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ISSN 10637834, Physics of the Solid State, 2012, Vol. 54, No. 8, pp. 1602–1605. © Pleiades Publishing, Ltd.

, 2012.
Original Russian Text © O.M. Golitsyna, S.N. Drozhdin, 2012, published in Fizika Tverdogo Tela, 2012, Vol. 54, No. 8, pp. 1503–1506.

FERROELECTRICITY

Dielectric Properties of Film Materials


Based on Polyethylene Terephthalate and Polycarbonate
with Ferroelectric Inclusions
O. M. Golitsyna* and S. N. Drozhdin
Voronezh State University, Universitetskaya pl. 1, Voronezh, 394006 Russia
* email: golitsynaom@yandex.ru
Received January 30, 2012

Abstract—The dielectric properties of film materials based on polyethylene terephthalate and polycarbonate
with inclusions of triglycine sulfate (TGS) and TGS with admixture of L, αalanine (ATGS) have been stud
ied. An increase in the temperature of the phase transition in these materials as compared to in bulk TGS and
ATGS has been revealed.
DOI: 10.1134/S1063783412080124

1. INTRODUCTION carbonate (PC) with ferroelectric inclusions, which


are the subject of the present work.
According to the results of modern research [1], the
efficiency of working elements of pyro and piezoelec
tric detectors can be increased by development of 2. SAMPLE PREPARATION
working elements based on nanostructured ferroelec AND EXPERIMENTAL TECHNIQUE
tric composite materials.
PET is a thermoplastic polymer and a good dielec
An attractive matrix basis for ferroelectric inclu tric possessing a high mechanical strength and distin
sions are films of porous aluminum (Al2O3) and silicon guished by a low hygroscopy [9, 10]. The glass transi
(SiO2) oxides with a regular hexagonal morphology of tion temperature of amorphous PET considered in
pores [2–4]. The precipitation of a ferroelectric in an this work is Tg = 67°C.
ordered array of pores makes it possible to obtain
materials distinguished by the presence of micro and PC is a thermoplastic amorphous polymer material
nanodimensional singlephase ferroelectric domains possessing a high hardness and strength combined
uniformly distributed with a given density. The tech with a very high resistance to impact action. It is dis
nology for production of materials based on Al and Si tinguished by insignificant water absorption, high
oxides with inclusions of triglycine sulfate (TGS), electrical resistivity, and insignificant dielectric loss in
(NH2CH2COOH)3 · H2SO4, is comparatively simple, a wide frequency range [9, 10]. The glass transition
temperature of this material is Tg = 150°C.
because TGS is easily incorporated into porous matri
ces of different topologies and geometries from the Through holes in films of materials were produced
aqueous solution [5–7]. However, the research in fer by bombardment with xenon ions (PET) and argon
roelectric nanostructures based on porous Al and Si ions (PC) in a nuclear accelerator (Dubna, Russia).
oxides has shown the importance of water for them, Observation of PET and PC film surfaces on a JEOL
which is capable of filling the pores of the initial matri JSM 6510 electron microscope has shown that the
ces of Al2O3 and SiO2, being structured in them and formed through holes (through pores) are randomly
adsorbed by the surface of these films due to their high distributed (Fig. 1a). The pore sizes in PET and PC
hydrophily and, thus, of noticeably changing the films were ~5500 and ~370 nm, respectively. The pore
parameters characterizing the physical properties of density n in PET film was ~(4.5–4.9) × 105 cm–2 and
the considered structures [7, 8]. Therefore, develop that in PC film, ~2 × 106 cm–2.
ment of sensors based on ferroelectric composite The fillers were TGS and TGS with admixture of L,
nanostructures combining the technological simplic αalanine (10 wt % αalanine in a solution): ATGS.
ity of fabrication and stable pyro and piezoelectric The structure and properties of bulk TGS crystals with
activity with increased hydrophoby is an urgent prob a model ferroelectric phase transition of the second
lem of modern research. order at a temperature TC = 322 K have been studied
This problem can be solved using film materials well and widely represented in scientific literature
based on polyethylene terephthalate (PET) and poly [11]. The phase transition temperature of the ATGS

1602
DIELECTRIC PROPERTIES OF FILM MATERIALS 1603

35

34

33

C, pF
32

31 2 4
3
30

29 1
50 μm
(а) 20 30 40 50 60 70 80 90 100
T, °C

Fig. 2. Temperature dependences of the capacitance C of


the PET sample with inclusions: (1) heating; (2) cooling;
(3) 3 months later, heating; and (4) 3 months later, cooling.

The presence of ferroelectric inclusions in pores


was controlled by means of a JEOL JSM 6510 micro
scope (Fig. 1b). The fraction of pores filled with ferro
electric for PC film was ~50%; for PET samples it was
higher and reached ~70%. The capacitance C and
conductance G were measured by a BM 484 Tesla
bridge at a frequency of 1.592 kHz with the measuring
10 μm voltage amplitude U0 = 0.3 V. During the studies, in
(b)
the intervals between measurements, the samples were
Fig. 1. Morphology of (a) the surface of PET after bom stored in air at room temperature.
bardment with xenon ions and (b) the surface of PET with
ferroelectric inclusions observed by scanning electron
microscopy on a JEOL JSM 6510 microscope. 3. EXPERIMENTAL RESULTS
Figure 2 shows the temperature dependences of the
crystal is displaced by 1–3 K (depending on the L, α capacitance C for a PET + TGS sample in the heat
ing–cooling mode (curves 1 and 2). The observed
alanine content in the solution) toward higher temper maxima of these dependences are found at the tem
atures as compared to of bulk TGS [12]. The ferroelec perature of ~51°C, which exceeds the phase transition
tric was incorporated into the pores of PET and PC temperature TC in bulk TGS. After three months, the
films from oversaturated solution of TGS (ATGS) salt curves C(T) exhibit stability and preserve the positions
at the constant temperature T = 55°C. To that end, at of maxima and the absolute values of C (Fig. 1, curves
the temperature T = 55°C, a reduced pressure p = 0.5 3 and 4) in contrast, e.g., to nanocomposite materials
atm was created under the film, which provided pre of porous Al and Si oxides with TGS inclusions [7].
cipitation of the ferroelectric material into the matri Such an anomalous dependence C(T) with a maxi
ces of PET and PC films. TGS and ATGS microcrys mum at T ~ 51°C was also found in PC + TGS sam
tals formed in this case on the surface outside pores ples (Fig. 3, curves 1 and 2). Moreover, the stable posi
were removed by fine polishing of the samples. After tion of the curves C(T) for PC + TGS materials is also
preserved for a long time.
that, the samples were annealed at a temperature of
100°C for 3 h in order to reduce the possible influence Figure 4 shows the temperature dependences of the
conductance G for the same samples, which qualita
of structured water on the studied processes. Elec tively repeat the dependences C(T) in Figs. 2 and 3. It
trodes, whose thickness did not exceed 50 nm, were is worth noting that the considered dependences G(T)
applied by vacuum evaporation of silver onto both sur do not change with time. The same behavior of the
faces of the samples. Silver was applied onto the upper dependence C(T) and G(T) for the materials under
surface of each sample through a mask, which had the study makes it possible to present only the depen
form of a round hole with a diameter d = 4 mm. The dences C(T).
lower surface of samples was covered with silver com For PET + ATGS and PC + ATGS samples, a dis
pletely. placement of the maxima of dependences C(T)

PHYSICS OF THE SOLID STATE Vol. 54 No. 8 2012


1604 GOLITSYNA, DROZHDIN

0.022
37.0

36.5 1
1 0.018
36.0
2
C, pF

G, µS
35.5 0.014
2
35.0

34.5 0.010

34.0
0.006
20 30 40 50 60 70 20 30 40 50 60 70
T, °C T, °C

Fig. 3. Temperature dependences of the capacitance C of Fig. 4. Dependences G(T) for a freshly prepared PC sam
the PC sample with inclusions: (1) heating and (2) cooling. ple with TGS inclusions: (1) heating and (2) cooling.

3
35
4
34
4.5
33 2
C, pF

4.0 1
C, pF

32 1
2 3
31 3.5
4
30
3.0
20 30 40 50 60 70 20 30 40 50 60 70 80 90
T, °C T, °C
Fig. 5. Dependences C(T) for freshly prepared (1, 2) PET +
ATGS and (3, 4) PC + ATGS samples: (1, 3) heating and Fig. 6. Dependences C(T) for freshly prepared (1, 2) PET
(2, 4) cooling. and (3, 4) PC samples: (1, 3) heating and (2, 4) cooling.

(Fig. 5) and G(T) is observed toward higher tempera electric layers on the interface between phases in the
tures as compared to the ATGS bulk crystal. pores of PET and PC.
In nanoscale composite materials with ferroelectric The curves C(T) obtained on thermocycling
inclusions, there are some factors that increase the (Fig. 2, curves 1 and 2; Fig. 3, curves 1 and 2; and
phase transition temperature TC as compared to in Fig. 5, curves 1–2, 3–4 ) do not coincide in the entire
massive ferroelectric. The most probable reason of temperature interval. The observed hysteresis is stable
extending the ferroelectric phase may be the electro in time: for example, 3 months since the time of prep
static interaction of ferroelectric inclusions [13]. The aration of the composite materials, the temperature
phase transition temperature can also be increased as hysteresis is preserved (Fig. 2, curves 3 and 4). Such
a result of the interaction of ferroelectric inclusions behavior of the dependences C(T) may be related to
with double electric layers emerging on the interface the nature of the initial polymer materials, which was
between phases [14]. We may assume that the shift of observed earlier in polyvinylidene fluoride–trifluoro
the maxima of the dependences C(T) (G(T)) may be ethylene copolymer [15]. Indeed, the dependences
related to the interaction of ferroelectric TGS (and C(T) for PET and PC polymer materials without fer
ATGS) inclusions with one another and with double roelectric inclusions, shown in Fig. 6, indicate the

PHYSICS OF THE SOLID STATE Vol. 54 No. 8 2012


DIELECTRIC PROPERTIES OF FILM MATERIALS 1605

presence of hysteresis phenomena in the initial matri ings of the XI International Conference “Physics of
ces. Dielectrics,” St. Petersburg, Russia, June 3–7, 2008,
Vol. 2, p. 403.
6. I. M. Morsakov, I. L. Kislova, and A. V. Solnyshkin, in
4. CONCLUSIONS Proceedings of the VIII International Scientific and
Thus, the precipitation of TGS and ATGS into Technical Conference “Fundamental Problems of Radi
pores made by bombardment of PET and PC with oengineering and Device Construction” (INTERMATIC
2010), Moscow, November 23–27, 2010, Vol. 2, p. 250.
xenon and argon ions leads to stable capacitance C and
conductance G of such structures, whereas the same 7. O. M. Golitsyna, S. N. Drozhdin, A. E. Gridnev,
V. V. Chernyshev, and I. E. Zanin, Bull. Russ. Acad.
characteristics of composite materials based on porous Sci.: Phys. 74 (9), 1291 (2010).
films of AL and Si oxides with ferroelectric inclusions
change with time. The comparatively high values of C 8. V. S. Borisov and L. A. Shcherbachenko, Phys. Solid
State 51 (12), 2546 (2009).
and G and stability of the dependences C(T) and G(T)
with time make it possible to consider the PET + 9. A. A. Askadskii and Yu. I. Matveev, Chemical Structure
and Physical Properties of Polymers (Khimiya, Moscow,
TGS(ATGS) and PC + TGS(ATGS) materials as 1983) [in Russian].
promising working elements for a wide range of pyro
10. A. A. Askadskii and A. R. Khokhlov, Introduction to
and piezoconverters. PhysicoChemistry of Polymers (Nauchnyi Mir, Mos
cow, 2009) [in Russian].
REFERENCES 11. M. E. Lines and A. M. Glass, Principles and Applica
tions of Ferroelectrics and Related Materials (Oxford
1. A. V. Solnyshkin, A. S. Troshkin, A. A. Bogomolov, University Press, Oxford, 1977; Mir, Moscow, 1981).
I. P. Raevski, D. N. Sandjiev, and V. Yu. Shonov, Integr.
Ferroelectr. 106, 61 (2009). 12. M. S. Tsedrik, Physical Properties of Crystals of the Trig
lycinee Sulfate Family (Nauka i Tekhnika, Minsk, 1986)
2. N. Masuda, K. Yada, and A. Osaka, Jpn. J. Appl. Phys. [in Russian].
37, 1340 (1998).
13. A. L. Pirozerskii, E. V. Charnaya, and Cheng Tien,
3. H. Asoh, K. Nishio, M. Nakao, T. Tamamura, and Phys. Solid State 49 (2), 339 (2007).
H. Masuda, J. Electrochem. Soc. 148, B152 (2001).
14. V. N. Nechaev, A. V. Shuba, and A. V. Viskovatykh,
4. G. A. Sukach, P. F. Oleksenko, P. S. Smertenko, Bull. Russ. Acad. Sci.: Phys. 74 (9), 1219 (2010).
A. M. Evstigneev, A. B. Bogoslovskaya, and V. Yu. Gor
oneskul, Phys. Chem. Solid State 6, 207 (2005). 15. T. Furukawa, Phase Transform. 18, 143 (1989).
5. A. A. Bogomolov, A. V. Solnyshkin, I. M. Morsakov,
P. V. Bykov, W. Künstler, and R. Gerhard, in Proceed Translated by E. Chernokozhin

PHYSICS OF THE SOLID STATE Vol. 54 No. 8 2012

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