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Treeing and Tracking in Solid Dielectrics
Treeing and Tracking in Solid Dielectrics
Whenever a solid material has some impurities in terms of some gas pockets or liquid pockets
in it the dielectric strength of the solid will be more or less equal to the strength of the weakest
impurities. If some gas pockets are trapped in the solid material during manufacture, the gas
has a relative permittivity of unity and the solid material Er, the electric field in gas will be Er
times the field in solid material. As a result, the gas breaks down at relatively low voltage. The
charge concentration here in void will make the field more uniform. These charge
concentrations at the voids within the dielectric lead to breakdown step by step and finally lead
to complete rapture of dielectric. As the breakdown is not caused by single discharge channel
and assumes a tree like structure is known as breakdown due to treeing. This phenomenon can
be readily demonstrated in a laboratory by applying an impulse voltage between point plane
electrodes.
Variac rating : 3A
HV Transformer
References:
http://www.faadooengineers.com/online-study/post/eee/high-voltage-
engineering/125/breakdown-due-to-treeing-and-tracking-in-solid-dielectrics
https://www.irjet.net/archives/V5/i4/IRJET-V5I4611.pdf