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AO4800B, AO4800BL Dual N-Channel Enhancement Mode Field Effect Transistor
AO4800B, AO4800BL Dual N-Channel Enhancement Mode Field Effect Transistor
UIS TESTED!
Rg,Ciss,Coss,Crss Tested!
D1 D2
S2 1 8 D2
G2 2 7 D2
S1 3 6 D1
G1 4 5 D1
G1 G2
SOIC-8
S1 S2
Thermal Characteristics
Parameter Symbol Typ Max Units
Maximum Junction-to-AmbientAF t ≤ 10s 55 62.5 °C/W
RθJA
Maximum Junction-to-AmbientA Steady-State 90 110 °C/W
Maximum Junction-to-LeadC Steady-State RθJL 40 48 °C/W
A: The value of R θJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. The value in
any given application depends on the user's specific board design. The current rating is based on the t≤ 10s thermal resistance rating.
B: Repetitive rating, pulse width limited by junction temperature.
C. The R θJA is the sum of the thermal impedence from junction to lead RθJL and lead to ambient.
D. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
E. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. The SOA curve
provides a single pulse rating.
Rev 1 : Dec 2007
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
60 20
10V
50
16 VDS=5V
4.5V
40
3V
12
ID (A)
ID(A)
30 125°C
2.5V 8
20
25°C
10 VGS=2V 4
0 0
0 1 2 3 4 5 0 0.5 1 1.5 2 2.5 3
VDS (Volts) VGS(Volts)
Fig 1: On-Region Characteristics Figure 2: Transfer Characteristics
60
1.7
VGS=4.5V
Normalized On-Resistance
50
VGS=2.5V 1.5
RDS(ON) (mΩ)
40 1.3 VGS=10V
VGS=2.5V
1.1
30
VGS=4.5V VGS=2.5V
0.9
20
0.7
VGS=10V VGS=4.5 VGS=10V
10 0.5
0 5 10 15 20 -50 -25 0 25 50 75 100 125 150 175
ID (A) Temperature (°C)
Figure 3: On-Resistance vs. Drain Current and Figure 4: On-Resistance vs. Junction
Gate Voltage Temperature
100 1.0E+01
90
1.0E+00
80 125°C
ID=6.9A
1.0E-01
70 125°C
RDS(ON) (mΩ)
60 1.0E-02
IS (A)
50 1.0E-03
40
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
25°C
1.0E-04
COMPONENTS
30 IN25°C
LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
1.0E-05 THE RIGHT TO IMPROVE PRODUCT DESIGN,
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES
20
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
10 1.0E-06
0 2 4 6 8 10 0.0 0.2 0.4 0.6 0.8 1.0 1.2
5 1400
VDS=15V
ID=6.9A 1200
4
Ciss
1000
Capacitance (pF)
VGS (Volts)
3
800
2 600
400 Crss
1
Coss
200
0 0
0 2 4 6 8 10 12 0 5 10 15 20 25 30
Qg (nC) VDS (Volts)
Figure 7: Gate-Charge Characteristics Figure 8: Capacitance Characteristics
100.0
50
TJ(Max)=150°C TJ(Max)=150°C
RDS(ON) TA=25°C TA=25°C
limited 40
10.0
Power (W)
ID (Amps)
30
10µs
20
1.0
1ms
10
DC 10ms
10s
0.1 1s 0
0.1 1 10 100 0.0001 0.001 0.01 0.1 1 10 100 1000
VDS (Volts) Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-to-
Figure 9: Maximum Forward Biased Safe
Ambient (Note E)
Operating Area (Note E)
10
D=Ton/T In descending order
TJ,PK=TA+PDM.ZθJA.RθJA D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
ZθJA Normalized Transient
RθJA=62.5°C/W
Thermal Resistance
0.1 HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET.PAPPLICATIONS
THIS PRODUCT D OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
TonIMPROVE PRODUCT DESIGN,
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO
Single Pulse T
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance