ASSIGNMENT – 6

1. What is scan compression?

The scan compression technique which reduces the test time and tester memory in whole test
cost without loss in the test coverage
2. What are the inputs and outputs of scan compression?
Inputs:
 Scan inserted netlist
 Test procedure/do files
 Library
Outputs:
 Scan technique + EDT files
 Test procedure files
 Do files
 Set-up files
3. What is compression ratio, test time?

Compression ratio:
Scan compression ratio is a measurement of compression achieved by scan compression logic
Or
It is a ratio between number of internal scan chains to number of external scan channels
Test time:
The time which is required for loading, capture, and unloading of scan chain in compression
technique
4. What is the difference between compression mode and Bypass mode?

Sl. No Compression mode Bypass mode

1. In this mode we can reduce test Here it is not possible to reduce test
cost by reducing test time and test cost
data
2. This mode consists of EDT block This mode will not have EDT block
which comprises of decompressor
and compressor
3. In Compression mode it is difficult In Bypass mode it is easy to debug the
to debug the scan paths scan paths
4. Complexity is more in compression In Bypass mode complexity is less
mode
5. Draw the architecture of compression technique?

6.Define masking? Explain making with help of an example

Masking in compactor technique is simply adding AND gates to block the X propagation which
arises in scan compression technique
Consider the below example of masking

In the above example of making an ‘X’ in one scan cell is blocking the observation of corresponding cells
in other scan chains associated with the same channel. Masking mechanism allows an automatic selection
of individual scan chains, so that ‘X’ sources from other scan chain do not block observation
7. What is fault aliasing?
During fault diagnosis, the existence of equivalent faults, or faults that are not distinguished by
the test set applied to the circuit, can create ambiguity as to the location of a defect. This happens
if the circuit-under-test produces a response that matches the circuit response in the presence
of two faults in different locations of the circuit

In the above example, the output of compactor EX-OR gate is giving equivalent faults because of
that it is not possible to detect fault this is nothing but fault aliasing, but after connecting two
AND gates to both inputs EX-OR gate it is possible to detect fault
8. Draw the waveform of EDT?
9. What are the advantages and disadvantages of compression technique?
Advantages:

 Test cost can be reduced

 Creation of patterns for testability is easy
 Maximum chain length can be reduced
Disadvantages:

 Area overhead
 Testing will be more complex
 As the compression ratio increases, more patterns are needed to maintain the same
high fault coverage

10. For a number of flops=100k, external channels=4, internal chains=40, no of patterns=5000,

frequency= 100Mhz. Calculate compression ratio, Test time, maximum chain length?

Given data:
Number of flops: 100k
External channels: 4
Internal chains: 40
Number of patterns: 5000
Frequency: 100MHz

1. Compression ratio = Number of internal scan chains

Number of external scan channels
CR = 40/4 = 10X

2. MCL = Total number of flops / Total number of internal scan chain

MCL = 100k/40 = 2500

3. Test time = (Pattern count + 1) * MCL * Tp

Tp = 1/f
=1/100M
=10ns
Therefore, Test time = (5000+1) *2500 * 10ns
= 125.025ms