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Effects of Y2O3 Addition On Microwave Dielectric Characteristics of Al2O3 Ceramics
Effects of Y2O3 Addition On Microwave Dielectric Characteristics of Al2O3 Ceramics
Effects of Y2O3 Addition On Microwave Dielectric Characteristics of Al2O3 Ceramics
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Abstract
Microwave dielectric characteristics of alumina ceramics with yttria addition were investigated. The sintering temperature was lowered, and the
dielectric constant (εr) did not remarkably change by adding yttria. The microwave dielectric loss (tan δ) increased from 8.4 × 10− 5 to 2.2 × 10− 4,
due to the presence of Al5Y3O12 secondary phase. The grain size had significant effects on the dielectric loss, and there was an optimum grain size
where the dielectric loss reached the minimum.
© 2007 Published by Elsevier B.V.
3. Results and discussion Fig. 4 shows the SEM micrographs of Y2O3 doped Al2O3
ceramics with various x. The grain size is about 20 μm for the dense
The bulk density of Al2O3 ceramics with various x as the function ceramic samples without Y2O3 doping. With the addition of Y2O3,
of sintering temperature is shown in Fig. 1. Alumina ceramics can be the grain size generally becomes fine, and the Al5Y3O12 secondary
sintered at 1700 °C to approach theoretical densities (3.9862 g/cm3). phase with different morphologies is uniformly distributed along
With increasing x, the densification temperature decreases from grain boundaries of alumina major phase. Doping Y2O3 can inhibit
1700 °C to 1600 °C. The XRD patterns shown in Fig. 2 indicate the grain growth in alumina ceramics during sintering, and this is similar
phase evolution of yttria doped alumina ceramics with various x. For to those reported previously [23,24]. The only exception is observed
all samples of yttria doped alumina, the secondary phase of Al5Y3O12 for x = 0.03, where the excess grain growth is caused by the over
is detected, and the amount of the secondary phase increases with sintering.
increasing x. This indicate that Y3+ can not replace Al3+ in corundum The microwave dielectric characteristics of Y2O3 doped Al2O3
alumina to form a solid solution of (Al1−xYx)2O3, and it tends to form ceramics are shown in Table 1 and Fig. 5. The dielectric constant
Al5Y3O12 secondary phase. Fig. 3 shows the Rietveld refinement of Al2O3 ceramics with various x varies within 9–10. The dielec-
results for the sample with x = 0.001, where a slow step scan is em- tric loss increases from 8.4 × 10− 5 to 2.2 × 10− 4, while the Qf at
ployed with a total collection time 12 h over the 2–θ ranges 20–130°. about 13 GHz decreases from 160,000 GHz to 58,320 GHz. With
The Al5Y3O12 is detected, and the (Al1−xYx)2O3 solid solution can increasing Y2O3 doping, the increased amount of secondary phase
never be formed even for such a small x because of the large difference brings harmful effects to the microwave properties. But compared
between the ionic radius of Al3+ and Y3+. Moreover, a minor amount with the samples of x = 0.005, 0.01, 0.03 and 0.05, the lowest dielec-
of quartz is observed in all ceramic samples, and it is introduced by tric loss and the highest Qf is observed for x = 0.02, where the
agate mortar because the hardness of alumina is higher than that of grain size is about 7–8 μm. It is known that the grain size has
quartz. significant effects on the dielectric loss. The larger grain size may
Fig. 1. Bulk density of Al2O3 ceramics doped with various amounts of Y2O3 Fig. 3. XRD pattern of sintering alumina doping 0.1 mol% yttria refined by
as a function of sintering temperature. Rietveld fitness.
K.X. Song et al. / Materials Letters 61 (2007) 3357–3360 3359
Fig. 4. SEM micrographs of Al2O3 ceramics with various x: (a) x = 0, (b) x = 0.001, (c) x = 0.005, (d) x = 0.01, (e) x = 0.02, (f) x = 0.03 and (g) x = 0.05.
cause oxygen vacancy of grains not easy to expel during cooling. Al5Y3O12 secondary phase is observed. The dielectric loss
On the other hand, the smaller grain size, the more grain bound- increases generally from 8.4 × 10− 5 to 2.2 × 10− 4, with yttria
aries, which will lead to higher dielectric loss. Correspondingly, doping. The secondary phase increases the dielectric loss, and
the optimum grain size has been also reported about 7–8 μm, which
has less dielectric loss [16,18]. Here, the secondary phase primar-
ily dominates the dielectric loss, and the grain size is the secondary Table 1
factor. Microwave dielectric characteristics of Al2O3 ceramics with various x
x f0 (GHz) εr Qf (GHz) tan (δ)
0 13.38 9.21 159,280 0.000084
4. Conclusion
0.001 14.05 9.91 100,350 0.00014
0.005 14.46 9.70 76,100 0.00019
The dielectric loss of alumina ceramics doped with various 0.01 14.88 9.68 64,700 0.00023
amount of yttria was investigated. It is hard to put the Y3+ ion 0.02 14.42 9.85 80,110 0.00018
into the Al–O octahedron of corundum structure of alumina to 0.03 12.60 10.00 66,320 0.00019
0.05 12.81 9.98 58,230 0.00022
form a solid solution of intermission and substitution, and the
3360 K.X. Song et al. / Materials Letters 61 (2007) 3357–3360