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Assignment#2: Dilawar Fa18-Epe-130
Assignment#2: Dilawar Fa18-Epe-130
DILAWAR FA18-EPE-130
SUBMITTED TO
MAAM SAIMA ALI
Q) A
Until now electric and electromagnetic fields have been regarded as probably the most abstract
and difficult part of the undergraduate electrical engineering curriculum. This is largely due to
the fact that such fields cannot be visualized directly Electric fields can be computed using
various methods with different precision. However, for insulation of electrical equipment a
more accurate electric field prediction is required. With the advent of computing power and
numerical techniques in recent years, it has become practical to use different techniques to
compute the electric fields. Such numerical techniques enable the designer to solve problems
that are difficult and use of analytical approach with many empirical factors is impossible. The
aim of this paper is to give a review of the application of different numerical techniques in the
electric fields computation that is useful for an undergraduate course, so methods are as
follow:
(a)Finite Difference Method (FDM)
(b) Finite Element Method (FEM)
(c)Charge Simulation Method (CSM)
(d)Surface Charge Simulation Method (SSM) or Boundary Element Method (BEM).
The first two methods are generally classified as domain methods and the last two are
categorized as boundary methods.
The potential Ve within an element is first approximated and then interrelated to the potential
distributions in various elements such that the potential is continuous across inter-element
boundaries. The approximate solution for the whole region then becomes.
where N is the number of elements into which the solution region is divided. The most common
form of approximation for the voltage V within an element is a polynomial approximation
For the triangular element, and for the quadrilateral element the equation becomes
The potential Ve in general is not zero within the element e but it is zero outside the element in
view of the fact that the quadrilateral elements are non-confirming elements (see Fig. 1.3).
Consider a typical triangular element shown in Fig. 1.4. The potentials Ve1,Ve2 and Ve3 at
nodes 1, 2, and 3 are obtained from Eq. (1.15), as
Where
The energy per unit length associated with the element e is given by the following equation:
The matrix given above is normally called as element coefficient matrix: The matrix element Cij(e) of the
coefficient matrix is considered as the coupling between nodes i and j
(c) Assembling of All Elements
Having considered a typical element, the next stage is to assemble all such elements in the
solution region. The energy associated with all the elements will then be
and, n is the number of nodes, N is number of elements and [C] is called the global coefficient
matrix which is the sum of the individual coefficient matrices.
(d) Solving the Resulting Equations
It can be shown that the Laplace’s (and Poisson’s) equation is satisfied when the total energy in
the solution region is minimum. Thus, we require that the partial derivatives of W with respect
to each nodal value of the potential is zero, i.e.
In general, δW/δVk=0 leads to
where, n is the number of nodes in the mesh. By writing the above Eq. (1.28) for all the nodes, k
= 1, 2, … n, we obtain a set of simultaneous equations from which the solution for V1, V2 … Vn
can be found. This can be done either by using the Iteration Method or the Band Matrix Method.
Now, for solving the nodal unknowns, one cannot resort directly to the governing partial
differential equations, as a piece-wise approximation has been made to the unknown potential.
Therefore, alternative approaches have to be sought. One such classical approach is the calculus
of variation. This approach is based on the fact that potential will distribute in the domain such
that the associated energy will reach extreme values. Based on this approach, Euler has showed
that the potential function that satisfies the above criteria will be the solution of corresponding
governing equation. In FEM, with the approximated potential function, extremization of the
energy function is sought with respect to each of the unknown nodal potential. This process leads
to a set of linear algebraic equations. In this matrix form, these equations form normally a
symmetric sparse matrix, which is then solved for the nodal potentials.
Within the individual elements the unknown potential function is approximated by the shape
functions of lower order depending on the type of element. An approximate solution of the exact
potential is then given in the form of an expression whose terms are the products of the shape
function and the unknown nodal potentials. It can be shown that the solution of the differential
equation describing the problem corresponds to minimization of the field energy. This leads to a
system of algebraic equations the solution for which under the corresponding boundary
conditions gives the required nodal potentials. Thus, this procedure results in a potential
distribution in the form of discrete potential value at the nodal points of the FEM mesh. The
related field strengths at the centers of all elements are then obtained from the potential gradient.
The values of the field thus obtained are dependent on the distance between the centers of the
elements and the electrode surface, and thus on the sizes of the elements.
Thus, once the types of charges and their locations are defined, it is possible to relate φij and Qj
quantitatively at any boundary point. In Charge Simulation Method, the simulation charges are
placed outside the space where the field solution is desired (or inside any equipotential surface
such as metal electrodes). If the boundary point Ci is located on the surface of a conductor, then
φi at this contour point will be equal to the conductor potential φ. When this procedure is applied
to m contour points, it leads to the following system of m linear equations for n unknown
charges.
where, φ1 denotes the fundamental solution of the potential problem, α = 1 or 2 for two or three-
dimensional problems respectively, and ρs(x) denotes the surface charge density. Equation (1.37)
is the basic equation for the source Formulation of the BEM. This equation can be solved using
the standard point collocation procedure for discretized image charges that lie within the
conducted boundaries. The collocation approach has been recognized as charge simulation. The
electric field is then given by
The resulting system of equations obtained using the source formulation will again be
asymmetric. By solving this system of equations, the unknown values of the charge density can
be found. Once the charge distribution is known, potential and electric field values can be
calculated throughout the domain using Eqs. (1.37) and (1.38) given above.
Q) B
Field Effects
For particles that are small compared to the wavelength, the electric field inside the particle Ein
is different from the field E in the surrounding medium. In an irregularly shaped particle, the
field can be highly nonuniform and is concentrated in the regions of large curvature. In the
general case there is no simple analytical form to describe the distribution of the field inside the
particle. For some simple geometrical shapes, however, such as spheres or ellipsoids, the field
inside the particle is uniform and proportional to the field outside. The ratio of these fields is
described by the local field factor f, which is defined as
f = Ein/E.
Under the assumption that the nanoparticles are spherical and that they occupy only a small
volume fraction, f is approximately given by where nnp is the refractive index of the
nanoparticles and mis the refractive index of the glass matrix. nnp is usually complex and
frequency dependent. The absorption and frequency dependence of the glass matrix can normally
be neglected.
The presence of the local field effect requires the correction of the nonlinear response of the
material. Under the assumption that the third-order susceptibility of the nanoparticles is much
higher than that of the matrix, the expression for the degenerated third-order Kerr susceptibility χ
(3) of the composite material can be written as where p is the volume fraction of the
nanoparticles.
In the case of metal nanoparticles, the local field factor can lead to a resonant enhancement of the
nonlinear response in the vicinity of the surface plasmon resonance [203]. For semiconductor
glasses this factor is usually omitted. The main reason for this is that the frequency dependence
of the refractive index nnp is normally weak. Thus, the local field factor is a constant that is
added to the volume fraction p. For a standard semiconductor-doped glass with nm ≈ 1.55 and
nnp ≈ 2.4, the local field factor is on the order of f ≈ 0.68. This means that in this case the
electrical field inside the nanoparticle is smaller than the field in the matrix, and the net
nonlinearity is therefore about five times smaller.
It was shown that the local field factor can theoretically lead to intrinsic bistability for
semiconductor nanoparticles near resonance . The nonlinear response of such a particle can be
approximately described by a saturated two-level system. Thus, because of the saturation, the
refractive index inside the particle depends on the light intensity (i.e., the electrical field), and
hence any change in the intensity of the light that is incident on the particle will modify the local
field factor; this in turn will change the intensity in the particle, which will change the refractive
index, and so on. This establishes an intrinsic feedback mechanism that can lead to intrinsic
bistability. A reexamination of this problem, however, which took into account nonlocal effects,
has shown that the conditions required to observe this intrinsic bistability are generally out of
reach.
Some geometrical configurations and the field factors
Q) C
1. Electrostatic generator
Description
Electrostatic machines are typically used in science classrooms to safely demonstrate electrical
forces and high voltage phenomena. The elevated potential differences achieved have been also
used for a variety of practical applications, such as operating X-ray tubes, particle
accelerators, spectroscopy, medical applications, sterilization of food, and nuclear physics
experiments. Electrostatic generators such as the Van de Graaff generator, and variations as
the Pelletron, also find use in physics research.
Electrostatic generators can be divided into two categories depending on how the charge is
generated:
Friction machines use the triboelectric effect (electricity generated by contact or friction)
Influence machines use electrostatic induction