“Mod el:BD- 6 An ae _ 7 Station | hEVERBEING § Model:BD-6 Analytical Probe Station Features “+ Huged Knob Chuck Stage + RF Probing Field Upgradable ++ 20K~4000X Magnification * Backlash-Free Movement Accessories + Wafer Chuck Pullout Stage * Microscope) Tilting Mechanism © RF ProbelGables « Activa Probes * Platen Linear Quick Up/Down Easy Load/Unload Wafer ‘ Platen Linear Fine Up/Down Picbe Card Tip Overdrive Adjustment * Choice Of Microscope (Tit) Up/Down For E-Z Revolving Objectives Specifications * Vacuum Chuck 6” Stainless Steel + High Voltage Probe * Laser Cutter [= Ultrasonic Cutter. || CCH. T Photomicrographs |_| Et + Probe Gard nddér * Packaged Device Holder * PCB Holder = Chuck Stage x6" Travel tion Free Table + Chuck Theta 0:20 degied * Shielding Box EE © Platen Up/Down | 6 im Adjustable Coarse Adjustment —_Lever-Driven * Platen Up/Down Fine Adustment __|Hand Wheel-Driven * Platen 12 Micropositioner * Microscope Stage | 1x1" [Travel Requirements * Electrical TID VAC, 602 220 VAC, 6OHZ t Vacuum 250 mmHg, 7 liter/min Dimensions ‘S90mmW x500mmD x 700mm With Microscope Weight 50 Kg With Microscope BD SEEN 5f,NO.341, SEC.1, KUANGFU RD., HSINCHU, TAIWAN Tel:886-3-5778994/5782994 Fax:886-3-5778995. Mobile:885-9111-3-9111, 886-9169-333-77 Emaieb_prober@yahoo.com.tw 25mm Adjustable) = Test Berich instrument Case With Caster Dark Field/Notmarski Inspection * Chuck Vacuum Patters *(Gold Plated Chuck’ May, 2002ayscts)S (Cn Model:EB-6 Analytical Probe Station Features Accessories © Coaxial Driven Chuck Stage * RF Probe / Cables Probing Field Up ORL » Active Probes + 20K-4000X Magnification © Choice Of Microscope (Tilt) Up/Down for E- Revolving Objectives Specifications * Photomicrbatephicg [||| | * Vacuum Chuck 6” Stainless Steel Prove Card holder | | © Chuck Stage 6°16" Tave > Chuck theta 0 30° Liquid Cyst Kit © Chuck Up/Down, ‘mm Adjustable fe bration Free Table *Platen 12 Micropostigne | | * Shielding Boy ® Mictoscope Stage 1x1” Travel * Test Bench isirurmentt Case With Caste! te Requirements * Migoscope Quick it Thee * Electrical TIO VAC, GOH2 Daik Field/Nermarski Inspection 220 VAC, ooKe | Ghickjvatuum Paterd ‘Saunas eal bane Goi Ped | Dimensions ‘Gemmiv x CoOmMD » TOOMmT WA Micostene | (Hf£8-6 580mmWx460mmDx700mmit) weight 6OKG || With Microscope 2B EVERBEING INT'L CORP. 5F)NO.341, SEC, KUANGFU RD,, HSINCHU , TAIWAN Tel:886-35778994/5782994 Fox:886 35778995 Mobile:886-911 1-3-9111, 886-9169-333-77 E-maikeb_proter@yahoo.com.tw May. 2002EVERBEING INT'L CORP. Ce ett eeeModel:PE- MINI Probe Station Features | © Compact Size — e Light Weight © Price Affordable Ere Electro-Optics Application — aes e Light Intensity/Wave Length ___ Measurement for LED/LD/PD © RF Probing East/West _ - © University Lab. Suitable _ @ Ideal for small wafer less than 4” e Side-Driven Chuck Stage e Backlash Free Movement Mobile: 886-9111-3-9111 www.probershopping.co.kr Shcctheation: Ee © Vacuum Chuck ___ 4" Stainless Steel) © Chuck stage = 3x3" Travel © Chuex theta | | | Q=30 degree (4 © Platen - = = = ~—_‘«6 Micropositioners — Requirements _ © Electrical 110 VAC, 60Hz “ye Vacuum -250 mmHg, 7 liter/min Dihehsions © 320mmWx320mmDx400mmH With Meee © Weight 20 Kg With Mieropeane - EE NO.341, SEC.1, KUANGEU RD., HSINCHU, TAIWAN, R. Oc. Tel: 886-3-6662000 Fax: 886-3- 6662200 Www.probestation.tw www. probearatione cn E-mail: probestation@yahoo.com Skype:probestation Accessories © Chuck Stage Push to Position | © Chuck Stage Vacuum-Based Movement © Microscope Tilting Mechanism _ And Quick Right Angle Switchover © light IntensityWavellengthh’ | 11, Measurement Adapter -© RF Probe/Cables 1 Ft foo os © Active Probes PTT © Low Current/Capacitance Probes e High Voltage Probe © Ultrasonic Cutter e CCTV © Photomicrographics e Packaged Device Holder ) '® Thermal Systems. © Liquid Crystal Kit @ PCB Holder — © Vibration Free TableTop e Shielding Box _ i “te Test Bench. Te instrument Case With Eadtel e Chuck Vacuum Pattern Jun. 200|) Be Model:SR- Aa RESISTIVITY, 7 Four ull rete idEVERBEING Model:SR-4 RESISTIVITY Four Point Probe Stand Features * True Vertical Up/Down * Individually Constant Spring Loaded Pin * Constant Pin Spacing * Ultimate Repeatability * Probe Head E-Z Changeover * Probing Z Position Adjustable On Top * Sturdy Feedthru Panel AtRearSide * Feedthru Choice Banana/BNC/Triaxial Female Requirements . Current Source ay 4 Voltage Meter Specifications * Chuck4”|,67,87 dia. Teflon) | s Head Up/Dawn T 11 mm | 7 “Probing £ Reston Miran | | | * Probe Pin Material. Tungsten Carbide * Chuck Quick Move Available * Hot Chuck Available * Shielding Box Available * Probe Pin Spacing | 40 mil,50 mil'62:5 mil 7 Probe Pin Spring | 45 grams,85 grams, 1 80 80 grams * Probe Pin Radius 40,6 Micron e416) Bidis. Chokef i) tt i * Others-Made Probe Head Available * Choice Of Pneumatic Up/Down By Switch Applications * Sheet Resistivity * Slice Resistivity * Doping Quolity * Metalization Thickness © BIN Typing) | eae fF} * * Vil Measurement eee / - J = = | j Se 3 DB EVERBEING INT'L CORP. 5F.NO.341, SEC.1, KUANGFU RD., HSINCHU, TAIWAN Tel:886-3-5778994/5782994 Fax:886-3-5778995 Mobile:886-9111-3-9111, 886-9169-333-77 E-mail:eb_probera@yahoo.com.tw Dimensions © 220mmWx420mmDx250mmH ep ieignt 20Kg Accessories ® Hot Chucks *VacuumChucks ||} |) ) 4 Chuck Quick Move Available # Shielding Box * Test Bench ® Instrument Case With Caster May. 2002