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Properties of Semiconductors-Preview: Silicon Unit Cell
Properties of Semiconductors-Preview: Silicon Unit Cell
Properties of Semiconductors-Preview: Silicon Unit Cell
Properties of
semiconductors-preview
Vivek Dixit
Electronics and Electrical communication Engineering
Indian Institute of technology Kharagpur
http://lampx.tugraz.at/~hadley/ss1/crystalstructure/crystalstructure.php
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Lattice Vectors
Simple cubic lattice
a = (1,0,0)a
b = (0,1,0)a
c = (0,0,1)a
R = ma + nb + pc (m,n,p: integers)
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Body-centered cube
a = a(½, ½, ½ )
b = a(-½,-½, ½ )
c = a(½,-½,-½ )
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Face-centered cube
a = a(0, ½, ½)
b = a(½, 0, ½)
c = a(½, ½, 0)
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• IC today owe to growth of pure, single‐crystal Si
• Starting material = SiO2 is reduced at 1800 0C with coke in an arc
furnace: SiO2 + 2C = Si (MGS) +2CO
• Metallurgical grade Si has ~1 ppm Fe, Al and heavy metal impurities.
• Fractional distillation is used to obtain electronic grade Si (EGS)~1ppb.
• Si(MGS) + 3HCl = SiHCl3 + H2, and chloride of impurities are formed
• 2SiHCl3 +2H2 = 2Si (EGS) + 6 HCl
• Different impurity chlorides condense at different temperatures.
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Czochralski method
• Heat EGS to melting point (1412°C) in a quartz‐lined
graphite container
• A seed crystal provide a template for growth
• it is lowered into the molten material and then is
raised and rotated slowly
• To slightly stir the melt and average out temperature
variations for homogeneous solidification.
• Doping: distribution coefficient, kd = (impurity
concentration in the solid Cs / impurity concentration
in the liquid CL) at equilibrium
• Kd is a function of the material, impurity, temperature,
and growth rate.
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Epitaxial Growth
• Epitaxy: technique of growing single crystal
layer on a substrate wafer
• Epitaxy types:
• Homoepitaxy: substrate and grown layer are of the
same material
• Heteroepitaxy: different material with a similar
lattice structure
• Epitaxy methods: chemical vapor deposition
(CVD), liquid‐phase epitaxy (LPE), molecular
beam epitaxy (MBE)
• pseudomorphic: substrate and layer are not
lattice‐matched without strain
• critical layer thickness, tc: a function of lattice
mismatch, the strain energy leads to formation
of defects called misfit dislocation
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Periodic Table
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At 300K
EC n=ni Semicondu Band gap intrinsic
ctor (eV) density (ni)
EG
Si 1.1 eV 1010 cm-3
Ge 0.66 eV 2X013 cm-3
EV p=ni
/ GaAs 1.42 eV 106 cm-3
𝑛 ∝𝑒
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Recombination
EC n=ni
Direct gap– emit light (GaAs)
EG
Indirect gap– emit heat (Si)
EV p=ni
F=-qE
v(t) m0 effective mass
F=ma m*
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E F=dp/dt
E=(1/2)m0v2=p2/2m0
F=dp/dtd(ħK)/dt
E=(1/2)m*v2=p2/2m*
p=m0v
p=ħK
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ħ=h/2π, k=2π/λ 15
Band structure
E Indirect bandgap
direct bandgap
E = EC + p2/2mn*
Ec
Ec
E = EC + (p-p0)2/2mn*
Ev
ħK
E = EV - p2/2mp*
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Why Silicon
Other semiconductors are used when Si isn’t suitable (e.g. to make
light‐emitting devices).
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Summary
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Doping
Weakly bound electron P-type dopant
EB ~ 0.1 eV B, Ga
V III
N-type dopant
P, As
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V
Donor in Si:
ε = εrε0
=11.8X8.854X10-12 F/m
mn* = 0.26 m0
EB ~ - 0.025 eV
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ND=1017 cm-3
At 300 K
ND+=1017 cm-3
n ≈ ND+ = 1017 cm-3
P ≈ 103 cm-3
ni=1010 cm-3
Natoms ≈ 4.99 X 1022 cm-3
ni << ND << Natoms (X 10-2)
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Deep acceptor
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• By doping, we replace a few atoms of semiconductor with atoms from a
different column of the periodic table.
• Ionized dopants produce electrons in the conduction band or holes in the
valence band.
• High T intrinsic carriers overwhelm the extrinsic carriers device
ceases to operate.
• Semiconductor devices for operation at high temperature should be made
with materials with large band gaps, such as SiC and GaN.
• The carrier concentration vs. temperature characteristic has freeze out,
extrinsic, and intrinsic regions.
• A low temperatures, semiconductors become insulators.
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