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College of Criminal Justice Education: Compiled By: Jonalyn Otongngan
College of Criminal Justice Education: Compiled By: Jonalyn Otongngan
College of Criminal Justice Education: Compiled By: Jonalyn Otongngan
ELECTRON MICROSCOPE
In 1931, German scientist Ernst Ruska developed the first electron microscope.
The Electron Microscope (EM) is an impressively powerful microscope that exists today,
allowing researchers to view a specimen at nanometer size.
They utilize the same principles behind an optical microscope, but rather than photons or
particles of light, concentrate electrons, charged particles located on the outside of atoms,
onto an object.
Additional differences include preparation of specimens before being placed in the
vacuum chamber, the use of coiled electromagnets instead of glass lenses, the use of a
thermionic gun as an electron source and the image or electron micrograph is viewed on
a screen rather than an eyepiece.
Compiled by: Jonalyn Otongngan
Techniques, which vary based on type of specimen and analysis, include:
- The major attractions of the SEM image are its high magnification, high
resolution, and great depth of focus.
- In its usual mode the SEM has a magnification range of 10X to 100,000X.
- Its depth of focus is some 300X better than optical systems at similar
magnifications, and the resultant picture is almost stereoscopic in appearance.
- Its great depth of field and magnification are invaluable in determining structural
relationships over a contextually broad area.
- Microscope examination of fibers, like the cotton fiber using SEM, cannot
provide quantitative characteristics of fibers, but is non-destructive and can be
used for a qualitative comparison.
Although SEMs are approximately 10 times less powerful than TEMs, they produce
high-resolution, sharp, black and white 3D images.