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VLSI Testing and

Testability

Testability Measures –
Combinational Circuits
Dr. S. Sivanantham
School of Electronics Engineering
VIT University
Vellore 632014
INIDA
VLSI Testing and Testability
Layered controllability example
CC0, CC1

1,1 2,2 d
a
3,5
z
1,1
b 3,2
c e
1,1

CC0(a) = CC1(a) = CC0(b) = CC1(b) = CC0(c) = CC1(c) = 1


CC0(d) = CC1(d) = 1+1 = 2

CC0(e) = 1 + 1 + 1 = 3 CC1(e) = min{1, 1} + 1 = 2

CC0(z) = min{2, 3} + 1 = 3 CC1(z) = 2 + 2 + 1 = 5

VLSI Testing and Testability


Observability measuring method
Algorithm steps

initialization step: set observability of PO to 0, and of internal nodes


and PIs to infinity

1. start from PO moving backwards towards PIs

1. propagate through to primary inputs, and add 1 for each logic layer; for
each gate, calculate the observability of all inputs

1. assess the difficulty of placing other PIs into values that allow the
observed PI value to propagate to PO

VLSI Testing and Testability


Detailed observability example
Observability of a Boolean gate input

CO(a)
CC1(a)
CO(z) = 0 CC0(a)
a CO(z)
CO(a) = CO(z) + CC1(b) + 1 z
b
CO(b) = CO(z) + CC1(a) + 1 CO(b)
CC1(b)
CC0(b)

same concept, using words:


the effort I must produce in order observe the input of a logic gate is
equal to the effort needed to observe the output plus one, augmented
with the effort needed to place all other inputs in a non-controlling state,
allowing the observed node state propagating through

VLSI Testing and Testability


Combinational observability rules (1)

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Combinational observability rules (2)

VLSI Testing and Testability


Reconvergence issue
SCOAP may perform poorly in presence of reconvergent signals

1. low testability value may remain undetected

1,1 2,2 s-a-0


a
z

3,4

2. SCOAP does not detect signal independency

1,1 2,2 1,1 3,3


a z a z

VLSI Testing and Testability


How reconvergent topologies are handled
(1)
SCOAP forward processing of controllabilities
format: CC0, CC1
1,1 3,2
a

1,1 2,6
b z
1,1
1,1
c
3,2

SCOAP backward processing of observabilities


format: CC0, CC1 (CO)

1,1 (6) 3,2 (4)


a

1,1 (5) 1,1(6) 2,6 (0)


b z
1,1(6) 1,1 (5)
1,1 (6)
c
3,2 (4)

VLSI Testing and Testability


How reconvergent topologies are handled
(2)
Controllability issue
4
format: CC0, CC1
Consequently, and only for the
purpose of this calculation, we
may change both OR output 5
controllabilities to 1 from 2 into 1 Eventually,

1,1 3,2 1
CC1(z) = 1 + 1 + 1 + 1 = 4

a
2,6
1,1 2,4
b z
1,1
1,1
c
3,2 1
2 1

Line be is connected to the In order to control z to 1, all three


inputs of three gates; however 3 inputs of the OR gate must be at
the effort needed to control b to 1, specifically this one
We take the effort of controlling b
logic 1 should be taken into
to logic 1 into account here
account once only

VLSI Testing and Testability


How reconvergent topologies are handled
(3)
Observability issue
format: CC0, CC1 (CO[0], CO[1])

1,1 (inf,6) 3,2 (inf,4)


a

1,1 (5) 1,1(inf,6) 2,6 (0)


b z
1,1(inf,6) 1,1 (5)

c
1,1 (inf,6) 3,2 (inf,4) In order to control a logic 0 on
this node, all other AND inputs
must be set to logic 1, which
prevents setting this node to
logic 0; thus CO[0] = infinity

Here the correct controllability values have not been considered during backwards observability processing

VLSI Testing and Testability

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