Presenter

Dr. Fakhar-un-Nisa Memon

Assistant Professor
(Analytical Chemistry)
Department of Chemistry UoK
Instrumentation
Mass Spectrometer
 Single focusing is so called because a collection of ions
exiting the source with the same mass-to-charge ratio
but with small diverging directional distribution will
be acted upon by magnetic field in such a way that a
converging directional distribution is produced as the
ions leave the field.
 The ability of magnetic field to bring ions with
different directional orientations to focus is the factor
more responsible for limiting the resolution of
magnetic sector instruments (less then 200).
DEVELOPMENT OF DOUBLE FOCUSING MASS ANALYZER

 In single focusing the translational distribution of ions

leaving the source arises from the Boltzmann distribution
of energies of the molecule from which the ions are
formed and from field inhomogeneities in the source.
 The spread of kinetic energies causes the broadening of
the beam reaching the transducer and thus a loss of
resolution.
 In order to measure the atomic and molecular masses with
a precision of few parts per million, it was necessary to
design the instrument that correct for both the directional
distribution of ions and energy distribution of ions.
DOUBLE FOCUSING MASS ANALYZER

 The term double focusing is applied to mass

spectrometers in which the directional aberrations
and energy aberrations of a population of ions are
simultaneously minimized.
 Double focusing is usually achieved by the use of
carefully selected combination of electrostatic and
magnetic fields.
 BASIC PRINCIPLE
 In the double focusing instrument shown in figure, the ion beam is first
passed through an electrostatic analyzer (ESA) consisting of two smooth
curved metallic plates across which a dc potential is applied. This potential
has the effect of limiting the kinetic energy of the ions reaching magnetic
sector to a closely defined range. Ions with energy greater then average strike
the upper side of ESA slit and are lost to ground. Ions with energies less then
average strike the lower side of ESA slit and are thus removed.
 Directional focusing in the magnetic sector and energy
focusing takes place at the intersect of Double focusing
point and collector slit. Thus, only the ions of one m/z are
double focused at the intersection for any given accelerating
voltage and magnetic field strength. Therefore, the collector
slit is located at this locus of double focus.