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Features Description: LTC2508-32 32-Bit Oversampling ADC With Configurable Digital Filter
Features Description: LTC2508-32 32-Bit Oversampling ADC With Configurable Digital Filter
FEATURES DESCRIPTION
nn ±0.5ppm INL (Typ) The LTC®2508-32 is a low noise, low power, high perfor-
nn 145dB Dynamic Range (Typ) at 61sps mance 32-bit ADC with an integrated configurable digital
nn 131dB Dynamic Range (Typ) at 4ksps filter. Operating from a single 2.5V supply, the LTC2508-32
nn Guaranteed 32-Bits No Missing Codes features a fully differential input range up to ±VREF, with
nn Configurable Digital Filter with Synchronization VREF ranging from 2.5V to 5.1V. The LTC2508-32 supports
nn Relaxed Anti-Aliasing Filter Requirements a wide common mode range from 0V to VREF simplifying
nn Dual Output 32-Bit SAR ADC analog signal conditioning requirements.
nn 32-Bit Digitally Filtered Low Noise Output
nn 14-Bit Differential + 8-Bit Common Mode 1Msps
The LTC2508-32 simultaneously provides two output
codes: (1) a 32-bit digitally filtered high precision low
No Latency Output
nn Wide Input Common Mode Range
noise code, and (2) a 22-bit no latency composite code.
nn Guaranteed Operation to 85°C
The configurable digital filter reduces measurement noise
nn 1.8V to 5V SPI-Compatible Serial I/O
by lowpass filtering and down-sampling the stream of
nn Low Power: 24mW at 1Msps
data from the SAR ADC core, giving the 32-bit filtered
nn 24-Lead 7mm × 4mm DFN Package
output code. The 22-bit composite code consists of a
14-bit code representing the differential voltage and an
APPLICATIONS 8-bit code representing the common mode voltage. The
22-bit composite code is available each conversion cycle,
nn Seismology with no cycle of latency.
nn Energy Exploration
nn Automated Test Equipment (ATE)
The digital filter can be easily configured for 4 different
nn High Accuracy Instrumentation
down-sampling factors by pin strapping. The configura-
tions provide a dynamic range of 131dB at 3.9ksps and
L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks and
SoftSpan is a trademark of Analog Devices, Inc. All other trademarks are the property of their 145dB at 61sps. The digital lowpass filter relaxes the re-
respective owners. Protected by U.S. Patents, including 7705765, 7961132, 8319673, 8576104,
8810443, 9054727, 9231611, 9331709 and patents pending.
quirements for analog anti-aliasing. Multiple LTC2508-32
devices can be easily synchronized using the SYNC pin.
250832fc
LEAD FREE FINISH TAPE AND REEL PART MARKING* PACKAGE DESCRIPTION TEMPERATURE RANGE
LTC2508CDKD-32#PBF LTC2508CDKD-32#TRPBF 250832 24-Lead (7mm × 4mm) Plastic DFN 0°C to 70°C
LTC2508IDKD-32#PBF LTC2508IDKD-32#TRPBF 250832 24-Lead (7mm × 4mm) Plastic DFN –40°C to 85°C
Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container.
For more information on lead free part marking, go to: http://www.linear.com/leadfree/
For more information on tape and reel specifications, go to: http://www.linear.com/tapeandreel/. Some packages are available in 500 unit reels through
designated sales channels with #TRMPBF suffix.
ELECTRICAL CHARACTERISTICS
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 4)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VIN+ Absolute Input Range (IN+) (Note 5) l 0 VREF V
VIN – Absolute Input Range (IN–) (Note 5) l 0 VREF V
VIN+ – VIN– Input Differential Voltage Range VIN = VIN+ – VIN– l –VREF VREF V
VCM Common-Mode Input Range l 0 VREF V
IIN Analog Input Leakage Current 10 nA
CIN Analog Input Capacitance Sample Mode 45 pF
Hold Mode 5 pF
CMRR Input Common Mode Rejection Ratio Filtered Output 128 dB
VIN+ = VIN– = 4.5VP-P, 200Hz Sine
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REFERENCE INPUT
The l denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Notes 4, 9)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VREF Reference Voltage (Note 5) l 2.5 5.1 V
IREF Reference Input Current (Note 11) l 0.7 1 mA
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0.8•OVDD tWIDTH
0.2•OVDD
tDELAY tDELAY 50% 50%
0.2•OVDD 0.2•OVDD
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COUNTS
0 0
400
–0.5
–1.0 –1.8
200
–1.5
–2.0 –3.5 0
–5 –2.5 0 2.5 5 –5 –2.5 0 2.5 5 –0.4 –0.2 0 0.2 0.4
INPUT VOLTAGE (V) INPUT VOLTAGE (V) OUTPUT CODE (ppm)
250832 G01 250832 G03 250832 G04
0 0 0
–0.4 –0.2 0 0.2 0.4 –0.4 –0.2 0 0.2 0.4 –0.4 –0.2 0 0.2 0.4
OUTPUT CODE (ppm) OUTPUT CODE (ppm) OUTPUT CODE (ppm)
250832 G05 250832 G06 250832 G07
128k Point FFT fSMPL = 1Msps, 128k Point FFT fSMPL = 1Msps, 32k Point FFT fSMPL = 1Msps,
fIN = 200Hz, DF = 256 fIN = 50Hz, DF = 1024 fIN = 10Hz, DF = 4096
0 0 0
DR = 131dB DR = 136dB DR = 141dB
–20 –20 –20
–40 –40 –40
–60 –60 –60
AMPLITUDE (dBFS)
AMPLITUDE (dBFS)
AMPLITUDE (dBFS)
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8k Point FFT fSMPL = 1Msps, Dynamic Range, Transition Noise Frequency Response,
fIN = 10Hz, DF = 16384 vs DF DF = 256, 1024, 4096, 16384
0 150 0.10
DR = 145dB 0 DF=256
–20 DF=1024
DF=4096
–40 145 0.08 DF=16384
–50
–80 140 0.06
–100
–120 135 0.04
–140 –100
135 132
SNR –115
HARMONICS, THD (dBFS)
SNR,SINAD (dBFS)
130 130
THD
DR (dB)
SINAD
125 128 –120
3RD
120 126
–125
2ND
115 124
135 30
HARMONICS, THD (dBFS)
THD
–120
3RD
DR (dB)
130 20
2ND
–130
125 10
120 0 –140
–40 –15 10 35 60 85 –40 –15 10 35 60 85 –40 –15 10 35 60 85
TEMPERATURE (oC) 250832 G16
TEMPERATURE (°C) 250832 G17
TEMPERATURE (oC) 250832 G18
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3 4
3
1 1
0 0 0
+FS
–1 –1
–2
–2 MIN INL –5
–3
–3 –4
–4 –10 –5
–40 –15 10 35 60 85 –40 –15 10 35 60 85 –40 –15 10 35 60 85
TEMPERATURE (°C) 250832 G19
TEMPERATURE (oC) 250832 G20 TEMPERATURE (°C) 250832 G21
8 175 0.8
5 0.5
4 125 0.4
3 0.3
2 100 0.2
I REF IOVDD
1 0.1
0 75 0
–40 –15 10 35 60 85 0.0001 0.001 0.01 0.1 1 2 2.5 3 3.5 4 4.5 5
TEMPERATURE (°C) FREQUENCY (MHz) REFERENCE VOLTAGE (V)
250832 G22 250832 G23 250832 G24
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–40 0.3
AMPLITUDE (dBFS)
–80 0
–100 –0.1
–120 –0.3
–140 –0.4
–160 –0.5
0 125 250 375 500 –5 –2.5 0 2.5 5
FREQUENCY (kHz) INPUT VOLTAGE (V)
250832 G26 250832 G27
–40
DNL ERROR (LSB)
0.1
0 –60
–0.1
–80
–0.3
–100
–0.4
–0.5 –120
–5 –2.5 0 2.5 5 0 125 250 375 500
INPUT VOLTAGE (V) FREQUENCY (kHz)
250832 G28 250832 G29
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LTC2508-32
SCKA
IN+ + SDOA
RDLA
32-BIT DIGITAL 32
SAR ADC FILTER
SPI
IN– –
PORT
SCKB
SDOB
14 RDLB
MCLK
BUSY
DRL
CONTROL LOGIC SYNC
SEL0
SEL1
GND
250832 FBD
TIMING DIAGRAM
Conversion Timing Using the Serial Interface
RDLA = RDLB = 0
MCLK
CONVERT
DRL
SCKA
DA30 DA28 DA26 DA24 DA22 DA20 DA18 DA16 DA14 DA12 DA10 DA8 DA6 DA4 DA2 DA0 WA6 WA4 WA2 WA0
SDOA
CONVERT DA31 DA29 DA27 DA25 DA23 DA21 DA19 DA17 DA15 DA13 DA11 DA9 DA7 DA5 DA3 DA1 WA7 WA5 WA3 WA1
BUSY POWER DOWN AND ACQUIRE
SCKB
DB12 DB10 DB8 DB6 DB4 DB2 DB0 CB6 CB4 CB2 CB0
SDOB
DB13 DB11 DB9 DB7 DB5 DB3 DB1 CB7 CB5 CB3 CB1 250832 TD
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–1 0V 1
The digital filter can be easily configured for 4 different –FSR/2
LSB LSB
FSR/2 – 1LSB
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10Ω
Figure 3. The Equivalent Circuit for the Differential SINGLE-ENDED- 6800pF 250832 F04
The inputs draw a current spike while charging the CIN Figure 4. Filtering Input Signal
capacitors during acquisition. During conversion, the
analog inputs draw only a small leakage current. High quality capacitors and resistors should be used in the
RC filters since these components can add distortion. NPO
INPUT DRIVE CIRCUITS and silver mica type dielectric capacitors have excellent
A low impedance source can directly drive the high imped- linearity. Carbon surface mount resistors can generate
ance inputs of the LTC2508-32 without gain error. A high distortion from self-heating and from damage that may
impedance source should be buffered to minimize settling occur during soldering. Metal film surface mount resistors
time during acquisition and to optimize ADC linearity. For are much less susceptible to both problems.
best performance, a buffer amplifier should be used to
Input Currents
drive the analog inputs of the LTC2508-32. The amplifier
provides low output impedance, which produces fast An important consideration when coupling an amplifier to
settling of the analog signal during the acquisition phase. the LTC2508-32 is in dealing with current spikes drawn
It also provides isolation between the signal source and by the ADC inputs at the start of each acquisition phase.
the ADC inputs. The ADC inputs may be modeled as a switched capacitor
load of the drive circuit. A drive circuit may rely partially
Noise and Distortion on attenuating switched-capacitor current spikes with
The noise and distortion of an input buffer amplifier and small filter capacitors CFILT placed directly at the ADC
other supporting circuitry must be considered since they inputs, and partially on the driver amplifier having suffi-
add to the ADC noise and distortion. Noisy input signals cient bandwidth to recover from the residual disturbance.
should be filtered prior to the buffer amplifier with a low Amplifiers optimized for DC performance may not have
bandwidth filter to minimize noise. The simple one-pole sufficient bandwidth to fully recover at the ADC’s maximum
RC lowpass filter (LPF1) shown in Figure 4 is sufficient conversion rate, which can produce nonlinearity and other
for many applications. errors. Coupling filter circuits may be classified in three
broad categories:
A coupling filter network (LPF2) should be used between
the buffer and ADC input to minimize disturbances reflected
into the buffer from sampling transients. Long RC time
constants at the analog inputs will slow down the settling
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the ADC inputs are much larger than the ADC’s sample Figure 6. Common Mode and Differential Input
capacitors (45pF), then the sampling glitch is greatly at- Leakage Current Over Temperature
tenuated. The driving amplifier effectively only sees the
average sampling current, which is quite small. At 1Msps, Let RS1 and RS2 be the source impedances of the dif-
the equivalent input resistance is approximately 22kΩ ferential input drive circuit shown in Figure 7, and let IL1
(as shown in Figure 5), a benign resistive load for most and IL2 be the leakage currents flowing out of the ADC’s
precision amplifiers. However, resistive voltage division analog inputs. The differential voltage error, VE, due to the
will occur between the coupling filter’s DC resistance and leakage currents can be expressed as:
the ADC’s equivalent (switched-capacitor) input resistance,
thus producing a gain error. RS1 +RS2 I +I
VE = • (IL1 –IL2 ) + (RS1 –RS2 ) • L1 L2
2 2
The input leakage currents of the LTC2508-32 should
also be considered when designing the input drive circuit, The common mode input leakage current, (IL1 + IL2)/2, is
because source impedances will convert input leakage typically extremely small (Figure 6) over the entire operat-
currents to an added input voltage error. The input leakage ing temperature range and common mode input voltage
currents, both common mode and differential, are typically range. Thus, any reasonable mismatch (below 5%) of the
extremely small over the entire operating temperature source impedances RS1 and RS2 will cause only a negligible
range. Figure 6 shows the input leakage currents over error. The differential leakage current is also typically very
temperature for a typical part. small, and its nonlinear component is even smaller. Only
the nonlinear component will impact the ADC’s linearity.
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Figure 7. Source Impedances of a Driver and amplifiers typically require substantial headroom to the
Input Leakage Currents of the LTC2508-32 power supply rails for best performance. Inverting ampli-
For optimal performance, it is recommended that the fier circuits configured to minimize swing at the amplifier
source impedances, RS1 and RS2, be between 5Ω and input terminals may perform better with less headroom
50Ω and with 1% tolerance. For source impedances in than unity-gain buffer amplifiers. The linearity and thermal
this range, the voltage and temperature coefficients of properties of an inverting amplifier’s feedback network
RS1 and RS2 are usually not critical. The guaranteed AC should be considered carefully to ensure DC accuracy.
and DC specifications are tested with 5Ω source imped-
Buffering Input Signals
ances, and the specifications will gradually degrade with
increased source impedances due to incomplete settling. The wide common mode input range and high CMRR of
the LTC2508-32 allow analog inputs IN+ and IN– pins to
DC Accuracy swing with an arbitrary relationship to each other, provided
The LTC2508-32 has excellent INL specifications. This that each pin remains between VREF and GND. This unique
makes the LTC2508-32 ideal for applications which re- feature of the LTC2508-32 enables it to accept a wide
quire high DC accuracy, including parameters such as variety of signal swings, simplifying signal chain design.
offset and offset drift. To maintain high accuracy over the
Buffering DC Accurate Input Signals
entire DC signal chain, amplifiers have to be selected very
carefully. A large-signal open-loop gain of at least 126dB Figure 8 shows a typical application where two analog
may be required to ensure 1ppm linearity for amplifiers input voltages are buffered using the LTC2057. The LTC2057
configured for a gain of negative 1. However, less gain is is a high precision zero drift amplifier which complements
sufficient if the amplifier’s gain characteristic is known to the low offset and offset drift of the LTC2508-32. The
LTC2057 is shown in a non-inverting amplifier configura-
VDD OVDD
0.047µF
IN+
4.99k
LTC2508-32
4.99k
IN –
0.047µF
REF GND
2.5V TO 5.1V
– 47µF
10Ω
(X7R, 1210 SIZE)
LTC2057
VIN– + 4.7µF
250832 F08
–3V
250832 F10a
250832fc
–80
at a constant rate, the LTC6655-5 will keep the deviation
–100
of the reference voltage over the entire code span to less
–120
–140
than 0.5ppm.
–160 When idling, the REF pin on the LTC2508-32 draws only
–180 a small leakage current (< 1μA). In applications where a
–200
0 0.5 1 1.5 2
burst of samples is taken after idling for long periods as
FREQUENCY (kHz) 250832 F10b shown in Figure 11, IREF quickly goes from approximately
0μA to a maximum of 1mA at 1Msps. This step in average
Figure 10b. 128k Point FFT with fIN = 200Hz
for Circuit Shown in Figure 10a current drawn causes a transient response in the refer-
ence that must be considered, since any deviation in the
reference output voltage will affect the accuracy of the
ADC REFERENCE
output code. In applications where the transient response
An external reference defines the input range of the of the reference is important, the fast settling LTC6655-5
LTC2508-32. A low noise, low temperature drift reference reference is also recommended.
is critical to achieving the full data sheet performance
of the ADC. Linear Technology offers a portfolio of high Reference Noise
performance references designed to meet the needs of The dynamic range of the ADC will increase approximately
many applications. With its small size, low power and 6dB for every 4× increase in the down-sampling factor
high accuracy, the LTC6655-5 is particularly well suited for (DF). The SNR should also improve as a function of DF in
use with the LTC2508-32. The LTC6655-5 offers 0.025% the same manner. For large input signals near full-scale,
(max) initial accuracy and 2ppm/°C (max) temperature however, any reference noise will limit the improvement
coefficient for high precision applications. of the SNR as DF increases, because any noise on the REF
When choosing a bypass capacitor for the LTC6655-5, the pin will modulate around the fundamental frequency of the
capacitor’s voltage rating, temperature rating, and pack- input signal. Therefore, it is critical to use a low-noise refer-
age size should be carefully considered. Physically larger ence, especially if the input signal amplitude approaches
capacitors with higher voltage and temperature ratings tend full-scale. For small input signals, the dynamic range will
to provide a larger effective capacitance, better filtering improve as described earlier in this section.
the noise of the LTC6655-5, and consequently facilitating
a higher SNR. Therefore, we recommend bypassing the DYNAMIC PERFORMANCE
LTC6655-5 with a 47μF ceramic capacitor (X7R, 1210
size, 10V rating) close to the REF pin. Fast Fourier Transform (FFT) techniques are used to test
the ADC’s frequency response, distortion and noise at the
The REF pin of the LTC2508-32 draws charge (QCONV) from rated throughput. By applying a low distortion sine wave
the 47μF bypass capacitor during each conversion cycle. and analyzing the digital output using an FFT algorithm,
MCLK
IDLE IDLE
PERIOD PERIOD
250832 F11
–80
–100
adhere to the maximum voltage relationships described
–120
in the Absolute Maximum Ratings section. The LTC2508-
–140 32 has a power-on-reset (POR) circuit that will reset the
–160 LTC2508-32 at initial power-up or whenever the power
–180 supply voltage drops below 1V. Once the supply voltage
–200 re-enters the nominal supply voltage range, the POR will
0 0.5 1 1.5 2
FREQUENCY (kHz) 250832 F12
reinitialize the ADC. No conversions should be initiated
until 200μs after a POR event to ensure the reinitialization
Figure 12. 128k Point FFT Plot of LTC2508-32 period has ended. Any conversions initiated before this
with DF = 256, fIN = 200Hz and fSMPL = 1MHz
time will produce invalid results.
ments.
4
During power-down, data from the last conversion can be Figure 13. Power Supply Current of
clocked out. To minimize power dissipation during power- the LTC2508-32 vs Sampling Rate
down, disable SDOA, SDOB and turn off SCKA, SCKB. The
auto power-down feature will reduce the power dissipa- INTEGRATED DECIMATION FILTER
tion of the LTC2508-32 as the sampling rate is reduced.
Since power is consumed only during a conversion, the 32-BIT DADC(n)
DIGITAL D1(n) DOWN
VIN SAR ADC DOUT(k)
LTC2508-32 remains powered down for a larger fraction of CORE FILTER SAMPLER
the conversion cycle (tCYC) at lower sample rates, thereby 250832 F14
250832fc
250832fc
fSMPL = DF × fO
ANALOG FILTER LTC2508
DIGITAL FILTER DOWN-SAMPLER
H1
H2 IMAGE
fSMPL – f0/2 ADC D1 (n)
VIN fSMPL – f0/2 DF DOUT (k)
CORE AT f0 (sps)
f0/2 fSMPL f0/2 fSMPL
250832 F19
H1 H2
ANALOG FILTER DIGITAL FILTER
HEQ
EQUIVALENT AAF
VIN TO ADC
f0/2 fSMPL
250832 F20
Figure 21. Frequency Response of Digital Filter with DF = 256 Settling Time and Group Delay
The length of each digital filter’s impulse response deter-
Frequency Response of Digital Filters mines its settling time. Linear phase filters exhibit constant
Figure 21 shows the frequency response of the digital delay time versus input frequency (that is, constant group
filter when the LTC2508-32 is configured to operate with delay). Group delay of the digital filter is defined to be the
DF = 256 and sampling at fSMPL. delay to the center of the impulse response.
For each configuration of the LTC2508-32, the digital LTC2508-32 is optimized for low latency, and it pro-
filter is a lowpass finite impulse response (FIR) filter vides fast settling. Figure 22 shows the output settling
with linear phase response. The bandwidth is inversely behavior after a step change on the analog inputs of the
proportional to the selected DF value. Each configuration LTC2508-32. The X axis is given in units of output sample
provides a minimum of 80dB attenuation for frequencies number. The step response is representative for all values
in the range of fO/2 and fSMPL – fO/2. The filter coefficients of DF. Full settling is achieved in 10 output samples.
GROUP DELAY
–2 –1 0 1 2 3 4 5 6 7 8 9 10 11
OUTPUT SAMPLE NUMBER 250832 F22
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MCLK
DRL
SCKA
250832 F23
DF NUMBER OF CONVERSIONS
CONVERSION
NUMBER 0 1 2 3 31 32 33 DF DF+1
MCLK
DRL
1 2 3 32 1
SCKA
32 SCKA
250832 F24
Figure 24. Reading Out Filtered Output Data with Distributed Read
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MCLK
DRL
FILTERED OUTPUT
REGISTER DOUT(0) DOUT(1) DOUT(2) DOUT(3)
250832 F25
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MCLK
DRL
SYNC
USER PROVIDED
MCLK
UNWANTED SYNCHRONIZATION
GLITCH WINDOW
CORRUPTED
MCLK
EXPECTED DRL
DRL W/O
PERIODIC SYNC
DF NUMBER DF NUMBER
OF CONVERSIONS OF CONVERSIONS
PERIODIC SYNC
MCLK
BUSY
NO-LATENCY
R(0) R(1) R(2) R(3) R(4) R(5) R(6)
OUTPUT REGISTER
1 22 1 22 1 22 1 22 1 22 1 22 1 22
SCKB
250832 F28
MCLK
CONVERT
DRL
SCKA
DA30 DA28 DA26 DA24 DA22 DA20 DA18 DA16 DA14 DA12 DA10 DA8 DA6 DA4 DA2 DA0 WA6 WA4 WA2 WA0
SDOA
DA31 DA29 DA27 DA25 DA23 DA21 DA19 DA17 DA15 DA13 DA11 DA9 DA7 DA5 DA3 DA1 WA7 WA5 WA3 WA1
250832 F30
250832fc
MASTER CLK
DRL IRQ
RDLA LTC2508-32
SEL0
SDOA DATA IN
SEL1 SCKA
CLK
RDLA = GND
CONVERT POWER-DOWN AND ACQUIRE CONVERT
tCYC
tMCLKH
tMCLKL
MCLK
DRL tCONV
tDRLLH
tSCKA tSCKAH tQUIET
SCKA 1 2 3 30 31 32
tSCKAL
tHSDOA
tDSDOADRLL tDSDOA
250832 F31
Figure 31. Using a Single LTC2508-32 with DF = 256 to Read Filtered Output
250832fc
SYNC
RDLAX
RDLAY
MASTER CLK
CLK
CONVERT
POWER-DOWN AND ACQUIRE CONVERT
tMCLKL
MCLK
DRL tCONV
tDRLLH
RDLAX
RDLAY
SYNC
tSCKA
tSCKAH tQUIET
SCKA 1 2 3 30 31 32 33 34 35 62 63 64
tHSDOA tSCKAL
tENA tDSDOA tDISA
Hi-Z Hi-Z Hi-Z
SDOA
DA31X DA30X DA29X DA1X DA0X WA7X DA31Y DA30Y DA29Y DA1Y DA0Y WA7Y 250832 F32
Figure 32. Reading Filtered Output with Multiple Devices Sharing MCLK, SCKA and SDOA
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MASTER CLK
BUSY IRQ
RDLB LTC2508-32
SDOB DATA IN
SCKB
CLK
tBUSYLH
tSCKB tSCKBH tQUIET
SCKB 1 2 3 20 21 22
tSCKBL
tHSDOB
tDSDOBBUSYL tDSDOB
250832 F33
250832fc
RDLBX
RDLBY
MASTER CLK
CLK
CONVERT
POWER-DOWN AND ACQUIRE CONVERT
tMCLKL
MCLK
BUSY tCONV
tBUSYLH
RDLBX
RDLBY
tSCKB
tSCKBH tQUIET
SCKB 1 2 3 20 21 22 23 24 25 42 43 44
tHSDOB tSCKBL
tENB tDSDOB tDISB
Hi-Z Hi-Z Hi-Z
SDOB
DB13X DB12X DB11X CB1X CB0X DB13Y DB12Y DB11Y CB1Y CB0Y 250832 F34
Figure 34. Reading No Latency Output with Multiple Devices Sharing MCLK, SCKB and SDOB
250832fc
RDLA
RDLB
MASTER CLK
CLK
CONVERT
POWER-DOWN AND ACQUIRE CONVERT
tMCLKL
MCLK
DRL tCONV
tDRLLH
BUSY tCONV
tBUSYLH
RDLA
RDLB
tSCKA tSCKB
tSCKAH tSCKBH tQUIET
SCKA/
SCKB 1 2 3 30 31 32 33 34 35 52 53 54
Figure 35. Reading Filtered Output and No Latency Output by Sharing SCK, and SDO
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250832fc
DKD Package
24-Lead Plastic DFN (7mm × 4mm)
(Reference LTC DWG # 05-08-1864 Rev Ø)
0.70 ±0.05
PACKAGE
OUTLINE
0.50 BSC
0.25 ±0.05
5.50 REF
RECOMMENDED SOLDER PAD LAYOUT
APPLY SOLDER MASK TO AREAS THAT ARE NOT SOLDERED
6.43 ±0.10
2.64 ±0.10
4.00 ±0.10
PIN 1 NOTCH
R = 0.30 TYP OR
PIN 1 0.35 × 45° CHAMFER
TOP MARK
(SEE NOTE 6)
12 1
0.50 BSC 0.25 ±0.05
0.75 ±0.05
5.50 REF
BOTTOM VIEW—EXPOSED PAD (DKD24) DFN 0210 REV Ø
NOTE:
1. DRAWING PROPOSED TO BE MADE VARIATION OF VERSION (WXXX) 4. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE
IN JEDEC PACKAGE OUTLINE M0-229 MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.15mm ON ANY SIDE
2. DRAWING NOT TO SCALE 5. EXPOSED PAD SHALL BE SOLDER PLATED
3. ALL DIMENSIONS ARE IN MILLIMETERS 6. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION
ON THE TOP AND BOTTOM OF PACKAGE
250832fc
250832fc
1k
8V
6800pF 5V 2.5V
0.1µF
2k 30.1Ω REF VDD
+ IN+
VCM LTC6363 6800pF LTC2508-32
10V 2k 30.1Ω
– IN–
0V VIN+ GND
–10V 6800pF
0.1µF
0.1µF
–3V
1k
250832 TA02
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LTC2380-24 24-Bit, 1.5/2Msps, ±0.5ppm INL Serial, 2.5V Supply, ±5V Fully Differential Input, 100dB SNR, MSOP-16 and 4mm × 3mm DFN-16
Low Power ADC Packages
LTC2368-24 24-Bit, 1Msps, ±0.5ppm INL Serial, Low 2.5V Supply, 0V to 5V Fully Unipolar Input, 98dB SNR, MSOP-16 and 4mm × 3mm DFN-16
Power ADC with Unipolar Input Range Package
LTC2378-20/ 20-Bit, 1Msps/500ksps/250ksps, 2.5V Supply, ±5V Fully Differential Input, 104dB SNR, MSOP-16 and 4mm × 3mm DFN-16
LTC2377-20/ ±0.5ppm INL Serial, Low Power ADC Package
LTC2376-20
DACs
LTC2757 18-Bit, Single Parallel IOUT SoftSpan™ ±1LSB INL/DNL, Software-Selectable Ranges, 7mm × 7mm LQFP-48 Package
DAC
LTC2641 16-Bit/14-Bit/12-Bit Single Serial VOUT ±1LSB INL/DNL, MSOP-8 Package, 0V to 5V Output
DAC
LTC2630 12-Bit/10-Bit/8-Bit Single VOUT DACs SC70 6-Pin Package, Internal Reference, ±1LSB INL (12 Bits)
REFERENCES
LTC6655 Precision Low Drift Low Noise Buffered 5V/4.906V/3.3V/3V/2.5V/2.048V/1.25V, 2ppm/°C, 0.25ppm Peak-to-Peak Noise,
Reference MSOP-8 Package
LTC6652 Precision Low Drift Low Noise Buffered 5V/4.906V/3.3V/3V/2.5V/2.048V/1.25V, 5ppm/°C, 2.1ppm Peak-to-Peak Noise,
Reference MSOP-8 Package
AMPLIFIERS
LTC2057 Low Noise Zero-Drift Operational 4µV Offset Voltage, 0.015µV/°C Offset Voltage Drift
Amplifier
LTC6363 Low Power, Fully Differential Output Single 2.8V to 11V Supply, 1.9mA Supply Current, MSOP-8 and 2mm × 3mm
Amplifier/Driver DFN-8 Package
LTC6362 Low Power, Fully Differential Input/ Single 2.8V to 5.25V Supply, 1mA Supply Current, MSOP-8 and 3mm × 3mm
Output Amplifier/Driver DFN-8 Package
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LT 0417 REV C • PRINTED IN USA
www.linear.com/LTC2508-32
For more information www.linear.com/LTC2508-32
LINEAR TECHNOLOGY CORPORATION 2016