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Micro Power 3 V Linear Hall Effect Sensor Ics Withtri-State Output and User-Selectable Sleep Mode
Micro Power 3 V Linear Hall Effect Sensor Ics Withtri-State Output and User-Selectable Sleep Mode
VCC VREF
To all subcircuits
RRatio / 2
Hall Element
Regulator
RRatio / 2
Dynamic Offset
Cancellation
OUT
Filter
Amp Out
Gain Offset
Programming Logic
SLEEP
Circuit Reference Current
GND
Description (continued)
Despite the low power consumption of the circuitry in the A139x, offset cancellation circuits. End of line, post-packaging, factory
the features required to produce a highly-accurate linear Hall effect programming allows precise control of device sensitivity and
IC have not been compromised. Each BiCMOS monolithic circuit offset.
integrates a Hall element, improved temperature-compensating These devices are available in a small 2.0 × 3.0 mm, 0.75 mm nominal
circuitry to reduce the intrinsic sensitivity drift of the Hall element, height microleaded package (MLP/DFN). It is Pb (lead) free, with
a small-signal high-gain amplifier, and proprietary dynamic 100% matte tin leadframe plating.
Selection Guide
Sensitivity
Part Number Package Packing1
(mV / G, Typ.)
A1391SEHLT-T2 1.25 DFN/MLP 2×3 mm; 0.75 mm nominal height 7-in. reel, 3000 pieces/reel
A1392SEHLT-T2 2.50 DFN/MLP 2×3 mm; 0.75 mm nominal height 7-in. reel, 3000 pieces/reel
A1393SEHLT-T2 5 DFN/MLP 2×3 mm; 0.75 mm nominal height 7-in. reel, 3000 pieces/reel
A1395SEHLT-T2 10 DFN/MLP 2×3 mm; 0.75 mm nominal height 7-in. reel, 3000 pieces/reel
1Contact Allegro™ for additional packing options.
2Allegro products sold in DFN package types are not intended for automotive applications.
ELECTRICAL CHARACTERISTICS valid through full operating ambient temperature range, unless otherwise noted
OUTPUT CHARACTERISTICS valid through full operating ambient temperature range, unless otherwise noted
TA (°C)
1.2
IREF (µA)
11
1.0
9
0.8
7 0.6
5 0.4
3 0.2
1 0
-20 -5 10 25 40 55 70 85 -20 -5 10 25 40 55 70 85
TA (°C) TA (°C)
Average Ratiometry, Sens, versus Ambient Temperture Average Ratiometry, Sens, versus Ambient Temperture
(A1391) (A1392)
102.0 102.0
101.5 101.5
Average Ratiometry, Sens (%)
101.0 101.0
2.5 to 3 V
100.5 3.5 to 3 V 100.5
100.0 100.0 2.5 to 3 V
3.5 to 3 V
99.5 99.5
99.0 99.0
98.5 98.5
98.0 98.0
97.5 97.5
-20 -5 10 25 40 55 70 85 -20 -5 10 25 40 55 70 85
TA (°C) TA (°C)
101.0
Average Symetry (%)
100.5
100.5
100.0
100.0 99.5
99.5 99.0
Linearity - , Vcc=3.5V
99.0 98.5 Linearity +, Vcc=3.5V
98.5 98.0 Linearity +, Vcc=2.5V
Linearity -, Vcc = 2.5V
98.0 97.5
97.0
97.5
-20 -5 10 25 40 55 70 85
-20 -5 10 25 40 55 70 85
TA (°C) TA (°C)
THERMAL CHARACTERISTICS may require derating at maximum conditions, see application information
Characteristic Symbol Test Conditions Min. Units
1-layer PCB with copper limited to solder pads 221 ºC/W
2-layer PCB with 0.6 in.2 of copper area each side, connected by
Package Thermal Resistance RθJA 70 ºC/W
thermal vias
4-layer PCB based on JEDEC standard 50 ºC/W
4500
4000
3500
4-layer PCB
Power Dissipation, PD (m W)
2-layer PCB
2500
(RθJA = 70 ºC/W)
2000
1-layer PCB
(RθJA = 221 ºC/W)
1500
1000
500
0
20 40 60 80 100 120 140 160 180
Temperature (°C)
Characteristics Definitions
Ratiometric. The A139x devices feature ratiometric output. Linearity and Symmetry. The on-chip output stage is
The quiescent voltage output and sensitivity are proportional to designed to provide a linear output with maximum supply voltage
the ratiometric supply reference voltage. of VCCN. Although application of very high magnetic fields will
The percent ratiometric change in the quiescent voltage output is not damage these devices, it will force the output into a non-lin-
defined as: ear region. Linearity in percent is measured and defined as
VOUT(+B) – VOUTQ
∆VOUTQ(VREF)÷ ∆VOUTQ(3V) (3)
∆VOUTQ(∆V) = × 100 % (1) Lin+ =
2(VOUT(+B / 2) – VOUTQ )
× 100 %
VREF ÷ 3 V
and the percent ratiometric change in sensitivity is defined as: VOUT(–B) – VOUTQ
∆Sens(VREF)÷ ∆Sens(3V)
Lin– = × 100 % (4)
∆Sens(∆V) =
VREF ÷ 3 V
× 100% (2) 2(VOUT(–B / 2) – VOUTQ )
A139x are low-power Hall effect sensor ICs that are perfect for valid. The device output transitions into the high impedance state
power sensitive customer applications. The current consumption approximately tPOFF seconds after a logic low signal is applied to
of these devices is typically 3.2 mA, while the device is in the the S̄L̄¯Ē
¯Ē¯P̄¯ pin (see figure 1).
active mode, and less than 25 µA when the device is in the sleep
mode. Toggling the logic level signal connected to the S̄L̄¯Ē¯Ē
¯P̄¯ pin If possible, it is recommended to power-up the device in the
drives the device into either the active mode or the sleep mode. sleep mode. However, if the application requires that the device
A logic low sleep signal drives the device into the sleep mode, be powered on in the active mode, then a 10 kΩ resistor in series
while a logic high sleep signal drives the device into the active ¯Ē¯Ē¯P̄¯ pin is recommended. This resistor will limit the
with the S̄L̄
mode. current that flows into the S̄L̄¯Ē
¯Ē¯P̄¯ pin if certain semiconductor
In the case in which the VREF pin is powered before the VCC junctions become forward biased before the ramp up of the volt-
pin, the device will not operate within the specified limits until age on the VCC pin. Note that this current limiting resistor is not
the supply voltage is equal to the reference voltage. When the required if the user connects the S̄L̄¯Ē¯Ē¯P̄¯ pin directly to the VCC
device is switched from the sleep mode to the active mode, a time pin. The same precautions are advised if the device supply is
defined by tPON must elapse before the output of the device is powered-off while power is still applied to the S̄L̄¯Ē¯Ē ¯P̄¯ pin.
VCC
VSLEEP
ICC
+B
B field 0
–B
tPON tPON
tPOFF tPOFF
Figures 2 and 3 present applications where the VCC pin is con- In both figures, the device output is connected to the input of an
nected together with the VREF pin of the A139x. Both of these A-to-D converter. In this configuration, the converter reference
pins are connected to the battery, Vbat2. In this case, the device voltage is Vbat1.
output will be ratiometric with respect to the battery voltage.
It is strongly recommended that an external bypass capacitor be
The only difference between these two applications is that the
connected, in close proximity to the A139x device, between the
S̄L̄¯Ē¯Ē¯P̄¯ pin in figure 2 is connected to the Vbat2 potential, so the
device is always in the active mode. In figure 3, the S̄L̄¯Ē¯Ē¯P̄¯ pin is VCC and GND pins of the device to reduce both external noise
toggled by the microprocessor; therefore, the device is selectively and noise generated by the chopper-stabilization circuits inside of
and periodically toggled between active mode and sleep mode. the A139x.
Supply pin
VCC VREF
Micro- A139x
I/O
processor
OUT SLEEP
I/O
GND GND
Figure 2. Application circuit showing sleep mode disabled and output ratiometirc to the
A139x supply.
Supply pin
VCC VREF
Micro-
I/O
A139x
processor
OUT SLEEP
I/O
GND GND
Figure 3. Application circuit showing microprocessor-controlled sleep mode and output ratiome-
tirc to the A139x supply.
In figures 4 and 5, the microprocessor supply voltage determines between the active and sleep modes.
the ratiometric performance of the A139x output signal. As in the
The capacitor Cfilter is optional, and can be used to prevent pos-
circuits shown in figures 2 and 3, the device is powered by the
sible noise transients from the microprocessor supply reaching
Vbat2 supply, but in this case, ratiometry is determined by the
microprocessor supply, Vbat1. the device reference pin, VREF.
The S̄L̄¯Ē¯Ē¯P̄¯ pin is triggered by the output logic signal from the It is strongly recommended that an external bypass capacitor be
microprocessor in figure 5, while in figure 4, the S̄L̄¯Ē ¯Ē¯P̄¯ pin is connected, in close proximity to the A139x device, between the
connected to the device power supply pin. Therefore, the device VCC and GND pins of the device to reduce both external noise
as configured in figure 4 is constantly in active mode, while and noise generated by the chopper-stabilization circuits inside of
the device as confiugred in figure 5 can be periodically toggled the A139x.
Supply pin
VCC VREF
Micro- I/O A139x
processor
OUT SLEEP
I/O
GND GND
Figure 4. Application circuit showing ratiometry of VREF . Sleep mode is disabled and the VREF
pin is tied to the microprocessor supply.
Supply pin
VCC VREF
Micro- I/O A139x
processor
OUT SLEEP
I/O
GND GND
Figure 5. Application circuit showing device reference pin, VREF, tied to microprocessor supply. The device
sleep mode also is controlled by the microprocessor.
Supply pin
VCC VREF
Micro-
I/O A139x Connected to Connected to Ratiometric to device
processor
OUT SLEEP A139x device supply, A139x device supply, supply (VCC), and
VCC VCC always valid
I/O
GND GND
Supply pin
VCC VREF
Ratiometric to device
Micro- A139x Connected to
processor
I/O Controlled by supply (VCC), and
A139x device supply,
OUT SLEEP microprocessor controlled by the
VCC
I/O microprocessor
GND GND
Supply pin
VCC VREF
Micro- I/O Connected to Ratiometric to micro-
A139x Connected to
processor A139x device supply, processor supply, and
OUT SLEEP microprocessor supply
I/O VCC always valid
GND GND
Supply pin
VCC VREF Ratiometric to micro-
Micro- I/O A139x Connected to Controlled by processor supply,
processor
OUT SLEEP microprocessor supply microprocessor and controlled by the
I/O microprocessor
GND GND
Application Circuit with Multiple Hall Devices and a Single A-to-D Converter
Cbypass Vbat2
VCC VREF
A139x
OUT SLEEP
GND GND
Cbypass Vbat2
VCC VREF
A1391x
OUT SLEEP
Supply pin
Cfilter Vbat1 GND GND
Microprocessor
I/O
A1
Cbypass Vbat2
A2
A1 A3
VCC VREF
A139x
A4
A2 OUT SLEEP
GND GND
A3
A4
Cbypass Vbat2
VCC VREF
A139x
OUT SLEEP
GND GND
Figure 6. Application circuit showing multiple A139x devices, controlled by a single microprocessor.
0.30
1.00 E F 6
6
1.00
1.50 E
A E
1 2
1
0.95
7X D C
SEATING
0.08 C PLANE C PCB Layout Reference View
0.5 BSC
1 2 YWW
LLL
0.55 ±0.10
NN
1.224 ±0.050
B 1
G Standard Branding Reference View
Revision History
Revision Revision Date Description of Revision
Rev. 7 October 26, 2011 Update Selection Guide
Rev. 8 February 13, 2019 Minor editorial updates