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ASE MEMS Packaging - SEMI 2013 C Zinck Final New2
ASE MEMS Packaging - SEMI 2013 C Zinck Final New2
Presented by
EVOLUTION Christophe Zinck
ASE Group
September 26th, 2013
Outline
1. Brief presentation of ASE Group
2. Overview of MEMS packaging
3. ASE MEMS packaging background and examples
4. Evolution to wafer level packaging (WLP)
5. ASE MEMS WLP toolbox
6. Conclusion
Module
higher Supply chain management complexity (for customer) lower
Courtesy of Yole
Military, Aeronautic
Specific 1st
Complex and level capping Medical
custom architecture depending on Industrial
– complex stacking, functionality High-end customer
multiple dice
Home automation
Dedicated / Automotive
customized
Market BOM
Price, size, low Functional
segments: consumption requirement,
cost and pressure high quality /
performance BOM reliability
standardization –
new solution for
stress New low cost
decoupling Gaming
solution for
cavity/holed package Consumer
(film assist, new lid)
Open
substrate Leadframe COL(Chip On
Lead)
platforms
Low cost - Large volume enabling, dual sourcing
High need for Standardization and extend to Wafer level package
– 3D integration Laminate Gel Coat
medium performance devices
© ASE All rights reserved 2013
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Packaging Technology:
Key to Success in MEMS
MEMS proliferation : delicate balance between performance & cost
New products through novel MEMS design, fab technology and innovative packaging
Package –device interaction : Packaging is more important for MEMS than non-MEMS
Impact on performance
Impact on product cost
Since 1993: Pre molded open cavity packages (cavity SO, cavity
LGA, custom LF) for Pressure sensor, Humidity/Temp Sensor, Gyro
sensor…
Since 1996: Overmolded packages (QFN, LGA, BGA, SOIC, SiP) for
Motion sensor (Accelerometer, Gyro, Magnetometer), FBAR,
Optical Sensor, Humidity/Temp sensor, Oscillator 5 dies in LGA 3x3
Wafer Saw
Wafer Saw
Wafer
Wafer
Premold Back-grinding
Die Attach
1st Die Attach Wire Bond
Actual Device
Cross section
COL
New needs:
• Wafer level capping
• W2W or C2W assembly
• Vertical interconnection
(TSV, TGV)
• Wafer level redistribution
and balling
ASE 3D WLP
Wafer to wafer bonding (device capping): MEMS toolbox
Top wafer: Si, Glass, active die wafer (dev)
Bottom wafer: Si
Bonding technology: polymer, glass frit
On going (dev): metal bonding (solder, eutectic),
Molded wafer after die to wafer
thin film capping, wafer scale LCP lid attachment
Carrier
ASE 3D WLP
Cap MEMS toolbox
Cap
MEMS
Via last processing
Cap
Via middle processing
MEMS
0.29mm 200um
About 40um
300um
Capping
Double
Open QFN/LGA (open pre-molded flip chip QFN
plastic cavity)
LCP lids QFN/LGA
aEASI 3D
embedded
MEMS & sensor
3D WLCSP (C2W)
Substrate Carrier
Metal Lid
Embedded Die
©SW
ASE All rights reserved 2013
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