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Irlb8314Pbf: Application V 30 V R Max 2.4 M 3.2 QG 40 NC I 171 A I 130A
Irlb8314Pbf: Application V 30 V R Max 2.4 M 3.2 QG 40 NC I 171 A I 130A
Irlb8314Pbf: Application V 30 V R Max 2.4 M 3.2 QG 40 NC I 171 A I 130A
S
D
G
TO-220Pak
G D S
Gate Drain Source
Thermal Resistance
Symbol Parameter Typ. Max. Units
RJC Junction-to-Case ––– 1.2
RCS Case-to-Sink, Flat Greased Surface 0.50 ––– °C/W
RJA Junction-to-Ambient ––– 62
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IRLB8314PbF
Avalanche Characteristics
EAS (Thermally limited) Single Pulse Avalanche Energy 180
mJ
EAS (tested) Single Pulse Avalanche Energy Tested Value 900
IAR Avalanche Current 68 A
EAR Repetitive Avalanche Energy 12.5 mJ
Diode Characteristics
Symbol Parameter Min. Typ. Max. Units Conditions
Continuous Source Current MOSFET symbol
IS ––– ––– 171
(Body Diode) showing the
A
Pulsed Source Current integral reverse
ISM ––– ––– 664
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage ––– ––– 1.0 V TJ = 25°C,IS = 68A,VGS = 0V
trr Reverse Recovery Time ––– 21 31 ns TJ = 25°C IF = 68A ,VDD=15V
Qrr Reverse Recovery Charge ––– 54 81 nC di/dt = 430A/µs
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IRLB8314PbF
1000 1000
VGS VGS
TOP 10V TOP 10V
ID, Drain-to-Source Current (A) 5.5V 5.5V
100 100
2.8V
2.8V
60µs PULSE WIDTH 60µs PULSE WIDTH
Tj = 25°C Tj = 175°C
10 10
0.1 1 10 100 0.1 1 10 100
ID = 120A
100
T J = 175°C
1.4
(Normalized)
10 1.2
T J = 25°C
1.0
1
100000 14
VGS = 0V, f = 1 MHZ
C iss = C gs + C gd, C ds SHORT ED
ID = 68A VDS= 24V
C rss = C gd
12
VDS= 15V
VGS, Gate-to-Source Voltage (V)
C oss = C ds + C gd
10
C, Capacitance (pF)
10000
C iss 8
6
C oss
1000 4
C rss
0
100 0 20 40 60 80 100 120
0.1 1 10 100
QG Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
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IRLB8314PbF
1000 1000
100µsec
Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area
180 2.5
120
100
1.5
80 ID = 100µA
ID = 250µA
60 ID = 1.0mA
1.0
40
20
0.5
0
-75 -50 -25 0 25 50 75 100 125 150 175
25 50 75 100 125 150 175
T C , Case Temperature (°C) T J , Temperature ( °C )
Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Threshold Voltage vs. Temperature
10
Thermal Response ( Z thJC ) °C/W
1
D = 0.50
0.20
0.1 0.10
0.05
0.02
0.01
0.01
Notes:
SINGLE PULSE 1. Duty Factor D = t1/t2
( THERMAL RESPONSE ) 2. Peak Tj = P dm x Zthjc + Tc
0.001
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
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IRLB8314PbF
800
6
400
4 T J = 125°C
200
2
T J = 25°C
0 0
2 6 10 14 18 25 50 75 100 125 150 175
Fig 12. Typical On-Resistance vs. Gate Voltage Fig 14. Maximum Avalanche Energy vs. Drain Current
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IRLB8314PbF
Fig 18. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
V (B R )D S S
15V
tp
L D R IV E R
VDS
RG D .U .T +
VD D
-
IA S A
20V
tp 0 .0 1 IAS
Fig 19a. Unclamped Inductive Test Circuit Fig 19b. Unclamped Inductive Waveforms
Fig 20a. Switching Time Test Circuit Fig 20b. Switching Time Waveforms
Id
Vds
Vgs
V g s (th )
Fig 21a. Gate Charge Test Circuit Fig 21b. Gate Charge Waveform
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IRLB8314PbF
EXAM PLE: T H IS IS A N IR F 1 0 1 0
LO T C O D E 1789 IN T E R N A T IO N A L PART N UM BER
ASSEM BLED O N W W 19, 2000 R E C T IF IE R
IN T H E A S S E M B L Y L IN E "C " LO G O
D ATE C O D E
N o t e : "P " in a s s e m b ly lin e p o s it io n YEAR 0 = 2000
ASSEM BLY
in d ic a t e s "L e a d - F r e e " LO T C O D E W EEK 19
L IN E C
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
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IRLB8314PbF
Qualification Information†
Industrial
Qualification Level
(per JEDEC JESD47F) ††
Moisture Sensitivity Level TO-220 N/A
RoHS Compliant Yes
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Limited by TJmax, starting TJ = 25°C, L = 0.067mH, RG = 50, IAS = 68A, VGS =10V.
Pulse width 400µs; duty cycle 2%.
R is measured at TJ approximately 90°C.
This value determined from sample failure population, starting T J =25°C,
L=0.5mH, RG = 50, IAS =60A, VGS =10V.
Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is
130A. Note that current limitations arising from heating of the device leads may occur with some lead mounting
arrangements. (Refer to AN-1140).
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