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  • Section D - Session 9

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    Mukul Dahiya
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    This document contains data from 4 cases analyzing the process capability of producing units to target specifications of 100g +/- 2g. It reports the mean, standard deviation, Cp, Cpk, defects beyond the upper and lower specification limits, and defects per million for 3 production lines. It then discusses how a six sigma capable process (Cp=Cpk=2) would perform if the mean shifted 1.5 standard deviations, demonstrating it would still meet the Motorola six sigma standard of less than 3.4 defects per million.

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    Section D- Session 9

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    This document contains data from 4 cases analyzing the process capability of producing units to target specifications of 100g +/- 2g. It reports the mean, standard deviation, Cp, Cpk, defects beyond the upper and lower specification limits, and defects per million for 3 production lines. It then discusses how a six sigma capable process (Cp=Cpk=2) would perform if the mean shifted 1.5 standard deviations, demonstrating it would still meet the Motorola six sigma standard of less than 3.4 defects per million.

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    4 views3 pages

    Section D - Session 9

    Uploaded by

    Mukul Dahiya
    This document contains data from 4 cases analyzing the process capability of producing units to target specifications of 100g +/- 2g. It reports the mean, standard deviation, Cp, Cpk, defects beyond the upper and lower specification limits, and defects per million for 3 production lines. It then discusses how a six sigma capable process (Cp=Cpk=2) would perform if the mean shifted 1.5 standard deviations, demonstrating it would still meet the Motorola six sigma standard of less than 3.4 defects per million.

    Copyright:

    © All Rights Reserved
    Download as XLSX, PDF, TXT or read online from Scribd
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    of 3

    Case 1 Case 2 Case 3 Case 4

    Lambda (/hr) 20 20 20 20
    mu (/hr) 25 25 12.5 12.5
    servers 1 2 2 3
    lambda/mu 0.8 0.8 1.6 1.6
    Lq (avg Q length) [from table] 3.2 0.1523 2.8441 0.3128
    Wq = Lq/lambda (hrs) 0.16 0.007615 0.142205 0.01564
    Wq in mins 9.6 0.4569 8.5323 0.9384
    Ws = Wq + 1/mu 0.2 0.047615 0.222205 0.09564
    Ws in mins 12 0.9569 9.0323 1.2717333
    Capability as producing units as per specifications

    Handles for cookers


    Trgt weight 100 g
    tolerance +-2 g

    USL 102 g
    LSL 98 g
    Off-centered process Centered process Off centered process
    Line 1 Line 2 Line 3
    Mean 100.3 100 99.8
    Std dev 0.6 0.33 0.6

    Process Capability Ratio, Cp = (USL-LSL)/(6*σ)


    Cp 1.11111111111111 2 1.11111111111

    Process Capability Index, Cpk = min((USL-µ)/(3*σ),(µ-LSL)/(3*σ))


    Beyond USL 0.944444444444446 2 1.22222222222
    Beyond LSL 1.27777777777778 2 1
    Cpk 0.944444444444446 2 1

    %age Defect calculations


    beyond USL, z 2.83333333333334 6 3.66666666667
    Beyond LSL, z -3.83333333333333 -6 -3

    %age defects beyond USL 0.23033% 0.00000% 0.01229%


    %age defects beyond LSL 0.00632% 0.00000% 0.13499%
    Total %age defects 0.23665% 0.00000% 0.14728%

    Motorola six sigma allowd for a shift in process mean by 1.5 sigma
    Suppose a six sigma capable process (Cp = Cpk = 2) shifts to the right by 1.5sigma

    beyond USL, z 4.5 3.3976731247E-06


    Beyond LSL, z -7.5 3.1908916729E-14
    Total defects 3.3976731566E-06
    Per million 3.39767315664763 DPMO Motorola six sigma standard
    Six sigma
    +6 sigma 0.0000000009865877

    total defects 1.97317540084896E-09


    1.97317540084896
    2 per billion
    3.4 per million Motorola six sigma

    Cp >1 - Capable process


    Cp > 2 - Six sigma capable process

    Cpk > 1 - capable process


    Cpk > 2 - six sigma capable process

    six sigma standard

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