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Preliminary data

SGP20N60, SGB20N60, SGW20N60

Fast S-IGBT in NPT-Technology


• 75 % lower Eoff compared to previous generation
combined with low conduction losses
• Short circuit withstand time 10 µs
• Designed for moderate and high frequency applications:
- SMPS and PFC up to 150 kHz
- Inverter, Motor controls
• NPT-Technology for 600V applications offers:
- tighter parameter distribution
- higher ruggedness, temperature stable behaviour
- parallel switching capability

Type VCE IC VCE(sat) Tj Package Ordering Code


SGP20N60 600 V 20 A 2.4 V 150 °C TO-220AB Q67041-A4712-A2
SGB20N60 TO-263AB Q67041-A4712-A3
SGW20N60 TO-247AC Q67040-S4236

Maximum Ratings
Parameter Symbol Value Unit
Collector-emitter voltage VCE 600 V
DC collector current IC A
T C = 25 °C 40
T C = 100 °C 20
Pulsed collector current, tp limited by T jmax I Cpuls 80
Gate-emitter voltage VGE ±20 V
Avalanche energy, single pulse EAS 115 mJ
I C = 20 A, VCC = 50 V, R GE = 25 Ω,
start at T j = 25 °C
Short circuit withstand time 1) t sc 10 µs
VGE = 15 V, VCC = 600 V, T j ≤ 150 °C
Power dissipation Ptot 178 W
T C = 25 °C
Operating junction and storage temperature T j , Tstg -55...+150 °C
Soldering temperature, 1.6mm from case for 10s - 260

1) allowed number of short circuits: <1000; time between short circuits: >1s
Semiconductor Group 1 02 / 1999
Preliminary data

SGP20N60, SGB20N60, SGW20N60


Thermal Resistance
Parameter Symbol Values Unit
min. typ. max.
Characteristics
Thermal resistance, junction - case RthJC - - 0.7 K/W
Thermal resistance, junction - ambient RthJA
TO-220AB - - 62
TO-247AC - - 40
SMD version, device on PCB: 1) RthJA - - 40
TO-263AB

Electrical Characteristics, at T j =25 °C, unless otherwise specified


Parameter Symbol Values Unit
min. typ. max.
Static Characteristics
Collector-emitter breakdown voltage V(BR)CES 600 - - V
VGE = 0 V, I C = 500 µA
Collector-emitter saturation voltage VCE(sat)
VGE = 15 V, I C = 20 A, Tj = 25 °C 1.6 2 2.5
VGE = 15 V, I C = 20 A, Tj = 150 °C - 2.4 2.9
Gate-emitter threshold voltage VGE(th) 3 4 5
I C = 300 µA, V CE = V GE
Zero gate voltage collector current I CES µA
VCE = 600 V, VGE = 0 V, T j = 25 °C - - 40
VCE = 600 V, VGE = 0 V, T j = 150 °C - - 2500
Gate-emitter leakage current I GES - - 100 nA
VGE = 20 V, VCE = 0 V

1) Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6cm 2 (one layer, 70 µm thick)
copper area for collector connection. PCB is vertical without blown air.
Semiconductor Group 2 02 / 1999
SGP20N60, SGB20N60, SGW20N60
Electrical Characteristics, at Tj =25 °C, unless otherwise specified
Parameter Symbol Values Unit
min. typ. max.
Characteristics
Transconductance gfs - 14 - S
VCE = 20 V, I C = 20 A
Input capacitance Ciss - 1100 1320 pF
VCE = 25 V, V GE = 0 V, f = 1 MHz
Output capacitance Coss - 107 128
VCE = 25 V, V GE = 0 V, f = 1 MHz
Reverse transfer capacitance Crss - 63 75
VCE = 25 V, V GE = 0 V, f = 1 MHz

Characteristics
Gate charge Q Gate - 100 130 nC
VCC = 480 V, V GE = 15 V, I C = 20 A
Internal emitter inductance LE - 7 - nH
measured 5mm from case

Safe Operating Area Characteristics


Short circuit collector current 1) - - - 200 A
VCE ≤ 600 V, V GE = 15 V, t sc ≤ 10 µs,
T j ≤ 150 °C
Turn off safe operating area - - - 80
VCE ≤ 600 V, Tj ≤ 150 °C

1) allowed number of short circuits: <1000; time between short circuits: >1s

Semiconductor Group 3 02 / 1999


Preliminary data

SGP20N60, SGB20N60, SGW20N60


Switching Characteristics, Inductive Load (Diode:BUP602D), at Tj = 25 °C
Parameter Symbol Values Unit
min. typ. max.
Characteristics
Turn-on delay time t d(on) - 24 29 ns
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Rise time tr - 38 46
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Turn-off delay time t d(off) - 225 270
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Fall time tf - 54 65
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Turn-on energy 1) Eon - 0.87 1 mJ
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Turn-off energy Eoff - 0.33 0.43
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Total switching energy 1) Ets - 1.2 1.43
VCC = 400 V, V GE = 0/+15 V, I C = 20 A,
RG = 16 Ω

1) E on and E ts include BUP602D diode commutation losses.

Semiconductor Group 4 02 / 1999


Preliminary data

SGP20N60, SGB20N60, SGW20N60


Switching Characteristics, Inductive Load (Diode: BUP602D), at T j = 150 °C
Parameter Symbol Values Unit
min. typ. max.
Characteristics
Turn-on delay time t d(on) - 22 27 ns
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Rise time tr - 35 42
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Turn-off delay time t d(off) - 250 300
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Fall time tf - 63 76
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Turn-on energy 1) Eon - 1.18 1.36 mJ
VCC = 400 V, V GE = 15 V, I C = 20 A,
RGon = 16 Ω
Turn-off energy Eoff - 0.49 0.64
VCC = 400 V, V GE = 0 V, IC = 20 A,
RGoff = 16 Ω
Total switching energy 1) Ets - 1.67 2
VCC = 400 V, V GE = 0/+15 V, I C = 20 A,
RG = 16 Ω

1) E on and E ts include BUP602D diode commutation losses.

Semiconductor Group 5 02 / 1999


Preliminary data

SGP20N60, SGB20N60, SGW20N60


Typ. collector current Safe operating area
IC = f (f) IC = f (VCE )
parameter: D = 0.5, Tj ≤ 150 °C parameter: D = 0, TC = 25°C, Tj ≤ 150°C
100 10 3

A
A
TC = 80 °C
80 10 2
t p= 4µs
70 TC = 110 °C 15µs
1
10
IC

IC
60 50µs
TC = 80 °C
50 200µs

1ms
40 10 0
TC = 110 °C
30 DC

20 10 -1

10 - - - square wave peak current


triangle wave peak current
0 1 2 3 4 5
10 -2 0
10 10 10 10 10 Hz 10 6 10 10
1
10
2
10
3
V 10
4

f VCE

Power dissipation Collector current


Ptot = f (TC) IC = f (TC)
parameter: Tj ≤ 150 °C parameter: VGE ≥ 15 V , Tj ≤ 150 °C
SGP20N60
190 50
W
A
160
40
140
35
Ptot

120
IC

30
100
25
80
20
60
15

40
10

20
5

0
0 20 40 60 80 100 120 °C 160 0
0 20 40 60 80 100 120 °C 160
TC TC
Semiconductor Group 6 02 / 1999
Preliminary data

SGP20N60, SGB20N60, SGW20N60

Typ. output characteristics Typ. output characteristics


IC = f (VCE) IC = f (VCE)
parameter: tp = 80 µs, Tj = 25 °C parameter: tp = 80 µs, Tj = 150 °C
65 65
A A

55 55
50 50
20V 20V
45 45
15V 15V
40 13V 13V
IC

40

IC
11V 11V
35 9V 9V
35
7V 7V
30 5V 30 5V
25 25
20 20
15 15
10 10
5 5
0 0
0 1 2 3 V 5 V
0 1 2 3 5
VCE VCE

Typ. transfer characteristics Gate-emitter threshold voltage


IC = f (VGE) VGE(th) = f (Tj )
parameter: tp = 80 µs, VCE = 10 V parameter: IC = 0.3 mA
50 6.0

A
V
25 C
40
5.0
VGE(th)

35

4.5
IC

30

25 4.0 max.

20
3.5

15 typ.
3.0
10

2.5 min.
5

0 2.0
0 2 4 6 V 10 -60 -20 20 60 100 °C 160
VGE Tj
Semiconductor Group 7 02 / 1999
Preliminary data

SGP20N60, SGB20N60, SGW20N60


Typ. switching time Typ. switching time
t = f (I C) , inductive load, Tj = 150°C t = f (RG) , inductive load, Tj = 150°C
par.: V CE = 400 V, V GE = 0/+15 V, R G = 16 Ω par.: VCE = 400 V, VGE = 0/+15 V, IC = 20 A
10 3 10 3

t d(off)

ns ns
td(off)
t

t
10 2 10 2 tf
tf

tr
t d(on)
tr

td(on)

10 1 10 1
0 5 10 15 20 25 30 35 A 45 0 10 20 30 40 Ω 60
IC RG

Typ. switching time Typ. collector-emitter saturation voltage


t = f (Tj) , inductive load , V CE = 400 V VCEsat = f (Tj )
V GE = 0/+15 V, I C = 20 A, RG = 16 Ω parameter: VGE = 15 V
3
10 4.0

V
ns
VCE(sat)

I C = 40 A
td(off) 3.0
t

10 2 2.5

tf I C = 20 A
2.0
tr

td(on) 1.5

10 1 1.0
0 20 40 60 80 100 120 °C 160 -60 -20 20 60 100 °C 160
Tj Tj
Semiconductor Group 8 02 / 1999
Preliminary data

SGP20N60, SGB20N60, SGW20N60


Typ. switching losses Typ. switching losses
E = f (I C) , inductive load, Tj = 150°C E = f (RG ) , inductive load, Tj = 150°C
par.: V CE = 400 V, V GE = 0/+15V, R G = 16 Ω par.: VCE = 400 V, VGE = 0/+15 V, IC = 20 A
4.5 3.0
*) E and E include BUP602D *) E
on ts mWs on and Ets include BUP602D
mWs diode commutation losses. Ets* diode commutation losses.

3.5 2.4
2.2 E ts*
3.0 Eon * 2.0
E

E
1.8
2.5
1.6
1.4 E on*
2.0
1.2
1.5 1.0
Eoff 0.8 E off
1.0
0.6
0.4
0.5
0.2
0.0 0.0
0 5 10 15 20 25 30 35 A 45 0 10 20 30 40 Ω 60
IC RG

Typ. switching losses Transient thermal impedance


E = f (T j) , inductive load, VCE = 400 V, ZthJC = f(tp )
V GE = 0/+15 V, I C = 20 A, RG = 16 Ω parameter: D = tp / T
2.0 10 1
*) E and E include BUP602D
on ts K/W
mWs diode commutation losses.

1.6 10 0

1.4
Z thJC

Ets *
1.2 10 -1
E

1.0
D=0.5
0.8 Eon* 10 -2 0.2
0.1
0.6
0.05
0.02
single pulse 0.01
0.4 10 -3

Eoff
0.2

0.0 10 -4 -7 -6 -5 -4 -3 -2 0
0 20 40 60 80 100 120 °C 160 10 10 10 10 10 10 s 10
Tj tp
Semiconductor Group 9 02 / 1999
Preliminary data

SGP20N60, SGB20N60, SGW20N60


Typ. gate charge Typ. capacitances
VGE = f (Q Gate) C = f (VCE )
parameter: IC = 20 A parameter: VGE = 0 V, f = 1 MHz
25 10 4

pF
120 V
V 480 V

Ciss
10 3
VGE

15

C
10
Coss
10 2

Crss
5

0 10 1
0 20 40 60 80 100 120 nC 150 0 5 10 15 20 25 30 V 40
QGate VCE

Short circuit withstand time Typ. short circuit current


tsc = f (V GE) ICsc = f (VGE )
par.: V CE = 600 V, start at T j = 25 °C par.: VCE ≤ 600 V, TC = 25 °C, Tj ≤ 150 °C
25 350

A
µs

250
I Csc
t sc

15
200

150
10

100

5
50

0 0
10 11 12 13 V 15 10 11 12 13 14 15 16 17 18 V 20
VGE VGE
Semiconductor Group 10 02 / 1999
SGP20N60, SGB20N60, SGW20N60

TO-220AB

dimensions
[mm]
symbol min max
A 9.70 10.30
B 14.88 15.95
C 0.65 0.86
D 3.55 3.89
E 2.60 3.00
F 6.00 6.80
G 13.00 14.00
H 4.35 4.75
K 0.38 0.65
L 0.95 1.32
M 2.54 typ.
N 4.30 4.50
P 1.17 1.40
T 2.30 2.72

TO-263AB

dimensions
[mm]
symbol min max
A 9.80 10.20
B 0.70 1.30
C 1.00 1.60
D 1.03 1.07
E 2.54 typ.
F 0.65 0.85
G 5.08 typ.
H 4.30 4.50
K 1.17 1.37
L 9.05 9.45
M 2.30 2.50
N 15 typ.
P 0.00 0.20
Q 4.20 5.20
R 8° max
S 2.40 3.00
T 0.40 0.60
U 10.80
V 1.15
W 6.23
X 4.60
Y 9.40
Z 16.15

Semiconductor Group 11 02 / 1999


SGP20N60, SGB20N60, SGW20N60

Edition 02 / 1999
Published by Siemens AG,
Bereich Halbleiter Vetrieb,
Werbung, Balanstraße 73,
81541 München
© Siemens AG 1997
All Rights Reserved.
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not for applications, processes and circuits implemented within components or assemblies.
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For questions on technology, delivery and prices please contact the Semiconductor Group Offices in Germany
or the Siemens Companies and Representatives worldwide (see address list).
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in question please contact your nearest Siemens Office, Semiconductor Group.
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Critical components1 of the Semiconductor Group of Siemens AG, may only be used in life-support devices or
systems2 with the express written approval of the Semiconductor Group of Siemens AG.
1)A critical component is a component used in a life-support device or system whose failure can reasonably be
expected to cause the failure of that life-support device or system, or to affect its safety or effectiveness of
that device or system.
2)Life support devices or systems are intended (a) to be implanted in the human body, or (b) to support and/or
maintain and sustain and/or protecf human life. If they fail, it is reasonable to assume that the health of the
user or other persons may be endangered.

Semiconductor Group 12 02 / 1999

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