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Designa置jon: E2847 - 14

Standard ltst Method for

Caiib「ation and Accuracy Verification of Wideband lnfrared
Thermometers「

TTds §tandard lS issued under the暁d designatlOn E2847; the nllmber immed】ately followlng the desjgnation lndlCa'es the year of
Or!gmal adop血01・言n the case of re‘,lSion` 'he year of las置revisIOn. A number in parentheses indicates the year of 】ast reapproval A

SuPersCrip[ epsi】on (g)一一}djcates an ed-tOrlal change since ‘he last rcvI§ion or reapprova】.

1. Scope
2. Referenced Documents
l・1 Thjs test methOd covers electronic instmments intended
2.1 ASTM SIandaI擁:2
for measureme-1' of teInPerature by detecting the intensity of
E344 Teminology Relating to Thermometry and Hydrom-
thel’mal 「adiation excha一一ged between the subject of measu.e_
et「y
men書aild lhe scnsor.
E1256 “fesI Methods for Radiation Themometers (Sing】e
1・2 The devices covered by [】lis test method are l.窮rred to Waveband Type)
as jnfrared the】・mOmeterS in thjs document. E2758Guide for Selection and Use of Wideband, Low
Tさmperature Infrared Themometers
l.3 The infrared thermometers covered in this test method
a「e instruments that are i-1tended to measul.e temPeratureS
3・耽rminology
bcIow 1000OC, meaSurC thcrmal radiation ovcr a widc band-
3.1 D帥nitioJ” Qf 7Z棚串やec擁c ro 7yzis fta履けd:
Widlh in lhe in血cd roglOn’and are dirccトrending ln ‘empera-
3.1・1 ca句, bottom, ′十十he pol.tion of the cavity radjatjon
SOurCe foming the end of the cavity.
l"4 This guidc covers best practice in ca看ibrating infrared
3工i・i Di踊S高n-The cavity bottom is the primary area
lhcrmome‘ers・ It addresses conccms that will help lhe user
Where∴an jn」血ed 'hemome'er bejng calibrated measures
PCrfom more accurate calibralions. It also llrOVides a struc加e 重adiation.
如Calculation of uncertaintics∴and rcpo血g of calibralion
3.l.2 ca↓砂radiation JO肌e, ”-a COnCaVe Shal)ed geonト
l●esu11s to include uncer'桝in'y.
etry approximating a perfect b庇kbody of contro-1ed tempera-
1.5 De(ai】s on the design a11d construction of infrared
ture and defined emissivity used for calibration of radiation
Ihemometers are not covered in this test method. thermometers.
1.6 This tes白ne‘hod does not cover infrared thermometry 3・l・2.1 Disc′`諒on-A cavity radiation sourcc is a subset of

above iOOOOC. It does not address the use o白1a叶OWband thermal radialion sources.
jn缶ared theI.mO】TleterS Or i一一什al.ed themoIneterS that do not 3.l-2.2 Disf咽ion」hノbc a∴CaVi‘y radiation source of

indicate temperature directly. Praclical va】ue for calibra‘ion, at leas1 90 % oJ the fic温-Of-View
Of a radiatio掘themome{er is expected lo be incidcnl on the
].7 The ‘′a】ues stated in SI units are to be regarded as the
CaVity bot10m. In addi‘ion, the ratio of lhe lenglh of thc cavity
Sta一一dard・ The values given in parentheses are for informa(ion
VCrSL'S thc cavily diamctcr is cxpectcd lo be grcater than or
Only.
e甲al to 5:1.
l.8 77,e Val〃C,‘唖a‘ed扉′初pomd 4‘ni,'川re ’c, be rega7加。
3工3 cat句′ Walls', "-the inside surfaces of the concave
a"’'胸nda肋77’e一′a/胸given jn pa′のt/都e.’GI“7∽〃樹naIica/
Shape forming a cavity radiation source.
COnVer高めn▲‖O S’l l‘n涼Jhat c”叩,1短deケ妙手j痢mation only
and a手e ILOt COnSideied JtandaI宏 3.1.4 c鵬tO′ne7; 7トthe individual or institution to whom the

Ca】ibration or accuracy verificatiol- is being provided.

3. 1 ’5 distance-姐ice ’.atio (D・・S), ′トSee feld-ゲview.

i一一`一一l`ren一‘‘i ¥STM sli-Iid・一l-l` `lSl' i一一{ ¥STM webs順1"1一¥l asmll'r[ ll!

`iiili・i i ¥STM uslO一一一〇一Ser‘i、t.1I `=一、一し⊂(一aslnll)ili看lli lII棚.I/上i.一.Ih i l】7肱

'li`棚I・′′ /` `一,i一一一!iくl一一l`i一一l-11一.一I- 1くl‘一一il iII` `lil一一一一i-1dis 。`il〇一一一i-。“丸田一一一Il一、 ii・一E!- ・il

the ASTM Websitc

Copy「ight ③ ASTM Internat10nal’100 Ba「r Ha「bor Dnve・ PO Box C700' West Con§hohocken, PA 1942B-2959 United §ta(es

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3工6 q第ctive cII?短il,f所′ト1hc ralio o」’thc amount of
energy over a given spectral band exiting a lhcmal radiation
sourcc Io that predicted by Planck’s Law at a given tempera-
1ure.
3.l.7 feId-(申,ie男f?-a uSually circular, flat surface of a
measured ol事c=r。m Which the radiation lhermome(er re-
ccivcs radiation. (l)3
3. 1.7. 1 Di,ぐC〃S-rioIトMany handheld infrared themometers
manufacturers include distance-tO-Size ratio (D:S) in their
SPeCificalions. Distance-tO-Size ratio relates to lhe following
Physical situation: at a given distance (D), the infrared ther-
mometer measures a size (S) or diameter, and a certain
Pel.Centage Of the themal radiation recejved by the infrared
thermometer is wi皿n this size, Field-Of-View is a measure oJ
the property described by distance-tO-Size ratio. (賞)
3工8 fa印Iate ra(Iiation ,JO耽e, ′,-a P】al a∫ Surface of
contro]led temperature and de餌ed emissivity used for calibra-
tions of radiation thermometers.
3工8.1 Disc〃SSion-A flatplate radiation source is a subset
of thermal radiation sources.
3工9 〃移a鋤ri′1g JemperatlI移J“aItge, It-temPerature range
for which the radiation thermometer is designed. (l)
3.1.10 p研きe,肝-a PrOCeSS that uses adry gas to remove the
POSSibility of vapor on a measul.ing surface.
3工1 l I・a(7iaIにe JeI7岬era飯It,, I!-temPeraturC Of an ideal (Or
Perfect) blackbody radiator having thc same radiance over a
givcn spectral band as thaI of the surface being mcasured. (2)
3工1 2 tIlennal radiation J鋤“e, "-a geOmetrically shaped
Object of controlled lcmperalurc and defincd cmissivity uscd
for ca]ibra,tion t)f radialion lhermomcters.
3工13 L/.?age Ie′型era研e ,.a′lge, ′t-temPCrature range for
which a radiatio重l thermometer is designed to be utilized by the
end user.
4. Summary of Practice
4. 1 The practice consists of comparing the readout tempera-
ture of an infrared thermometer to the radiance temperature of
a radiation sollrCC. Thc radiancc tcmpcrature shall correspond
to the spcctrz11 range o=he in虹arcd thermometer under tcst・
4.2 The radiation source may be of two types. Idea11y, the
SOurCC Will be∴a CaVity source having an emissivily close Lo
unity (1.00). Howcver, becausc the field-Ofnyiew of somc
infrared thermometers is larger lhan typical blackbody cavily
aperturcs, a 】argc-arCa flatp】atc sourcc may bc used重br lhcsc
calibrations. In either case, the traceab獲e measuremenl o白he
radiance temperature of the source sha11 be known, along with
calculated uncertainties.
4.3 The radiance temperature of the §OurCe Shall be trace-
able lo a national metrology institute such as the National
Inslitute of Standards and Ttchnoiogy (NIST) in Gaithersburg,
Mary喜and or the National Research Cou重ICil (NRC) in Ottawa,
0】lt紬io, Canada.
一The ho購ace mⅢTlbel‘S in pa「entheses 「efe「 to a l st of 「efe「ences a=he end of
this standa「d.
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且2847 - 14
5. Significanee and Use
5.1 This guidc provides gujdc獲ines and basic test mclhods
for the accuracy verification of infrarcd themometers. I[
includes test seトup and calculation of uncertainlies. I白s
intendcd to provide the user with a consistent mcthod, Whilc
rcmaining Hexib]e in thc choice of ca]ibrzltjon equipmenl・ I白s
understood lha=he uncerlainty ob庇Lined depends in la∫ge Parl
upon the apparatus and instrumentation used' Therefore, Since
this guide is not prescriptive in approach, it provides deしailed
instruction in uncertainty evaluation to accommodaIe the
Variety of apparatus and instrumen†alion that Inay be em-
PIoyed.
5.2 This guide is血ended prima正ly for ca】ibra血g handhe]d
infrared thermometers, However, the techniques described jn
this guide may also be apprOPriate for ca]ibrating other classes
Of radiation the賞“Ⅲ10meterS. It may a】so be of he]p to those
Ca塙brating therma= magers.
5,3 This gujde s】)eCifies the necessary elements ofthe rellOrt
Of calibration 上br aLn inhared thermome書er, The requil‘ed
elements are intended as a commullication tool to help the end
user of theSe instruments make accurate me租surements. The
e賞ements also provide enough information. so tha=he resu]ts of
the calibration can be reproduced in a se arate laboratory,
6. Sources of Uncertainty
6. 1 Uncertainties are present in a11 ca量ibrations. Uncertain-
ties are underestimated whe】l their effects aLre underestimated
Or Omitted. The predominanl sou】●ceS Of uncertainty are de-
scribed i11 Section lO and are listed in Thble l and Tal)le X上賀
Of A叩end諒Ⅹ漢・
6.2 Typical】y, the most preva】ent sources of mcertainties in
this method of calibratio!l are: (]) emissivity estimatiol1 0f the
Calibration source, (2) size-Of-SOurCe Of the infrared
thermometer, (3) temperature grndients on the radiation source,
(4) improper alignme11t Of the infrared thermometer with
respect to the radiation soul’Ce, (5) caljbration temperature of
the radiation source, (6) ambient temperature and O reflected
temperature. The order of p!●eValence of these uncertalnties
may vary, depending on use of p「oper procedure and the type
OJ themal radiation sourcc used. Dcpendjng on lhe tcmpera-
ture oI the radiation source, the calibratio皿method of thc
radiation source. the oplical charactcristics of [he infrared
thcrmomcter and the detcctor and filter characteristics of the
TAB」E I Components of uncertajn重y
10.4,1
10.2、3. X2.4 (exam印e)
「0。急2, X2.5 (exampゆ
10。7.1
「0.8.1
109,1
￣「est Methods E1256
Append寂X3
X2.3
1014.1
10.15,2
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jn丑arcd山crmomcler, lhc∴COnlribulion o=hcsc uncertaintics
may changc significanlly in the overall uncertainty budgel.
7. Apparatus
7.1 7%emal RadiatioIきSol/ne.・
7工1 There are two different classes of therma】 l・adiation
sources which can be used for infrared thermo】neter Caljbra-
tions: a CaVity source and a flatplate source. Some so11rCeS may
be considel.ed a hybrid of both categories. Each of these
SOしIrCeS has advzlntageS and disadvanlilgeS. The cavjty source
provides∴a∴SOu一・Ce Of radiation血at has∴a mOre Predictable
en-issivity. However, the flatp】ate source can usually be made
less expensive]y, and ca一一be made with aL diameter large
enough tO Calibrate infrared the∫mOmeterS With ]ow dis[ance to
size ratios (D:S).
7.1.2 Idcally, Ihe sizc oJ lhe Ihermal radialion sourcc should
bc∴SPeCificd by the infrored thcrmometer manufacturer" In
many cases, this infomation may not be available・ In lhese
cases a field-Of-View Iest should be completed as discusscd in
E1256. The porlion of signal incidcnt on lhe in血ared themom-
etcr that does not comc from lhe source shou】d he accountcd
for in thc unccrtainty budgct.
7.1.3 Caviり, So初でe:
7工3.1 A cavity source can be constructed in several shapes
as shown in Fig・ 1. In general, a high length-tO-diameter ratio
(L:D) or radius-tO-diameter ralio (R:D) in the spherical case
丁D⊥
TD⊥
観v時面t吊れ副職豊d p霊抑留
同園 Sph e「e
FIG, 1 Cavity Shapes
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且2847 - 14
will resu虹n a smaller unccrtainty. A smaller conical angle @
Wi】1 also resu旧n a sma=er uncertainty.
7.1.3.2 The l。Cation of a reference or a controI probe, Or
both, and the thermal co重lductivity o白he cavity wa11s∴are
important considerations in cavity source construction. In
generaLl同reference or controI probe should be as close as
I-raCtical to the cente「 of the area where the infrared thermom-
eter wi11 typically measure, tyPically the cavity bottom. If tl-ere
is a scparation bctwecn thc Iocation of the reference probc and
the cavity surface, CaVity walls with a higher the賞mal c(允duc-
1ivity will resul白n a sma11er uncerlainly due to leInPerature
gradients in this region.
7.1.3.3 The walls of the cavity source can be treated in
severa] differcnt ways. A painted or ceramic surface wiIl
genera11y result in higher emissivity than an oxidized metal
surface. By ‘he same measure an OXidized metこ一I sしIrface wi】l
generally result in higher ehissivity than a non-OXidizcd metal
surface. In some cases亘may be imposstble to paln=he cavity
source surface. This is especially true at high temperatures.
7.1,3.4 The e価ective cmissivity ol thc cavity source shall be
calculated to detel・mine the radiance teml〕eratbre of the cavity.
Calculation of e鉦新ive emissivity is beyond the scope of this
slan a∫d. Detcrminalion of eifeclive emissivity can bc math-
ematically calculated or mOdeled.
7.1.4 Fla印Iate Sou′t;e・●
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7.1"4.1 A皿atplate source is∴a dcvicc that consisIs of a 7.3.1 The thermal radi加ion sourcc sh租ll be calibrzltCd wilh a

Painlcd circular or rcctangular plate. ’rhe cmissivity is like工y to transfer sねndard lraceable lo a na'ional metroIogical institutc
be lcss well dcfincd than with a cavity source. This can be SuCh as lhe Nalional Ins血Ic of Standards and耽chnoIogy

Partially overcomc by performing a radiometric tran垂r (SCe (NIST) or Nalional Research Council (NRC). If a refercnce
Scheme II in 7・3.7) to the flatplate sourcc. However, the 血crmometor (radiomctric or contact) is uscd during thc cali-
radiometric transfer sh。uld bc carried o山Wjth an jnst「ument bration o白he unit-under-1est, thjs serves as thc calibrali。n O「
OPCrating over a similar spcctral band as thc in血arcd thermom- thc radiation sourcc. In this casc. thc rcfercncc thcrmomcIcr
eter under test. Shall have a calibration traceable ↓o a mtional me‘rological
7工4.2 A cavity source is the preferred radiometric source institute.
for infrared themometer calibrations. Tlle CaVi†y source has
7.3.2 This calibration of the thermal radiation source may
two main advantages over a flatplate source. First’the cavity
take place in the calibration laboratory, Or it may be done by a
SOurCe has better defined emis§ivity and an emissivity much
third party calibralion 】aboratory. The ill↑erval o白hese checks
CIoser to unity due to i†s geometric shape. Second, along wi'h
is dete重・mined by the calib‘.a書ion labOratO賞・y. The d輔related to
the emissvity being c萱oser to unily, the eifects or re伸ected
the calibration interva=s paft of the calib】・ation mlCe11ainties
temperature are lessened. Tempe裏・ature unifomity on the flat-
for the infrared tilermOmete]. Caljbration.
P】ate source may be more of a concem as wel]. However, a
7.3.3 Regardless of whether a cavity soし一rCe O「 a鯛atplate
flatplate source has a main advantage ove賞・ a CaVity source. The
SOurCe is used, there are two approaches to calibrating the
temperature cont「O]led flatplate surface can be muc=arger
SOurCe: COntaCt Calibration (Hg. 3, Scheme J) and l.adiometric
than a tyl,ical cavity source opening, allowillg for much
CalibraLtion (Fig, 3, Scheme H). (3)
Sma]]el’D:S ratios (greater frold-Of-View).
7.3.4 In軸g. 3 the arrows show the path oftraceability t。 the
7.2 ApeI●他控:
International System of Units (SI) thr。ugh a national metro-
7.2.1 An additiona] ape11ure may nOt be needed for a】】
logica] institute (NMl). The reference radiation source is the
Ca]ibrations. An ape血re js typical】y used to contro] scatter. If
Cavity source or bIackb。dy s。urCe uSed to ca皿rate the infrared
used, the aperture shou】d be temperature-COntrO】led or reflec-
thcrmomctcr. In Schcmc I, it is shown that the △T mcasurc-
tive. An aperture shouId be used if recommended by the mcnt md the emissivity correction shz111 be addcd inlo thc
infrared thermometer mamlfacturcr. If an aperture is uscd for
lemperature calculation. The △T mcasuremen白s bascd on the
Calibrafron・ this information should bc staled in [he rcporしof
di餓3renCe in temperalurc betwecn thc refercnce thcmomcter
Calibration. The inIormation lhal shall be included is the
and lhc cavity walls. Thc emissivity corrcction is based on thc
aperlure dis離しnCe, lhc aperture size, and thc measuring dis-
radiation sourcc nol having 'he same cmissivily as the infrarcd
1ance. A possib看e configuration for apcr‘ure use is shown in ng.
thcmomctcr’s cmissivity sctting. Thc symboI加rcfers to thc
2. WaVeleng瓜and bandwid山o† the lrans」tr radiation them0m_
7.2.2 In蹄基・ 2, dap∫ is thc apcrlure distancc. Thc mcasuring
eter and t重le in紐ared thermometer,
distance is shOWn by dm.ar
7.3,5 In either scheme, the transI料slandard sha看l be trace-
7.3 7tⅥ明雄?r StandaId.・ able to a national metrologica】 institute.

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Å畔血鵬 囲圏
FIG, 2 Use of an Aperture fo「 a Caiib「ation

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刷G, 3 Caiib「ation Schemes I and =
7.3.6 In Scheme I, a COl11act lhermometer is used as the
transfer standard. The emissivity uncerlainties become of
greater concem. Tllis is especia11y the case when using a
flatI)1ate source.
7.3.7 In Scheme II, a radiatioll ther】T]Ometer is used as the
transfe]‘ Staildard. ln this scheme, the emissivity and heat
exchangeしInCertainties are greatly reduced. This is especial漢y
Slgni克can白n the czISe Or uSing il Hatpiate souI.Ce. the radiation
ther】mmeter Should operate over a similar speCtral range as the
infrared thermometer to be calibrated. Any diferences in
SPeCt】●al range will resu]t in additiona看 uncertaintes, For
instance, ifthe radiation source is calib!・ated with an 8 to 」4 Hm
radiation lhermometer, and an il血ared thermometel・ With a 7 to
14 Hm SPCCtral rcsponsc is bcing calibrzltCd, CVCn this differ-
CnCe in bandwidlh shall bc zICCOunled for in thc uncerlaLinty
budgct, Sincc thc radiancc tcmperz血re (dりC mOStly lo the
e節eclive emissivily) will bc di佃erent.
7.4 An初e所7bmpera肋e 77!eI77鋤neter:
7"4.l ′rhe anbien1 1cmperature should be moni(OrCd dしIring
thc ca]ibration to cnsurc thal it is within thc laboratory’s limits.
This should be done using zI CZllibrated lhermomeler. At a
minimum, the labora†ory’s ambien=emperature limits should
be recorded on the report of ca]ibration.
7.5 Mo肋ting Devi(、e:
7.5.1 The in什ared the「mometer may be moullted on a巾pod
Or Similar 】TIOunting fixture. Moullting may not be required in
書he case or a mひnual】y he】d ca】ibralioIl. In this case the hand is
the 】nOunting device.
7.6 Dis/a′!Ce Me(聞r高og Device:
7.6.】 The distance between the radiation source∴and the
infrared thermometer is a critical factor in calibration. This
distance should be eithel’meaSul’ed dul’jng the in打ared ther-
momele}● calibration or sel by fixturing. This measurmg dis-
tance along with the target size sha】l be recorded on the report
of calibra章ion.
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巨2847 - 14
7.7 CalibratioIL’Below /I夢e Del牛Point oγ FIDSt-Poi所:
7.7.1 For calibralions where Ihe set-POint of lhe radiation
SOurCe is below the dew or frost pomt, it may be nccessary lo
Pllrge thre紬ea arOund lhc source wilh a dry gas such as dried
nitrogen or dried air to prevent ice buildup. It may be desirab宣e
to use a vacuum ft)r this purpo§C. It is beyond the sc()Pe O「this
Sしandard to rccommcnd a spccific dcsign or mcthod for such a
purge・
8. Preparation o書ApparatuS          .
8. 1 ”坊働t'd 772er7nOmeter.・
8.1.1 The infrared tllermOmeter Shou賞d be al】owed to reach
ambient temperature before any 】TleaSurementS are made. The
amount oftime may be specified by the manufacturer. If this is
not the case, eXPeI’imentatioll may need to be done to deter-
mi-1e the proper lime for血e device 10 1hermally stabilize. This
unce11ainty shOuld be accounted for in the ambient temperature
SeCtion of the uncertainty budget.
8.l.2 If a ]ens cleaning is required, it shall be performed
fo】lowing the mamfacture「’s guide】ines.
8.2 Radlation So〃JCe.・
8.2.1 “rhe radiation sollrCC∴Should bc set lo the dcsircd
Calibra(ion tcmpera冊C and allowed to stabili2/e∴a=hc sct
Ca量ibralion temperaturc. Any e鯖ecIs due to se肌ing time should
be accoしmted for in lhc uncerlain(y budget.
8.2.2 If a purge device i§ uSCd wilh the radiation source for
the calibra面on, it should he in place befo「e thc radiali。n SOurCe
is slabiIi乙ed.
9. Proccdurc
9. 1 Ca/ibmtion P41in/,r..
9.1.1 The number of calibration po】ntS uSed during a ca喜i-
bration should be determined by the customer. I川le CuStOmer
does not know what l-Oints to use for a calibration, a reCOm-
mendatio旧Tlay he made. For an infrared thermometer used
OVer a n劃TOW range Of temperature, One POi】lt may be enough.
Fo置・ an infrared th賓mometer used over a wide range of
temperature, a minimum of血ree calibration poiIltS Should be
Chosen. These points should represent at least the millimum,
maximum and midpoint temperature of the infrared thermom-
eter usage teml)era冊e range. The llSage range may nOt be the
Same flS thc mcasurillg temPeraturC rangC Of thc infrarcd
lhermometer.
9工2 Thc order of calibration points may bc∴arbilrary.
However, it is imporlant lo note thal hcating of the infrared
thermomeler by the calibralion source may cause a condilion
Similar to thermal shock. This is especially true when going
from a ca!ibration sourcc at a higher tcmperature lo a caljbr紅
tion source al a lower lemperature. Thus, it is besI practice lo
Calibrate at lower lemperature points before higher temPerature
pO宣n書S・
9.2 S†eps 9.3 to 9.6 should be repeated for each calibration
point.
9.3 R坊ecte(1 7わやeraれ〃℃:
9.3.1 If required, Se=he infrared themometeris reJ]ecled
temperature setting to the radiation source’s reflected tempera-
ture. This setting should represen=he temperature of t】le
ambient surroundings facing the themal radiation source. The
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 定職
rcflacしed lempcra血C SClting may bc called background tem-
PCraturC Or ambien=emperature on some deviccs. Many
in血ed thermometcrs do not have a manual rcflcctod lempera-
1ure sc血g. On these devices・ renected temperature is com-
Pen§ated for interna量ly.
9.4 E涼s∫ivih† Se,fing."
9.4・1 Thc cmissivity sctting o」“ thc inharcd lhemOmCtCr
Should match the eInissivity or emissivity setting of the
radiation source.
9.4"2 Some inhared thermometers have a fixed emissivity
Setting alld some radiation sources have a fixed emi§Sivity. In
a ca§e Where both settings are fixed and are not equai, a
mathematical a勘ustment sha11 be made. An examp賞e of such an
adiustme賞1t Can be found in X2.3.
9.4.3 The Preferred method is to adjust the infrared ther_
momete】・ emissivity setting to the radiatio一一SOurCe・s emissivjty.
Jf the radiation source receives a contact ca-ibration (Fjg. 3,
Scheme I), thi§ emissivity wou]d be the emissivity of the
Surface. 1f the radjation source receives a radiometric caHbra_
ti{)n (吋3’Scheme II)' t]一e emjssivi書y wouId be the emjssivity
Setting of the transfer standard. If t】le emissivjty settjng of the
i血ared thermomete】・ camot be set exactly to the e餌ective
emissivity of the themal 】・adiation source言hen a correction
may be made as is shown jn X2.3.
9・5 AligI硯ent.・
9.5.1 P均)aI・a子i個.・
9"5.1"1 If an addi-iona】 apertwre is used for the calibration,
ensure that the aperture is properly cmplaccd at血o specified
distance a§ Shown in rig. 2. I白he aperture is tempera[ure-
COn(rolled’enSure tha=he apcrture is wilhin its specified
(emr)eratUrC !imi(S.
9.5.1.2 In Fig. 4, thc mcasuring distancc is dcsignated by
`dJ The `Ⅹ, axis refers to the horizonta萱direction; the ・Y‘ axis
refers to the vertical direction; and the ・Z・ axis refers to the
direction coming out of the cavity or触pIate. In the case of
the flatp看ate・ the `Z, axis i§ a]ways norma量to the flatplate
Surface.
9.5.1.3 If a fixture is being used to hold the i血ared
thermometer for calibration, mOun=he i重出ared themOmeter.
9.5工4 If thc inhared thermomcter calibralion mounting is
manuaらhoid 1he in什ared lhemometer jn front o川e radialjon
SOurCC at thc spccificd distancc.
9.5工5 Ensure lhat thc in血red thcrmomcter is roughly
level and norma=o the target sur∫acc" Ideal量y, 1he ang]e
bctween the normal ‘o a触plate source and 'hc line o∫ sigh書of
thc inhared thermomcter sh。u]d be ]ess than 5O. When using a
CaVity source・ thc anglc of incidence should bc small cnongh to
allow fo=he in缶ared ‘hermometer,s field-Of-View to see lhe
unifom part of the cavity bottom.
9.5工6 If thc inharcd thermometer is cquipped with a lens
CaP・ rCmOVC the 」ens cap before measuring"
9・5-2 `Z’Axi・7 Alignn花nt:
9.5.2.1 Set tl「e distance from the sou】・Ce uSing the measuring
device. The distance may be measured from the ape11ure. from
the cavity source 。Penjng, Or from the radiation soui・Ce Surface.
No丁T} 」】n most cases・ it may no' be good practiee to touch the
radjation∴SOurCC肌rface. Jn such cases` an a]ternate point of known
djstallCe from the surface may be used for thc djstance meas調rement.
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書脅章魚農遺物守 を
代書1聾喋墓
一兎狐疑‡箪‡羊蹄悠揚
且2847 - 14
9.5.3 `X’- a融`Y,-Axe・, Alig刷剛t.・
9.5.3・1 A】ignment in the `Ⅹ, and ・Y’djrections may be done
using lasers provided with the皿ared thermometel・ or it may
be done by maximizing the signa量・ Use of `aser polnterS is a
quicker method・ bu=ile量aser r'O血er may not represent the
OPtical centcr of thc皿arcd thcmomctcr. A givcn infrarcd
thcrmometcr may have some othcr op‘ical alignmenl device
SuCh as lighトen血ing diodes tha' may be used as we11.
M狐inlizing血e slgnal is the preferred mclhod.
9・5・3.2 If using 】aser a】ignmel-t、 Cente「 †he 】aLSer On the
Center Of thc radiation sourcc.
9.5.3"3 1f maximizing the signa], for calibration pojnts
above ambient・ the posjtion of the infrared themo】neter Sha】I
be a軸sted vertica]ly and ho「izontally to produce 】maXimum
temperature whj】e aiso maintainjng t重一e ]jne of sight perpen-
dicular to the∴SOurCe. Thjs is皿stratcd in鴫. 5. In th。
CXanPle in Fig. 5・ the maximum tempcrature obscrved on lhe
infrared thermomeler.s readou白s 300.3OC. For ca]ibration
POints below ambient‘ the ‘emPera山rc shall be minimizcd.
9.5.3.4 ln cases whe「e the sjze o白he radiation source is
much largcr than [hc ficld-Of-Vicw of thc radiation
thcmometer, the ‘emperature may plalcau instead of rcach王ng
a simple maximum or minimum. In such cases, fl dcflncd
Change in lempe「ature should bc obscrved whi宣c moving皿c
infrared themometer a】ong an axis. Then lhc inhared ther-
mometer should be cenlered midway betwecn thcse 'wo points.
This shaI量be done for both axes. This is ilIustra‘cd in I帝6. In
this case, the in血ed lherlnOmeter is move即rom Side lo side.
A plateau in the temperature readout of 300.3OC is observed. In
this case the user shal! observe a drop-O航=he temperature
readout of 3"OOC. This means the user should be Iooking for a
reading of 297.3OC. Points ・A’and ・B, indicate where this
drop-Off occurs. Poin' `C・ represents the midi)O血of ・A, and
`B’.
9.5.3.5 The defined change shou-d be at least l % of the
infrared thermometer p】ateau reading in OC or l OC, WhiclleVer
is greater. For exampIe,机he infrared [hermometer readou白s
120.OOC‘ †he de血ed change shou】d be a=eas=.2OC. If the
in丑ared lhermomeler readou=s 50.OOC’the delined chalge
Should be a=eas=.OOC.
9.6 Mea踊Im1eI証
9.6.1 Perform measurements accordjng to the 】nallufact叶
er’s procedures・ The measuren「en=ime shou]d be a period
Sjgnifcantly longer than the infrared thermometer,s response
tjme. It may be necessary to take more than one measurement
to dctcrminc rcpeatabi航y and rcdl!Ce unCCrtainty duc to noisc.
Rccord the measured ‘cmperalure.
9・7 A4i踊雁男t:
9.7.1 In some cases the adjuslment may be done by labora-
tory personne】・ This shall only be done w皿the perndssion of
the customer. Any measurement before the calibration shouId
be jnc]uded jn the TePOrt Of calibration. Consu臣he infrared
thermomete自nanufacturer for the adiustmeI叫rocedure.
9.7.2 After any aヰiustmcn巾e inhared thcrmomctcr a旬usト
ment should be verified a[ all calibration I)Oinls.
9.7・3 In cases where an adjustment camot be done, a tabI。
Of correclions at each ca!ibration point should be provided` to
the customer.
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 左紗 岳2847 _ 14

閣上諒 d ⊥-諒
喜櫨冊e「肌o叩eくe「

Cavfty Me謡uring Dis鳴nce

重鼠冊を「州o問合鳴r
闇臆臆臆 d --÷融
軸t Pねte Measu「ing Distance
FiG・ 4 Caiibration Setup Showing Measuring Devices

10. Measurement Uncertainty

ー ・ I i ・ ⋮ ⋮ ⋮ I ・ - - ・ ⋮ 舶

lO,1 Overvie†t’:

10工1 While il is beyond the scope ol“ this documen=o

PrOVide tests and metllOds to determine each elelnent Of the

uncer[ain置y budget, the fomat shown here should provide a

basic hamework for uncertainty budget calculations. Any

Calcu]ations of measurement unce巾ainty shouid ft刑ow Iocal

uncertainty budget calcし看lation guidelines such as the “U.S.

Guide to the Expression of Uncertalnty in Measurement’’or t】le

``Eva血餌ion of Measurement Data - Guide,tO the Expressjon of

Uncertainty in Measurement.”

10」.2 The uncertainties as presented in this guide are listed

Movき脈船台r弼O船賃隠「同数腱的Sid合
調調煩e部轡X涌u購晦叩e融U唯r闇d鳴 in rI「乙刷c重.
ほの腿erv鈎
FiG. 5 X.Y Alignment in the Maximizing Case 10.2 Mea鋤reme所Eq〃ation:

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 4齢
10.2.1 The measuremen' equation is shown in Eq ]. Uncer-
ta血y in lhe calibratjoI1 1emperature is accounted for by
evaluating Ts. The uncertainty in reflecled ambient radiation is
accounlcd for by evalualing by S(Tw). The e皿ects oI uncer-
tainty jn source cInissivily arc accoun‘cd for by cvaluating Es.
暗,・α') = S(訂吉事(T"′) - S(T。)]十㌔串s(Tぐ)
-S(Tw)]             (!)
whel・e:
S(7J = jmp】emeiltation of the Sakuma-Hattori Eql-ation
曾▲S  = emissivily o白he measured surface
争楯T = instrument emissivity setting
7L硯S = infrared thermOmeter readou"empera†ure
rs  = eXPeCted radiation temperature of the therma] ra-
diation sollrCe
Tw  = re鯖ected radiation temperature (walls)
事I  二dclecIor lcmperature
」 O.2.2 Uncertainty due to Reflected Tbmperature"
10.2.2.1 Tb evaluate for reflec'ed tcmperature uncertainty,
Eq =s di節erentiated to get Eq 2, This number is then used in
Eq 3 to ge=he temPerature meaSurement uncertainty due to
reflected tempe農・ature. An example of this ca】cu]ation is shown
in X2,5.
鵠幸吉 (2)
U証言吉葉(7・w)二鵠語り(Tw) (3)
10.2.3 Uncertainty due to Emissivity.
10.2.3"l Tb evaluate for source emissivjty uncertainty, Eq l
js di餌ercntiatcd 10 ge一】 q 4. This mmber is thcn uscd in t沌5
to get the uncertainty due to一・eflected temPerature. An example
Of this calculation is shown in X2.4.
聖二士s(臣S剛 (4)
.時点」専一
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‥、∵章∵y- ..言
E2847 _ 14
U・侶二葉u(⊂)9)二島妬) (
∂T
l O.3 So冊でe Related UncertaiI証e一,.・
10・3.1 The uncertainties lisled i宣=O.4 - 10.9 relate to t】
thermal radiation source.
10.4 Calib′一a’ion 7初野eratl催:
10.4.1 The calibrati。n temPerature OI` the∴SOurCe is t】
temperature of the sol]rCe aS indicated by the source,s readoI
In Scheme I・ this is the一一nCertainty of the temperature reado
as determined by contact traceability. In Scheme II, this is t!
uncertainty of the radiance temperature readout as determing
by radjomet「jc traceabiIity.
]0.5 So初でe E′n短il句′:
10.;.1 Ca/ibration Scheme / - Fla印Iate S鋤’re-In lh
CaSe, the e血ssivity of the surface is detemi11ed by some 。thl
method such as Fourier-tranSform infrared or radiometr
COmParison’Tbst methods to de↑ermine eInissivity are ou[linc
in Guide E2758. Since the emissivi‘y for a specific surfa(
COating may vary widely, thjs can cause a -arge amo…一=
Variance in the emissivity va】ue and ‘he res山ing ul-Certainl
]0.5.2 CaIibmtio′裏Sche〃2C l 「 Cavitl・ S個性e-ln a Ca重jbr(
tion Schcmc I wjth a cavity sourcc, thc cmissivity should t
detem上ned by either modcling・ Ol・ by ‘he cmjssivity uncc
tainly pro¥′idcd by lhe source,s mamIacturcr,
10.5・3 CflIibratir,n Scheme /l「Fo】・ Calibration Scheme I
the emissivity may still vary over time or be dependent o
SPeCt!・aI bandwidth. However, these uncel.tainties are reduce
Significantly compared to those in Scheme I.
10.6 R甥ected AInbient RadiatioI!:
10.6.1 Reflected radiation is sometimes referred to as back
g賞・Ound radiation. The cause of its e飾ect js sometimes referre
to as background temperature. Tl-is ul-Certalnty is muc】l mOr
Of a concem when ca]ibrating instmments with a flat可at
SOurCe than jt js with a cavjty source' It is especia一]y a concer
When measu血g obiects zl=emperatures below ambjent. T
Calculate this ullCertai】1ty, utiIize Eq 2 a融3.
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10.7 Sの初Ce /1eat E抑/硯ge:
10.7.1 Sourcc hcal cxchange is ‘he uncertain‘y of the
di鮒erence belween the∴SOurCe’s controI sensor or readout
lcmpcra川re and thc source’s aclual surface lempera'ure. This
unccr融nly is due to hcat flow betwcen the scnsor localion and
the sou「cc’s surface. I白hc flatplatc s(冊CC is calihrated wjth a
radiometrically, this uncerLainty is minimi∠ed. However, there
Stil=s some uncerlainty since the heat flow may be di節erent
from time to lime.
10.8 AInbient Cひn(l諦。n品
1 0.8.1 This uncertainty Iargely accounts fo「 variances due to
COI重VeCtうon, although olher Jinors may Play a role. For a
flatplate source, the effects of convection are minimal. For a
CaVity source, the e鮒ects of convection should be even less.
However言f a soしIrCe Of fo「ced air is cIose to t】le SOul・Ce, this
uncertainty may be more of an issue. Essentia11y, When a forced
air source is placed cIose to the surface, the unifo「mjty pattem
Of the肌rface may be changed. This may be a very d摘cult
uncertainty to determjl-e. The conditions of air fl‘)W may have
to be exaggerated to get a true idea of this effect.
10.9 So蹄でe UI所)7γ扉か:           、
10.9. 1 Source皿iformity lS unCertall-ty due to temperature
non-homogcncily on thc calibr租lor su可elCe. Sincc an in血ared
lhermOmelcr avcragc=he lcmperalures wi皿n its field-Of-
Vicw, this uneerlainly lS Calculatcd by considcring how much
lhc皿iIormity will czluSe fl differencc in measurcment between
a mcasuremcnt of a small spol at the ccnler of lhe source and
a largcr spot c。rreSPOnding lo the in什arcd lhemometcr under
tcst.
10. 10 h坊vaIt?d T7IemOI"eter Relaled軌ceJ.taindes:
10.10.1 Thc linCCrtaintics listcd in 10.1l - 10.15 re重こしte tO
the in正ared山emomeler under lesl.
10.1 1 Size-〆二Sou7℃e匂解でt:
10"11.1 Size-O短く)urCe emect unccrlainty is caused by z111y
l.adjation meaS↓lred from lhe source or its surroundings not
acco州ted for by Ihe source uniformi[y uncertainty in lO.9.
Most of the e鯖ects of the size-Ofrsource effect unce-1ainty are
CauSed by optical scatter. This uncertainty will be large if the
SOu「Ce diameter is smal]er lhan the fieId-Of-View of the infra「ed
th crm omctcl..
10"12 Ambie所7Z,l甲,erat"re:
10.12.1 Ambiellt temPel●ature is∴an unCertainty related to
how well lhe delecIor temper餌ure∴aCCOunls for changes in
reflected ilmbien=emI)eratしIre. Detector temperature can be
Calculated by a method shown in Ap])endix X3. The infrared
thermometer under test should be auowed enough time to reach
a steady-State houslng temPe「ature. This is especially critical
after the infrared thermometer is introdllCed into a new
environmcnl・ The clltcIs ‘)f anbien=cmpcr机しIrC and chilngeS
in detector tcmpcralure on radiomclric meastIrementS Should
bc dctemined for cach spccifro modcI oI infrarcd thermometer
under lesし
1 0. 13 AtIm華heric Ab.?OJption:
10.」3.1 The unce】1ainties ]’e]ated to atmospheric abso].Ption
are typiealiy ve「y low. Neverthe】ess, they should be accounted
・主蒔浩二。
.電着鼻.霊 草玉子、
操車や子羊㌻∴ 、
読(へ 自信、〔音手短言霊
且2847 - 14
for. Thc calcしIlations outlined in this stilndard ilrC bascd on zI
B初t?a〃 i,寝e〃裏ational des poid9 Ct meSl聴g (BIPM) document.
(4)
10.13.2 For measuring dislances grealer than l m, a mOdc]
Of slandard atmosphcre∴Shall be consulted. For meas皿ng
djslances of l m (一l. less, lhe expanded皿ccr(alnty (k = 2) is
norma11y O.0006.
10"13.3 ’塙blじX2.] in X2.6 giYeS C租lculaled values 」t)r lhe
atmospheric abso町tion uncertainties at various temperatures.
This table is specific to the 8 to 14甲n SPeCtral band. For
Calculations for other spectral bands, COnSult X2.6.
1 0車上N。i∫e.・
]0.14.1 Noise is unwanted signal experienced by the in缶o-
red thermomeleris measuremenl system. The o重・igin o」’the
noise can be froln both electrical and physical sources. This
uncertainty call be taken什om the infrared thermoⅡleter’s
SPeCifications or detemined by experimentation.
10. 15 Di岬Ial, Re砂l蹄ion:
10.15.1 This is the contribl葛tion due to quantization error of
the infrared thermometer readout.
10.15.2 Tt) Calculate display resoIution un6e】・tainty, take the
dispIay resolution and divide by two. This result has∴Zl
rectangular distribution. Use standard practice to determine the
expanded uncertaiilty Of a rectallgula〇・ distribution. For
example, if an infrared thermometer has a display reso皿ion 。f
O.1OC, then lhc rectangular dislribl】tion is ±0.05OC and the
expanded uncerlainty is O.058OC.
10-16 Sample Uncer/ain砂B職dget.・
10.16.1 A sanple uncertalnly budgct for an infrared thcr-
mometer calibration is shown in 1tlble X」工This struc加re in
no mamcr reprcsents an unccllain(y budgct for a speci範c
model ol’inhared山emOmeler or tl SPeCi」ic calibration source.
Note that all uncertainties listed in this tab】e are expaI〕ded
uncertainties (k = 2).
重l. Report p
=.1 Repor=he calibration resullS in any convcnient form.
This may be z=able of values of nominal tempcrature with the
temperature rcadout of the in柾a∫ed lhermomcter at each of the
Calibration poinls.
11.2 Thc report should includc at a minimum a titlc, a
皿ique idenlification oJ the item calibrated, a reCOrd oI the
PerSOn Who performed the calibration, the date of calibration.
the source temperature (Or the corrected source tempera加re)
VerSuS infrared thermometer readoul temperature, the measur-
ing distance, the emissivity setting of the in紅ored thermometer,
the diameter of the source, †he ambient tempera†ure, a descrip-
tion o」● the aperlure inc】uding aperture dislance (許しISed), and
the measurement unCertainties. The infrared thermOmeter read-
1ng VerSしlS COITeCted source temperature is best represented in
a table. Supp】ementary jnformation, illCludi!1g a COnCise de-
SCription of the ca】ibration method, a list of the reference
instruments used, a Statement regarding the tl“aceahility o=he
CaIibration, a reference to or a description of theしInCertainty
budget, and fl∴Citation of this guide, 】nay be requested by
1l.3 A料nlPle report is inc】uded in Appendix X4.
いさo請けO則0唯職場鵬0しo6i4
革Y物S.A.S.
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C○○葛T教OLADA
 の 良2847 - 14

12. Recordkeeping Requirements Olherwisc known as an unccrlainly budgct言s uscd. This

12.1 A rccord system of all calibrations sha11 be kept. This uncertainty evaluation shaH follow the method shown in thc

SyStem Shall conlain su鮎cient inIormation to permit rcgcnera-

Measurement Uncertainty scc(ion.
tion o白he certificate, however naned, and sha11 includc thc
14. Keywords
idcntity of personnel invoIved in prcparalion and calibralion.
]4・] accuracy vcrincations; background radia'ions; biack-
12.2 Calibratjon records shal】 bc relalncd for thc pcriod of
bodics; Calibralions: CaVily radiatjon sourccs; distancc to sizc
time de血ned by lhe labora10ry’s qualily syslem.
ratios; emissivities;允elds-Or-View; lIatplate radiation sources;

handheld themometers: infrared; infrared thermometers; ra-

13. Precision and Bias
13.1 Due to the varying nature ofthe equipmellt uSed in this
lest me山od, nO Statemen† can be made about the precisioll and
bias or thjs test method. Instead‘ al裏eSlimate of uncertall-ty,
diation therInOmeterS; reflected radiations; Size-OfBource ef-
fects; SPOt Sizes; temPerature meaSurementS; ↑hermal imagers;
thermal radiation sources; thermometries; tranSfer standards;
uncertai ntjes

APPENDIXES

(Nomlandatory Information)

Ⅹ1. SAMPL曲UNCERTA萱NTY BUDG鱒T

XL1

Unce鵬in母 ∪(OOC)   ∪( 1 00OC)  ∪(420OC〉   ∪(80OOC)

Source
叫巧い山里豊 明呪い帰⋮

B B A B B A一 B A B A A

CaIibralion Temperature
Soll「Ce Emissivity
Reflected Ambienl Radiation
Sou「Ce Heat Exchange
Ambien書Conditi(〕nS
Source Unito「mity
Inf「a「ed Thermometer
Size-OトSource E償∈rot
Ambien( Tempera血re
Atmospherie Absorptton
Noise
D胆0∩ ∴∴∴∴∴∴∴∴∴
Comb]ned Expanded Uncertalnty (k=2)

X2. UNCERTAINTY CALCULATION

Ⅹ2.1 Ceneral
X
2        2
2         ︹う

X2.1.1 Videband il誼ared t】lermOmeterS meaSure radjation

in a spec講c e]ectromzlgnelic spectral band. UsiI】g Planck,s

Law to mode] the eifects of wideband rad王atiol- is compiicated.

布￣五
X

A 】Tlethod to perfom this calculation is presented here. (5) 塁[s(T)]Z詰叩(嘉)

X2.2 Sakuma"Hattori IIquation (Planckian Form) X2.2.2 In Eq X2工E‘l X2.2, and Eq X2.3, C2 is a physicaI
COnStant. A, B, and C are consta獲ltS derived from the infrared
Ⅹ2'2.1 The Sakuma-Hattori Equation is shown in Eq X2工
thermometer’s relationship between signa圧eceived and tem-
The i-1VerSe Sakuma-Hattori is shown in Eq X2.2. The Iうrst

derivative of the Sakuma輸Hattori is shown in Eq X2.3. W】len PeraturC. A and B a重C dcrivcd from thc in血arcd thcrmomctcl.,s

doing the mathematics using t】leSe equatふons, Kelvins shaI! be SPeCtral rcsponsc. C is a scalar bascd on infrarc(=hemomeler
used for temperature rather than OC. gain and can bc considered as unity Ior this analysjs. Calcula-
tion for these constants is shown in Eq X2.4, Eq X2"6, Ijq X2ふ

(Ⅹ2.1) and Eq X2.7. Thc vzllue for △九is lhe inhared themomcter,s

bandwid(h. Thc valuc for ^《言s lhe inharcd lhermomeler,s

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CCntCr WaVCIcnglh buscd on zI SimpIc avcr!lgC Ol’thc in正arcd X2.4 Emissivity Uncertainty
lhcrmometcr’s high and low bandwidth limits.
X2.4.1 For this calculalion, Eq 4 and liq 5 are used.

A二年一誌) (X2・4) X2.4.2 For this example, an 8 1o 14 Hm infrared thcrmom-

B=詳  (X2・5)
C二〇.0          (X2.6)
C2二14387.752I」n諸      (X2,7)
eler is bcing calibraled. The true temperature of thc source (Ts)
is 200.00OC. The cmissivi[y se=ing of the infrared thermometer
(g皿) is O.95. Thc nominal emissivity o白hc surfacc (6sし」RT.) is
O.95 wilh an expanded uncenainly or U(Es) = 0.02. The
reflected lemperature (TREFI_) is 23OC.

X2.2.3 Fo「 example, the 8 to 14四一SPeCtral band is X2.4.3 Using Tat}1c X2‘l, S(Ts) = 0.0461160 and S打w) =

COnSidered. For血e 8 to 14甲m spectral band,品=】 l Hm and 0.0076966. These values are used in Eq 4 to give the value in
△九二6 tJm. Using X2.4 and X2.5, A=9’364 Hm and Bこ]78.4

し皿lK. ム

X2.2"4 1宅間e X2.] shows computed values for the 8 to 14 豊=尋(Tb・) - S(Tw)巨万封04剛- ・)・。07中
二0・0404415               (Ⅹ2.量0)

X2.4.4 This value is used in Eq 5 with the value for

TA日LE X2・1 Sakuma-Hattori CaicuIations fo「 the 8 to 14いm
∂S(Tm。as)l卵= 0.000305968 K-1 obtained舟om Tbblc X2.l.
Specl「ai Band
This calculates the expanded uncertainty ln temlS Of temPera-
ture as shown in Eq X2.11.
∂ S(T仰個)

∂⊂s 事丁′ 、  0・0404415
U。 ( T,剛)
布U周= 0.脚30う968
〔)T

(X2.11)
X2.4.5 A graphical representation of a similar examp]e is
Shown in Fig, X2.=n with TS ranging froln -500C to lOOOOC.
In †his example, U(gs) = 0.0工

X2.5 Re鮒ected TchI)erature Uncertainty

X2.5.1 Tb calculate the皿certainty due to reflected tem-

Perature uSe Eq 2 and Eq 3.

Hm SPeCtral ba-1d for S(T) and ∂S/飢“∴I「hc computcd values are
bascd on the paramelers discusse〔l in X2.2.3. X2.5・2 In this example, the emissivity setting (畿1NS・rR) ofthe

8 to 14 Hm infrared thermometer is correctly set to O.95. The

X2・3 Infrared Therm。n-eter With a Fixed Emissivity Set_ true temperatしIre OLthe soしlrCe (Ts) is OOC, T】le infrared
ting thermometer calculates the reflected temperature (TD) at 23OC.
X2.3.1 Il● an 8 lo 14 Hm inrrared lhermomeler with a fixed The reflected temperature unc帥ainty is U(Tw) = 3 K.

emissivity setling is used with a source at a different emissivity, X2.5.3 Use Eq 2 to calcu】ate ∂S(T,。一。fiS) I ∂S(Tw) as is shown
Eq l can be rewrilten as Eq X2.8. This assumesTD =Tw as the in Eq X2.12.
ambient temperature uncertain†y accoしmtS for lhis.
f)S(T鵬)_1-〔、 ]-0・95
○ ○こ「手痛-二0・052632 (X2・重2)
s(T,,吉S陣笠[S(T出Tw)] (X2.8) ∂S(T,-,) ￣ ⊂.柄

Ⅹ2.5.4 Use the result obtaiIled in Eq X2.12 with Eq 3. From

X2.3.2 As an example, an inf「a「ed thel・mOmeter With a fixed

emissivily se叫ng (t:冊,,) of O,95 is calibraIed. The 】・adialion

SOurCe’s emissiviIy (t;s) is O.97. The source’s true temperature
諾器g鵜島器霊蕊義認悪霊
皿certalnty as is showh Eq X2.1 3.
(Ts) is lOO.00OC. The reflecled temperature (Tw) is 23.00C.
X2.3.3 Using T拙e X2.1 S(Ts) = 0.0202920 aLnd S(Tw) =
0.0076966. TheSe Values are used in Eq X2.8 resulting in Eq u誰正鵠蒜u(T,y)
∂T

O.00019945 K￣ 1
s(7「剛)こ0・。202920十豊[0・0202920 - 0 0076966]

二0・0205572                (X2.9)
(X2、13)

X2.3.4 Tb detel’mille What the measured tempel・ature Should X2.5.5 A graphicaI representation of a s血i]ar examP】e is
be, uSe Eq X2.2. This resu】ts in a temperature of 374.43 K or Shown in rig, X2.2 wilh TS ranging from -50OC to 10000C. In
lO重.280C. this ex紺nple, U(Tw) = 1.O K.

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鼻         五         〇         0
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蹄∴∴的∴∴舵
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偶     的0     細0     000     餌場    的0 0

餌場弼徳で馨珊露eratり鴫(OC)
FIG" X2・1 Emissivity uncertain置y Contribu置ion Io lbtal Uncertairty

X2.6 Atmospheric Absorption Uncertainty x2・6.3 App】y山ese血a 'o Eq Xユ14. The solution is shown

X2.6.1 Tb determine the unce巾ainty due to atmosphe賞・jc in Eq X2・15.

absorption, B′確聞;ntema証明al 〔短po硫ct ,1榔u仰(lnteト
national Bureau o量● Weights and Measures or B]PM) provides
Va】ues in uncertajnty in terms of signa量strength. The nor】mal
畔古等 (X2.14)

Va]ue fo】. this uncertainty in tems of exl)anded uncerta血y (k

二2) is O.0006.
0.調
160=0・09K (Ⅹ2.15)

X2・6・2 For example’COnSide「 ca賞culating tile unCertainty

duc to atmosphc「ic absorption. An 8 to ]4いm i11fra「cd X2.6.4 Tbble X2・2 shows∴Caiculated unccrtainty due to

thermomelcr is calibraled using a 200OC (473,15 K) sollrCC. atmospheric ahsorp'ion k-r the 8 to 14 um spectral band.
Using Eq X2工S = 0.0461160, and Ijq 3"1.13∂SI∂T =
0.000305968 K-1.

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FiG. X2,2 Reflected Temper露tu「e Unce「書ainty Cont「ibution to “lblaI Uncertainty

TABLE X2.2 Uncertainties for Atmosphe「ic Absorption for the 8

to 14 Hm Spectrai Band

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 4齢 宣2847 - 14

X3. DETECTOR TEMPERATURE DETERMINATION (S)

Ⅹ3.1 A poinl of di組cu宣ty血Oughout in delermining tem- ambien=emperalure do not need to be known。 A11 1hat is

Peratllre unCertai】1ty is tha=he value o」’Td is not k】10Wn tO the rcquired is tha=hese values a.rc constant during thc ‘wo

user. It is measured intemally by the instrument, but is not measurements. The deteclo「 1empcrature, Td, Can be calculatcd

displayed on lhe readout. The bcst assumption is that T,l Will bc 血on1 1hc Eq Xう」
the Same aS, Or C】ose to, ambient temperatl-re, and this may
・碑。β置S(11M榔,) 〇 ・1村部2S(1「鵬1音,2)
require some conditioning of the instrument before use. S(乃)二
〔値湘1 ￣ 〔]Nし卵職2   ●
Howcver・ there aLrC SOme Situations whcrc ensuring that Td =

T。nlb is not practicable. One is where the infrared themometer whe「e:

is used for an extended period in front of a hot source (for Z完劇Sl - 7L,劇S2  = the two jl南ared themo】11eter 】・ead-
ex.anlp]e, during calibration at high temperatures), Where the ]ngS COrreSPOnding to 8INSTRl and
radiation fro重n the source may hea=he detector above ambie11t CINS丁R2, l“e叩eCtive】y, and
temperature. The sccond is wherc血e infrared lhemometcr is f高汀Rl and cINS7R2 = the emissivily seltings used

used inside zI Walk-in froezer, Wherc the ambicn置temperaturc is

X3.4 The accu「acy of calcuiations made with Eq X3.=s
Well be】ow the specified operati】教g temPerature for the ther-
bcsI whcn glNSIRi and EINS「R2 arC Widcly spaccd. VIllucs oJ O.5
mometer. In these cases, the themlO】Tleter Can S硝】 be used
and l are usua宣ly adequale.
SuCCeSS餌]y, bu=he detector sha11 be maintai11ed above a

defined temperature, uSually above OOC. X3.5 F。r eXan叩Ie, tWO readings nf a b】ackb。dy using an 8
to 14 Hm thcmomctcr might be Tmふl = 14l.80C when thc
X3.2 Dependence on the detector temperature is remOVed if
inslrumenlal emissivily is <e=0 E-n、… = 1・ al-d Tmca,2 =
しhc instrumenlal emissivity is se=o l (1his js precludcd in fixed
219.4OC when cうnQtr2 = 0.5. Substiluling these values into Eq
Cmjssivity instruments). On thc othcr ha-重d, reiative]y hrge
X3.1 gives Td = 2l.50C.
errors in the estimate (guess) of the detector temperatlJre Can
usua】1y be toIerated without signjficant error in the reading. X3・6 Calculatio】lS Ol’1his sort a「e useful for delemining 'he

expected variation of detector lempera(u購as the conditio]lS

X3.3 For a吐justab】e emissivity instruments, the detector inside the laboratory change. While i白s no- pr)SSible to do唖s
temPerature Can be inferred from tWO meaSurementS Of the for fixed e】nissivity instruments言I may be possible to infer
SamC targCt uSing two di餌orcnt instrumcntal cmissivity sct- their behavjor from measuremen書s on simiiar a旬ustabIe emis-
1ings. Thc tcmpcraLure and cmissivity of the target and the Sivity instruments.

X4. SAMPLE REPORT FOR AN INFRARED THERMOMETER

See賞了ig. X4.1

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REFE RENCES

( l) 】EC/TS 62492工看ndustrial p「ocess control devices -Radiation瓜er-
mometers -Pa「t ] : Ttch11ical data for radiation t置漢ermOmetel’S, IEC,
GeileVa. Switzerland, 2008. Aval】ab1e什om Inlernatjona】 Electrotech-
11ica獲Comn〕ission (IEC), 3, ruC de Varemb6, P.O. Box 131, CH-12】1
GcllCVa 20. Switzer】and, http://www.iec.ch.
(2) DcWitt, D. P, and Nutter, G. D.. eds.. “Theory and Practice of
Radiatioll Thermometry,’’Johll Wi!ey and Sons. New Yol’k, NY, 1988.
(到VDI 3511 Blatt 4.4 / Part 4・4, Tt:Chnische恥mpcraturemcssung
Strahlungsthermometric Kalibrie則ng VOn StrahlungsthermOmCtem,
′]tml)erature meaSuremCnt in indしIStry Radiation thermometl’y Cali-
b「atioil Of radia亡ion thc「moine書e「S.
(4) Fischer,工Saundel’S, P, Sadli, M.. Battue11o. M., Park, C. W.. Yuan.
Z., Yoon, H., Li, W., Van der Ham, E., Sakuma, F., Yamnda, Y.,
Ba皿co. M.. Machin, G,, Fox, N.. HollandしJ., Ugur. S,, Matveyev.
M., Bioembergen. P∴U調m:血中h〃電CIs ror calibration of radialion
themometers bek’W the sil'Cr町im∴ OC’トWG5 working document
CC丁WG508」13. BiPM. SC巾眼L I+劃軸i May 2In8. Availablc rrom
the B!PM webche. h叫訓を胃管-鵬Im-org.
15) Saunders, P, MSL ’I轟hnical G面責七22 -Calibratjon of Low耽mpera-
ture Jnfra∫ed ll噛mDiI_ MeaLSure重nenl Standards Laboratory of
New Zea!and. 2(東部. hnpJ/msi.iri.c「i.nzltraining-and-reSOurCCS/
tcchnicaトguides,
(6) E‘;al〃a存on (Z/ Wc瓜録がIC"I DaIa臆G話de柄所c E準rc."ioIt∴0/
[朽ceIでく肌1申n ”ea∫llmれC爪JCGM 1 00, BIPM, S色vres, France, May
2008. Avajlable from the BIPM websjte, http’〃www.bipm.Org.
(7) U. S. Guide lo thc Expres§ion of Uncertainty in Measurement,
Nationa重Conference of S書andards Laboratories. Boulder, CO, 1997.

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