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HAMADA - A FULLY INTEGRATED 2x1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER
HAMADA - A FULLY INTEGRATED 2x1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER
HAMADA - A FULLY INTEGRATED 2x1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER
signals comes at 7.8125 kHz, which is generally far below the to cancel TX I/Q mismatch are also implemented in the trans-
flicker noise corner of scaled CMOS devices. In a direct-conver- ceiver.
sion mobile WiMAX transceiver in scaled CMOS technology, The block diagram of the direct-conversion receiver is shown
the flicker noise becomes a critical issue. in Fig. 3. The receiver has two RF paths for the low band and the
This paper describes a fully integrated 2 RX 1 TX high band. The RF input signal is first amplified by a cascoded
dual-band direct-conversion mobile WiMAX transceiver in common-source low-noise amplifier (LNA) with LC tank, and
a 65 nm CMOS technology [12]. Section II presents the then down-converted to the baseband I/Q signals by I/Q mixers.
transceiver architecture. The frequency plan based on an in- The LNA is directly connected to the I/Q mixers via AC cou-
ductor-less LO distribution with a dual-mode fractional divider pling capacitors. In a direct-conversion mobile WiMAX trans-
is discussed in Section III. The frequency plan provides high ceiver in scaled CMOS technology, the flicker noise is a critical
immunity to the VCO pulling and copes with the constraints issue as described in Section I. Therefore, the receiver adopts
of floor planning while maintaining the signal integrity of a the passive mixers to reduce the flicker noise from switching
long LO distribution path. Section IV focuses on the design transistors. Then the flicker noise from the operational amplifier
of three key circuits in the transceiver. The first one is a novel (op-amp) in the following TIA becomes dominant at low fre-
noise-shaping transimpedance amplifier (TIA) for mitigating quencies. Thus, in this paper, a noise-shaping TIA is proposed
the flicker noise of scaled CMOS devices. The second one is to improve the noise figure (NF) of the receiver. The details of
the dual-mode fractional divider employed in the inductor-less the noise-shaping TIA are described in Section IV. In each I/Q
LO distribution path. The third one is a wide-band passive path, the down-converted signals are filtered and amplified by
mixer employed in the transmitter. Then, measurement results the proposed noise-shaping TIA, an LPF and two variable gain
are presented in Section V. Finally, conclusions are presented amplifiers. Finally, the signals are converted to the digital sig-
in Section VI. nals by a time-interleaved pipelined analog-to-digital converter
(ADC) in which the amplifiers are shared by I/Q paths for area
and power savings [13].
II. TRANSCEIVER ARCHITECTURE
The block diagram of the direct-conversion transmitter is
The high-level transceiver block diagram is shown in Fig. 2. shown in Fig. 4. The transmitter has two output paths for
The transceiver is composed of a phase-locked loop (PLL), an the dual-band operations. The digital I/Q signals are con-
LO generation/distribution block, two receivers (RX-A, RX-B) verted to analog baseband I/Q signals by current-steering
and a transmitter. The transceiver covers the frequency ranges of digital-to-analog converters (DACs) in I/Q paths. The baseband
the dual-band for mobile WiMAX, which are the low-band (LB) signals are filtered by reconstruction LPFs, and then up-con-
of 2.3–2.7 GHz and the high-band (HB) of 3.3–3.8 GHz. The verted to the RF signal by I/Q mixers. In order to reduce the
transceiver adopts the direct-conversion architecture to mini- number of circuit components, the I/Q mixers are shared in the
mize the number of circuit components and power consump- low-band and the high-band paths by employing wide-band
tion. Calibration schemes to tune the oscillation frequency of passive mixers. The output power of the up-converted RF
the VCO, to tune the cutoff frequency of the low-pass filters signal is controlled by the programmable gain stages. The
(LPFs), to cancel RX DC offset, to cancel TX LO leakage, and passive mixers in the receivers and the transmitter are driven
2776 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010
by quadrature LO signals generated by the PLL and the LO low band and 8/3 for the high band so that a single VCO can
generation/distribution block as shown in Fig. 2. The details of cover the entire frequency range.
the LO generation are discussed in the next section. The frequency plan employed in this work is shown in Fig. 5.
The single VCO in the PLL covers a frequency tuning range
of 8.8–10.8 GHz. The operating frequency of the VCO is then
III. FREQUENCY PLANNING
divided by 2 just after the VCO. The LO signal of 4.4–5.4 GHz
Several frequency plans to prevent the VCO pulling in the di- is globally distributed. For the low-band operation, the global
rect-conversion transceivers have been reported for Bluetooth, LO signal is divided by 2 just before the passive mixers in the
wireless local area network (WLAN) and mobile WiMAX ap- receivers and the transmitter. Thus, the low-band LO signal of
plications. They are categorized into two approaches. The first 2.2–2.7 GHz is obtained. For the high-band operation, the global
approach is the integer division (typically divide-by-2) of the LO signal is divided by 4/3, and then the high-band LO signal
VCO operating frequency [3], [8], [14], [15]. However, this ap- of 3.3–4.05 GHz is obtained. In this case, the global LO signal
proach might still suffer from the pulling caused by the second of 4.4–5.4 GHz is divided by 2 locally. Then, it is mixed with
harmonic of the carrier frequency [16]. Integer division ratios the global LO signal to generate the LO signal of 6.6–8.1 GHz,
higher than two could reduce the harmonic pulling. The other which is finally divided by 2 to generate 3.3–4.05 GHz.
approach employing the fractional division of the VCO oper- At this point, we will compare the proposed frequency plan
ating frequency prevents both direct and harmonic pulling [5], with a conventional one as shown in Fig. 6. LO distribution
[7]–[10], [17]–[22]. We employ the division ratio of 4 for the based on a fractional division technique with a mixer usually
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2777
Fig. 6. Comparison of high-band LO signals distributed by (a) the conventional “fractional-then-distribute” plan and (b) the proposed “distribute-then-fractional”
plan.
suffers from the degraded LO signal integrity due to the un- then-fractional” plan where local 4/3 dividers are placed just
desired lower side-band spur of the mixer’s image tone [17]. before the passive mixers in the receivers and the transmitter.
Fig. 6(a) shows the LO signals distributed by the conventional In this plan, there are no lower side-band spurs in the distri-
plan, which we refer to as the “fractional-then-distribute” plan bution path at the nodes b1, b2, b3 and b5, which contributes
where a root 4/3 divider is placed just after the VCO. In this plan, to avoiding the degradation of the LO signal integrity in the
a large root 4/3 divider with an LC band-pass filter (LC-BPF) LO distribution path. Therefore, no LC-BPFs are required in
shall be required to reduce the lower side-band spur of 2/3 car- the LO distribution path, i.e. inductor-less LO distribution is
rier frequency at the node a2 in Fig. 6(a), otherwise area- achieved. Though higher side-band spurs such as harmonics of
consuming digital-calibration circuits to suppress the spur are the LO signal are generated at the output of the divider right
used [7], [17], [19]. Besides, in order to distribute the LO signal, after VCO, the harmonics are sufficiently suppressed by the
additional LC-BPFs are also to be added for suppressing the re- low-pass response of the buffers. This plan takes advantage of
growing spur at the nodes a3 and a5. As the power consumption scaled CMOS devices for low-power, high-speed and small-area
of the buffers inserted in the LO distribution path is reduced for integration since the LO distribution path is composed of only
minimizing the power consumption of the MIMO transceiver, simple CMOS inverter buffers [18]. It also provides high flex-
the cutoff frequency of the buffers becomes low. As a result, the ibility for the floor planning of the LO distribution path, and
gain for the lower side-band spur becomes larger than the gain the proposed plan can be scalable to larger integrated
for the desired LO signal. The low-pass response of the buffers MIMO systems. However, the issue here is that this plan re-
has a large impact on the spur re-growth in a long LO distribu- quires as many local 4/3 dividers as the number of the receiver
tion path for the MIMO transceiver. Therefore, the conventional and the transmitter paths. Conventional large 4/3 dividers with
“fractional-then-distribute” plan requires the LC-BPFs. LC-BPFs are not usable in this case. In this work, we resolve
The LO signals distributed by the proposed frequency plan the issue by proposing a novel dual-mode fractional divider. The
are depicted in Fig. 6(b), which we refer to as the “distribute- circuit details are described in the next section.
2778 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010
Fig. 8. Block diagrams of (a) basic TIA, (b) noise-shaping TIA and (c) noise-
shaping TIA with feedback capacitance.
A. Noise-Shaping Transimpedance Amplifier where is the conductance seen from the mixer output,
In the receiver design, the passive mixer topology is adopted is the feedback conductance of the TIA, is the voltage gain
to reduce the flicker noise as described in Section II. Thus, the of the op-amp and is the input-referred noise of the op-amp.
reducing the flicker noise from the TIA becomes very important. From (1) and (2), the equivalent block diagram of the basic TIA
Enlarging the input transistors of the op-amp in the TIA is a is derived as shown in Fig. 8(a).
straightforward approach to mitigate the flicker noise. However, For suppressing the flicker noise from the op-amp in the
it may make it much more difficult to design the op-amp, which closed loop, it is a natural idea to place an additional gain
is already constrained by stringent specifications such as those component before the op-amp, because the input-referred noise
for gain, bandwidth, linearity, and stability. In our case, actually, of the op-amp is suppressed by that gain. Consequently, we
even with larger input devices to decrease the flicker noise of the focus on the block in Fig. 8(a) that contains .
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2779
(3)
Fig. 9. Block diagram of dual-mode fractional divider.
which physically means the mismatch between the original con-
ductance at node and the absolute value of the added nega-
tive conductance. If the values were perfectly matched, the ad- In practice, the noise from the negative conductance cell
ditional gain would become infinity. Thus, the magnitude of the shown as in Fig. 8 should also be con-
additional gain is determined not by device parameters such as sidered. The transfer function of the input-referred noise of the
the gm but only by the relative accuracy of , and . negative conductance cell is derived as follows:
Therefore we can manage or the magnitude of the addi-
tional gain flexibly.
Since the actual implementation of the TIA has 1st order
LPF characteristics, we need to consider the influence of the
feedback capacitance as shown in Fig. 7(c). The effective
impedance at node is modified by the capacitance as (7)
shown in Fig. 8(c). Although the reduces the impedance
at node and the suppression of the noise from the op-amp Even if the circuit is ideally designed ( is zero) and the noise
at high frequencies, the noise suppression effect is maintained from the op-amp becomes zero as predicted in (5), the noise
at low frequencies. It means that the noise is selectively from the negative conductance cell appears at the TIA output. It
suppressed only at low frequencies and the NTF is shaped is important to design the noise of the negative conductance cell
into a high-pass characteristic. The STF and the NTF of the to be low enough to satisfy the noise specification of the TIA,
noise-shaping TIA with the feedback capacitance are derived which is the case in our design.
as follows:
B. Dual-Mode Fractional Divider
Fig. 9 shows the block diagram of the proposed dual-mode
fractional divider. It is composed of the divide-by-2 circuit, the
gm-cell and the mixer. In order to eliminate the LC-BPFs used
for suppressing the lower side-band spur generated by the mixer
(4)
in the high-band operation, we have adopted single side-band
(SSB) mixer architecture. The divide-by-2 circuit is stacked on
the gm-cell and the mixer. Current-mode connection eliminates
the buffer and LC-BPFs placed often between the divide-by-2
circuit and the mixer. In addition, the power consumption for the
(5) high-band operation is reduced by sharing the biasing current in
the divide-by-2 circuit and the mixer.
(6) The schematic diagram of the dual-mode fractional divider is
depicted in Fig. 10. For the low-band operation, the dual-mode
With the aid of the additional gain boost by , the STF of the fractional divider is configured as shown in Fig. 10(a). It com-
noise-shaping TIA becomes closer to the ideal low-pass char- prises a conventional divide-by-2 circuit based on a flip-flop
acteristics than the one without the gain boost. Since the nega- topology, where the transistors M1 through M4 work as the
tive conductance cell is placed between the virtual ground nodes gm-cells. Meanwhile, for the high-band operation, four sets
of the TIA, linearity of the negative conductance cell itself is of four single-gate mixers (4-SGMs) take the place of four
not critical. Linearity of the proposed TIA is better than a con- gm-cells to compose the SSB mixer topology as shown in
ventional one without the negative conductance cell because the Fig. 10(b). If we utilize a conventional Gilbert-cell mixer
open loop gain of the TIA is larger owing to the additional gain here, it is very difficult to stack the divide-by-2 circuit on the
boost by . mixer. Thus, the single-gate mixer topology [23] is employed to
2780 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010
Fig. 12. Measured (a) receiver output noise and (b) receiver gain.
Fig. 10. Schematic diagram of dual-mode fractional divider for (a) low-band
V. MEASUREMENT RESULTS
operation and (b) high-band operation. Fig. 12 shows the measured output noise and gain of the re-
ceiver with or without the noise-shaping function. By enabling
the noise-shaping function, 4 dB improvement of the receiver
output noise at 7 kHz is achieved as shown in Fig. 12(a). In con-
trast, as shown in Fig. 12(b), the difference of STF is negligibly
small with or without the noise-shaping function. Fig. 13 shows
the measured and simulated noise suppression ratio at 1 kHz,
which is the ratio of the noise with the noise-shaping to that
Fig. 11. Simplified schematic diagram of wide-band passive mixer employed without the noise-shaping, where the total noise from LNA to
in transmitter.
the noise-shaping TIA is compared. It proves that, by making
small, we can improve the noise suppression ratio as predicted
in (5). Notice that we cannot make too small. When be-
achieve low-voltage and low-power operation. In the single-gate
comes larger than , the polarity of turns negative
mixer, two LO signals are applied together to the gate of the
and the feedback loop becomes unstable. In this implementa-
transistor, and the mixing function is achieved by the squaring
tion, are estimated by circuit simulation while con-
function of the transistor’s second-order non-linearity. Because
necting LNA, mixer and TIA with varying process, voltage, and
the proposed dual-mode fractional divider has no LC-BPFs and
temperature (PVT) conditions. The nominal value of is de-
is shared by both the low-band and the high-band operations, it
termined so that does not become negative in the worst case.
is applicable to the proposed “distribute-then-fractional” plan.
is set to 0.3, or is . About 4.6 dB improve-
ment of the noise is achieved at the design point. The deviation
C. Wide-Band Passive Mixer in Transmitter
between the measurement and the simulation in Fig. 13 is within
Fig. 11 shows the simplified schematic diagram of the wide- the expected range of process variation.
band passive mixer employed in the transmitter. Actual imple- The layout of the compact dual-mode fractional divider is
mentation is the double-balanced topology for both I/Q paths. shown in Fig. 14. The size is 56 um by 118 um. It is laid out
The mixer is composed of resistors , a capacitor for AC to minimize the lower side-band spur of caused by the
coupling and a switching transistor . The resistor is the device mismatches and layout asymmetry of the single-gate
termination resistor as a load of the mixer, which is also used for mixers employed in the dual-mode fractional divider. Further-
biasing the following programmable gain stage. Wideband char- more, the non-linearity of the single-gate mixer, which also
acteristics are achieved by making small enough to exclude causes the spur, is low in spite of the low-voltage operation
the effect of parasitic capacitance on impedance at the node X. [23]. Thus, the spur of is low enough to be filtered out
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2781
TABLE I
PERFORMANCE SUMMARY OF MOBILE WIMAX TRANSCEIVERS
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2
R. Lin, and S. Gross, “A 1 2 MIMO multi-band CMOS transceiver no. 12, pp. 2232–2238, Dec. 2003.
with an integrated front-end in 90 nm CMOS for 802.11a/g/n WLAN [21] S. Khorram, H. Darabi, Z. Zhou, Q. Li, B. Marholev, J. Chiu, J. Cas-
applications,” in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, taneda, H. M. Chien, S. B. Anand, S. Wu, M. A. Pan, R. Roofougaran,
Feb. 2008, pp. 356–357. H. J. Kim, P. Lettieri, B. Ibrahim, J. J. Rael, L. H. Tran, E. Geronaga, H.
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Macedo, A. D. Moore, J. W. M. Rogers, and M. Toner, “A fully in- m
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Yu, T. Sepke, S. Shekarchian, L. Tee, P. Muller, J. Tam, and T. Cho, and A. Rofougaran, “A 5-GHz direct-conversion CMOS transceiver
2
“A fully integrated 2 2 MIMO dual-band dual- mode direct-conver- utilizing automatic frequency control for the IEEE 802.11a wireless
sion CMOS transceiver for WiMAX/WLAN applications,” in IEEE Int. LAN standard,” IEEE J. Solid-State Circuit, vol. 38, no. 12, pp.
Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2009, pp. 416–417. 2209–2220, Dec. 2003.
[8] F. Beaudoin, T. Zortea, G. Deliyannides, M. Hiebert, M. McAdam, [23] J. Deguchi, D. Miyashita, and M. Hamada, “A 0.6 V 380 W0 14
M. Venditti, V. Choudary, B. Guay, H. Djahanshahi, T. McKeen, and dBm LO-input 2.4 GHz double-balanced current-reusing single-gate
A. Hafez, “A fully integrated tri-band, MIMO transceiver RFIC for CMOS mixer with cyclic passive combiner,” in IEEE Int. Solid-State
802.16e,” in Proc. IEEE RFIC Symp., Jun. 2008, pp. 113–116. Circuits Conf. Dig. Tech. Papers, Feb. 2009, pp. 224–225.
[9] A. Behzad, K. A. Carter, H. M. Chien, S. Wu, M. A. Pan, C. P. Lee,
Q. Li, J. C. Leete, S. Au, M. S. Kappes, Z. Zhou, D. Ojo, L. Zhang, A.
Zolfaghari, J. Castanada, H. Darabi, B. Yeung, A. Rofougaran, M. Ro-
fougaran, J. Trachewsky, T. Moorti, R. Gaikwad, A. Bagchi, J. S. Ham- Jun Deguchi (M’10) received the B.S. and M.S.
merschmidt, J. Pattin, J. J. Rael, and B. Marholev, “A fully integrated degrees in machine intelligence and systems engi-
MIMO multiband direct conversion CMOS transceiver for WLAN ap- neering, and Ph.D. degree in bioengineering and
plications (802.11n),” IEEE J. Solid-State Circuit, vol. 42, no. 12, pp. robotics from Tohoku University, Sendai, Japan, in
2795–2808, Dec. 2007. 2001, 2003 and 2006, respectively.
[10] M. Zargari, L. Y. Nathawad, H. Samavati, S. S. Mehta, A. Kheirkhahi, In 2006, he joined the Center for Semiconductor
P. Chen, K. Gong, B. Vakili-Amini, J. A. Hwang, S. W. M. Chen, M. Research and Development, Toshiba Corporation,
Terrovitis, B. J. Kaczynski, S. Limotyrakis, M. P. Mack, H. Gan, M. Kawasaki, Japan. Since then he has been engaged
Lee, R. T. Chang, H. Dogan, S. Abdollahi-Alibeik, B. Baytekin, K. in the design of analog and RF circuits for wireless
Onodera, S. Mendis, A. Chang, Y. Rajavi, S. H. M. Jen, D. K. Su, communications. In 2004, he was a Visiting Scholar
and B. A. Wooley, “A dual-band CMOS MIMO radio SoC for IEEE at the University of California, Santa Cruz.
802.11n wireless LAN,” IEEE J. Solid-State Circuit, vol. 43, no. 12,
pp. 2882–2895, Dec. 2008.
[11] G. Chien, P. B. Leong, S. W. Son, M. Tsai, and L. Tse, “A fully-inte-
grated dual-band MIMO transceiver IC,” in Proc. IEEE RFIC Symp., Daisuke Miyashita (M’10) received the B.E. and
Jun. 2006, pp. 81–84. M.E. degrees in electronic engineering from the
[12] J. Deguchi, J. D. Miyashita, Y. Ogasawara, G. Takemura, M. Iwanaga, University of Tokyo, Tokyo, Japan, in 2001 and
K. Sami, R. Ito, J. Wadatsumi, Y. Tsuda, S. Oda, S. Kawaguchi, N. Itoh, 2003, respectively.
2
and M. Hamada, “A fully integrated 2 1 dual-band direct-conversion In 2003, he joined the Center for Semiconductor
transceiver with dual-mode fractional divider and noise-shaping TIA Research and Development, Toshiba Corporation,
for mobile WiMAX SoC in 65 nm CMOS,” in IEEE Int. Solid-State Kawasaki, Japan, where he has been engaged in
Circuits Conf. Dig. Tech. Papers, Feb. 2010, pp. 456–457. the design of RF and analog circuits for wireless
[13] D. Kurose, T. Ito, T. Ueno, T. Yamaji, and T. Itakura, “55-mW 200- communications.
MSPS 10-bit pipeline ADCs for wireless receivers,” IEEE J. Solid-
State Circuit, vol. 41, no. 7, pp. 1589–1595, Jul. 2006.
[14] T. Maeda, H. Yano, T. Yamase, N. Yoshida, N. Matsuno, S. Hori, K.
Numata, R. Walkington, T. Tokairin, Y. Takahashi, M. Fujii, and H.
Hida, “A direct-conversion CMOS transceiver for 4.9–5.95 GHz multi-
standard WLANs,” in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Yosuke Ogasawara received the B.E degree from
Papers, Feb. 2004, pp. 90–91. Chuo University, Tokyo, Japan, in 2003.
[15] M. Simon, P. Laaser, V. Filimon, H. Geltinger, D. Friedrich, Y. Raman, From 2003 to 2006, he was with 1st SoC Design
and R. Weigel, “An 802.11a/b/g RF transceiver in an SoC,” in IEEE Int. Division, NEC Micro Systems, Ltd., Kanagawa,
Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2007, pp. 562–563. Japan, as an Analog RFIC Designer. In 2006, he
[16] D. Miyashita, H. Ishikuro, T. Shimada, T. Tanzawa, S. Kousai, H. joined the Analog Device Design Department,
Kobayashi, H. Majima, K. Agawa, M. Hamada, and F. Hatori, “A Semiconductor Company, Toshiba Corporation,
low-if CMOS single-chip bluetooth EDR transmitter with digital I/Q Kawasaki, Japan, where he is working on the design
mismatch trimming circuit,” in VLSI Circuits Symp. Dig. Tech. Papers, of RF front circuit for wireless communications.
Jun. 2005, pp. 298–301.
[17] H. Darabi, S. Khorram, H. M. Chien, M. A. Pan, S. Wu, S. Moloudi, J.
C. Leete, J. J. Rael, M. Syed, R. Lee, B. Ibrahim, M. Rofougaran, and
A. Rofougaran, “A 2.4-GHz CMOS transceiver for bluetooth,” IEEE
J. Solid-State Circuit, vol. 36, no. 12, pp. 2016–2024, Dec. 2001.
[18] Y. Palaskas, A. Ravi, S. Pellerano, B. R. Carlton, M. A. Elmala, R. Gaku Takemura received the B.E. degree in elec-
Bishop, G. Banerjee, R. B. Nicholls, S. K. Ling, N. Dinur, S. S. Taylor, trical engineering and the M.E. degree in electronic
and K. Soumyanath, “A 5-GHz 108-Mb/s 2 2 2 MIMO transceiver communication engineering from Kyoto University,
Kyoto, Japan, in 1995 and 1997, respectively.
RFIC with fully integrated 20.5-dBm P1 dB power amplifiers in 90-nm
CMOS,” IEEE J. Solid-State Circuit, vol. 41, no. 12, pp. 2746–2756, In 1997, he joined the Wireless and Multimedia
Dec. 2006. LSI Development Department, Semiconductor
[19] S. Pellerano, P. Madoglio, and Y. Palaskas, “A 4.75-GHz fractional Company, Toshiba Corporation, Kawasaki, Japan.
frequency divider-by-1.25 with TDC-based all-digital spur calibration Since then, he has been engaged in the development
in 45-nm CMOS,” IEEE J. Solid-State Circuit, vol. 44, no. 12, pp. of wireless communication circuits.
3422–3433, Dec. 2009.
2784 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010
Masaomi Iwanaga received the B.E. and the M.E. Shoko Oda received the B.E. and the M.E. degrees
degrees in electrical and electronic engineering from in electrical engineering from Kyushu University,
Kobe University, Kobe, Japan, in 1996 and 1998, re- Fukuoka, Japan, in 2005 and 2007, respectively.
spectively. In 2007, she joined the Center for Semiconductor
In 1998, he joined the Wireless & Multimedia LSI Research and Development, Toshiba Corporation,
Development Department, Semiconductor Company, Kawasaki, Japan. Since then, she has been engaged
Toshiba Corporation, Kawasaki, Japan. Since then, in the design of RF and analog circuits for wireless
he has been engaged in the development of wireless communications.
communication circuits.
Kenichi Sami received the B.E. degree in electrical Shunji Kawaguchi was born in Hyogo, Japan, in
engineering from Tokyo University, Tokyo, Japan, in 1959. He received the B.S. degree in electronic
1997. engineering from Kobe University, Kobe, Japan, in
Since then, he joined the Toshiba Corporation, 1983.
Kawasaki, Japan, in 1997 and has been engaged in In 1983, he joined the Toshiba Corporation,
the development of wireless communication circuits. Kawasaki, Japan, where he has been engaged in the
design and development of bipolar LSI’s, especially
for wireless communications. He is currently the
Chief Specialist of the Analog Device Design
Department, Toshiba Corporation Semiconductor
Company.