ANALYSIS CERTIFICATE

XRF MONITOR DATA SHEET

Product Name: AUSMON XRF Drift Monitor – Rare Earths

Product Code: 1201100 – 40mm

Supplier: XRF Scientific

23 Dennis St
Campbellfield VIC 3061
AUSTRALIA
+613 9308 7533

Intended Use: This monitor is a fusion of mutually dissolved alkali oxides and metal oxides.
It has been formulated for use with XRF Spectrometers so as to have appropriate count
rates when analysing a range of rare earths and sands etc. The monitor contains 39
elements and its composition is such that reasonable counting precision can be obtained for
any element in a short time, generally less than 20 seconds.

Chemical Composition:
Compound Wt % | Compound Wt %
Fluorine F 0.5 | Barium oxide BaO 0.4
Sodium oxide Na2O 2.0 | Lanthanum oxide La2O3 2.1
Magnesium oxide MgO 3.8 | Cerium oxide CeO2 5.1
Aluminium oxide Al2O3 3.6 | Praseodymium oxide Pr6O11 0.5
Silicon oxide SiO2 7.5 | Neodymium oxide Nd2O3 1.6
Phosphorus oxide P2O5 7.5 | Samarium oxide Sm2O3 0.4
Sulphur oxide SO3 0.7 | Europium oxide Eu2O3 0.5
Chlorine Cl 0.2 | Gadolinium oxide Gd2O3 0.5
Potassium oxide K 2O 0.7 | Terbium oxide Tb2O3 0.3
Calcium oxide CaO 0.4 | Dysprosium oxide Dy2O3 0.5
Scandium oxide Sc2O3 0.1 | Holmium oxide Ho2O3 0.1
Titanium oxide TiO2 1.4 | Erbium oxide Er2O3 0.4
Manganese oxide MnO 0.1 | Thulium oxide Tm2O3 0.4
Iron oxide Fe2O3 2.5 | Ytterbium oxide Yb2O3 0.5
Nickel oxide NiO 0.2 | Lutetium oxide Lu2O3 0.2
Bromine Br 0.2 | Hafnium oxide HfO2 0.3
Strontium oxide SrO 0.2 | Lead oxide PbO 0.3
Yttrium oxide Y2O3 5.5 | Thorium oxide ThO2 0.7
Zirconium oxide ZrO 0.2 | Uranium oxide UO2 0.4
Niobium oxide Nb2O5 0.7 |

Notes:
1. The concentrations listed above are not certified and the disk should not be used to
establish a calibration. This disk is to be used for day to day monitoring of the
stability of XRF spectrometers.
2. Some variation may occur between monitor disks.
3. The disk is ground and polished optically flat so that it can be mounted precisely in
the XRF Instrument.
4. The flat surface of the disk should not be touched or handled in such a way that it
could be contaminated.

www.xrfscientific .com