University of Massachusetts Lowell

Department of Mechanical Engineering

Engineering Spectral Analysis MECH 5190

Experiment Number and Title:

Laboratory 2
Introduction to Spectral Analysis

Prepared By:

German Oswaldo Hohl Lopez

Partners:

Bahadir Sarikaya
Tyler Bussone

19 October 2017
Lab 2: Introduction to Spectral Analysis Engineering Spectral Analysis MECH 5190

Introduction
This laboratory explores the concepts of windowing when analyzing signals. To analyze the
frequency components of complex signals, a dynamic spectral analyzer can be used to
replace PC based digital data acquisition systems, oscilloscopes and digital multi-meter.
Dactron Photon multi-channel dynamic signal analyzer is capable of displaying signals in
the frequency domain by transforming time domain traces using Fast Fourier
Transformation (FFT).
Objectives
To introduce means of analyzing signals using a dynamic spectral analyzer.
To examinate the conversion of time to frequency domain data using Fast Fourier
Transformations (FFT).
To studied errors inherent with FFT and methods to reduce these errors.
Discussion of Procedures
The Discrete Fourier Transformation (DFT) is an essential tool widely used in the analysis
of spectral analysis. In assignment 1, the waveform source generated a pure tone (sine
wave) in the time domain. This signal is transformed to the frequency domain to better
visualize the leakage effects.The Hanning and Flat top methods are applied to minimize
the effects of leakage.
Random noise is introduced to the pure tone signal in assignment 2. In order to evaluate
the effects of the contamination, averaging is implemented. The signal is comprised of a
pure tone and random noise at various amplitude and frequencies values. Averaging allow
to examine the effects of noise either increasing the frame number or decreasing amplitude.
Conclusion
Any major difficulty was found while performing this experiment. The Flat top method
has excellent characteristics compare to the Hanning window. Although the frequency
resolution of the Flat Top is quite poor, this window is appropriate for calibration purposes.
Suggestions and Recommendations
While performing averaging, it is recommended to use 100 as a frame average number.

Equipment
Dactron Photon Multi-channel dynamic signal analyzer Bruel and Kjaer.
Function Generator BK precision 4010A Serial 40101057405111645

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Lab 2: Introduction to Spectral Analysis Engineering Spectral Analysis MECH 5190

Post-Lab Analysis
Results Obtained and Analysis Performed
Describe the purpose, inputs and outputs of the experiments along with the critical
parameters used and their selection strategy.
Acquisition of a Pure Tone.
The purpose of this assignment is to correctly produce the true frequency of the output
sine signal by converting the time domain to frequency domain using DFT. The leakage
error presented in the frequency domain plot is visually detectable when selecting to
”none” in the window in the analysis tab (Figure 1). Distortion of the frequency domain of
a pure tone is presented. The amplitude is set to 1 Volt at 150 Hz for frequency. In the
time domain plot the Amplitude reached to 1.0015 Volts while in the frequency domain it
is observed a Peak-Peak value is 2.003 Volts. The shape of the plot in the frequency
domain is in the Force Input shape.
To reduce the leakage presented in the signal, Hanning window is selected. The new plot
displayed a shrink curve, the values of amplitude changed slightly to 2.0028 Volts
peak-peak.
When selecting Flat Top window, the changes in frequency domain amplitude are less
(2.016 Volts peak to peak and 1.005 Volts amplitude). The number of lines and points is
kept equal as the previous Hanning window (200 lines, 512 points). The delta T is
observed constant. The final plot obtained is a cosine bell shaped stretched and smoother
than the two previous techniques (Figure 2).
Acquisition of a Pure Tones and Random Noise
The purpose of this second assignment is to acquire a signal that incorporates a pure tone
and random noise. The contaminated sine wave signal is generated at closest to 800 Hz
from the Function generator. The sampling parameters of the Function generator are
adjusted manually (peak value is to be checked at the channel status window). The
sampling parameters of the analyzer are also adjusted to allow for data collecting. The
resulting output spectrum shows some noise effect but is difficult to visually evaluate it
(Figure 3).
Both inputs are connected by a T coupling to allow the Photon analyzer to compare the
two sine waves. The Function generator is set to 100 Hz meanwhile 10 Hz are created with
the Photon Analyzer. The output spectrum trace shows a more contaminated signal.
Taking the average the Voltage peak to peak are divided by half. Turning the averaging off
and repeating the process, it is observed a even more contaminated signal (Figure 4). The
amplitude voltage and the peak to peak increased. When increasing the random noise to 1
Volt RMS, the output spectrum trace in the time domain appears less cosine bell shaped.

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 Figure 1. Waveform Source-Sine 1 Volt, 150 Hz Figure 2. Flat Top window

Figure 3. Function generator 800 Hz, 5 Vpp Figure 4. Avg. off, 0.1 RMS, function gen. 100 Hz

References
[1] Murat, Inalpolat. Engineering Spectral Analysis. Laboratory experiment 2. Handout.
2017
[2] McClelan, James. Schafer, Ronald. DSP FIRST, second edition.2015