IEEE Standard Requirements,

Terminology, and Test Code for

Bushings for DC Applications—
Corrigendum 1

IEEE Power Engineering Society

Sponsored by the
Transformers Committee

IEEE
IEEE Std C57.19.03™-2005
3 Park Avenue
New York, NY 10016-5997, USA (Corrigendum to
IEEE Std C57.19.03-1996)
6 June 2006
 IEEE Std C57.19.03-1996/Cor 1-2005
(Corrigendum to IEEE Std C57.19.03-1996)

IEEE Standard Requirements,

Terminology, and Test Code for
Bushings for DC Applications—
Corrigendum 1

Sponsor

Transformers Committee
of the
IEEE Power Engineering Society

Approved 7 December 2005

IEEE-SA Standards Board

Abstract: This corrigendum corrects IEEE Std C57.19.03-1996. The standard applies to outdoor
and indoor power apparatus dc bushings of condenser type that have basic impulse insulation
levels of 110 kV and above for use as components of oil-filled converter transformers and
smoothing reactors, as well as air-to-air dc bushings. This standard defines the special terms
used, service conditions, rating, general requirements, electrical insulation characteristics, and
test procedure for the bushings for dc application.

Keywords: bushings, dc application

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ii
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Introduction

This introduction is not part of IEEE Std C57.19.03-1996/Cor 1-2005, IEEE Standard Requirements, Terminology, and Test Code for
Bushings for DC Applications.

IEEE Std C57.19.03-1996 was approved by the IEEE-SA Standards Board on 20 June 1996 and published
6 January 1997. During the reaffirmation process for this document in 2002, several errors in the document
were reported. All known errors are corrected in this corrigendum.

Notice to users
Errata

Errata, if any, for this and all other standards can be accessed at the following URL:
http://standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL
for errata periodically.

Interpretations

Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/

index.html.

Patents

Attention is called to the possibility that implementation of this standard may require use of subject matter
covered by patent rights. By publication of this standard, no position is taken with respect to the existence
or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying
patents or patent applications for which a license may be required to implement an IEEE standard or for
conducting inquiries into the legal validity or scope of those patents that are brought to its attention.

Participants
At the time this standard was completed, the IEEE Task Force for C57.19.03 Corrigendum 1 had the
following membership:

Fred E. Elliott, Chair

John Graham Lars-Erik Juhlin Pierre Riffon

Copyright © 2006 IEEE. All rights reserved.

iv
The following members of the balloting committee voted on this standard. Balloters may have voted for
approval, disapproval, or abstention.

Saber Azizi-Ghannad James D. Huddleston, III Michael S. Newman

Wallace B. Binder, Jr. Rowland I. James, Jr. Robert C. Olen
Bill Chiu Jose A. Jarque Dhiru S. Patel
Keith Chow Wayne E. Johnson J. M. Patton
Tommy P. Cooper Lars E. Juhlin Carlos A. O. Peixoto
Alan W. Darwin Morteza Khodaie Johannes Rickmann
Ronald L. Daubert Young Han Kim Michael A. Roberts
Eric J. Davis Hermann Koch Oleg Roizman
Larry J. Davis J. L. Koepfinger Dinesh Pranathy Sankarakurup
Randall Dotson John G. Lackey Subhas C. Sarkar
Barry L. Easter Gerald E. Lee Sascha M. Schmeling
Fred E. Elliott Yeou Song Lee Devkin Sharma
Gary R. Engmann Thomas G. Lindquist Hyeong J. Sim
Christopher Faust William Lumpkins James E. Smith
Joseph Foldi G. L. Luri Loren B. Wagenaar
Randall C. Groves John W. Matthews Joe D. Watson
Peter Heinzig Gary L. Michel James W. Wilson, Jr.
Gary A. Heuston Yinghua Min Eric V. Woods
Philip J. Hopkinson Kyaw Myint Guochang Zhou
Dennis Horwitz Waldemar Ziomek

When the IEEE-SA Standards Board approved this standard on 7 December 2005, it had the following
membership:

Steve M. Mills, Chair

Richard H. Hulett, Vice Chair
Don Wright, Past Chair
Judith Gorman, Secretary

Mark D. Bowman William B. Hopf T. W. Olsen

Dennis B. Brophy Lowell G. Johnson Glenn Parsons
Joseph Bruder Herman Koch Ronald C. Petersen
Richard Cox Joseph L. Koepfinger* Gary S. Robinson
Bob Davis David J. Law Frank Stone
Julian Forster* Daleep C. Mohla Malcolm V. Thaden
Joanna N. Guenin Paul Nikolich Richard L. Townsend
Mark S. Halpin Joe D. Watson
Raymond Hapeman Howard L. Wolfman

* Member Emeritus

Copyright © 2006 IEEE. All rights reserved.

v
 IEEE Std C57.19.03-1996/Cor 1-2005
Requirements, Terminology, and Test Code for Bushings for DC Applications—Corrigendum 1

CONTENTS
1. Overview .................................................................................................................................................... 1

1.1 Scope ................................................................................................................................................... 1

1.2 Purpose ................................................................................................................................................ 1

2. Normative references.................................................................................................................................. 1

Changes to IEEE Std C57.19.03-1996 ........................................................................................................... 2

5. Rating ......................................................................................................................................................... 2

5.3 Rated dielectric strength ...................................................................................................................... 2

7. Test procedure ............................................................................................................................................ 3

7.2 Design tests.......................................................................................................................................... 3

Copyright © 2006 IEEE. All rights reserved.

vi
 IEEE Std C57.19.03-1996/Cor 1-2005
Requirements, Terminology, and Test Code for Bushings for DC Applications—Corrigendum 1

IEEE Standard Requirements, Terminology, and

Test Code for Bushings for DC Applications—
Corrigendum 1

1. Overview

1.1 Scope

This corrigendum corrects errors in IEEE Std C57.19.03-1996.

1.2 Purpose

This standard defines the special terms used, service conditions, rating, general requirements, electrical
insulation characteristics, and test procedure for the bushings for dc applications. This corrigendum corrects
errors in the initial publication of this standard.

2. Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments or corrigenda) applies.

IEEE Std C57.19.03-1996, IEEE Standard Requirements, Terminology, and Test Code for Bushings for
DC Applications.1

1
IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ
08854, USA (http://standards.ieee.org).

Copyright © 2006 IEEE. All rights reserved.

1
 IEEE Std C57.19.03-1996/Cor 1-2005
Requirements, Terminology, and Test Code for Bushings for DC Applications—Corrigendum 1

Changes to IEEE Std C57.19.03-1996

NOTE—The editing instructions contained in this corrigendum define how to merge the material contained therein into
the existing base standard and its amendments to form the comprehensive standard.

The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace.
Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the
change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add
new material). Delete removes existing material. Insert adds new material without disturbing the existing material.
Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used
to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one.
Editorial notes will not be carried over into future editions because the changes will be incorporated into the base
standard.

5. Rating

5.3 Rated dielectric strength

5.3.3 Rated chopped-wave lightning-impulse voltage

Change the text in 5.3.3 as shown:

The rated chopped-wave lightning-impulse voltage is the crest value of a standard 1.2 × 50 µs impulse
voltage, which a new bushing shall be capable of withstanding for a specified time from the start of the
wave at virtual time zero until flashover of a rod gap or coordinating gap occurs when tested under the
conditions specified in 7.2.3 7.2.2.

5.3.4 Rated switching-impulse voltage

5.3.4.1 Rated wet switching-impulse voltage

Change the text in 5.34.1 as shown:

The rated wet switching-impulse voltage is the crest value of a 250 × 2500 µs switching-impulse voltage
wave, which a new bushing shall be capable of withstanding when tested under the conditions specified in
7.2.4.1 7.2.3.

5.3.4.2 Rated dry switching-impulse voltage

Change the text in 5.3.4.2 as shown:

The rated dry switching-impulse voltage is the crest value of a 250 × 2500 µs switching-impulse voltage
wave, which a new bushing shall be capable of withstanding when tested under the conditions specified in
7.2.4.2 7.2.4.

Copyright © 2006 IEEE. All rights reserved.

2
 IEEE Std C57.19.03-1996/Cor 1-2005
Requirements, Terminology, and Test Code for Bushings for DC Applications—Corrigendum 1

7. Test procedure

7.2 Design tests

7.2.2 Full-wave and chopped-wave lightning-impulse withstand voltage

Change the last paragraph of 7.2.2 as shown:

The time to chopping shall be 3 µs. The chopped-wave peak-voltage level shall be 115% of the full-wave
value.

Change Table 2 as shown:

Table 2 —Routine and design tests for dc bushings

Clause Tests Routine Design Special
number
7.2.1 Low-frequency dry X
7.3.3 Low-frequency dry X
7.2.2 Lightning impulse X
7.3.5 Lightning impulse X
7.2.3 Switching-impulse wet X
7.2.4 Switching-impulse dry X
7.3.6 Switching-impulse Xa
7.2.5.3 7.2.5.2 DC applied voltage X X
7.2.5.4 7.2.5.3 DC polarity reversal X X
7.2.6 Capacitance X
7.2.6 Power factor X
7.2.7.1 Pressure test X
7.2.7.2 Cantilever strength X
7.2.8 Thermal test X
7.3.4 7.3.7 Potential tap withstand X
7.3.9 7.3.8 Mechanical tests X
7.4.1 Contamination test X
7.4.2 Even rain test X
7.4.3 Uneven rain test X
a
Only for wall bushings and roof bushings.

Copyright © 2006 IEEE. All rights reserved.

3
 IEEE Std C57.19.03-1996/Cor 1-2005
Requirements, Terminology, and Test Code for Bushings for DC Applications—Corrigendum 1

Replace Table 4 with the following:

Table 4 —Power factor and capacitance limits

Type of construction Power factorc Capacitance
Limit % Acceptable change %a Acceptable change %b
Resin-impregnated 0.85 +0.04 +1.0
Paper-insulated –0.04 –1.0
Oil-impregnated 0.50 +0.02 +1.0
Paper-insulated –0.06 –1.0
a
The arithmetic difference in power factors (expressed in percent) measured at 10 kV or at the rated maximum
line-to-ground voltage before and after dielectric withstand voltage test shall be within the specified limit. For
example, if the power factor of the oil-impregnated, paper-insulated bushing was 0.30% before the withstand test,
the maximum acceptable power factor after the test would be 0.32%.
b
The percent change in capacitance after the dielectric withstand voltage test based on the initial value shall be
within the specified limit. The measurements are to be made at 10 kV or at the rated maximum line-to-ground
voltage. If the bushing has more than 100 conductive layers, the accepted percentage change in capacitance will be
(1/No. of Layers) × 100.
c
Corrected to 20 ºC. See 7.1.4 g).

Copyright © 2006 IEEE. All rights reserved.