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Millimeter-Wave Technology Assignment VI (20×1)
Millimeter-Wave Technology Assignment VI (20×1)
Millimeter-Wave Technology Assignment VI (20×1)
Assignment VI (20×1)
Q3) Which of the following do you think creates a problem for the MOSFET at the millimeter-
wave (MMW) frequencies?
a) significant gate to source parasitic capacitance
b) significant gate to source parasitic inductance
c) significant gate-source and gate-drain parasitic capacitances
d) significant parasitic inductances at the all terminals
Please go through week 6 presentation slides 49˗50 and related lecture/ discussions
for better understanding
Q4) The device for which the thickness of the depletion region under reverse bias is varied
for capacitance variation is
a) Light emitting diode
b) Varactor diode
c) Thermistor
d) IMPATT diode
Please go through week 6 presentation slide 7 and related lecture/ discussions for
better understanding
Q7) The transistor for which two different barrier height is created for its two pn junctions is
a) HEMT (High electron mobility transistor)
b) HBT (Heterojunction Bipolar Transistor)
c) Thyristor
d) MESFET (metal-semiconductor FET)
Please go through week 6 presentation slide 16 and related lecture/ discussions for
better understanding
Q12) In the following device, only one type of charge carriers are involved in current flow.
a) HEMT (High electron mobility transistor)
b) HBT (Heterojunction Bipolar Transistor)
c) PIN diode
d) Varactor diode
Please go through week 6 presentation slide 44 and related lecture/ discussions for
better understanding
Q13) FET is
a) Voltage controlled as it depends on VGS
b) Current controlled as it depends on ID
c) Voltage controlled as it depends on VTH
d) All of the above
Please go through week 6 presentation slide 44 and related lecture/ discussions for
better understanding
Q15) When the gate to source voltage of a depletion type RF n-MOSFET is less than the
pinch off voltage, drain current is of the order of
a) 100 mA
b) 0
c) 1 mA
d) 10 mA
When the gate to source voltage is less than pinch off, both of the junctions will be
reverse biased and channel is not formed. Hence, no current flows.
Q17) The device that improves mobility by avoiding scattering from the doping agent by
using highly doped n-channel to create 2D electron gas is
a) HBT
b) MESFET
c) HEMT
d) SCR
Please look at slide 51.
Q18) The following device utilizes the property of negative resistance for amplification.
a) GUNN diode
b) IMPATT diode
c) BARITT diode
d) All of the above
Please look at slide 28 and 39.
Q19) Among the following C-MOS technological nodes that would provide the best device
performance at 60 GHz is
a) A 180 nm node n-MOS
b) A 180 nm node p-MOS
c) A 65 nm node n-MOS
d) A 65 nm node p-MOS
The dimensions are the smallest gate width that can be fabricated in that
fabrication process. Now, transit time must be small as the frequency increases.
Therefore, lower node provide higher unity gain frequency fT. Further, electron
mobility is higher than the hole mobility.
Q20) The output characteristics of a MOSFET with low values of Vds, the value of the on-
state resistance is
a) Vds/Id
b) 0
c) Vds/Ig
d) Infinity
The o/p characteristics is a plot of Id verses Vds, which for low values of Vds is almost
constant. Hence, the on-state resistance is constant & the slop is its constant value.
Please look at the slope of output characteristics in slide 44.