EEE 1011-Automated Test Engineering Lab

Digital Assignment-3
Name: Kanav Bhasin
Register Number: 18BEE0068
Slot-L31+L32
Faculty: Prof Karthikeyan A

Experiment-3
Title: In-Circuit functional test (ICFT) using QT 200
Aim: To perform In-Circuit functional test (ICFT) using QT 200
Apparatus Used:
• In-Circuit functional test (ICFT) using QT 200
• Test Clip
• PCB with the IC under test
• Power cable for QT-200
• Interactive Software and a PC
Truth Table: NOT Gate (7404 IC)
Input Output
0 1
1 0

Description: In-circuit functional testing (or clip-on testing as it is popularly called) is the
functionality of each component on the board using test clips. Here, the inference is that
the overall board functionality can be verified if each and every component on the board is
tested and found to be good. This is ideal for component-level replacement, where
replacing an entire board is expensive or impractical.
Clip-on testing uses a technique called backdriving to force the desired logic state to the
input pins of the Device under test (DUT). The tester hardware is equipped with powerful
pin drivers that can source or sink currents high enough to force nodes on the DUT to a
required state. Of course, this is done for a very short amount of time to ensure that the
tests done are within the safety limits of the devices in the circuit. This can often be difficult
in circuits where the components are normally operating near their current handling limits
or node capacitance is high.
Outputs:

Selecting ICFT from the interactive window

ICFT Clip connected to QT-200

Data cable connected to the IC and power is supplied to PCB

Device data and types is entered in the interactive platform

Run the test

Functionality test passed

Result: In circuit functional test for the given IC on a PCB was successfully performed and
the device passed the functionality test