PISB

Reg. U. S.Pat. Of.

C39.4-1966
Revision of
C39.4-1956

UDC 621.3.083.4

American Standard Specifications for

Automatic Nu1I-Balancing
Elect r ica I Measur ing Instr uments

Sponsor
Electrical Standards Board

Approved January 21, 1966

AMERICAN STANDARDS
INCORPORATED
ASSOCIATION

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 7007273 OCIOLO43 bTB W

American Standard
Registered United Stoles Patent Ofice

An American Standard implies a consensus of those substantially concerned with

its scope and provisions. An American Standard is intended as a guide to aid the
manufacturer, the consumer, and the general public. The existence of an American
Standard does not in any respect preclude anyone, whether he has approved the
standard or not, from manufacturing, marketing, purchasing, or using products,
processes, or procedures not conforming to the standard. American Standards are
subject to periodic review and users are cautioned to obtain the latest editions.
Producers of goods made in conformity with an American Standard are encouraged
to state on their own responsibility in advertising, promotion material, or on tags or
labels, that the goods are produced in conformity with particular American Standards.

Published by
AMERICAN STANDARDS ASSOCIATION
INCORPORATED
10 East 40th Street, New York, N. Y. 10016
Copyright i Y h h by .American Standards Association, Incorporated
Universal Decimal Classification 621.3.083.4
Printed in USA
EN3M266/9

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 m %O09273 0001044 534 m

Foreword
(This Foreword is not a part of .American Standard Specifications for Autometic Null-lhlancing Electrical Measuring Instruments, C:)'). i-
1965.1

This standard was originally prepared by a subcommittee of Sectional Committee C39 on Electrical Measuring
Instruments. The work began in 1952 and after considerable time and effort was issued as an American Standard in
1956.
In 1964 the subcommittee undertook the revision of the standard to bring it up to date and to add requirements
for miniature recorders. The definitions have also been brought up to date and coordinated with those of the Scientific
Apparatus Makers Association.
Suggestions for improvement gained through the use of this standard will be welcomed. They should be sent to the
American Standards Association, Incorporated, 10 East 40th Street, New York, N.Y. 10016.
~

The organizations which participated in this work and the names of their representatives, as listed at the time this
standard was submitted to the Sectional Committee for approval, are as follows:
F. X. Lamb, Chairman bl. A. Pisciotta, Secretary
Organization Represented Name of Representntive
American Society for Testing and .................................................................................................. Gordon Thompson
Defense Electronics Supply Center ..................................................................................... ..........Ross V. Doughty
Electric Light and Power Group .............................................................................................................. J. B. Leinbach
A. T. Higgins (.4ft/
General Services 4dministratio1-1,Federal Supply Service ................................................................................. .....J ohn F. Kirby
George R . Tucker /,4/t/
Institute of Electrical and Electronics Engineers ..............................................................................

C. Dale Owens
Dr M. B. Stout
M. L. Lush (.41t/
Instrument Society of Amerika .................................................................................................................... 4. Yï. Jacobson
National Bureau.of Standards, partment of Commerce ........... .................................................... F. K. Harris
National Electrical Manufacturers Association ..................................... .................................................... J. F. Connelly
J. M.Cunnien
P. .A. DePaolo
L. J. Lunas
G. Stolar
Scientific Apparatus Makers Association ................................................................................................................ G . L. Broomell
Telephone Group .................................................................................................. ............................... R. H. Van Horn
J . P. Messana / 4 1 t l
U.S. Department of the Navy, Bureau of Ships .....................................................................................
Subcommittee C39-4 on Automatic Null-Balancing Electrical Measuring Instruments, which is directly responsible
for the development of this standard, has the following personnel:
G. L. Broomell, Chairman M. A. Pisciotta, Secretary
E. A. Blomqvist L. J. Lunas
U'. H. Brand D. R . Hyer
4. W.Jacobson Robert McCarron
J. B. Leinbach R . S. Smith
C. A. Vogelsang

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 Contents
SECTION PAGE
1. Introduction .................................................................................................................................................... 7
2. Scope .............................................................................................................................................................. 7
3. Classification .................,.......................,,,..., ......, ,....,.........,.....,,.,.,..,.., .................. ............ ...... 7
3.1 Exhibiting Means ..................................... ....... ...... .................................... ........ 7
3.2 Recording Means ................................................................................................................................ 8
3.3 Number of Measured Variables ....................................................... ... I............................ 8
3.4 Scale Length ............. ....................................................................................................... 8
3.5 Type of Measuring Cir ............. ....,<..........................................
.......,........a... I 8
3.6 Range or Span .......................................................................... ...................................................... 8
3.7 External Circuit Resistance Rating ,......... ...... ...... .... ...__. ...... ...... ...... .......... .. ............................................ 8
3.8 Impedance of Measured Variable ......................................................... ..............,................................ 8
3.9 Power Supply for Measuring Circuit ........................................................................................................ 8
3.10 Reference Operating Conditions .......................,......................,............................. .... . 8
3.1 1 Rated Operating Conditions ....... 8
3.1 2 Performance Ratings ................................................................., , .........,,,.......... ........ ................... 8
8
8
3.15 Design Limits .... ...... ..... ................................................................. 8
4. Definitions ............................................ ................. 8
.......................................................................... <.......................... 8
......................... 9
9
4.4 Design Limits ,.....I................................................................................... ......................... 9
4.5 Detecting Means ................................. 9
4.6 . -End Device ................ ........................................................... <.<............................... 9
9
_.._.......... 9
....................................... 9
4.10 Position Influence. .......................................................................................... 9
4.1 1 Interference .................................................. . 9
4.12 Intermediate Means ................................................................................................... 9
....................................................... 9
............... 9
........................................................ 9
4.16 Operating Conditions ... ................................................................ ............. 10
10
................................................................................... 10
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

.................................. .. .... .... 10

................... 10
.......................................... 10
4.22 Source Resistance ............ ...... . ................................................................ 11
4.23 Span ...................................................................................................... ....................... .......... 11
11
.................................. 11
................................ 11
4.27 Travel ........................................ .. ........................ ........................................ 11
5. General Requirements ....................................................................................... ....... 11
5.1 Construction _ _ _..._................................... ........... ............................................................ 11
5.2 Safety Requirements .._......... .............. ...... .......................................... .................................... 11
5.3 Enclosure .................................... ,............................................. ......................... ............ 11
5.4 Protective Finishes .... ............ ...... .. ...... ...... .. ...... ........ .... .. .... .. .. .. .. .. ........................................... 12
5.5 Screw Threads _... ..................,. .............,........................................... . ........ ................... 12,

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
... 12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 m 9009273 O001046 307 m
SECTION PAGE

5.6 Interchangeability of Parts. and Subassemblies ........................................................................................ 12

5.7 Scale and Chart Visibility ....................................................................................................................... 12
5.8 Indicating Scales .................................................................................................................................... 12
5.9 Data Marking .......................................................................................................................................... 12
5.10 Chart Drive ....................................................................................................................
5.1 1 Terminals ........................................................................................................................
5.1 2 Potentiometer Current Standardization .................................................................................................. 12
5.13 Thermocouple Reference-Junction Compensation .................................................................................... 12
5.14 Electron Tubes and Semiconductors................................. ;...................................................................... 13
5.15 Gain Adjustment .................................................................................................................................... 13
5.16 Time per Point ........................................................................................................................................ 13
5.17 Standard Accessories .............................................................................................................................. 13
5.18 Available Accessories .............................................................................................................................. 13
6 . Test Conditions ................................................................................................................................................ 13
6.1 Chart and Ink ........................................................................................................................................ 13
6.2 Potentiometer Current Adjustment .......................................................................................................... 13
6.3 Gain Adjustment .................................................................................................................................... 13
6.4 Enclosure ................................................................................................................................................ 13
6.5 Warm-up Period ..................................................................................................................................... 13
6.6 Use of Indicating Scale............................................................................................................................ 13
7. Reference Standards ........................................................................................................................................ 13
7.1 Accuracy ....... .................................................................................................................. 13
7.2 Verification.................................................................... ................................................................... 13
.
8 Test Procedures ........................................ ............................................................................... 13
8.1 Tests for Reference Performance ...... ....................................................................................... 13
8.2 Tests for Rated Performance .................................................................................................................... 18
8.3 Tests for Operating Influences ...... ..................................................................
. 8.4 Tests for Design Limits .................. ......................................................... .................................. 21
.
9 Revision of American Standards Referred to in This Document ...................................................................... 22
Detailed Requirements
Direct-Current Potentiometer, Direct-Current Bridge, Strip Chart- 3 inches to less than 6 inches wide
General Characteristics ................................................... ........................................................................... 23
Performance Characteristics ............. ............................................................... .. 24
Direct-Current Potentiometer, Direct-Current Bridge, Strip Chart -6 inch minimum width and round chart
General Characteristics .................... ................................................... 25
Performance Characteristics ........................................................... .................................................... 26
Table 1 Operating Conditions and Design Limits ............ ................................................... 14
Figures
Fig . 1 Potentiometer Instrument for Measurement of Temperature
with Thermocouples, Method 1-Crushed-Ice Bath .......................................................................... 16
Fig . 2 Potentiometer Instrument for Measurement of Temperature
with Thermocouples, Method 2- Metal Block .................................................................................. 17
.
Fig 3 Test for Normal Mode Interference Influence for Instruments with dc Measuring Circuits ................... 19
Fig . 4 Test for Common Mode Interference Influence for Instruments with dc Measuring Circuits .................. 20

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 m 9009273 0001047 243
American Standard Specifications for
Automatic Null-Balancing Electrical Measuring Instruments
1. Introduction
1.1 This standard applies to null-balancing electrical
measuring instruments of the dc potentiometer, and dc
bridge types. It describes various means by which such
instruments are classified, such as exhibiting means,
recording means, scale length, type of measuring circuit,
performance ratings, reference operating conditions,
rated operating conditions, extreme operating conditions,
etc. A portion of the standard, covering definitions and
general requirements, is written without quantitative
values, these being covered in detail on the Detailed
Requirement Sheets for each type of instrument.
1.2 The performance of instruments is based on three
sets of operating conditions:
( 1) Reference operating conditions
( 2 ) Rated operating conditions
( 3I Extreme operating conditions
1.2.1 Reference operating conditions are the csndi-
tions under which reference performance is stated and
the base from which the values of operating influences
are determined.
1.2.2 Rated operating conditions denote the limits of
specified variables or conditions within which the per-
formance ratings apply. The performance ratings include
the most, significant performance characteristics, such as
accuracy, dead band, span step response time, and
damping.
1.2.3 Extreme operating conditions denote limits of
operating conditions beyond which the instruments are
not intended to be used. They are also employed by this
standard as the values of operating conditions at which
the magnitude of various operating influences are de-
termined. They include ambient temperature, interfer-
ence, position, vibration, etc.
1.3 Test procedures are given for determining conformity
of instruments to the standard.
2. Scope
2.1 This standard applies to indirect-acting electrical
measuring instruments of the automatic null-balancing
type. In these instruments the position of the end device
is a function Of the measured when
is achieved. These instruments include intermediate
means to control the power applied to the end device in
with the difference between the magnitude Of
the measured signal and an opposing electrical quantity
whose magnitude is a function of the position of the end
'rvice.
COPYRIGHT 2003; American National Standards Institute
m
2.2 Instruments within the scope of this American Stan-
dard may be suitable for positioning various end devices
such as indicating, recording, controlling, repeating
devices, etc, but the detailed requirements include only
the indicating and recording end devices.
2.3 This standard further applies to instruments having
the following types of measuring circuits:
2.3.1 dc Potentiometer - Typical Measured Vari-
ables -
( 1) dc voltage and current
( 2 ) ac power and voltage (e.g., through intermediate
means such as a thermal converter)
(3) Temperature (e.g., by means of a thermocouple or
radiation pyrometer)
( 4 ) Hydrogen-ion concentration (pH) (e.g., by means
of a concentration cell)
( 5 ) Weight and foree (e.g., by intermediate means
such as a strain gage)
2.3.2 dc Bridge - Typical Measured Variables
( 1) Resistance
( 2 ) Temperature (e.g., by means of a temperature-
sensitive resistor)
(3) Thermal conductivity for analysis of gas (e.g., by
means of a thermal-conductivity cell)
NOTE: The foregoing typical measured variables are for example
only. It should be recognized that many other quantities may be
measured through the use of suitable primary detectors and inter-
mediate means. These devices may be internal or external and may
or may not be supplied as part of the instrument. Where a voltage
divider or similar device is furnished in the instrument and con-
nected ahead of the null balance circuit, this information shall be
made clear.
2.4 This standard acknowledges that the basic measure-
ment systems are frequently modified for special purposes
(e.g., multiple ranges, range-changing devices, nonlinear
characteristics). Also, other forms of measuring circuits
such as an ac bridge are often employed. In such cases,
the standard applies where appropriate.
3. Classification
This section lists the characteristics by which the
instruments included in this American Standard may be
classified.
3.1 Exhibiting Means
NOTE: Throuehout this standard. references to charts or indi-
cating scales ap$y only where such 'devices are provided. Instru-
ments classified under 3.1(3)and ( 4 ) have no charts, nor is it the
intent of the standard to imply that indicating scales are neces-
sarily provided in any instruments except those classified uiider
3.1(31.
( 1 ) Recording-strip chart
( 2 ) Recording-round chart
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
7
Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 9009273 O O O L 0 4 8 L 8 T W
c39.4
8 AMERICAN STANDARD SPECIFICATIONS FOR

(3) Indicating only 3.12 Performance Ratings

(4) None (where the end device is other than recording (1) Accuracy rating
or indicating; requirements for such end devices are not ( 2 ) Dead band rating
included in the scope of this standard) (3) Dynamic response rating-usually span step-
response-time rating
3.2 Recording Means
( 4 ) Dynamic response rating-time per point
3.2.1 Single Marking Device (Pen, Stflus, etc)
('5) Damping characteristic
(1) Continuous-curve drawing
( 2 ) Intermittent-marking device retracted from chart 3.13 Extreme Operating Conditions
between measurements (1) Ambient temperature
(3) Sequential-intermittent records of more than one ( 2 ) Operating power supply
quantity (3) Interference
3.2.2 Multiple Marking Devices (4)'
Source resistance
(1) Continuous-curve drawing (5) Ambient relative humidity
( 2 ) Intermittent-marking device retracted from chart ( 6 ) Position
between measurements ( 7 1 Vibration
(3) Sequential-intermittent records of more than one ( 8 ) Shock
quantity per marking device
3.14 Operating Influences
3.2.3 Printing
(i) Ambient temperature
(i) Multiple records, single color ( 2 ) Operating power supply
( 2 ) Multiple records, two or more colors
. \. Interference
(3
3.3 Number of Measured Variables. The number of (4)Source resistance
measured variables which are recorded or indicated ( 5) Reproducibility
simultaneously or sequentially. (6) Routine servicing
( 7 ) Position
3.4 Scale Length
(8) Vibration
(1) Chart scale length
( 9 ) Shock
( 2 ) Indicating scale length
3.5 Type of Measuring Circuit 3.15 Design Limits
( 1) dc potentiometer ( 1 ) Dielectric
( 2 ) dc bridge ( 2 ) Insulation leakage current
( 3 ) Ambient relative humidity
3.6 Range or Span (4)Storage temperature
3.7 External Circuit Resistance Rating ( 5 1 Vibration (damaging 1
( 6 ) Shock (damaging)
3.8 Impedance of Measured Variable
3.9 Power Supply for Measuring Circuit
(1) Battery-operated (isolated from operating power
supply) 4. Definitions
( 2 ) From operating power supply
3.10 Reference Operating Conditions The definitions in this section apply to automatic
(1) Ambient temperature null-balancing electrical measuring instruments within
( 2 ) Operating power supply the scope of this American Standard. For additional
( 3 ) Interference definitions, see American Standard Definitions of Elec-
( 4 ) Source resistance trical Terms, Instruments, hleters and 'tieter Testing
( 5 ) Ambient relative humidity (Group 301, C42.30-1957, and American Standard
(6) Position Terminology for Automatic Control, C83.1- 963.
( 7 ) Vibration
4.1 Accuracy
3.11 Rated Operating Conditions 4.1.1 Rated Accuracy. The limit which errors will
( 1) Ambient temperature not exceed when the instrument is used under any com-
( 2 ) Operating power supply bination of rated operating conditions.
(3) Interference NOTE 1: It is usually expressed as a percent of the span. It is
(4) Source resistance preferred that a t sign or - sign or both precede the number or
quantity. The absence of a sign infers a t sign.
(5) Ambient relative humidity NOTE 2: Rated Accuracy does not include accuracy of sensing
(6) Position elements or intermediate means external to the instrument.
(7) Vibration 4.1.2 Reference Accuracy. A number or quantity
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~ ~~
~
m 7007273 0001OY9 016
AUTOMATIC NULLBALANCING ELECTRICAL MEASURING INSTRUMENTS
which defines the limit of error under reference operating
conditions.
NOTE 1: It is usually expressed as a percent of the span. It is
preferred that a t sign or - sign or both precede the number or
quantity. The absence of a sign infers a 5 sign.
NOTE 2: Reference Accuracy does not include accuracy of
sensing elements or intermediate means external to the instrument.
See Error and Correction.
4.2 Correction. The difference between the true value
and the indication of the measured signal.
NOTE: A positive correction denotes that the indication of the
instrument is less than the true value.
-
Correction = True Indication
See Error.
4.3 Dead Band. The range through which the measured
signal can be varied without initiating response. This is
usually expressed in percent of span.
NOTE: Threshold and Ultimate Sensitivity are defined as one
half the dead band. When the instrument is balanced at the center
of the dead band, they denote the minimum change in measured
signal required to initiate response. Since this condition of balance
is not normally achieved and is not readily recognizable, these
terms are not used in this standard and the various requirements
are stated in terms of dead band.
Sensitivity is frequently used to denote the same quantity. How-
ever, its usage in this sense is deprecated since it is riot in accord
with accepted standard definitions of the term.
4.3.1 Dead Band Rating. The limit which the dead
band will not exceed when the instrument is used under
rated operating conditions.
4.4 Design Limits. Design aspects of the instrument in
terms of certain limiting conditions to which the instru-
ment may be subjected without permanent physical dam-
age or iinpairment of operating characteristics.
4.5 Detecting Means. The first system element or group
of elements that responds quantitatively to the measured
variable and performs the initial measurement operation.
The detecting means performs the initial conversion or
control of measurement energy.
4.6 End Device. The final instrument element that
responds quantitatively to the measured signal and per-
forms the final measurement operation. An end device
performs the final conversion of measurement energy to
an indication, record, or the initiation of control.
4.7 Error. The difference between the indication and
the true value of the measured signal.
NOTE: .4 positive error denotes that the indication of the instru-
ment is greater than the true value.
Error = Indication - True
See Correction.
4.8 Influence
4.8.1 Operating Influence. The change in a desig-
nated performance characteristic caused solely by a
prescribed change in a specified operating variable from
its reference operating condition to its extreme operating
condition, all other operating variables being held within
the limits of reference operating conditions.
NOTE 1: It is usually expressed as a percentage of span.
NOTE 2: If the magnitude of the influence is affected by direc-
tion, polarity, or phase, the greater value shall be taken.
COPYRIGHT 2003; American National Standards Institute
~ ~~~
m c39.4
9
4.9 Operational Maintenance Influence. The effect of
routine operations which involve opening the case, such
as to inspect or mark records, change charts, add ink,
alter control settings, etc.
4.10 Position Influence. The change in the indicated
or recorded value caused by mounting the instrument
with its vertical axis inclined from normal by a specified
angle.
4.11 Interfeience. Any spurious voltage or current
appearing in the circuits of the instrument. (See Normal
Mode Interference ; Common Mode Interference; Mag-
netic Field Interference.)
NOTE: The source of each type of interference may be within
the instrument case or external. The instrument design shall be
such that the effects of interference arising internally are negligible.
This standard is concerned with the magnitude of the effects of
interference from external sources.
4.11.1 Common Mode Interference. A form of
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
interference which appears between any measuring
circuit terminal and ground.
4.11.2 Differential Mode Interference. (SeeNormal
Mode Interference.)
4.11.3 Longitudinal Interference. (See Common
Mode Interference.)
4.11.4 Magnetic Field Interference. A form of in-
terference induced in the circuits of a device due to the
presence of a magnetic field.
NOTE: It may appear as common mode or normal mode inter-
ference in the measuring circuit.
4.11.5 Normal Mode Interference. A form of inter-
ference which appears between measuring circuit term-
inals.
4.11.6 Transuerse Interference. (See Normal Mode
i nte rfe re nce .)
4.12 Intermediate Means. Includes all system elements
or devices that are used to perform necessary and dis-
tinct operations in the measurement sequence between
the primary detector and the end device. The inter-
mediate means, where necessary, adapts the operational
results of the primary detector to the input requirements
of the end device.
4.13 Measured Signal. The electrical quantity applied
to the measuring circuit terminals of the instrument.
NOTE: It is the electrical analog of the measured variable.
4.14 Measured Variable (Measurand).The physical
quantity, property, or condition which is to be measured.
NOTE: Common measured variables are temperature, pressure,
thickness, speed, etc.
4.15 Null Balance. As applied to instruments within the
scope of this American Standard, null balance is the
condition which exists in the circuits of an instrument
when the difference between an opposing electrical quan-
tity within the instrument and the measured signal does
not exceed the dead band. The value of the opposing
electrical quantity produced within the instrument is
related to the position of the end device.
Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 m 9009273 0001050
c39.4
10
4.16 Operating Conditions. Conditions (such as am-
bient temperature, ambient pressure, vibration, etc) to
which a device is subjected, but not including the vari-
able measured by the device.
4.16.1 Extreme Operating Conditions. The range
of operating conditions within which a device is designed
to operate and under which operating influences are
usually stated.
4.16.2 Rated Operating Conditions. The limits of
specified variables or conditions within which the per-
formance ratings apply.
' 4.16.3 Reference Operating Conditions. The con-
ditions under which reference performance is stated and
the base from which the values of operating influences
are determined.
4.17 Performance Ratings
4.17.1 Rated Performance. The limits of the values
of certain operating characteristics of the instrument
which will not be exceeded under any combination of
rated operating conditions.
4.17.2 Reference Performance. The limits of the
values of certain operating characteristics of the instru-
ment which will not be exceeded under any combination
of reference operating conditions.
4.18 Range. The region between the limits within which
a quantity is measured, expressed by stating the lower
and upper range-values.
NOTE 1 : For example:
'
( a ) O to 150 F
Ib) -20 to +200 F
( c l 20 to 1.50 F
NOTE 2: The following compound terms are used with suitable
modifications in the units: Measured-Variable Range, Measured-
Signal Range, Indicating-Scale Range, Chart-Scale Range, etc.
NOTE 3: For multirange devices, this definition applies to the
particular range that the device is set to measure.
4.18.1 Electrical Range. The range expressed in
equivalent electrical units.
4.18.2 Lower Range-Value. The lowest quantity that
a device is adjusted to measure.
NOTE: The following compound terms are used with suitable
modifications in the units: Measured-Variable Lower Range-Value,
Measured Signal Lower Range-Value, etc.
4.18.3 Upper Range-Value. The highest quantity
that a device is adjusted to measure.
NOTE: The following compound terms are used with suitable
modifications in the units: Measured Variable Upper Range-Value,
Measured Signal Upper Rangevalue, etc.
4.18.4 Elevated-Zero Range. A range where the
zero value of the measured variable, measured signal,
etc, is greater than the lower range-value.
NOTE: The zero may be between the lower and upper range-
values, at the upper rangevalue, or above the upper range-value.
For example:
( a l - 2 0 to 100
(b) - 3 0 t o O
( C I -50 to -10
4.18.5 Suppressed-Zero Range. A range where the
zero value of the measured variable, measured signal,
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
838 m
AMERICAN STANDARD SPECIFICATIONS FOR
etc, is less than the lower range-value. Zero does not
appear on the scale.
NOTE: For example: 20 to 100.
4.18.6 Suppression Ratio (of a Suppressed-Zen,
Range). The ratio of the lower range-value to the span.
NOTE: For example: Range 20 to 100
Suppression Ratio =-
20
80
= 0.25
4.19 Repeatability. The closeness of agreement among
a number of consecutive measurements by the instrument
for the same value of the measured signal under the same
operating conditions, approaching from the same direc-
t ion.
NOTE: It is usually expressed as a maximum nonrepeatability
in percent of span.
4.20 Reproducibility. The closeness of agreement
among repeated measurements by the instrument for the
same value of input made under the same operating con-
ditions, over a long period of time, approaching from
either direction.
NOTE 1: 11 is expressed as a maximum nonreproducibility in
percent ofspan for a specified
NOTE 2: Reproducibility includes drift, repeatability, and dead
band.
4.21 Response, Dynamic. The behavior of the instru-
ment output as a function of the measured signal, both
with respect to time. (See Damping Characteristic; Step
Response; Frequency Response; and Ramp Response.)
4.21.1 Frequency- Response Characteristic
( 1 ) In a linear system, the frequency-dependent rela-
tion, in both gain and phase difference, between steady-
state sinusoidal inputs and the resulting steady-state
sinusoidal outputs.
( 2 ) With nonlinearity, as evidenced by distortion of
specified amplitude, the relation is based on that sinus-
oidal component of the output which corresponds to the
frequency of the input.
4.21.2 Span Frequency-Response Rating. The
maximum frequency in cycles per minute of sinusoidal
variation of measured signal for which the difference in
amplitude between output and input represents an error
no greater than five times the accuracy rating when the
instrument is used under rated operating conditions.
The peak-to-peak amplitude of the sinusoidal variation
of measured signal shall be equivalent to full span of
the instrument.
It must be recognized that the span frequency-response
rating is a measure of dynamic behavior under the most
adverse conditions of measured signal (i.e., the maximum
sinusoidal excursion of the measured signal). The fre-
yuency response for an amplitude of measured signal
less than full span is not proportional to the freyuency
response for full span.
The relationship between the frequency response of
different instruments at any particular amplitude of
measured signal is not indicative of the relationship that
will exist at any other amplitude.
 9009273 O O O L 0 5 L 774
AUTOMATIC NULLBALANCING ELECTRICAL MEASURING INSTRUMENTS
4.21.3 Ramp Response. A criterion of the dynamic
response of an instrument when subjected to a measured
signal which varies at a constant rate.
4.21.4 Ramp Response Time. The time lag, ex-
pressed in seconds, between the measured signal and the
equivalent positioning of the end device when the meas-
ured signal is varying at constant rate.
4.21.5 Ramp Response-Time Rating. The maxi-
mum ramp response time for all rates of change of meas-
ured signal not exceeding the average velocity corres-
ponding to the span step-response-time rating of the
instrument when the instrument is used under rated
operating conditions. Example: If the span step-response-
time rating is 4 seconds, the ramp response-time rating
shall apply to any rate of change of measured signal not
exceeding 25 percent of span per second.
4.21.6 Step Response. A criterion. of the dynamic
response of an instrument when subjected to an instan-
taneous change in measured quantity from one value to
another.
4.21.7 Step-Response Time. The time required for
the end device to come to rest in its new position after an
abrupt change to a new constant value has occurred in
the measured signal.
4.21.8 Span Step-Response-Time Rating. The lim-
it which the step-response time will not exceed for a
change in measured signal essentially equivalent to full
span when the instrument is used under rated operating
conditions. The actual span step-response time shall not
be less .than 2/3 of the span step-response-time rating.
(For example, for an instrument of 3-second span step-
responsc-time rating, the span step-response time, under
rated operating conditions, will be between 3 and 2
seconds.)
I t must be recognized that the step-response time for
smaller steps is not proportional t o the step-response
time for fuZ1 span.
NOTE: The end device shall be considered to be at rest when it
remains within a band of plus and minus the accuracy rating from
its final position.
4.22 Source Resistance. The resistance presented to
the input of a device by the source.
4.22.1 Source Resistance Rating. The value of
source resistance which, when injected in an external
circuit having essentially zero resistance, will either
( 1 ) double the dead band, or ( 2 ) shift the dead band by
one-half its width.
4.23 Span. The algebraic difference between the upper
and lower range-values.
NOTE 1: For example:
( a ) Range O to 150, Span 150
( b ) Range -20 to 200, Span 220
( c ) Range 20 to 150, Span 130
( d ) Range -100 to -20, Span 80
NOTE 2: The following compound terms are used with suitable
modifications in the units: Measured Variable Span, Measured
Signal Span, etc.
NOTE 3: For multirange devices, this definition applies to the
particular range that the devicr is set to measure.
COPYRIGHT 2003; American National Standards Institute
c39.4
11
4.24 Time per Point ( Multiple-Point Recorders).
The time interval between successive points on printed
records.
NOTE: For some instruments this intirval is variable and de-
pends on the magnitude of change in measured signal. For such
instruments, time per point is specified as the minimum and maxi-
mum time intervals.
4.25 Transient Overshoot. An excursion beyond the
final steady-state value of output as the result of a step-
input change..
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
NOTE: It is usually referred to as the first excursion; expressed
as a percent of the steady-state output step.
4.26 Transportation and Storage Conditions. The
conditions to which a device may be subjected between
the time of construction and the time of installation.
Also included are the conditions that may exist during
shutdown.
NOTE: No permanent physical damage or impairment of operat-
ing characteristics shall take place under these conditions, but
minor adjustments may be needed to restore performance to normal.
4.27 Travel
4.27.1 hdiC8tOr Travel. The length of the path
described by the indicating means or the tip of the pointer
in moving from one end of the scale to the other.
NOTE 1: The path may be an arc or a straight line.
NOTE 2: In the case of knife-edge pbinters and others extending
beyond the scale division marks, the pointer shall be considered
as ending at the outer end of the shortest scale division marks.
4.27.2 Pen Travel. The length of the path described
by the pen in moving from one end of the chart scale to
the other. The path may be an arc or a straight line.
5. General Requirements
The requirements in this section apply to the design
and construction of all instruments w'ithin the scope of
this American Standard. Additional requirements or
exceptions for design and performance are covered by
the Detailed Requirement Sheets.
5.1 Construction. The construction of instruments shall
be mechanically sound, suitable to their purpose, and
shall be such as to give assurance of satisfactory per-
formance. All materials shall be suitable for the purpose
for which they are used. Workmanship shall be such as
to provide a neat appearance commensurate with the
service for which intended.
5.2 Safety Requirements. The applicable provision
of American Standard Electrical Safety Requirements for
Electrical Measuring and Controlling Instrumentation,
C39.5-1964, shall be applied to the instruments covered
by this specification.
5.3 Enclosure. Instruments shall be designed and
constructed with close-fitting joints in the enclosure to
minimize the entrance of dust and moisture that might
impair operation over an extended period of time or when
subjected to any of the tests specified herein.
Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 W 7009273 0001052 600
c39.4
12
5.4 Protective Finishes. Exposure to the atmosphere
and conditions which can be reasonably expected in
applications for which the instrument is intended shall
not cause rust or corrosion which affect the performance.
Protective finishes shall be used where necessary to
assure this requirement.
5.5 SC*W Threads. All threaded parts normally em-
ployed in the application or normal use of instruments
shall comply with American Standard:
Unified Screw Threads, Bl.1-1960
Screw Thread Cages and Gaging, B1.2-1951
Square and Hexagon Bolts and Nuts, B18.2-1960
Slotted and Recessed Head Wood Screws, B18.6.1-
1961
Hexagon Head Cap Screws, Slotted Head Cap Screws,
Square Head Set Screws, and Slotted Headless Set Screws,
B18.6.2-1956
Slotted and Recessed Head Machine Screws and Ma-
chine Screw Nuts, B18.6.3-1962
Slotted and Recessed Head Tapping Screws and Metal-
lic Drive Screws, B18.6.4-1958
Where practicable, all other screw threads shall also
comply with these standards.
5.6 Interchangeability of Parts and Subassemblies.
Parts and subassemblies required for general maintenance
shall be interchangeable in instruments of the same
type and model.
5.7 Scale and Chart Visibility. The instrument shall
be so designed that the scale and the chart may be easily
read while operating normally with cover closed. On
strip-chart instruments, a portion of the most recent
record shall be visible with the cover closed.
5.8 Indicating Scales. The legibility of indicating
scales shall be consistent with the accuracy rating. The
style and size of the scale numerals and the maximum
number of digits shall be such as to provide legibility at
a distance consistent with intended applications.
5.8.1 Scale and Chart Divisions. The value of each
scale and chart division, wherever practical, shall be
either 1, 2, or 5 units or an integral power of 10 times
these values. The spacing between divisions on the chart
preferably shall be between 0.04 and 0.1'25 inch.
5.9 Data Marking. Instruments shall be legibly marked,
with the applicable details specified below. If made on
the indicating scale plate, these markings shall not be
so conspicuous as to distract attention from the scale
markings specified in 5.8.1.
5.9.1 Scale Data. The following infoimation shall be
visible from the front of the instrument without opening
the cover and on or associated with the indicating scale
if one is provided:
( i ) Designation of the unit of measurement such as
millivolts, degrees C, pH, ohms, etc
( 2 ) Multiplying factor, if required
COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
AMERICAN STANDARD SPECIFICATIONS FOR
5.9.2 General Date. The following information shall
be legibly marked on the instrument and accessible from
the front, but need not be visible with the cover closed:
( 1 ) Manufacturer's name, trademark, or symbol
( 2 ) Manufacturer's type or model number or both
(3) Manufacturer's serial number
( 4 ) Range of measured variable
( 5 ) Range of measured signal, if feasible
( 6 ) Instruction book number
(7) Nominal power supply, including voltage, fre-
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
quency, and' maximum load in volt-amperes
( 8 Primary detector and external intermediate device,
if required, where same is not evident from other stated
data
( 9 ) Response-time classification: Span step response-
time rating for single-point instruments or time per point
for multiple-point instruments
(10) Chart number
( 1 1 ) Chart speed
(12) Identification and, if not self-evident, the location
of parts subject to replacement in normal maintenance
5.10 Chart Drive. The chart shall be driven by a
synchronous motor.
5.11 Terminals
5.11.1 Mounting of Terminals. The terminals,
studs, or binding-post bodies shall be firmly anchored
to the instrument in such a manner as to prevent turning
or movement sufficient to cause damage to internal con-
struct ion.
5.11.2 Marking of Terminals. The terminals shall
be legibly marked and information shall be provided to
identify the proper connections.
5.12 Potentiometer Current Standardization
5.12.1 Regulated Supply. For potentiometer circuits
where the source of potentiometer current is a regulated
voltage supply, means shall be provided to permit check-
ing the supply with an external standard.
5.12.2 Periodic Adjustment. For potentiometer
circuits where the source of potentiometer current is such
that periodic adjustment by comparison with a standard
is required in order to meet performance ratings, means
for accomplishing such adjustment shall be automatic.
When the adjustment operation occurs periodically,
means shall also be pro;ided to adjust manually the
current at any time. If the period is one day or more,
nonautomatic adjustment is acceptable for round-chart
instruments.
5.12.3 CircuitSupply-Condition Indicator. When
the bridge or potentiometer is energized by a source
subject to deterioration, means shall be provided to
indicate when the source is no longer adequate.
5.13 Thermocouple Reference-Junction Compensa-
tion. When the purpose of the instrument is to measure
temperature by means of a thermocouple, compensation
for the reference-junction temperature shall be automatic.
 ~

m 9009273 OOOL053 547 m

c30.4
AUTOMATIC NULL-BALANCING ELECTRICAL MEASURING INSTRUMENTS 13
5.14 Electron Tubes and Semiconductors. Electron mination of characteristics shall be based on values
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

tubes and semiconductors, when used, shall be com- indicated on the indicating scale where provided.
mercially available types.
5.15 Gain Adjustment. In instruments where the per- 7. Reference Standards
formance is affected by the amount of amplification pro-
vided in the intermediate means, provision shall be made 7.1 Accuracy. Reference standards in which the com-
for adjusting the gain of the intermediate means. bined uncertainties are less than the accuracy ratings
of the instrum,ent under test, by a factor of at least 3,
5.16 Time per Point. With a change in measured sig-
shall be used in testing the accuracy of instruments.
nal between successive points equivalent to the span, the
instrument shall be capable of balancing and printing 7.2 Verification. Standards shall be tested periodically
within its performance ratings. and certified in terms of national standards. These tests
can be made in any laboratory capable of substantiating
5.17 Standard Accessories. The following accessories
measurements of the accuracies required.
shall be supplied with the instrument where applicable:
.~
Box of 100 charts or one chart roll
Mounting hardware 8. Test Procedures
Ink and pen filler, or ink pads
Lubricating oil The procedures in this section shall be used to de-
Pen cleaner termine compliance with the detailed performance rat-
Battery ings, operating influences, and design limits. The instru-
Instructions for installation and operation ment shall be set up and adjusted in accordance with
Special tools required for adjustment the manufacturer's standard instructions. Unless other-
Available Accessories. The following material wise stated in this section, test conditions shall be main-
shall be available from the manufacturer: tained in accordance with Section 6.
( 1) Internal wiring diagram and circuit-component
Values for rated and extreme operating conditions,
values performance ratings, operating influences, and design
( 2 ) Maintenance manual and replacement parts list limits shall be determined by reference to the applicable
Detailed Requirement Sheets.
8.1 Tests for Reference Performance. Reference per-
6. Test Conditions formance shall be determined under reference operating
conditions as listed in Table 1.
When conducting a test to determine compliance with 8.1.1 Connecting Means. Where instrument per-
a detailed requirement, all conditions shall be main- formance and accuracy are affected by the characteristics
tained as stated in Table 1, unless otherwise specified by of the connecting means, the connecting means recom-
the applicable test procedure of Section 8. If additional mended by the manufazturer shall be used.
conditions are specified in the manufacturer's standard 8.1.2 Test Procedures. The reference standards
instructions, they shall also be maintained. shall be so located that they are not subjected to tem-
6.1 Chart and Ink. The chart and ink supplied by the perature gradients resulting from rapidly varying temper-
manufacturer shall be used. atures, drafts, or localized sources of heat.
8.1.2.1 Potentiometer Instruments for Measurement
6.2 Potentiometer Current Adjustment. For poten-
of emf (Electromotive Force) -
tiometer circuits, the potentiometer current shall be ( 1 ) Use copper wires for connecting the reference
adjusted when required, in accordance with the manu- potentiometer to the instrument.
facturer's instructions, immediately prior to performing ( 2 ) Adjust the current of the reference potentiometer
tests. to the standard value.
( 3 ) Short-circuit or clamp the coil of the galvanom-
6.3 Gain Adjustment. The gain of the intermediate
eter in the reference potentiometer so that motion of the
device shall be adjusted for minimum dead band in ac-
galvanometer will not introduce spurious voltages.
cordance with manufacturer's instructions.
( 4 ) Adjust the potentiometer circuit current of the
6.4 Enclosure. The cover of the case shall be closed instrument where required in accordance with manu-
and other openings in the case shall be closed to the facturer's instructi,ons.
degree indicated by 5.3. ( 5 ) Set the reference potentiometer to the emf value
at which it is desired to check the instrument accuracy.
6.5 Warm-up Period. The instrument shall be ener-
Approach the balance point from each direction. Use
gized at least 30 minutes before starting test.
indicating scale, where provided, for observing instru-
6.6 Use of Indicating Scale. Observation for deter- ment reading.

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 c39.4
14 AMERICAN STANDARD SPECIFICATIONS FOR

I I I I I I I I I I I I 2
E
.d

O
P-
O
O In Y
Y
Q\ I I I I I I I I I 0 I Y
m
-
O
o
7 a
Y

O
m o
Y
O
QI
O
QI
O 0 0
o
m d
o
2.
m
o
~
O
3
O
m
In
I -m
U
m

I ü
."m
-u
O O U x
d rn YI
.

>
O m
O
Y $12 0 O
I 2M
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

e4
m
U 2 QI
m ci
O

-
+I
m
In
O
CiI
x
+I O 0 0
5: er) O
I
m
c4 0

U
m 2 5 2 ._
2 m
o
m
.w
Y
S
W
o 8 %%% Y o> E
3
U
Li

op
mLi
8 U
5 bL

E
L

-X

E
-
e

m
EO
.-x
U
S
CI
c
o X
m
O
5O
-n 1 -E
c)

u
2
3 E
Y

2u
c
o a- o ."mOY
&
.-m 5 m u u O m
I .-
o o71 E E
-
Li
a m YI
. -Y
>* o E E Z I

-
Y
I m O u
M CI E S E S
E o 0 - " .-S
.I

E
E CI u
Z E E f 2 .-uO
.I
c
2o o
1-

n
E
o
.I
ci
* E E L
" O 0 0
o
2
E
.-
O
.-
Y -m
5 uuz
oa d
E E E
U
I
e
n a
c
O
m
> I
1
E

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ’7009273 QOOL055 3LT
c39.1
AUTOMATIC NULLBALANCING ELECTRICAL MEASURING INSTRUMENTS 15
8.1.2.2 Potentiometer Instruments for Measurement instrument where required in accordance with the man-
of Temperature with Thermocouples ufacturer’s instructions.
( i ) Read the temperature indicated by the mer-
( i ) Method 1 (see Fig. 1 ) cury thermometer and obtain the emf equivalent of this,
( a ) Use a melting crushed-ice bath for maintain- temperature from a table of emf-temperature equivalents’
ing the temperature of the test reference junction. for the type of thermocouple used.
(b) Use thermocouple extension wires of appro- ( j ) Obtain the emf equivalent of the temperature
priate type for connecting the instrument to the test at which it is desired to check the instrument accuracy.
reference junction. The thermoelectrically positive and ( k ) Set .the reference potentiometer to the value
negative wires must be connected to the respective posi- which is the algebraic difference between the emf equiv-
tive and negative terminals of the instrument. alents of the checking temperature and the.test reference-
( c ) Join a copper wire to each of the extension junction temperature. Approach the balance point from
wires at the test reference junction. Insulate the junction each direction. Use indicating scale, where provided, for
with a suitable material (e.g., paraffin) and place in good observing instrument reading.
thermal contact with the ice bath but electrically in- Example: It is desired to check an instrument having
sulated therefrom. Allow sufficient time for junctions to a range of O-1,000 F with an iron constantan thermo-
reach temperature of ice bath. couple at 100 F, 500 F, and 900 F. The temperature of
( d ) Connect the copper wires to the reference the test reference junction is 90 F. The emf equivalents
potentiometer, observing proper polarity. (reference temperature 32 F) of these temperatures are:
( e ) Adjust the current of the reference poten-
tiometer to the standard value. Temperature, emf,
Degrees F Millivolts
( f ) Short-circuit or clamp the coil of the gal-
vanometer of the reference potentiometer. 90 1.65
( g ) Adjust the Potentiometer circuit current of 1O0 1.94
the instrument where required in accordance with the 500 14.12
manufacturer’s instructions. 900 26.40
( h ) Set the reference potentiometer to the emf
equivalent of the temperature at which it is desired to Set the reference potentiometer as follows:
check the instrument accuracy. [Use table of emf-temper- Reference
ature with reference junction of O C (32 F ) for the type Check Junction Reference
of thermocouple used.] Approach the balance point from Temperature, Temperature, Potentiometer
each direction. Use indicating scale, where provided, for Temperature, Equivalent Equivalent Setting,
observiig instrument reading. Degrees F Millivolts Millivolts Millivolts
( 2 ) Method 2 (see Fig. 2) 1O0 1.94 1.65 0.29
( a ) Use a metal block with three holes drilled in 500 14.12 1.65 12.47
proximity to each other and near the center of the block 900 26.40 1.65 24.75
to provide a uniform temperature for the test reference
junction. 8.1.2.3 Resistance Bridges
( b ) Use thermocouple extension wires of appro- ( i ) Use copper wires for connecting the reference
priate type for connecting the instrument to the test resistance box to the instrument in accordance with
reference junction. The thermoelectrically positive and the manufacturer’s wiring instructions.
negative wires must be connected to the respective posi- ( 2 ) Obtain the resistance equivalent of the desired
tive and negative terminals of the instrument. check point from the specified table.
( c ) Join a copper wire to each of the extension (3) Set the resistance box to the resistance equivalent
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

wires at the test reference junction. Electrically insulate
each junction and insert it into a hole in the metal block.
( d ) Connect the copper wires to the reference
potentiometer, observing proper polarity.
( e ) Insert a calibrated mercury thermometer in
the third hole of the metal block and allow sufficient
time for the thermometer to reach the temperature of the
block.
( f ) Adjust the current of the reference poten-
tiometer to the standard value.
( g ) Short-circuit or clamp the coil of the gal-
vanometer of the reference potentiometer.
( h ) Adjust the potentiometer circuit current of the
of the check point. Approach the balance point from
each direction. Use indicating scale, where provided, for
obtaining instrument reading.
8.1.2.4 Other Circuits. Use manufacturer’s recom-
mendation for testing for accuracy.
8.1.3 Dead Band
8.1.3.1 Method 1
NOTE: In employing this method it is essential that a reference
standard be used which can be reproducibly set to any fixed value
with an error significantly less than the dead band rating of the
instrument under test.
( 1 I Connect the reference equipment to the instrument
and set it at a value corresponding approximately to
midspan of the instrument.

LI. -.
COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~~
~~
- ~ ~

9009273 OOOLO5b 256

AMERICAN STANDARD SPECIFICATIONS FOR

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
Fig. 1
Potentiometer Instrument fur Measurement of Temperature with Theriiiocouples
Method 1 - Crushed-Ice Bath

( 2 ) Set the gain adjustment of the instrument to pro-
vide minimum dead band in accordance with manu-
facturer’s instructions.
( 3 ) Change the setting of the reference equipment
until the instrument indication is greater than the orig-
inal value by an amount equal to approximately twice
the accuracy rating.
( 4 ) Slowly reset the reference equipment to the orig-
inal value [8.1.3.1(1 I]. Observe instrument reading.
( 5 ) Change the setting of the reference equipment
until the instrument indication is less than the original
value by an amount equal to approximately twice the
accuracy rating.
( 6 ) Slowly reset the reference equipment to the orig-
inal value [8.1.3.1(1 I].Observe instrument reading.
17) T h e difference in t h e readings obtained in
8.1.3.1(4)and 8.1.3.1(6),expressed in percent of span,
is the dead band.
8.1.3.2 Method 2
NOTE: This method is applicable to instruments in which the
balancing means can be readily displaced manually and without
damage.
( 1 ) Connect the reference equipment to the instrument
and set it at a value corresponding approximately to mid-
span of the instrument.
( 2 ) Set the gain adjustment of the instrument to pro-
vide minimum dead band in accordance with manufac-
turer’s instructions.
(3) Manually displace the balancing motor shaft or
associated gearing until the instrument indication is
greater than the original value by an amount equal to
approximately twice the accuracy rating/”

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 W 9009273 O O O L 0 5 7 L92 W
c39.4
AUTOMATIC NULLBALANCING ELECTRICAL MEASURING INSTRUMENTS 17

INSTRUMENT

THERMOCOUPLE
EXTENSION WIRES

THERMOMETER

COPPER WIRES

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
REFERENCE
POTENTIOMETE

Fig. 2
Potentiometer Instrument for Measurement of Temperature with Thermocouples
Method 2 - Metal Block

(4) Allow the system to return to balance slowly so
that the edge of the dead band may be determined.
(5) Manually displace the balancing motor shaft or
associated gearing until the instrument indication is
less than the original value by an amount equal to ap-
proximately twice the accuracy rating.
( 6 ) Allow the system to return to balance slowly so
that the edge of the dead band may be determined.
( 7 ) T h e difference in t h e readings obtained in
8.1.3.2(4)and 8.1.3.2(6),expressed in percent of span,
is the dead band.
8.1.4 Dynamic Response or Time per Point
8.1.4.1 Span Step-Response Time
Method 1 -Chart speed is increased sufficiently to
allow an accurate time analysis of record. An abrupt
change in measured signal equivalent to 99 percent of
span is applied and the instrument allowed to balance
as defined in Section 4. Test is repeated for opposite
direction of balancing action.
Method 2-The abrupt change in measured signal
is applied for a precisely timed interval. Length of in-
terval is varied in small steps, and length of interval
during which balance, as defined in Section 4 is achieved,
represents response time for 99 percent of span.
8.1.4.2 Span Frequency Response. Apply a sinus-
oidally varying measured signal having a double ampli-
tude (peak-to-peak value) equivalent to approximately
99 percent of span at a frequency which will allow the
instrument to come to rest momentarily at the peak
values. The instrument is considered to follow chan
/-
--

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 9009273 0001058 O29
c39.4
18
at higher frequencies if the indicated or recorded double
amplitude does not differ from the initially determined
double amplitude by an amount exceeding 10 times the
accuracy rating.
8-1-43Ramp Response Time. To determine the
ramp response time of an instrument, a technique for
the particular instrument must be devised. Because of
the wide variation in instrument designs, no standard
test procedure for ramp response time is included in this
standard. Refer to the manufacturer for the method to
be employed for particular instruments.
8.1.4.4 Time per Point (Multiple-Point Instru-
ments). To determine conformance with 5.16, values of
measured signal equivalent as nearly as practicable to
the upper and lower range-values are applied alternately
to successive measurement points. The instrument shall
balance and indicate or record each value of measured
signal to within the accuracy rating.
8.1.5 Maximum Transient Overshoot. The dead
band of the instrument is adjusted to within the dead
band rating and the instrument is caused to balance
near one end of the span. An abrupt change in measured
signal equivalent to approximately 90 percent of span is
applied to the instrument. The amount of overshoot
beyond the point of final balance expressed in percent
of span is the transient overshoot. Test is repeated for
opposite direction of balancing action.
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
8.2 Tests for Rated Performance. Because of the
large number of possible combinations of rated condi-
tipns, no tests are specified for rated performance.
8.3 Tests for Operating Influences. Data -shall be
taken for each of the operating conditions (ambient
temperature, operating power supply, etc) at its extreme
value. This data shall be compared with reference per-
formance in order to determine each operating influence.
This should then be compared with the maximum allow-
able influence given in the Detailed Requirement Sheets.
8.3.1 Ambient Temperature Influence
8.3.1.1 High Temperature Influence. The instru-
ment shall be placed in a test chamber and set up to
simulate installed conditions. The temperature of the
chamber shall be raised to the high limit of the extreme
operating temperature range, as determined from the
Detailed Requirement Sheets, with the relative humidity
not exceeding 20 percent. The instrument shall be main-
tained at that temperature for a period of 24 hours and
shall be energized from the operating power supply dur-
ing that time. At the conclusion of the 24-hour period and
while still at the high temperature, the following per-
formance characteristics shall be measured and com-
pared with the data obtained prior to the test: accuracy,
dead band, step-response time, or time per point.
8.3.1.2 Low Temperature Influence. With the
instrument installed as in 8.3.1.1, the temperature shall
be reduced to the low limit of the extreme operating
temperature range, as determined from the Detailed
COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
AMERICAN STANDARD SPECIFICATIONSFOR
Requirement Sheets. The instrument shall be maintained
at that temperature for a period of 24 hours and shall
be energized from the operating power supply during
that time. At the conclusion of the 24-hour period, and
while still at the low temperature, the following períorm-
ance characteristics shall be measured and compared
with the data obtained prior to the test: accuracy, dead
band, step-response time, or time per point.
8.3.2 Operating-Powersupply Influence
8.3.2.1 Operating-Power-Supply Voltage Influence.
The operating-power-supply voltage shall be varied
slowly over the range stated for extreme operating con-
ditions in the Detailed Requirement Sheets. Throughout
the test the performance characteristics shall be meas-
ured and compared with the data obtained prior to the
test.
8.3.2.2 Operating-Power-Supply Transient-Voltage
Influence. The operating-power-supply voltage shall be
changed abruptly in either direction by the amount
stated for extreme operating conditions in the Detailed
Requirement Sheets and the transient shift in instrument
indication shall be measured.
8.3.2.3 Opera t ing-Po we r-S u p p l y F r e q u e n c y In-
fluence. The operating-power-supply frequency shall be
varied over the range stated for extreme operating con-
ditions in the Detailed Requirement Sheets. Throughout
the test, the performance characteristics shall be meas-
ured and compared with the data obtained prior to the
test.
8.3.3 Interference Influence. For all interference
tests, the instrument shall be caused to balance at ap-
proximately midspan by means of suitable external equip-
ment such as the test potentiometer employed to test for
accuracy. This equipment shall be stable, shall have low
resistance, and shall be completely isolated from the
operating power supply and ungrounded. The instrumFnt
case shall be grounded.
NOTE: Although these procedures apply particularly to dc
potentiometer instruments, they are adaptable to other types of
dc measuring circuits. Where they are not directly applicable, the
manufacturer should be consulted for specific procedures.
8.3.3.1 Normal Mode Interference Influence. (Refer
to Fig. 3.) With the instrument balanced at approxi-
mately midspan, normal mode interference shall be
artificially introduced by applying a voltage of operating-
power-supply frequency between the measuring circuit
terminais of the instrument. This voltage shall be ad-
justable in magnitude and isolated from the operating
power supply and ground by a suitable transformer. The
rms (root-mean-square) magnitude of this voltage shall
be measured by a voltmeter connected to the input ter-
minals of the instrument, and this voltmeter shall be
preferably of the batterysperated electronic type. Means
shall be provided for continuously shifting the phase
angle of the applied voltage.
The rms magnitude of the normal mode interference
shall be adjusted to the value stated for extreme operat-
ing conditions in the Detailed Requirement Sheets, and
 E 7007273 0001059 Tb5 c39.4
AUTOMATIC NULL.BALANCING ELECTRICAL MEASURING INSTRUMENTS 19

o#mnNc
POWER SuPP'V{ I I
Fig. 3
Test for Normal Mode Interference Influence for Instruments with dc Measui --ig Circuits

the phase angle shall be varied through 360 degrees. meter shall preferably be of the battesr-operated elec-
Throughout the test the error (accuracy) and dead band tronic type.
shall be measured and compared with the data obtained The rms magnitude of the common mode interference
prior to the introduction of the normal mode interference. shall be adjusted to the value stated for extreme operat-
8.3.3.2 Common Mode interference Influence. ing conditions in the Detailed Requirement Sheets, and
IRefer to Fig. 3 . ) With the instrument balanced at ap- the phase angle shall be varied through 360 degrees.
proximately midspan, common mode interference shall Throughout the test the error (accuracy) and dead band
be artificially introduced by applying a voltage of operat- shall be measured and compared with the data obtained
ing-power-supply frequency between each measuring prior to the introduction of the common mode inter-
circuit terminal of the instrument and the instrument ference.
case. This voltage shall be adjustable in magnitude and 8.3.3.3 Magnetic-Field Influence. With the instru-
means shall be provided for continuously shifting its ment balanced at midspan, it shall be subjected to an
phase angle. The rms magnitude of this voltage shall be external magnetic field derived from a Helmholtz coil
measured by a voltmeter connected between instrument set energized at operating-power-supply frequency. The
case and the measuring circuit terminal, and this volt- coils shall be 40 inches in diameter, not over 5 inch$$,.

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 c39.4
20 AMERICAN STANDARD SPECIFICATIONS FOR

MEASURING
-

A A (

O
STABLE
Dc
SOURCE

AC VACUUM-TUBL
VOLTMETER

- --``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

Fig. 4
Test for Common Mode Interference Influence for I n s t r u m e n t s with dc Measuring Circuits

long, and spaced 20 inches apart, and shall carry suf-
ficient current to produce the required field. (56.5 ampere
turns per coil will produce a field intensity of approxi-
mately 1 oersted.) The instrument under test shall be
placed in the center of the coil system.
The magnetic-field strength shall be adjusted to the
value stated for extreme operating conditions in the
Detailed Requirement Sheets and the phase angle shall
be varied through 360 degrees. The test shall be re-
peated with the coil oriented along each of the three
major axes. Throughout the test the error (accuracy)
and dead band shall be measured and compared with the
data obtained prior to the introduction of the external
magnetic field.
8.3.4 Source Resistance. With the source resistance
not exceeding one-tenth the source resistance rating,
adjust the dead band of the instrument in accordance
with the manufacturer's instructions. Then insert re-
sistance in the external circuit as specified in the tabu-
lated Detailed Requirement Sheets under extreme oper-

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~- ~-
9009273 O O O L O b L b L 3
4CTOM4TIC YULLB4L4YCIYG ELECTRICAL ME4S1lRING INSTRUMENIS
ating conditions. The values of error, dead band, span
step-response time, and transient overshoot p d e r these
conditions of test shall not exceed the values for operat-
ing influences shown in the tabulated Detailed Require-
ment Sheets.
8.3.5 Reproducibility. The instrument shall be
operated for a period of 24 hours, during which all
operating conditions shall be held constant. As frequently
as desired during this period, the error (accuracy1 shall
be measured and compared with data obtained prior to
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
the test.
8.3.6 Operational Maintenance Influence. If the
instrument has a cover it shall be operated for 1 hour
with its cover closed, after which all internal components
shall be exposed to ambient conditions to the extent
provided in the design for routine servicing. After 15
minutes, the cover shall be closed and the error (accuracy)
shall be measured within 1 minute and compared with
the data obtained prior to the test.
8.3.7 Position Influence. The instrument shall be
mounted with its vertical axis inclined from normal in
any direction by an angle equal to that stated for ex-
treme operating conditions in the Detailed Requirement
Sheets. The error shall be measured and compared with
the data prior to inclining the instrument.
8.3.8 Vibration Influence. The instrument shall be
supported in its normal operating position and vibrated
in the direction of each of its three major axes at an ac-
celeration and over the frequency range stated in the
Detailed Requirement Sheets for the extreme operating
condition. While undergoing vibration, the error (ac-
curacy) shall be measured and compared with the data
obtainid prior to vibration.
8.3.9 Shock Influence. The case of the instrument
shall be mounted in its normal operating position and
subjected, by drop test, to an acceleration having the
magnitude stated for the extreme operating condition in
the Detailed Requirement Sheets for a duration not
exceeding 50 milliseconds. When shock is applied, the
transient shift in instrument indication shall be measured.
8.4 Tests for Design Limits. Prior to conducting any
of the tests in this section, the instrument shall be oper-
ated under the test conditions of Section 6, and shall be
checked for compliance with the performance ratings
given in the Detailed Requirement Sheets. This procedure
shall be repeated at the conclusion of the test.
8.4.1 Dielectric Test (Voltage Withstand Test).
The instrument shall be conditioned for this test for
16 to 24 hours in an atmosphere having a temperature
of approximately 30 C (86 F ) and a relative humidity of
85 percent. Alternating voltage of operating-power-
supply frequency and approximating a true sine wave
shall be applied continuously for a period of 60 seconds.
The measurement of the test voltage shall be made by the
voltmeter method whereby the voltmeter derives its
voltage from the high-potential circuit, either directly or
COPYRIGHT 2003; American National Standards Institute
~ ~ ~ ~
(39.4
21
by means of a voltmeter coil placed in the testing trans-
former or through an auxiliary potential transformer.
To avoid voltage surges, the applied voltage shall be
raised to its full value gradually and, upon completion
of the 60-second test period, shall then gradually be
reduced.
The rms values of test voltage which the instrument
shall withstand without damage or flashover shall be
determined by reference to the design limits in the De-
tailed Requirement Sheets. The test voltage shall be
applied to the instrument as follows:
( 1 ) Between terminals of operating power supply (and
any other circuits intended for connection to power
lines) and case, with all terminals of measuring circuit
tied to the case.
( 2 ) Between terminals of measuring circuit and case.
If the measuring circuit is connected directly or through
a capacitor to the case or ground, this connection shall
be removed during the test.
( 3 ) Between terminals of operating power supply and
all parts such as the chart mechanism which may be
touched in the normal use of the instruments.
(41 If the instrument is housed in a case of insulating
material, a test probe of 0.250-inch diameter and having
a hemispherical tip with a 0.125-inch radius shall be
used to explore the exterior surfaces.
8.4.2 Insulation Test (Leakage Current Test). This
test shall follow the one given in 8.4.1. The instrument
shall be conditioned for 16 to 24 hours in an atmosphere
having a temperature of approximately 30 C (86 F ) and
a relative humidity of 85 percent. A test voltage of normal
operating-power-supply voltage and frequency shall be
applied to the instrument through a suitable ac milliam-
meter in the manner described in the following subsec-
tions. The leakage currents measured by the milliammeter
shall be compared with the maximum allowable values
stated as design limits in the Detailed Requirement
Sheets:
( 1 ) Between terminals of operating power supply (and
any other circuits intended for connection to power lines)
and case.
( 2 ) Between terminals of measuring circuit and case.
( 3 ) Between terminals of operating power supply and
all parts such as the chart mechanism which may be
touched in the normal use of the instruments.
( 4 ) Between each circuit and remaining circuit or
circuits.
8.4.3 Ambient Relative Humidity Effect. The in-
strument shall be placed in a humidity chamber and set
up to simulate installed conditions. The chart and ink
shall be removed. The chamber shall be maintained for
120 hours at 50 C (122 F ) and at the condition of humid-
ity stated in the Detailed Requirement Sheets as the
design limit for which subsequent operation of the instru-
ment shall not be impaired. During this period. the in-
strument shall be energized from the operating power
supply. At the conclusion of this period, the he-&-,
<
Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~
9009273 0 0 0 1 0 b 2 S S T
c39.4
22
means shall be shut off and the instrument shall be de-
energized and allowed to cool for 48 hours in the test
chamber. Inasmuch as the relative humidity rises as the
temperature decreases, precautions should be taken to
prevent dripping on the instrument. At the end of the
cooling period, the instrument shall be removed from the
chamber and maintained de-energized under the test
conditions of Section 6 for 24 hours. Its performance
characteristics shall then be measured and compared
with the data obtained prior to the test.
8.4.4 Storage Temperature Test. Standard cells,
batteries, and ink shall be removed from the instrument
for this test. The instrument shall be subjected for 48
' hours to each extreme value of the storage temperature
range stated in the Detailed Requirement Sheets as the
design limits for which subsequent operation of the in-
strument will not be impaired. Following exposure at the
temperature extremes, the instrument shall be main-
tained de-energized under the test conditions of Section 6
for 24 hours. Its performance characteristics shall then
be measured and compared with the data obtained prior
to the test.
8.4.5 Vibration Test. The instrument shall be vi-
brated in the direction of each of its three major axes.
Components which are normally removed during ship-
ment shall be removed for the test, and shipping clamps
or other securing methods normally used during ship-
ment shall be employed.
The instrument shall be vibrated over the frequency
tange and at the acceleration stated in the Detailed
Requirement Sheets as the design limits at which dam-
$ging resonance shall not occur. Audible or visible reso-
nance shall be considered to be potentially damaging
unless proved otherwise by vibration testing at these
frequencies for one hour.
8.4.6 Shock Test. Components which are normally
removed during shipment shall be removed for this test,
and shipping. clamps or other securing methods normally
used during shipment shall be employed.
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---
COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
AMERICAN STANDARD SPECIFICATIONS FOR
The case of the instrument shali be subjected to shock
along each of its major axes ( a total of 6 directions) hav-
ing the acceleration stated in the Detailed Requirement
Sheets as the design limit for which subsequent operation
of the instrument will not be impaired. The duration of
the shock shall not exceed 50 milliseconds.
9. Revision of American Standards
Referred to in This Document
When the following American Standards referred to
in this document are superseded by a revision approved
by the American Standards Association, Incorporated,
the revision shall. apply:
American Standard Electrical Safety Requirements for
Electrical Measuring and Controlling Instrumentation,
C39.5-1964
American Standard Definitions of Electrical Terms,
Instruments, Meters and Meter Testing (Croup 30),
C42.30-1957
American Standard Terminology for Automatic Con-
trol, C85.1-1963
American Standard Unified Screw Threads, Bl.1-1960
American Standard Screw Thread Gages and Caging,
B1.2-1951
American Standard Square and Hexagon Bolts and
Nuts, B18.2-1960
American Standard Slotted and Recessed Head Wood
Screws, B18.6.1-1961
American Standard Hexagon Head Cap Screws, Slotted
Head Cap Screws, Square Head Set Screws, and Slotted
Headless Set Screws, B18.6.2-1956
American Standard Slotted and Recessed Head Ma-
chine Screws and Machine Screw Nuts, B18.6.3-1962
American Standard Slotted and Recessed Head Tap-
ping Screws and Metallic Drive Screws, B18.6.4-1958
 m 9009273 0001063 496 m
c39.4
AUTOMATIC NULLBALANCING ELECTRICAL MEASURING INSTRUMENTS 23
DETAILED REQUIREMENTS

General Characteristics
Direct-Current Potentiometer
Direct-Current Bridge
Strip Chart -3 inches to less than 6 inches wide

Item Units . Requirement

Recording means Single marking device (See Note 1 I
Number of measured variables - 1 ISee Note 1 )
l’en travel Inches 3 to less than 6
Indicator travel Inches 3 to less than 6
--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

Electrical span Imin) Millivolts 1 (See Note 2 )

Source resistance rating Ohms Specified by manufacturer
idc potentiometer only1
Span stepresponse rating Imin i Seconds 1
Time per point ímax I Seconds Specified by manufacturer
IMultipoint only)

NOTE 1 : Multipoint and multichannel instruments have the same characteris-

tics, point-by-point and channel-byshannel, as single point instruments.
NOTE 2: In a bridge instrument the equivalent minimum span in ohms is equal
to the minimum electrical span in millivolts divided by the maximum allowable
current through the resistance element in milliamperes.

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~ ~

9009273 00010b4 322

c39.4
AMERICAN STANDARD SPECIFICATIONS FOR
24

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 m 9009273 00010b5 2b9 m
c39.4
AUTOMATIC NULL-BALANCING ELECTRICAL MEASURING INSTRUMENTS 25
DETAILED REQUIREMENTS

General Characteristics
Direct-Current Potentiometer
Direct-Current Bridge
-
Strip Chart 6 inch minimum width and round chart

Item Units .Requirement

Recording means - Single marking device (See Note 1 I
Number of measured variables - 1 ISeeNote l i
Pen travel
Strip chart i min I Inches 6
Round chart (min1 Inches 3
Indicator travel
Strip chart íminì Inches 6
Round chart ímini Inches 20
Electrical span Iminì Villivolts I (See Note 21
Source resistance rating Ohms Specified by mrnufíicturer
Idc potentiometer only)
Span step-response rating íminì Seconds 1
Time per point (max I Seconds Specified by manufacturer
i \luhipoint onlyl

NOTE 1: Multipoint and multichannel instruments have same characteristics,

point-by-point and channel-by-channel, as single point instruments.
VOTE 2: In a bridge instrument the equivalent minimum span in ohms is equal
t v the minimum electrical span in millivolts divided by the maximum a l l o ~ a b l e
current throußh the resistance clement in milliamperes.

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 -~
~~ ~

9009273 OOOLObb L T 5
(39.4
26

.-s
I

E
L
cr;
.-C
L
3
-
L
I
L
a
U
dt

-z8
.a

2w
I
S

E
I
2.
Y.
.-C .

ua5
fi
I
E)

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
12/30/2003 08:08:08 MST Questions or comments about this message: please call
the Document Policy Group at 1-800-451-1584.
 ~- ___

0 9009273 0001067 031

AMERICAN STANDARDS
The standard in this booklet is one of over 2,600 standards approved to date
by the American Standards Association, incorporated.

The ASA provides the machinery for creating voluntary standards. It serves
to eliminate duplication of standards activities and to weld conflicting standards
into single, nationally accepted standards under the designation "American
Standards."

Each standard represents general agreement among maker, seller, and user
groups as to the best current practice with regard to some specific problem. Thus
the completed standards cut across the whole fabric of production, distribution,
and consumption of goods and services. American Standards, by reason of
ASA procedures, reflect a national consensus of manufacturers, consumers, and
scientific, technical, and professional organizations, and governmental agencies.
The completed standards are used widely by industry and commerce and often
by municipal, state, and federal governments.

The ASA, under whose auspices this work i s being done, i s the American
clearinghouse and coordinating body for standards activity on the national
level, Founded in 1918, it i s a federation of 135 trade associations, technical
societies, professional groups, and consumer organizations. Some 2,000 com-
panies are affiliated with the ASA as company members.

ASA i s the United States member of the International Organization for

Standardization (ISO), the International Electrotechnical Commission (IEC), and
the Pan American Standards Commission (COPANT). Through these channels
American industry makes its position felt on the international level. American
Standards are on file in the libraries of the national standards bodies of more
than 50 countries.

For a free list of all American Standards or information about membership

--``,`,````,,``,```,,,,,,,,,-`-`,,`,,`,`,,`---

in the ASA, write:

American Standards Association

INCORPORATED
10 EAST 40th STREET, NEW YORK, N. Y. 10016

COPYRIGHT 2003; American National Standards Institute Document provided by IHS Licensee=IHS Employees/1111111001, User=EEPPM03,
4 MST Questions or comments about this message: please call
12/30/2003 08:08:08
the Document Policy Group at 1-800-451-1584.