Keysight i3070 In-Circuit Test System

Getting Started

i3070 Series 6 Family 2

Board Test Methods 3
i3070 In-Circuit Test Software 4
Starting the i3070 Series 6 System 6
Emergency Shutdown 8
i3070 Series 6 Family
The i3070 Series 6 In-Circuit Test (ICT) system may be a 4-module or 2-module
system. The description refers to the maximum number of modules the testhead
can have, not to the number of populated modules. For example, a 4-module
system might have only one or two populated modules, but it could be upgraded
to have three or four.
These configurations come with either fully muxed hybrid pin cards or fully
unmuxed hybrid pin cards. Muxed or unmuxed refers to the architecture of hybrid
pin cards used in the ICT system; whether resources are shared or not through
multiplexing. In general, muxed hybrid pin cards share digital channels whereas
unmuxed hybrid pins cards have dedicated digital channel for each of its pins.

Figure 1 E9903G 4-module ICT System

Table 1 Test station controls

Item Description
Emergency Shutdown Press the Emergency Shutdown switch to power down the testhead
Switch and its associated equipment in an emergency situation.
It turns off all AC power to the testhead, and is equivalent to turning off
the main circuit breaker on the rear of the system.
Main Power Switch Controls the incoming line voltage and is located at the rear of the
system.
Testhead Rotation Rotates the testhead into any position from 0 to 90 degrees from the
Switch horizontal.
Guided probe Used by the operator for manual probing of circuits.
Operator footswitch Functions like the START button in the operator screen; can be used
when the operator’s hands are busy.

2 Getting Started
Board Test Methods
The following are some of the test methods used by i3070 In-Circuit Test Systems.
Some of these test methods may not be available on your system, but can be
included as an option.

Table 2 Test methodologies

Test Method Description

Shorts & Opens An unpowered test method that tests for unexpected shorts and
opens; expected results are confirmed using a known good board.
Analog In-circuit An unpowered test that measures the value of analog devices such
as resistors and capacitors.
Vectorless Test EP (VTEP) An unpowered test of the connectivity from each pin on a device to
the circuit board. The system uses nanoVTEP hardware to measure
the capacitance from a pin of a device to the nanoVTEP probe to
determine connectivity.
Polarity Check An unpowered test that automatically tests the orientation (polarity)
of electrolytic capacitors on the board under test. This test detects
reversed capacitors before they can fail and possibly damage the
board or cause safety hazards.
Connect Check (Mux systems only) An unpowered test method that uses the
intrinsic pin protection diodes of the device-under-test to verify
contact between the devices.
Analog Functional A powered test that applies a stimulus to a device or circuit under
test and measures its response.
Mixed Testing A powered test that applies analog functional and digital test
methods to a device or circuit.
Digital In-circuit A powered test that applies vector patterns to the device and tests
for the expected outputs. Digital in-circuit techniques are also used
for programming of devices such as Flash and PLDs.
Boundary-scan A powered test of boundary-scan devices.
i3070 LED Test Measures LED color and luminosity with superior throughput during
i3070 in-circuit testing. It returns the LED color value and luminosity
in nanometers and µW/cm2 to accuracies of ±3 nm and ±10%
respectively.

Getting Started 3
i3070 In-Circuit Test Software
The i3070 In-Circuit Test Software provides the tools for test programming and
deployment, with an operator interface for production testing. The applications and
programming software include languages for board test development and quality
reporting.
To maximize productivity, the test development software can also be set up and run
from the developers’ own Windows workstations in addition to the testhead.
Table 3 lists the standard software provided for test development, which depends
on your i3070 system platform (Mux or UnMux). Table 4 lists other board test
applications and options. Refer to Overview of Test Development Process, which
describes the process and explains when and how the various tools are used.

Table 3 Test development software

Task UnMux Systems Mux Systems

Develop • Developer Interface: Provides step-by-step • Board Consultant: Guides you through the entry and
guidance from data entry to test and fixture verification of board data; and helps identify errors
generation. The test development process is and testability problems with the board data.
organized into phases and tasks to be • IPG Test Consultant: Step-by-step guidance
completed. through the test generation and fixture generation
processes.
• Fixture Consultant: Customize the test fixture by
editing fixture attributes such as wiring, probe
locations, board placement, and fixture electronics.
Other useful tools during test development:
• Part Description Editor: Helps you create part description libraries for components such as a resistor
pack or multi-chip module.
• Setup Test Editor: Helps you develop VCL setup-only library tests for digital devices.
Debug • Engineer Test Interface: For pins and shorts • Board Test Insight (BTI): Debug all test types.
tests, analog in-circuit tests, and VTEP tests.
An AutoDebug utility automatically debugs
unpowered analog in-circuit tests.
• Pushbutton Debug: For digital, analog
functional, mixed, and boundary-scan tests.
Test • Board Test Insight (BTI): Also use BTI as the operator interface for production testing.

4 Getting Started
Table 4 Other board test applications

Application Description
Access Consul tant An analysis and advisory tool that allows you to optimize the use of test probes in limited
access situations.
Coverage Analyst Provides a comprehensive view of the predictive test coverage based on the contents of a
board test directory.
Pushbutton QSTATS Produces several SQC reports that help you analyze your production process and identify
process problems.
Korn Shell Shell environment for executing UNIX commands on Windows operating systems.
BT-Basic Programming environment for editing and manipulating test programs.
Diagnostics (DGN) Troubleshooting tool that lets you check the hardware configuration, verify performance, and
isolate failures to a field-replaceable unit (FRU).
Boundary Scan For testing digital devices that comply with IEEE Standard 1149.1.
Data Log Converter Optional tool that runs in the background to generate reports from i3070 log files, and sends
the customized output to a specified folder or web server.

Getting Started 5
Starting the i3070 Series 6 System

Boot the Testhead Controller

1 Turn on the monitor and any other peripherals.
2 Turn on power to the controller and allow the controller to boot.
3 Log on to Windows using your assigned user name and password.
The standard user names supplied with the test system are shown in Table 5.

Table 5 i3070 system users

User Name Defaul t Password Definition and Permissions

operator Resetme1 For operators using the operator interface to test boards.
tcm Resetme1 For operators using BT-Basic to test boards.
user Alterme1 For general users or sustaining engineers.
engineer Alterme1 For test developers or sustaining engineers.
calibrate Keysight1 Used for system calibration and maintenance. This user
has administrative rights.

Boot the Testhead

1 Log on as calibrate if you intend to boot the testhead.
2 Open a Korn Shell window and type dgn at the command line to run the
Diagnostics program.
3 When the DGN interface appears, select the Testhead Functions softkey.
4 Boot the testhead using the Testhead Power On softkey.
Booting takes about 2 to 5 minutes, depending on the number of testhead
modules in your system.

6 Getting Started
 Shutting Down
Shut down the system before removing power to perform tasks such as installing a
new disk or interface card.
Unboot the testhead before shutting down the controller to
prevent damage to the software.

Perform the following procedures in order:

1 Unboot the testhead:
a Log on as calibrate.
b Open a Korn Shell window and type dgn at the command line to run the
Diagnostics program.
c When the DGN interface appears, select the Testhead Functions softkey.
d Unboot the testhead using the Testhead Power Off softkey.
2 Shut down the controller:
a Select Shut Down from the Start menu.
b Push the power switch on the controller to turn it off.

Getting Started 7
Emergency Shutdown
The Emergency Shutdown Switch, (or Emergency Off, EMO) is the red button
located at the lower left corner on the front of the testhead. It turns off all AC and
DC power to the testhead, and is equivalent to turning off the PDU on the rear of
the pod.
Press the Emergency Shutdown Switch if you ever need to power down the
testhead and its associated equipment in an emergency situation.

Figure 2 Emergency Shutdown Switch

To restore power after pressing the Emergency Shutdown Switch:

Pull the Emergency Shutdown Switch out to its normal position, then switch the
Power Distribution Unit (PDU) off and then on again.

DO NOT use the Emergency Shutdown Switch as a substitute for correct

power-down (unboot) procedures; i.e., executing the “testhead power off”
command.

8 Getting Started