EEE1011- Automated Test Engineering Lab

Digital Assignement-4
Name: Kanav Bhasin
Register Number: 18BEE0068
Slot: L31+L32
Faculty: Prof Karthikeyan A

Experiment-4
Title: QSMVI TEST USING QT 200 TEST EQUIPMENT
Aim: To perform QSMVI Test to verify the functionality of an unknown IC using QT 200
Apparatus Used:
• QT 200 Test Equipment Machine
• PC with installed software
• Card-edge connector with IC clip
• IC to be tested (IC 7408)
Truth Table:
AND Gate:
A B Y
0 0 0
0 1 0
1 0 0
1 1 1

Description:
QSMVI is a technique used for capturing the voltage Vs current trace of a node or pin (w.r.t.
Gnd) by applying a current limited sine wave of selected amplitude and frequency under
Power off condition. The VI trace testing requires no device test program to be written and
hence is independent of the functionality of the device under test unlike in-circuit
functional test and out-circuit functionality test. Hence, this test is an ideal tool for testing
all custom digital as well as analogue devices such as transistors, resistors, diodes and
regulators.
Output:

IC 7408 for testing

Test window for QSMVI

QT-200 test equipment

Sequence generator
Test in progress

Various traces
 Test passed

When pins are deliberately open circuited

 Final status of the pins
Result: The functionality of the 7408 IC was verified successfully with QSMVI technique
using QT-200 test equipment.