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Aspects of Alumina Control in Aluminium Reduction Cells
Aspects of Alumina Control in Aluminium Reduction Cells
249
In this investigation, several point fed reduction cells were 3.0 Measured A lumina Conc entr ation
subjected to a feed cycle of differing alumina feed rates to test the
of the base feed period, with bath sampling tongs in the tap -0.90
hole of the cell. Samples were analysed through LECO and dM
/dt
dMAl 2O 3 /dt kg/minute
250
As well as alumina feed rate and amperage the dM Al O dt is Sludge can backfeed via a film of electrolyte at the sidewalls. As
2 3
the metal pad is wetted by electrolyte, a film will flow from the
dependent on the % of alumina dissolving, secondary feeding rate
bulk bath though the metal pad at the sidefreeze by a combination
(or back feeding) and current efficiency. Temperature
of circulation and density gradients (Figure 4). According to
dependence of any or all of these variables is possibly responsible
Grjotherm and Welch8, the contact area between sludge and non-
for this behaviour.
saturated electrolyte at the sidewall is small, and hence the
The volume of electolyte to which the alumina is added to, will dissolution of alumina from sludge into the electrolyte via this
positively influence its dissolution and mixing in a cell, and hence pathway is likely controlled by the access of fresh electrolyte.
the % of the alumina feed dissolving. However, comparison
between the total bath mass or the bath dip height (as an indicator Sludge can also be present in a significant amount in the center of
of bath mass in the feed zone) with dM Al O dt during the the cell, under the alumina feeders, dependent on feeding
2 3 technology. This may be either continuously exposed to the
underfeed period showed there was no apparent correlation, electrolyte (as in Figure 4), or intermittently from oscillation of
suggesting that this influence is eclipsed by other phenomena. the metal-bath interface. In this situation mass transfer would
control the sludge dissolution. In the cell technology in this
Analysis of the superheat level of the electrolyte showed no investigation this is unlikely to be a significant source of
correlation with dM Al2O3 dt , indicating the influence of superheat backfeeding as the alumina dissolution behaviour observed in the
on the % of alumina dissolving was inconsequential on the cells is relatively good.
relationship observed in Figure 2.
If an undissolved alumina layer were to exist at the bath-metal
Current efficiency follows a proportional relationship with the interface, then as well as affecting the cell pseudo-resistance2 and
electrolyte temperature / AlF3 concentration. High current cell current efficiency9, the layer would also contribute to
efficiency at low electrolyte temperature / high AlF3 concentration secondary feeding of alumina into electrolyte10. In comparison
will result in a greater rate of electrolysis and hence a greater net with sludge at the bottom of the cell, alumina floating on top of
rate of alumina depletion. the metal pad will be in a more favorable position for dissolution
100%
into the electrolyte. If such a layer was present, the mass transfer
area would be far greater than for dissolution of sludge at the
95%
sidewall, and hence is more likely to be controlled by the
Current Efficiency (%)
current efficiency that others have found to be due to wt% °C wt% wt% ∆wt%
temperature4,5,6,7. This suggests the variation in the current
A 12.81 957.8 8.11 2.51 5.61
efficiency is not solely responsible for the behaviour observed in
Figure 2. B 12.88 961.0 8.22 1.94 6.28
251
7.5
Note that although it is more appropriate for comparison between
technologies in terms of voltage, the comparisons made are based
7.0
on similar amperages, and therefore compatible in terms of
Concentration Gradient
6.0
5.5 A key difference between this work and that of Jie et al3 and
Kvande et al2 is that these were generated with zero feeding
5.0
occurring, whereas in this study the underfeed was at > 0%. With
4.5 very little pseudo-resistance curve data being published, it is not
4.0 known whether ideal pseudo-resistance curves can be attained or
-1.10 -1.05 -1.00 -0.95 -0.90 -0.85 even approached with conventional feed cycling.
Underfeed Alumina
Average Mass Electrolyte
Nominal Depletion Rate
Temperature (kg/minute)
dM Al O dt (C)
2 3
Haupin and others12 have shown that the cathode overvoltage can
Figure 5: Concentration difference between electrolyte and
be affected by interfacial composition and transfer processes.
saturation and versus underfeed dM Al2O3 dt (from Table 1)
Figure 5 shows the calculated concentration gradient versus Kvande et al2 observed significant differences in the pseudo-
resistance between the under and overfeed periods. Through
dM Al O dt and the observed relationship suggests that the 2 3 simultaneous measurement of both the alumina and pseudo-
variation in the net secondary feeding rate may be a significant resistance over an overfeed period (135% feed rate), and a
cause of the relationship observed between dM Al O dt and bath subsequent underfeed (of zero feed rate), a higher resistance
2 3
temperature, with current efficiency also likely to be responsible curve, with less change in resistance, was observed from the
for some of temperature dependence. overfeed when compared to the underfeed period (Figure 7).
1
Change in Pseudo-Resistance (micro-ohms)
0.8
0.6
Theoretical Resistance
0.4
0.2
0
Measured Resistance
Figure 6: Measured and theoretical change in pseudo-resistance An alumina layer at the bath-metal interface was suggested as the
for measured alumina concentration cause of the difference in resistance between the two feed periods,
that introduced an additional electrical resistance term in the bath,
Figure 6 above shows that the calculated theoretical resistance due to presence of the alumina sludge, and in certain cases, a thin
change is of a magnitude greater than that measured (calculated layer of cryolite may freeze out also.
assuming constant alumina depletion rate throughout underfeed).
This was consistently observed over all the pseudo-resistance Although Kvande et al2 considered the possible effect of a thin
traces. frozen electrolyte layer above the metal pad to be small compared
to the influence of undissolved alumina present on the metal
There have been very few published experimental curves from surface, Haupin has hypothesised that such phenomena may be
industrial reduction cells. Published pseudo-resistance curves by significant13.
Kvande et al2 show that for the alumina concentration change in
Figure 6, a pseudo-resistance change of up to ~0.7 µΩ was With the particularly aggressive overfeeding used for the
measured (from 1.9% to 2.9%). Similar results were reported by experimental measurements in this present study (20kg added
Jie et al3, with a measured and calculated pseudo-resistance during initial 2 minutes of overfeed, followed by the normal
change of ~0.6 µΩ for the same alumina concentration range. overfeed), it is possible that a postulated alumina layer at the bath-
These compare well with the calculated theoretical, whereas in metal interface may exist long enough to also influence the
this study however, a change in pseudo-resistance of only ~0.19 pseudo-resistance during the subsequent underfeed period.
µΩ was observed (see Figure 6).
Given that the time between the termination of the overfeed and
initiation of the underfeed period is relatively short (< 30
252
minutes), and that the difference in the pseudo-resistance between resistance minimum), it would be expected that the average
the under and overfeed reported by Kvande et al2 (Figure 7) took change in alumina concentration during the underfeed would
up to 30 minutes to develop after commencement of the underfeed increase with the end of underfeed alumina concentration as
period (feed periods were in the order of 3-4 hours), it is possible shown in Figure 8. The experimental data however, shows a
that the aggressive overfeeding used in the experimental cells may significant deviation from the expected relationship
create a persisting alumina layer at the bath-metal interface, and
hence permanent reduction in the pseudo-resistance change. 1.60
0.40
Influence of Temperature on Resistance-Alumina Curve
0.20
As seen in Figure 7, there is a significant difference between the
1.5 1.7 1.9 2.1 2.3 2.5 2.7
observed ∆R and dR dt versus that expected. This has been
Cell Average Underfeed End Alumina Concentration (wt%)
hypothesised by others and also here to be due the presence of an
alumina layer, acting as an additional resistance at the bath – Figure 8: Average Change in Underfeed Concentration versus
metal interface. Also as discussed above, a significant part of the Average Underfeed End Concentration
influence of temperature on dM Al O dt could be explained by the
2 3
the back feeding of alumina sludge, possibly from an alumina If the resistance-alumina curve was varying with temperature (due
layer at the bath-metal interface. to the alumina concentration gradient between an alumina layer
and the electrolyte), then it would be expected that the magnitude
With an alumina layer acting as an additional resistance at the of the deviation between the expected relationship and that
bath-metal interface, influencing the overall cell pseudo- observed in Figure 8 would correlate with the calculated alumina
resistance, it would be expected that if its dissolution back into the concentration gradient.
electrolyte was controlled by the electrolyte temperature (through
temperature dependence of concentration gradient for mass To assess the magnitude of the deviation, a reference resistance-
transfer), then mass/size of any alumina layer and hence the cell alumina curve was used to compare the expected change in
pseudo-resistance would also be dependent on the electrolyte alumina concentration over the underfeed, with that measured. To
temperature. account for the reduced change, or ‘flattening’ of the pseudo-
resistance (Figure 7), the theoretical resistance alumina was scaled
The pseudo-resistance is slightly dependent on temperature via its down by a factor of 4.4, so that for the coldest cell (where the
effect on the bath conductivity. A possible temperature effect due deviation was expected to be the least), the change in alumina
to an alumina layer on the pseudo-resistance would however be concentration equaled that measured for the underfeed end
significantly greater. alumina concentration. The calculated change expected for the
measured end underfeed alumina concentration is shown in Figure
With the mass of any alumina layer decreasing during the
8.
underfeed, due to the net dissolution into the bulk electrolyte, the
resulting decrease in resistance (of the alumina layer) would From Figure 9, with the exception of one data point, there is a
partially offset the increase in resistance due to polarisation during clear, positive relationship between the deviation from the
the underfeed period (in the alumina concentration range left of reference resistance-alumina curve (Figure 8) and the alumina
the minimum pseudo-resistance). At higher temperatures, the concentration gradient (Table 1).
concentration gradient for mass transfer is greater, resulting in the
greater depletion of any alumina layer. This would cause a 0.60
Resistance-Alumina Curve (wt%)
0.40
greater deviation from the theoretical pseudo-resistance.
0.20
Unfortunately, due to variation in the alumina concentration 0.00
control range for each cell, pseudo- resistance curves from
-0.20
individual cells could not be directly compared to ascertain the
possible influence of temperature on the pseudo-resistance curve. -0.40
-0.60
Some evidence for a dependency of the resistance versus Al2O3
-0.80
curve on temperature via the effect of an undissolved alumina
4.5 5.0 5.5 6.0 6.5 7.0 7.5
layer is seen in an analysis of Al2O3 concentration data. With the
Calculated Alumina Concentration Gradient (wt%)
particular control parameters and operating conditions used during
these experimental measurements, the end of underfeed period
was determined by a set change in the pseudo-resistance (∆R). If Figure 9: Deviation from Reference Resistance-Alumina Curve
the resistance-alumina curve was consistent for all of the versus Calculated Alumina Concentration Gradient
experimental cells (all cells were operating left of the pseudo-
253
Inspection of the resistance data of the errant data point in Figure With the temperature dependence of dM Al2O3 dt (and
9 indicated that it was expecially noisy, suggesting this may be the
consequently dC Al O dt ) and the possible temperature
reason for its exception from the other data points. 2 3
Manipulation of the feed cycle, either through a reduced rate of • It is also hypothesised that with the presence of an alumina
overfeeding, and / or an extended base feed period may allow an layer at the bath-metal interface, the degree of flattening of
alumina layer to fully dissolve prior to the underfeed the theoretical resistance-alumina curve may be temperature
commencing. This would result in the pseudo-resistance in the dependent. Some evidence for this is apparent from these
subsequent underfeed following the theoretical pseudo-resistance experimental measurements. Further experimental
more closely. A steeper resistance curve would allow more measurements are required to properly ascertain these
accurate measurement of ∆R, and (in particular) the resistance phenomena.
slope ( dR dt ) and hence lower variation in the end of underfeed
alumina concentration. Acknowledgement
Assistance and financial support from Comalco Aluminium Ltd.
The possible presence of an alumina layer at the bath-metal is gratefully acknowledged.
interface, where it is in a favorable position for dissolution into
the electrolyte and with adequate area for mass transfer, appears References
to be a significant cause of the correlation observed between
1. Bearne, G. “Reduction Line Process Control Development”,
dM Al O dt and temperature, as well as some contribution from
2 3 Sixth Australasian Aluminium Smelting Workshop, 1998,
the temperature dependency of the current efficiency. 91-130.
With this relationship between temperature and the dissolution of 2. H. Kvande, B.P. Moxnes, J. Skaar and P.A. Solli, “Pseudo
the alumina layer into the electrolyte, may alter the effect of the resistance Curves for Aluminium Cell Control – Alumina
alumina layer on the cell pseudo-resistance, resulting in variation Dissolution and Cell Dynamics” , Light Metals 1997, 403-
in the resistance-alumina curve with temperature. 409.
Similar 'flatness' of the pseudo-resistance curve seems however to 3. L. Jie, H. Yongzhong, W. Huazhang and L. Yexiang, “An
be prevalent in other cell technologies14,15. With the constant Estimation Model of Alumina Concentration for Point-
addition of alumina that occurs, it is possible that pseudo- Feeding Aluminium Reduction Cells”, Light Metals 1994,
resistance curves close to the theoretical cannot be attained in a 441-447.
point fed cell with a conventional feed cycle. Further investigation
into this is envisaged.
254
4. T.R. Alcorn, C.J. McMinn and A.T. Tabereaux, “Current
Efficiency in Aluminum Electrolysis by Anode Gas
Analysis”, Light Metals 1988, 683-695.
255