fy = 20 to 200 um, of essentially planar bsst-cleaned steal, The determination may be cartied out on a representative saction of the biast-cleaned substrate or, If diect cbservation of the surface is not feasible, (on a replica of the surface (so0 annex [NOTE — Where approniate hs procedure mey be used for sisessing the roughness profile of other abrasive Bleu-clauned wubarates, ‘An altemative procedure is described in ISO 8503-4 2 References 180 4618, Paints and varnishes ~ Vocabutery. 180 8603, Preparation of sto! substrates before application of pints and related products — Surface raughness character- Istles of blast-cloanod steal substraces ~_ Part 1: Specifications and definitions for ISO surface profits comparators for the assessrment of abrasive blast. lesned surfaces. = Part 2: Method for the grading of sutface profile of abrasive bast-cleaned steel — Comparator procedure, = Part4: Method for the calibration of 180 surface profile comparators and for the determination of surface ‘profile — Stylus instrument procedure. 180 8504-2, Preparation of ste! substrates before application of ainis and related products ~ Surface preperation methods — Part 2: Abrasive blast-cleaning.” 3 Definitions For the purpose ofthis pert of SO 8503, the definitions givenin 1S0 4618 and ISO 8503-1 apply. 4 Pri iple Observation of the test surface over @ specifod fold of viow Using a specified microscope. Adjustment of the microscope, bby movement of the objective (or the stage), to focus on the highest peok within the field of view. Determination of the distance hy moved by the objective [or the stage) in order to ‘focus on the lowest valley within the same field of view, Repetition ofthe procedure to obtain values fora further 19 it feront fiolds of view and csiculation of the arithmetic mean of the distance hy between the highest peck and lowest valley In each field of View as the mean maximum peak-to-valley height Fy. GD At reste atthe stage of ett 5 Apparatus 5.1. Optical microscope, hoving a fine focus adjustment ‘with itis or no backlash (play (see clause A.S in annox A). The _adjustmont shall give fine control of the movement ofthe ob: Jective orstago and shall be fitted witha graduated verriar ecole having a scale velua of not mora than 1 jum. The microscope shall have an objective Tons with a numerical aperture of not less than 0,5 together with an eyepiece lans to give a fold of View grester than 0,5 mm in ameter, Tho fal of view may be ‘reduced by the use ofa circular eyepiece reticle or by 8 stop in the lamphouso. NOTE — Advica concerning the use of the microscope ie gion in tnnoxes And D. Arr A describes 8 procedure for dotrmining tho Imirescops beclaeh. Annex D explains the significa ofthe defined or the microscope. (See also the not 1052.1 5.2 Light source, fittod to the microscope (6.1) 0 iluminete the test surface perpendicular to its plane. Light fiters may be used to minimize aro. NOTE — These requirements for the apperatus (6:1 and 62) are generally net by microscopes for metals purpOsNS. 6 Test surfaces 6.1 180 surface profile comparator Visually chock that each sogmant of the ISO surface profile ‘comparator (see [SO 6506-1) that is to be calbrated Is un: ‘damaged, Lightly clean the surface with a dry, fie bristle brush ‘to remove any particle of dust and then, using a similar brush, wash the surface with petroleum spirit, 40/60 (commerci {rade}, to remove oil and grease residues. Allow to dry befere ‘carrying out the calibration, Calibrate each segment of the comparator at described in clause 7, 62 Bh 1ed stool substrates/replica Visually check that the surface that ls to be measured Is un- damaged. Lightly clean the surface with a dr, fine bristle brush toromove any particles of dust and then, using a similar brush, wash the surface with petroleum spit, 40/60 (commerci fade}, to remove oll and grease residues. Allow to dry before carrying out the procedure. Determine the surface profile as described in clause 7. [NOTE ~ i roptca (a annox ist ba measure, cleanit oly with 8 dry bras 7 Procedure for measurement of maximum peak-to-valley height h,, 7.1. Locete the test surface (clause 6) under the objective of the microscope (6:1) s0 that the moasurements ate taken on & tet area not loss than & mm from any edge. Adjust the lightsource (5.2) 40 Murinate the test rea, normal to the plane of the surface, Focus the microscope approximataly on the sur- face. 7.2. Raise the objective unt no part ofthe test area isin focus {see the notes). Then slowly lower the objective, using the fe Aadjstinant knob, until the frst point in the observed area just ‘comes into focus. On the form given in annex C, record te reading r, on the vernier scale asthe height of the highest peak in that field of view. NOTES 11 On some microscopes, tho cbjectvw is xed and the stage is ‘movabie, Acstment of focus ie aohived by relsing or lowering he so 2. ite racommended that focusing should tways be cared out ine ‘ame diction (se clause D2) 7.3 Lower the objective until no part of the test area isin focus (s00 the notes to 7.2). Then slowly rale the objective .n- ‘tho fiat point inthe observed area just comes into focus. On ‘the form given in annex C, record the reding ra on the werner ‘Scale, corected for any backlash (see ennex A), 28 the depthot the lowest vally in that field of view. Ifthe reading cannot be corrected for backlash in the miercecope movement, continue to raise the objective until the lowest valley is no longer in focus, Thon slowly lower the objective untl the loweet valley is ‘once more in focus. Record the reading rz on the verniar scale ‘6 the depth of the lowest valley in that field of view. 7.4. Theddifference between the readings (7 — 12s the max: ‘mum peok-to-valley height fy for that field of viow. 7.8 Ropeat the procedure desorbed in 7.2, 7.3 and 7.4 unt ‘o-valley height has been determined for20 completely differant fide of view, uniformly distributed over ‘the test surface, but not less than 6 mm from sny edge. 8 Calculation and expression of results 8.1 Calcite the moan value Fy and tho standard doviaton for the 20 masrum paakto-elly readings, for each tot surface, It the standard deviation obtained is fess than one-third ofthe ISO 8503-3 : 1988 (E) 8.2 _|f the method is used to calibrate an ISO surface profile Comparator and if the standard deviation obtained is more than ‘one-third of the mean result, repeat the procedure (clauso 71, ‘and obtain the mean and standard doviton for the 40 readings. Ifthe standard doviationis til more than one-third of the mean, react the comparator at the profile is of inadequote uniformity, 8.3 11 the mothod is usod to determine the profia ofa blast- cleaned surface, either directly or from a replica, report fy, ‘ogathor with the standard dovition and the maximum reading Of ‘hy to indicate the degree of uniformity of the surface roughness. 9 Test report “Tho form of tho test roportis given in annox B and shall contain atleast the following information : 8) the identification of the ISO surface profile comparator and the segmonta restod or, ifthe profile ofa steal substroxo was detorminad, the identification of the stel substrate and whether a replica of the substrate was used; a reference to this part of 180 8503 (180 8808-9 ©) the magnification of the objective lens, and its ‘numerical aperture: 4) the magnification of the eyepiece lens and of any in- ‘termediate magnification; ‘the diameter of the field of view of the tost area; 1) tho total magnification of the microscope: 2) the result of the test as indicated in clause 8 and, if the profile of an ISO surface profile comparator was deter- ‘mined, the limits forthe comparator (see 850-1), hh) any deviation, by agrooment or othonwice, from the procedure descrdved and, if the profile of a steel substrate was determined on a replica, the method of preparation of the rep snnex El; 1 the name of the opsrator; il the dato of the test.10 8503-3: 1988 {E) Annex A Determination of backlash (play) in the microscope adjustment mechanism (his annex forms an incegral part of she Standrd.) A.1__ Carry out the following procedure using the microcone (6.1) but with the magnificetion Increased to between X 360 to x40, A.2 Place an ISO surface profile comparator (6.1) on the stape of the microscope 60 thatthe area to be examined is not less than 5 mm from any edge. Adjust the light source to it luminate the test area normal tothe plane ofthe surface. Focus approximately the microscope on the surface. A.3 Raise the objective (see note 1 to 7.2) until no part of ‘the test areas is In focus. Slowiy lower the abjective using the {ing adjustment knob, until the ict point (i.e. the highost peak) in the observed ares just comes into focus. Racord the reading (09) of the vores scale. Repeat tis procedure without moving the comparator until 20, readings have been obtained, and then celculate their mean @. A.A Without displacing the comparator, lower the objective Lunt the highest peak i no longer infocus, Slowy raise the ob- [ective unt the highest peak in the observed area just comes into foous. Record the reading (p2) of the vernir scale, peat this procedure without movin the comparator unt 20 readings have been obtained, and then csleulato toi moan a. ‘AS Coculte the backlash asthe aftorence (Fj — Fh and ‘provided that the value isnot greater then 3 um, use this value in7.3. ifthe value is greater than 3 ym, reject the microscope.180 8603-3 : 1988 (E) Annex B Test report for the calibration of ISO surface profile comparators and for the determination of surface profiles (This erex forms an intgrl part ofthe Stand.) eat laboratory and address 2. Test eurace entfeation {2180 surface prof comparstor by sta substrate “replica? ‘3 International Standord reference 150 88093 4 Miovaoope cous (Objective one magniiestion x Objective numeric! eperture NA. Intermediate magoitizaton®! Eyepiece megrifcation Diamatar of fod of vow stm Total magnification x, 5. Results? Mean Maximum Neminal value ‘cada ‘Standaré roadeg hy of hy vito Segment 1 Segment 2 Segment 3 Segment 4 Stoel subetate/repica®! ‘6. Any deviations trom the standard procedure? [Nene and poston of person authorizing the deviations (soe 6 above) 8. Date of present tests) ‘Datel of any previous tstel® 10. Nome of operator It profi meosurement i of i steel subsuate or) a voplc, give deal, IW apatabia. ‘See seperate Form farnox C] fr actus rwaings. Delete ab appropriate, eer10 8603-3: 1988 (E) Annex C Form for recording surface profile measurements made in accordance with ISO 8503-3 {This annex forms an integral part of the Standard.) Test laboratory and acess Objective lane magnification X.eeee. Diamar of fll of view seer os 05mm Objective lens numerical spsrure NA ‘Total magniieaton Fyeniene megrifiation Ke Intermediate magnification X. rm roterence™ {1150 surace profile comparator by Stoo cubetrate/cepca?! Rendng? | ___Seamene 1 Segrnen2 Mean = Fy Maximum hy roc Minium hy reading ‘tondrd deviation Delt appropriate 21. Mprole measurement is of i» soa! aubevote or a repli, give deta. 3} All readings in miromotres. 4 Replaco by “stelsubsvate” or “rope”, applicable.180 8503-3: 1988 (E) Annex D Guidance notes for calibrating ISO surface profile comparators using a focusing microscope {This annex does not form an integral part ofthe Standard D.1_ Depth of field and field diameter ‘Whon using an optical microscope, the choice of lenses avsilable to obtain the magnification required for observations dictates the depth of field and the maximum field diameter. The depth of field is controlled by the numerical aperture of the objective lens wihich permits the accurate determination of peak heights and valley dopths. However, the smaller field diameter that results from the use ofa high numerical aperture tone and the consequent higher magnification, may fall to core ‘tin an adequate representation of high peeks and low valleys. At lower magnifications, the field diameter i larger snd hence representative peaks and valieys are more tkely to be present, but the coarser depth of file may prevent a precise detarmine- ton of their respective heights. ‘Tha distribution ofthe magnification between the objective and eyepiece lansas is Important in controling the dapth of Fld. ‘Whon a magnification of X 160 is required, the selection of a X 10 objective and 2 X 15 eyepiece would comply. Howaver, a typioal X 10 objective has @ numerical aperture of 0,28 and ‘would give a depth of field of about 7 yim. By selecting a X 20 bjective with a numerical aperture of not lees than 0,5, the depth of field is reduced to the acceptable value of 2 un. The field ciameter isin inverse relation to the total magnification, ‘the latter being obtained by muitiptying the magnification ofthe individual lansas in the microscope system. Mary microscopes have a fixed intermaciate lens which usually adds a factor of X 1,25 oF X 1,5. Whan these considerations are taken Into account along with ‘the desire to produce a test method for measuring tho surfaca profiles of [SO comparators, itis necessary that standard re- ‘quirements be specified in order to obtain figures aligning with visual and tactile assessments, By controling the numveical aperture of the objective lens and the field of view, the ‘magnification is indirectly controlled. To meet the requirement {or an objective with a numerical aperture not less than 0,8 and 2 field of view greater than 0,5 mm diameter, a microscope with ‘an objective lens of X 20, a numerical aperture of 0,6 and an ‘eyepiece ion of X 10 is typical and provides a total magnifica- tion of X 200, D.2_ Focus movement Normal microscopy procedures require the final focusing ‘movement to be always made in the sama direction. However, the procedure outlined in clause 7 suggests that, for a ‘microscope with a fine adjustment mechanism that is free from backlash (play), the direction of the final focusing movernent for the valley depths can be the opposite of that used when ‘measuring the peak heights. This deviation is permitted in order to increase substantially the spued of operation, because @ fine adjustment mechanism that Is tree from backlash would in troduce no errar when focusing from opposite civections, ‘Therefore, Ifthe fino adjustment mechanism of the microscope has backlash, itis imperative eithor thatthe final focus move- ment bo always made in tha same direction to prevent the intoduction ef error or that the backlash determined In clause A.B of annex A be used. Obviously, the procedure for @ microscope whore its fine ad |ustmont machanism is roa trom backlash Is much ser for the cbserver and is more efficient, Therefore, it is suggested thet every effort be mad to ensure the proper movement ofthe fine adjustmant mechanism. Annex A gives the procedure for determining the backlash in tho fine adjustment. Using this procedure, a particular instru- ment can be inspected and the nocsssary corrections im- plemented. D.3 Variability of surface profile To obtain a representative value for the surface profile of abrasive blost-claaned structural steel, it ia necessary 10 verage at least 20 maximum poak-to-valay helghts iy obtein- ed by using the procedure described in clause 7. This avorage, known 2s the mean maximum ped-towalley height Ay, ‘minimizes irregularities caused by rogue peaks, cracks, hackles, et, ‘Tho standard deviation for 2 set of 20 peak-to-valley ‘measurements that have been carried out correctly is usually between 16 % and 25 % of the mean of the measurements, ‘Thus, a standord deviation greater than 33 % of the mean in dicates an unacceptably high variability in the measuting pro- ‘cedure or in the test area, and @ further sat of peak-to-valey ‘measurements isto be made to establish whether the initial set of readings wes representative (see clause 8).180 8503-3 ; 1988 (E) Annex E Guidance notes for the preparation and measurement of replicas (hia annex does not form an integral part of the Standard.) ‘When tha tast methods used to verify the profile ofa steel substrate, itis usually impracticel to obtain a small sample of the actual surface whose profile is to be determined. In this case, its etl possible, by examining a replica ofthe steel surface, to determine the surface profte, A replica produces the reverse of the metal surface (that is, the peaks of the steel substrate become the vale ofthe replica and the valleys of the steel bacome the peaks of the roplica), but this reversal does not affect the valiclty of the measurement methods Sescrbed in ISO 8503-4 and this part of ISO 8503. A varity of replicating techniques is availabe including solventiess two-component organic polymers that crosslink to give a hard solid surface. These polymers may have disadvantages in that they do ot penetrate into the deepest, sherpest valleys and the 8 release agent may be required. They provide, however, a hard enough surface to enable the stylus measurements described in 180 8503-4 to be made. ‘A swo-componant pigmented scone rubber product hes also been used with success. Its initial viscosity end flexible natura when Cross-finked men that penetration into reentrants of gri-blasted profiles, and subsequent cemoval, is good. Due to its softness, however, moasuromont is restricted to the microscope method described in this part of ISO 8803. ‘efore any replicating technique is used, It should be examined for accurécy by replicating at least five steel surfaces whose profiles have boon determined directly. These steel surfaces should have been prepared by use of abrasive ofthe seine type as thet used on the surface to be tested, and thay should have profiles that span the test surface profile range. Is preferable thatthe profile obtained ‘rom the replica should be within 10 % of that obtained on the stool surface, 12 replicating technique is used to determine the surface profile of asubswate, this should be stated when reporting the “mean ma imurm pesk-to-valley height”.180 8603-3 : 1988 (E) UDC 667.6 : 669.14 : 620.178.11 Descriptors: paints, verniches, substrates, sto! products, teas, determination, surface condition, profeenteria, roughness, vio-tctio ‘comoarizon specimens, microscopes, ‘rice based on 8 pages