ASME BPVC.
V-2019 ARTICLE 4
NONMANDATORY APPENDIX P
PHASED ARRAY (PAUT) INTERPRETATION
P-410 SCOPE
This Nonmandatory Appendix is to be used as an aid for
the interpretation of Phased Array Ultrasonic Testing
(PAUT) images.19 The flaw signal interpretation metho-
dology using PAUT is very similar to that of conventional
ultrasonics; however, PAUT has improved imaging cap-
abilities that aid in flaw signal interpretation. This inter-
pretation guide is primarily aimed at using shear wave
angle beams on butt welds. Other possibilities include
(a) longitudinal waves
(b) zero degree scanning
(c) complex inspections, e.g., nozzles, fillet welds
P-420 GENERAL
P-421 PAUT IMAGES — DATA VISUALIZATION
PAUT data is routinely displayed using a rainbow color
palette, with the range of colors representing a range of
signal amplitude. Generally, “white” represents 0% signal
amplitude, “blue” (or lighter colors) represents low ampli-
tudes, and “red” (or darker colors) represents above re-
ject signal amplitude (see Figure P-421-1).
(a) PAUT has the ability to image the data in the same
format as conventional ultrasonics – A-scans, and time or
distance encoded B-scan, D-scan, and C-scans. (See Figure
P-421-2.)
NOTE: The examples shown here are not necessarily typical of all de-
fects due to differences in shape, size, defect orientation, roughness,
etc.
(b) The PAUT primary image displays are an E-scan or
S-scan, exclusive to the PAUT technique. Both the E-scan
and S-scan display the data in a 2D view, with distance
from the front of the wedge on the X-axis, and depth on
the Y-axis. This view is also considered an “end view.”
E-scans and S-scans are composed of all of the A-scans
(or focal laws) in a particular setup. The A-scan for each
beam (or focal law) is available for use in flaw signal
interpretation.
(c) An E-scan (also termed an electronic raster scan) is
a single focal law multiplexed, across a group of active ele-
ments, for a constant angle beam stepped along the
phased array probe length in defined increments. Figure
P-421-3 shows an example of an E-scan.
(d) An S-scan (also termed a Sector, Sectorial, Swept
Angle, or Azimuthal scan) may refer to either the beam
movement or the data display (see Figure P-421-4).
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P-450 PROCEDURE
P-451 MEASUREMENT TOOLS
PAUT instruments typically have flaw sizing aids con-
tained within the software. These sizing aids are based
on using multiple sets of horizontal and vertical cursors
overlaid on the various image displays. PAUT instruments
rely on the accuracy of the user input information (such
as component thickness) and calibration to accurately
display flaw measurements and locations.
P-452 FLAW SIZING TECHNIQUES
Flaw sizing can be performed using a variety of indus-
try accepted techniques, such as amplitude drop (e.g.,
-6 dB Drop) techniques and/or tip diffraction techniques.
Different flaw types may require different sizing
techniques.
P-452.1 Flaw Length. Flaw lengths parallel to the
surface can be measured from the distance encoded D-
or C-scan images using amplitude drop techniques by
placing the vertical cursors on the extents of the flaw dis-
played on the D- or C-scan display. Figure P-452.1 shows
an example of cursors used for length sizing.
P-452.2 Flaw Height. Flaw height normal to the sur-
face can be measured from the B-, E-, or S-scan images
using amplitude drop or tip diffraction techniques.
(a) Using amplitude drop techniques, the horizontal
cursors are placed on the displayed flaws upper and low-
er extents. Figure P-452.2-1 shows an example of cursors
used for height sizing with the amplitude drop technique.
(b) Using tip diffraction techniques the horizontal cur-
sors are placed on the upper and lower tip signals of
the displayed flaw. Figure P-452.2-2 shows an example
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of cursors used for height sizing with the tip diffraction
technique.
P-480 EVALUATION
This section shows a variety of PAUT images and the in-
terpretation/explanation. There are significant variations
amongst flaws and PAUT setups and displays, so the fol-
lowing images should be used as a guide only. Evaluator
experience and analysis skills are very important as well.
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 ARTICLE 4
P-481 I.D. (INSIDE DIAMETER) CONNECTED
CRACK
These typically show multiple facets and edges visible
in the A-scan and S-scan. There is a distinct start and stop
on the A-scan, and a significant echodynamic travel to the
signal as the probe is moved in and out from the weld (if
the crack has significant vertical extent). The reflector is
usually detectable and can be plotted from both sides of
the weld. The reflector should plot to the correct I.D.
depth reference or depth reading, as shown in Figure
P-481.
P-481.1 Lack of Sidewall Fusion. LOF (Lack of Fu-
sion) plots correctly on the weld fusion line, either
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through geometrical plotting or via weld overlays. There
may be a significantly different response from each side of
the weld. LOF is usually detected by several of the angles
in an S-scan from the same position. The A-scan shows a
fast rise and fall time with short pulse duration indicative
of a planar flaw. There are no multiple facets or tips.
Skewing the probe slightly does not produce multiple
peaks or jagged facets as in a crack. There may be mode-
converted multiple signals that rise and fall together and
maintain equal separation. Figure P-481.1 shows an
example.
P-481.2 Porosity. Porosity shows multiple signal re-
sponses, varying in amplitude and position. The signals
plot correctly to the weld volume. The signals’ start and
stop positions blend with the background at low ampli-
tude. The A-scan slow rise and fall time with long pulse
duration is indicative of a nonplanar flaw. Porosity may
or may not be detected from both sides of the weld, but
should be similar from both sides. Figure P-481.2 shows
an example of porosity.
P-481.3 O.D. (Outside Diameter) Toe Crack. Toe
cracks typically show multiple facets and edges visible
in the A-scan and S-scan. There is significant echodynamic
Black and White (B&W) Version of Color Palette
0%
Blue (light)
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ASME BPVC.V-2019
travel to the signal as the probe is moved in and out from
the weld. The reflector is usually detectable and can be
plotted from at the correct O.D. depth reference line or
depth reading. Normally, toe cracks are best character-
ized on S-scans and lower angle E-scan channels. Figure
P-481.3 shows an example.
P-481.4 (Incomplete Penetration). Incomplete Pene-
tration (IP) typically shows high amplitude signals with
significant echodynamic travel or travel over the I.D. skip
line. IP will typically respond and plot from both sides of
the weld in common weld geometries near centerline re-
ference indicators. Generally, IP is detected on all chan-
nels, with highest amplitude on a high angle E-scan. The
A-scan shows a fast rise and fall time with short pulse
duration indicative of a planar flaw. Figure P-481.4 shows
an IP signal.
Note that IP must be addressed relative to the weld
bevel. For example, a double V weld will have IP in the
midwall, whereas a single V bevel will be
surface-breaking. However, the rise-fall time of the signal
is similar to that for toe cracks and other root defects.
This requires extra care on the part of the operator. Note
that incomplete penetration can look similar to surface
lack of sidewall fusion.
P-481.5 Slag. Slag typically shows multiple facets
and edges visible in the A-scan and S-scan. The A-scan
shows a slow rise and fall time with long pulse duration,
indicative of a nonplanar flaw. Typically slag shows lower
amplitude than planar flaws, and may be difficult to dis-
tinguish from porosity, or from some smaller planar de-
fects. Slag is typically detectable from both sides, can be
plotted from both sides of the weld and is often best char-
acterized using an S-scan. A slag reflector will typically
plot to the correct depth area and reference lines that co-
incide to the weld volume. Figure P-481.5 shows an
example.
Figure P-421-1
Signal Amplitude Response 100%
Red (dark)
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 ASME BPVC.V-2019 ARTICLE 4

Figure P-421-2
Scan Pattern Format
Top (C) view

Index axis

Ultrasound

Ultrasound
is
ax
an
Sc

D-scan (side view)

Ultrasound

Depth

B-scan (end view)

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 ARTICLE 4 ASME BPVC.V-2019

Figure P-421-3
Example of an E-Scan Image Display

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 ASME BPVC.V-2019 ARTICLE 4

Figure P-421-4
Example of an S-Scan Image Display

Figure P-452.1
Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display

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 ARTICLE 4 ASME BPVC.V-2019

Figure P-452.2-1
Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the
B-Scan Display

Figure P-452.2-2
Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display
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GENERAL NOTE: The two arrows in the A-scan at left show the relevant signals for measurement.

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 ASME BPVC.V-2019 ARTICLE 4

Figure P-481
S-Scan of I.D. Connected Crack

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Figure P-481.1
E-Scan of LOF in Midwall

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 ARTICLE 4 ASME BPVC.V-2019

Figure P-481.2
S-Scan of Porosity, Showing Multiple Reflectors

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Figure P-481.3
O.D. Toe Crack Detected Using S-Scan

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 ASME BPVC.V-2019 ARTICLE 4

Figure P-481.4
IP Signal on S-Scan, Positioned on Root

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Figure P-481.5
Slag Displayed as a Midwall Defect on S-Scan

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 ARTICLE 4 ASME BPVC.V-2019

NONMANDATORY APPENDIX Q
EXAMPLE OF A SPLIT DAC CURVE

Q-410 SCOPE Q-422 SECOND DAC

This Appendix provides an example of a split DAC curve Starting with a SDH position prior to the reflector re-
when a single DAC curve, for the required distance range, sponse that falls below 20% of FSH, set the gain so that
would have a portion of the DAC fall below 20% of full this response is 80% ± 5% of FSH. Record the reference
screen height (FSH). See Figure Q-410. level gain setting for this second portion of the DAC curve.
Mark the peaks of the remaining SDH indications on the
screen and connect the points to form the second DAC
Q-420 GENERAL curve. See Figure Q-422.
Q-421 FIRST DAC
Create a DAC curve as normal until a side-drilled hole
Q-423 NOTCH REFLECTORS
(SDH) indication peak signal falls below 20% of FSH.
See Figure Q-421. This technique can also be used for notch reflectors.

Figure Q-410
Distance–Amplitude Correction

10

80%

5
Falls below
20% FSH

0 5 10

Reflectors moved
into beam

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 ASME BPVC.V-2019 ARTICLE 4

Figure Q-421
First DAC Curve

10

42 dB 80%

20%

0
5 10

Reflectors moved
into beam

Figure Q-422
Second DAC Curve

42 dB 52 dB

10

80%

0 5 10

Reflectors moved
into beam

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