Lab Session # 5: Assessment Rubrics For GSC-103 Applied Physics

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Applied Physics Lab Manual Institute of Bu siness Management

Collage of Engineering and Sciences

LAB SESSION # 5
Assessment Rubrics for GSC-103 Applied Physics
Method: Lab reports and instructor observation during Lab sessions
Outcome Assessed:
a. Ability to conduct experiments, as well as to analyze and interpret data (P).
b. Ability to function in teams (A).
c. Ability to use the techniques, skills and modern engineering tools necessary for engineering practice (P).
Performance Exceeds expectation Meets expectation Does not meet expectation Marks
(5-4) (3-2) (1-0)
1. Realization of Able to fully or moderately Able to somewhat understand Able to slightly or unable to
Experiment [a, c] understand the concepts related the concepts related to the understand the concepts related to
to the experiment and provide experiment and provide results the experiment and does not
excellent results. with minor errors. provide excellent results.
2. Teamwork [b] Able to fully or moderately Able to somewhat produce Able to slightly or unable to
produce end results and proper end results and improper produce end results and no
delegation of tasks. All delegation of tasks. Few delegation of tasks. One member is
members show responsibility members show responsibility working or no member show
and work for the part they are and work for the part they are responsibility or work for the part
assigned to do. assigned to do. they are assigned to do.
3. Procedural Able to fully or moderately Able to somewhat understands Able to slightly or unable to
Skills and understands lab work procedure lab work procedure and understands lab work procedure
Laboratory Safety and perform lab work. Displays perform lab work. Somewhat and perform lab work. Slightly
Rules [a, c] skills to act upon sequence of displays skills to act upon displays or does not displays skills
steps in lab work. Always or sequence of steps in lab work. to act upon sequence of steps in lab
often take precautions or use Occasionally take precautions work. Rarely or does not take
equipment with care. or use equipment with care. precautions or use equipment with
care.
4. Conducting Able to fully or moderately Able to somewhat initiate lab Able to slightly or unable to initiate
Experiment with initiate lab work. Capable to work. Somewhat capable to lab work. Slightly capable or
own initiative [a, c] perform experiment using perform experiment using incapable to perform experiment
procedural skills on his own. procedural skills on his own. using procedural skills on his own.
5. Use of Able to fully or moderately use Able to somewhat use lab Able to slightly or unable to use lab
Observation [a] lab work observation for work observation for analysis work observation for analysis and
analysis and calculations. and calculations. Somewhat calculations. Slightly displays or
Displays skills to perform displays skills to perform does not displays skills to perform
related analysis and calculations related analysis and related analysis and calculations
using the observation from lab calculations using the using the observation from lab
work. observation from lab work. work.
6. Modern Tool Able to fully or moderately Able to somewhat Able to slightly or unable to
Use [a, c] demonstrate the use of relevant demonstrate the use of demonstrate the use of relevant
tool. Displays skills to relevant tool. Somewhat tool. Slightly displays or does not
demonstrate the use of relevant displays skills to demonstrate displays skills to demonstrate the
tool for the lab work. the use of relevant tool for the use of relevant tool for the lab
lab work. work.
7. Ability to Able to fully or moderately Able to somewhat Able to slightly or unable to
troubleshoot troubleshoot experimental troubleshoot experimental troubleshoot experimental errors
errors and Resolve errors and resolve them without errors and somewhat resolve and slightly or unable to resolve
without guidance or supervision. them without guidance or them without guidance or
supervision [a] supervision. supervision.
Total
Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

INSTITUTE OF BUSINESS MANAGEMENT


COLLEGE OF ENGINEERING & SCIENCES

Applied Physics (GSC: 103)

Semester _____________

EXPERIMENT NO # 5
LAB OBJECTIVE: Study the characteristics of a diode curve

Name of Student :

Student ID :

Date :

Lab Assessment
Total Marks

Marks Obtained

Lab Engineer:
Name: Sir Mukesh Kumar___________
Signature: __________________
Date: __________________

Faculty: Ms Rabia Hassan____________


Name: __________________________
Signature: __________________
Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

EXPERIMENT # 5
SEMICONDUCTOR DIODE CHARACTERISTICS
Objective: Study the characteristics of a diode curve

Equipment and Materials:

1. DC power supply
2. Digital multimeter (DMM)
3. Diodes (Silicon D2N4002, Germanium D1N4148)
4. Resistors 1KΩ, 1MΩ
Basic Concepts:

A diode is a two-terminal electronic equipment that blocks current in one direction while letting
current flow in another direction.

When a diode is connected in a Forward Bias condition, a Negative voltage is supplied to the N-
type material and a positive voltage is supplied to the P-type material. If this external voltage
becomes greater than the value of the potential barrier, 0.7 volts for Silicon and 0.3 volts for
Germanium, the potential barriers opposition will be overcome and current will start to flow as
the negative voltage pushes or repels electrons towards the junction giving them the energy to
cross over and combine with the holes being pushed in the opposite direction towards the
junction by the positive voltage. This results in a characteristics curve of zero current flowing up
to this “knee” voltage and high current flow through the diode with little increase in the external
voltage.

Forward Biased Junction Diode is showing a Reduction in the Depletion Layer


Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

Figure. 1: Forward Bias Junction diode

When a diode is connected in a Reverse Bias condition, a positive voltage is applied to the N-
type material and a negative voltage applied to the P-type material. The positive voltage applied
to the N-type material attracts electrons towards the positive electrode and away from the
junction, while the holes in the P-type end are also attracted away from the junction towards the
negative electrodes. The net result is that the depletion layer grows wider due to a lack of
electrons and holes and presents a high impedance path, almost in insulator. The result is that a
high potential barrier is created thus preventing current from flowing through the semiconductor
material.

Reverse Biased Junction Diode is showing the Increase in the Depletion Layer

Figure. 2: Reverse Bias Junction diode


Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

Figure. 3: Junction Diode Symbol and Static

Procedure:
1. Using the DMM perform the diode test for both forward and reverse bias. If successful
continue to step 2, otherwise replace the diode.
2. Connect the circuit of figure 4. For each source voltage listed in table 1, measure and
record the diode current Id.

Circuit Diagram:

Figure. 4: Circuit Diagram to test Diode Characteristics

Table 1: Silicon Diode Measured Values

Vd 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.75


Id
Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

Table. 2: Germanium Diode Measured Values:

Vd 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.75


Id

3. Reverse the source voltage in figure 4. Set source voltage to 20V of table 2, measure
value of Vd and Id.

For Silicon Diode:

Vd Measured = ____________________

Id Measured = ____________________

For Germanium Diode:

Vd Measured = ____________________

Id Measured = ____________________

Conclusion:

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Applied Physics Lab Manual Institute of Bu siness Management
Collage of Engineering and Sciences

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