Professional Documents
Culture Documents
Part 1 Course Introduction
Part 1 Course Introduction
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Other Excellent References
• Ashby, Shercliff, and Cebon, Materials Engineering, Science, Processing , and Design, Elsevier, Amsterdam,
2007.
• Wolf and Tauber, Silicon Processing for the VLSI Era, Vol1: Process Technology, 2nd ed., Lattice Press, 1999.
• Cambell, The Science and Engineering of Microelectronic Fabrication, 2nd ed., Oxford, NY, 2004.
• Moreau, Semiconductor Lithography: Principles, Practices, and Materials, Plenum Press, NY 1998.
• Mack, Fundamentals Principles of Optical Lithography: Science of Microfabrication, Wiley Interscience, NY,
2008.
• Lieberman, and Lichtenberg, Principles of Plasma Discharges and Materials Processing, Wiley Interscience,
NY, 1994.
• Brodie, Physics of Micro/Nano‐Fabrication, Plenum Press, NY, 1993.
• Ohring, Material Science of Thin Films: Deposition and Structure, 2nd ed., Academic Press, San Diego, 2002.
• Kovacs, Micromachined Transducers Sourcebook, McGraw Hill, Boston, 1998.
• Maluf and Williams, An Introduction to Micrloelectromechanical Systems Engineering, 2nd ed., Artech,
Norwood, MA , 2004.
• Staff edited, CNF Nanocourses, Cornell Nanoscale Science and Technology Facility, 1998‐2008
• Goddard, et al., Handbook of Nanoscience Engineering and Technology, CRC Press, 2002.
• Bhushan, Handbook of Nano‐technology, 2nd ed., Springer Verlag, 2006.
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Common Journals
• Proceedings of the SPIE (largest series of conference proceedings in optics,
photonics
• IEEE Transactions (several journals representing different topics), IEEE
Press
• Sensors and Actuators (A & B), Elsevier Publishing
• Journal of Microelectromechanical Systems, IEEE Press
• Journal of Micromechanics, and Microengineering, IOP Press
• Journal of Micro/Nanolithography, MEMS, and MOEMS, SPIE Press
• Science Magazine, AAA Press
• Nature, Nature
• Journal of the American Vacuum Society (A & B), AVS Press
• Journal of the Electrochemical Society, AIP Press
• Journal of Applied Physics, AIP Press
• Nanoletters, ACS Publishing
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Course Outline
• Introduction and survey of the initial device development from a fabricators
standpoint
• Survey of Materials Science and choice of substrate
• Vacuum Science
• Lithography
• Dry Etching
• Thin film science and deposition
• Wet etching
• Surface Micromachining
• LIGA technologies
• Comparison of top down technologies
• Metrology
• Packaging
• Scaling laws
• Applications
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Early History of the Integrated Circuit
• 1947: Three scientists at Bell Telephone Laboratories, William Shockley,
Walter Brattain, and John Bardeen demonstrate the first transistor:
• 1955: Frosch and Derick at Bell Labs patent the diffusion furnace and
develop SiO2 passivation layers for silicon transistors
• 1955: Andrus and Bond at Bell Labs pattern oxide layers with
photolithography
• 1957: Lantrop and Nall (US Army) Pattern 200um leads to connect
discrete transistors
• 1958: Last and Noyce develop the first step and repeat cameras for
lithographic processing at Fairchild
• 1957/1958: Jean Hoerni at Fairchild conceptualizes the first planer
fabrication process for pn junctions using oxide barriers to protect pn
junctions underneath. Allowed all of the circuitry required for transistor
fabrication to be patterned on 1 side of the wafer.
• 1959: Fairchild’s Robert Noyce patents the monolithic IC that ties
transistors, capacitors, resistors together using micro lithographically Dec. 1947: First Transistor
patterned aluminum leads deposited on top of Heorni’s protective
coating.
• 1960:Fairchild sells planer npn transistor device utilizing SiO2 barrier
oxide for passivation that was patterned using a lithographic fabrication
process
• 1960: Fairchild demonstrates the first IC with 4 transistors and 5
resistors
• 1961 GCA Corporation commercializes the step and repeat reduction
device for optical lithography
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1957: Lantrop Semiconductor Fabrication Patent 1960: Fairchild’s first IC
Early History of the Integrated Circuit
• 1960: First MOS transistor
• 1960: Ian Ross of Bell Labs uses CVD to
between the substrate and the collector
to raise breakdown voltage and
significantly increase the speed of the
circuit
• 1961: Hoerni demonstrates Silicon
transistor that exceeds Ge switching
speeds: Computers take off!!
• 1963: San and Wanlass of Fairchild
showed that p‐ and n‐ channel MOS
transistors arranged into a
complementary circuit (CMOS) drew
close to zero power in standby mode
• 1964: Standard logic IC families
introduced
• 1964: General Microelectronics releases
the first commercial MOS IC
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Moore’s Law
• 1965: Fairchild’s Director Gordon Moore introduces Moore’s law which
accurately predicts the exponential increase of transistor density in an IC
and provides a guide for technological progression that is still in use today
• NSF is now preparing for the demise of Moore’s law
– reached the limits of optical lithography
– Single bit logic is fading to quantum computing and the q‐bit
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Early History of the Integrated Circuit
• 1964: Multi‐chip SLT packaging
technology introduced by IBM
• 1965: Fairchild Engineers develop
Dual In‐Line (DIP) chip packaging
• 1966: Semiconductor bipolar RAM
• 1966/1967: Computer aided design
leads to Application Specific IC (ASIC)
• 1967: Turnkey equipment supplies
such as Applied Materials introduce IBM SLT Packaging
commercial tooling
• 1969: Intel enters the scene with
commercial tooling, silicon gate
technology, and embedded metallic
leads
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MEMS Timeline
• 1983: Integrated pressure sensor LIGA MEMS:
developed by Honeywell
Nickel plated
• 1984: Draper Labs begins silicon MEMS accelerometer
development
using comb drive
• 1982: LIGA developed by Ehrfeld et al at Sensing.
Karlsruche
Guckel 1990
• 1986: Shimbo demonstrates silicon wafer
bonding
• 1987: First inertial MEMS gyro measured
by Draper
• 1987‐1988: Integrated fabrication of
mechanical mechanisms appears using
microfabrication processes in silicon
• 1989: The term MEMS coined at the
IEEE Micro‐Tele‐Operated Robotics
Workshop
• 1991: Guckel publishes paper on the
possible applications of poly‐Si MEMS
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Polysilicon MEMS circa 199614
MEMS Timeline
• 1992: SCREAM process developed by
MacDonald’s group at Cornell
• 1992: Multi‐User MEMS Process
MUMPS ‐ First Foundry Service
• 1994: Analog Devices manufactures
the first commercial surface
micromachined accelerometer
• 1996: Sandia institutes a 3 layer
surface micromachining process
• 1997: Sandia’s SUMMiT V Foundry Comb Drives using Sandia’s SUMMiT V
Process
• 1997 Bosch DRIE Etching
EPCOS RF Variable
Capacitor, 2008
Kitching’s Chip Scale
Atomic Clock, NIST 2003 JDW, Electrical and Computer Engineering,
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Hornback’s DLP Mirrors invented at TI in 1997
Markets and Applications
• IC’s
– Computers
– Electronics
• MEMS
– Microfluidics
– Optics
– RF MEMS
– Accelerometers
• Nanosystems
– Materials
– Fabrics
– Biology
– Genetics
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The Beginnings of Nanotechnology
• 1857: Faraday makes colloidal gold
nanoparticles
• 1959: Richard Feynman’s Talk: There’s Colloidal Au
Plenty of Room at the Bottom nanoparticles
• 1974: Norio Taniguchi of Japan coins
the word nanotechnology
• 1975: NSF solicits university proposals
for submicron structures which was
used to develop university based clean
room and technology centers (Cornell
Nanofabrication Facility)
• 1981: Billing and Rohrer of IBM invent
the Scanning Tunneling Microscope
• 1983‐1990: number of nano articles
doubled every 7.7 years
• 1985: Curl, Kroto, Smalley discover
Fullerenes