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Received 1 December 1969 by E. Burstein
Received 1 December 1969 by E. Burstein
and
F.H. Pollak and M. Cardona
WE REPORT here the results of an experimental When a uniaxial stress is applied, the Raman
investigation of the effects of static uniaxial peak exhibits splittings and shifts which are
stress on the frequency of the q ~0 optical linear in the applied stress. From the observed
phonons in silicon using Raman scattering. In splittings of the Raman peak with applied
the absence of uniaxial stress, the first order stress along [001] and [111] directions we
Stokes Raman spectrum of silicon exhibits a have obtained the first experimental values for
single peak at w
8 — ~, where w1 and w~ the phenomenological coefficients which
are the frequencies of the incident and scattered describe the changes in the spring constant
radiation, respectively, and W0 is the frequency of the q ~ 0 optical phonons with strain. The
of the q~0 triply degenerate optical phonons. shift due to the hydrostatic component of the
strain yields a value for the mode Gruneisen
parameter for the q ~0 optical phonons
* Present address: Department of Physics, (y~= —8mW0 /8lnV where V is the volume of
Northeastern University, Boston, Massa- the crystal) which is found to be essentially
chusetts.
the same as that for diamond as determined
1 fromby
t Research
of Naval Research,
supported the
in part
ArmybyResearch
the U.S. Office
Office- Mitra, Brafman,
Raman scatteringDaniels,
measurements
and Crawford
of the shift
Durham, and the Advanced Research Projects in frequency induced by hydrostatic pressure.
Agency. Our results are in reasonable agreement with
the lattice dynamical theory of the morphic
~ Research supported in part by the Army Re-
search Office-Durham, the National Science effects of strain on the first order Raman
Foundation, and the Advanced Research spectra of diamond-type crystals developed by
Projects Agency. Ganesan, Maradudin and Oitma.2
133
134 STATIC UNIAXIAL STRESS ON THE RAMAN SPECTRUM Vol. 8, No. 2
~ + q(~0~.
+ ~?)~ A 2r, 2r~~
~ ~ + q(~j2~
-r ~D-- A 2rr~2 = 0
~ 2r7~.2 p + q(j~~.
+ ~j:v)~A (2)
where A = ~2 ~ and ~2 ~ ± A’2~3is the
strain dependent frequency of the optical
phonons. The secular equation is referred to the
system of crystallographic axes, ~ = [100], *In the single subscript notation the stress
v = [010] and z = {00i]. Diagonalization of the strain relation is given by
secular matrix yields the set of three eigen-
vectors of the optical phonons in the presence = (i~ I = 1, 2 6)
of strain. The relation between single and double sub-
script notation is given by NYE J.F., Physical
For a uniaxial stress, ~ applied along either Pro pert/es of Crystals, p. 134, O.U.P. London,
the [001] or the [ill] directions, one finds that the (1957).
threefold degeneracy of the q 0 optical phonon
is split into a singlet ~ = 1l~)with eigenvector = 7 = In
parallel to the stress and a doublet (~l~ = R1) -.~ ii 2
with eigenvectors perpendicular to the stress. - 1 -r
There is also a shift in the frequency of the IL ~/2 /r~
The Raman scattering measurements were scattered radiation is polarized along ~“ (or
carried out at room temperature using a 25 mW vice versa). Similarly, on transforming the
He—Ne laser (6328 A) as source. Since silicon Raman tensor to the x”y”z”axes, one finds that,
is opaque at the laser frequency, the measure- for x”y”z” samples with uniaxial stress along
ments were carried out in the back-scattering z” // [1111 and the incident and back scattered
configuration~ The samples were in the form of radiation along x // [112], the singlet mode
rectangular shaped bars approximately 2 cm long (eigenvector along z’) is observed when the
and 1 mm x 1 mm in cross-section, having incident and scattered radiation are both polarized
polished and etched (2 cm x 1 mm) faces. Two along z” // [iii], whereas, one of the doublet
sample orientations were used designated as modes (eigenvector along ),“) is observed, with
x’y’z’ and x”y”z” . In the x#ylzI orientation the one fourth of the intensity of the singlet mode,
long (z’) axis of the rod was parallel to [001] when the incident radiation is polarized along
and the short (x’ and y’) axes were parallel to z” and the scattered radiation is polarized
[110] and [110] respectively. In the x’y”z” along y’ (or vice versa). By switching the
orientation the long (z”) axis was parallel to polarization of the incident radiation between
[iii] and the short (x” and y’ ) axes were z’ and y’ (or between z” and y”) leaving the
parallel to [112] and [110] respectively. Negative polarizer for the scattered radiation fixed
homogeneous uniaxial stresses were applied along y’ (or z’) one can optionally observe
along the long axes of the samples using the either the singlet or the doublet. Furthermore,
5 by operating the Raman spectrometer (designed
Brown University uniaxial stress apparatus.
The homogeneity of the strain at the surface by Dr. A. Filler) in a step scanning mode with
produced by this apparatus has been demonstrated photon counting, and carrying out the scattering
by the fact that values of various parameters measurements on the singlet and doublet in the
(e.g. deformation potentials) as measured by same run by switching the polarization of the
piezo-electroreflectance, where the penetration incident laser beam for each grating position, it
depth of the light is approximately equal to that was in fact possible to condiderably reduce the
in this experiment, are in good agreement with frequency reproducibility errors. The switching
those determined by bulk measurements (e.g. of the polarization was accomplished by inserting
transmission and cyclotron resonance).5 a A/2 plate into the path of the incident beam by
means of a mechanical device electronically
Raman scattering is a particularly useful coupled to the grating drive system.
technique for observing the splitting of the
frequencies of the q ~ 0 optical phonons since Typical spectra for the x’y”z” orientation
one can make use of polarization selection (uniaxial stress along [111]) are shown in Fig. 1.
rules6 to selectively observe scattering by a The data were obtained for a uniaxial stress of
given type of phonon. Since the strain induced —11.5 x 10~dynes/cm2 and the slit widths
changes in the Raman tensor are relatively small, (0.3 mm) corresponded to an instrumental
the scattering is to a good approximation resolution of 1.8 cm’. The counting rate for the
determined by the first order Raman scattering zero stress peak was 3/sec and the background
tensor of diamond-type crystals. On transforming counting rate was ~5/sec. The Raman peak in
the Raman scattering tensor to the x’y’z’ axes the absence of strain occurs at W
0 = 5230±0.2cm’
one finds that for the x’y’z’ samples with and its half width is 3.7 cm’. The position
uniaxial stress along z’ // [001] and the incident of the zero4 strain peak
but was agrees with
somewhat higherthat reported
than that
and back-scattered
the singlet mode (eigenvector alongx z //
radiation along ) iS[110], by Russell
(520 cm ) reported by Parker, Feldman and
observed when the. incident and scattered radiation Ashkin.7 The width of the peak is somewhat
are both polarized along y’ // [110], whereas one smaller than that (4.6 cm~)reported by Parker
of the doublet modes (eigenvector along y’ ) is and co-workers. No change in peak width with
observed, with the same intensity, when the applied stress is observed. The data of Fig. 1
incident radiation is polarized along z’ and the show that for a negative uniaxial stress along
136 STATIC UNIAXIAL STRESS ON THE RAMAN SPECTRUM Vol. 8, No. 2
I I I I I
~ (z”z”);~Ilx’~r~o
5— 0 (Y~’Z’)~’Ux”; rlIZ” —
I • (Z”z”);~’lIx”;rIlz”
—4- 2 -
Slit Width ~ T~—ll.5xlO’dyne/cm
\/ \
I
~3- -~ ~—
~:
FREQUENCY IN crr~1
FIG. 1. The first order Raman spectrum of Si at 300°K with a uniaxial stress of
—11.5x l09dynes/cm2 applied along the [111] direction. The entries in the
parentheses i.e. (z’z” ) and (y”z”), designate the polarization direction of the
incident and scattered radiation. In each case, the direction of the incident and
scattered radiation is along x” and —x respectively.
[111], A~l= — 0d is positive. [In the case of values of the elastic compliance constants
the x’y’z’ orientation (negative uniaxial stress s, = 76.8, s,
2 = —21.4 and s~ = 126.0 (in units
along [001]) the sign of L\~2is found to be of 10_14cm2/dyne~we obtain using equations
negative.] The intensities of the singlet and (3)—(6) the following values (within 20 per
doublet peaks in Fig. 1 are uncorrected for cent) for the coefficients
2): p = —1.2, qp,= q, andand
—1.8 r (inr =units
— 0.63.
small differences
incident beams forinthe
thetwo
intensities of the When
polarizations. of 102~
(The sec for p and q are obtained directly
values
the appropriate corrections are made, the ratio from the data for the ~// [001]). The data for
of the singlet peak to doublet peak intensity is the two orientations yield values of —4.7 and
found to be 4 as expected from the first order —5.9 for the quantity (p + 2q) which determines
selection rules. In recording the spectra the the shift in frequency with hydrostatic pressure,
counting time per grating step for the doublet indicating a self-consistency of about 25 per
(400 sec) was chosen to be twice as long as cent. Our values for the coefficients agree in
that for the singlet (200 sec) in order to partially sign and are in reasonable agreement in magnitude
compensate for the unequal scattering intensities, with the theoretical values, p = —0.4, q —1.0
[In the case of the x’y’z’ orientation, the singlet r = —1.5, which Ganesan, Maradudin and Oitmaa2
and doublet peaks are found to have the same have obtained using a Morse potential and only
intensities as expected.] taking nearest neighbor interaction into account.
Lii -
——-—Li
0 -
‘E 526 —
C
— -.-- — —-.-.
-— —..
w
z
0
~
Ui 524 (//
-
—a——
/ ~ ~
-
~ -~- —
I I 522 - I
-10 -5 0 -5 2 -10
UNIAXIAL STRESS IN ~ dyne /cm
FIG, 2. Shifts and splittings of the first order Raman peak of Si at 300°Kwith
uniaxial stress applied along the [0011 and [1111 directions.
— p_____
+ 2q (7) The present experiment demonstrates the
70 =
REFERENCES
1. MITRA S.S., BRAFMAN 0., DANIELS W.B. and CRAWFORD R.K., (to be published).
2. GANESAN S., MARADUDIN A-.A. and OITMAA J., Annals in Physics (in press).
3. RUSSELL J., Appl. Phys. Lett. 6, 223 (1%5).
4. POLLAK F.H. and CARDONA M., Phys. Rev. 172, 816 (1968).
5. LOUDON R., Adv. Physics 13, 423 (1964).
6. PARKER J.H., FELDMAN D.W. and ASHKIN M., Phys. Rev. 155, 712 (1967).
7. KITTEL C., Introduction to Solid State Physics, p. 125 3rd edition, Wiley, New York (1966).