HAMADA - A FULLY INTEGRATED 2x1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER

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2774 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO.

12, DECEMBER 2010

A Fully Integrated 2 1 Dual-Band


Direct-Conversion Mobile WiMAX Transceiver With
Dual-Mode Fractional Divider and Noise-Shaping
Transimpedance Amplifier in 65 nm CMOS
Jun Deguchi, Member, IEEE, Daisuke Miyashita, Member, IEEE, Yosuke Ogasawara, Gaku Takemura,
Masaomi Iwanaga, Kenichi Sami, Rui Ito, Junji Wadatsumi, Yuki Tsuda, Shoko Oda, Shunji Kawaguchi,
Nobuyuki Itoh, Member, IEEE, and Mototsugu Hamada, Member, IEEE

Abstract—This paper presents a fully integrated 2 RX 1


TX dual-band direct-conversion mobile WiMAX transceiver in a
65 nm CMOS technology. The frequency division ratios of 4 for
the low band (2.3–2.7 GHz) and 8/3 for the high band (3.3–3.8
GHz) are employed to provide high immunity to the VCO pulling
and to cover the entire frequency range with a single VCO.
A “distribute-then-fractional” frequency plan is proposed to
provide the frequency division ratios without degrading the LO
signal integrity in the LO distribution path. The proposed plan is
achieved by an inductor-less LO distribution with a novel compact
dual-mode fractional divider. A noise-shaping transimpedance
amplifier (TIA) is also proposed to mitigate the flicker noise of
scaled CMOS devices. The two receivers consume 214.1 mW and Fig. 1. Comparison of floor plans for (a) typical MIMO transceiver and (b)
single-chip MIMO transceiver.
247.7 mW in the low-band and the high-band operations, which
are lower than the power consumption of the mobile WiMAX
transceivers reported previously. In spite of the low power con-
sumption, the receivers achieve the total noise figure of 3.8 dB and CMOS technology is a straightforward approach, there are
4.5 dB in the low-band and the high-band operations by virtue of various technical challenges in designing a single-chip MIMO
the proposed noise-shaping TIA. transceiver as discussed below.
Index Terms—Direct-conversion transceiver, flicker-noise, fre- Fig. 1 compares the two types of floor plans for a MIMO
quency planning, IEEE 802.16e, mobile WiMAX, multiple-input/ transceiver. As shown in Fig. 1(a), it is favorable to lay out RF
multiple-output (MIMO), pulling, single chip. circuits in receivers (RX), transmitters (TX) and synthesizers
(SYN) close to the peripheral pads of the chip to avoid the degra-
I. INTRODUCTION dation of the transceiver performance due to the parasitic effects
[3]–[6]. Furthermore, it is important to keep the length of the
OBILE worldwide interoperability for microwave local oscillator (LO) distribution path as short as possible by op-
M access (WiMAX), based on IEEE 802.16e standard [1],
[2] is one of the emerging standards for broadband wireless
timizing the floor plan of the circuit blocks. In contrast, as shown
in Fig. 1(b), it is often the case that the RF circuits are placed at
communication. Mobile WiMAX adopts the multiple-input, only one or two peripheries of the die in the single-chip imple-
multiple-output (MIMO) technique and the orthogonal fre- mentation [7]–[11]. It leads to difficulty in optimizing the floor
quency division multiple access (OFDMA) modulation scheme, plan of MIMO transceivers. As a result, the LO distribution path
and supports the option of seamless handover. It offers high tends to be long, and the signal integrity of the LO distribution
data rates over a wide communication range in mobile environ- path tends to be degraded. The trend will become pronounced in
ments. Consequently, mobile WiMAX is achieving worldwide the future owing to the increasing number of MIMO transceivers
penetration in a wide variety of products, ranging from mobile coexisting with larger-scale integration of digital circuits. It also
PCs to smartphones. Low-cost implementation of a mobile results in the increase of the chip-level power consumption as
WiMAX transceiver is essential under the above-described cir- the number of transceivers increases.
cumstances. While its single-chip implementation in a scaled In terms of the floor planning and power consumption, for
mobile WiMAX transceivers, direct-conversion architecture [3],
[7], [8] is usually preferred because of its fewer circuit compo-
Manuscript received April 12, 2010; revised June 30, 2010; accepted August nents and lower power consumption compared with super-het-
20, 2010. Date of publication October 18, 2010; date of current version De- erodyne architecture. However, direct-conversion architecture
cember 03, 2010. This paper was approved by Guest Editor Ranjit Gharpurey.
The authors are with the Toshiba Corporation, Kawasaki, Japan (e-mail: jun.
suffers from the issues of flicker noise, voltage controlled oscil-
deguchi@toshiba.co.jp). lator (VCO) pulling, DC-offset, I/Q mismatch and LO leakage.
Digital Object Identifier 10.1109/JSSC.2010.2075295 In the mobile WiMAX system, the first subcarrier in OFDMA
0018-9200/$26.00 © 2010 IEEE
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2775

Fig. 2. High-level transceiver block diagram.

signals comes at 7.8125 kHz, which is generally far below the to cancel TX I/Q mismatch are also implemented in the trans-
flicker noise corner of scaled CMOS devices. In a direct-conver- ceiver.
sion mobile WiMAX transceiver in scaled CMOS technology, The block diagram of the direct-conversion receiver is shown
the flicker noise becomes a critical issue. in Fig. 3. The receiver has two RF paths for the low band and the
This paper describes a fully integrated 2 RX 1 TX high band. The RF input signal is first amplified by a cascoded
dual-band direct-conversion mobile WiMAX transceiver in common-source low-noise amplifier (LNA) with LC tank, and
a 65 nm CMOS technology [12]. Section II presents the then down-converted to the baseband I/Q signals by I/Q mixers.
transceiver architecture. The frequency plan based on an in- The LNA is directly connected to the I/Q mixers via AC cou-
ductor-less LO distribution with a dual-mode fractional divider pling capacitors. In a direct-conversion mobile WiMAX trans-
is discussed in Section III. The frequency plan provides high ceiver in scaled CMOS technology, the flicker noise is a critical
immunity to the VCO pulling and copes with the constraints issue as described in Section I. Therefore, the receiver adopts
of floor planning while maintaining the signal integrity of a the passive mixers to reduce the flicker noise from switching
long LO distribution path. Section IV focuses on the design transistors. Then the flicker noise from the operational amplifier
of three key circuits in the transceiver. The first one is a novel (op-amp) in the following TIA becomes dominant at low fre-
noise-shaping transimpedance amplifier (TIA) for mitigating quencies. Thus, in this paper, a noise-shaping TIA is proposed
the flicker noise of scaled CMOS devices. The second one is to improve the noise figure (NF) of the receiver. The details of
the dual-mode fractional divider employed in the inductor-less the noise-shaping TIA are described in Section IV. In each I/Q
LO distribution path. The third one is a wide-band passive path, the down-converted signals are filtered and amplified by
mixer employed in the transmitter. Then, measurement results the proposed noise-shaping TIA, an LPF and two variable gain
are presented in Section V. Finally, conclusions are presented amplifiers. Finally, the signals are converted to the digital sig-
in Section VI. nals by a time-interleaved pipelined analog-to-digital converter
(ADC) in which the amplifiers are shared by I/Q paths for area
and power savings [13].
II. TRANSCEIVER ARCHITECTURE
The block diagram of the direct-conversion transmitter is
The high-level transceiver block diagram is shown in Fig. 2. shown in Fig. 4. The transmitter has two output paths for
The transceiver is composed of a phase-locked loop (PLL), an the dual-band operations. The digital I/Q signals are con-
LO generation/distribution block, two receivers (RX-A, RX-B) verted to analog baseband I/Q signals by current-steering
and a transmitter. The transceiver covers the frequency ranges of digital-to-analog converters (DACs) in I/Q paths. The baseband
the dual-band for mobile WiMAX, which are the low-band (LB) signals are filtered by reconstruction LPFs, and then up-con-
of 2.3–2.7 GHz and the high-band (HB) of 3.3–3.8 GHz. The verted to the RF signal by I/Q mixers. In order to reduce the
transceiver adopts the direct-conversion architecture to mini- number of circuit components, the I/Q mixers are shared in the
mize the number of circuit components and power consump- low-band and the high-band paths by employing wide-band
tion. Calibration schemes to tune the oscillation frequency of passive mixers. The output power of the up-converted RF
the VCO, to tune the cutoff frequency of the low-pass filters signal is controlled by the programmable gain stages. The
(LPFs), to cancel RX DC offset, to cancel TX LO leakage, and passive mixers in the receivers and the transmitter are driven
2776 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010

Fig. 3. Receiver block diagram.

Fig. 4. Transmitter block diagram.

Fig. 5. Frequency plan.

by quadrature LO signals generated by the PLL and the LO low band and 8/3 for the high band so that a single VCO can
generation/distribution block as shown in Fig. 2. The details of cover the entire frequency range.
the LO generation are discussed in the next section. The frequency plan employed in this work is shown in Fig. 5.
The single VCO in the PLL covers a frequency tuning range
of 8.8–10.8 GHz. The operating frequency of the VCO is then
III. FREQUENCY PLANNING
divided by 2 just after the VCO. The LO signal of 4.4–5.4 GHz
Several frequency plans to prevent the VCO pulling in the di- is globally distributed. For the low-band operation, the global
rect-conversion transceivers have been reported for Bluetooth, LO signal is divided by 2 just before the passive mixers in the
wireless local area network (WLAN) and mobile WiMAX ap- receivers and the transmitter. Thus, the low-band LO signal of
plications. They are categorized into two approaches. The first 2.2–2.7 GHz is obtained. For the high-band operation, the global
approach is the integer division (typically divide-by-2) of the LO signal is divided by 4/3, and then the high-band LO signal
VCO operating frequency [3], [8], [14], [15]. However, this ap- of 3.3–4.05 GHz is obtained. In this case, the global LO signal
proach might still suffer from the pulling caused by the second of 4.4–5.4 GHz is divided by 2 locally. Then, it is mixed with
harmonic of the carrier frequency [16]. Integer division ratios the global LO signal to generate the LO signal of 6.6–8.1 GHz,
higher than two could reduce the harmonic pulling. The other which is finally divided by 2 to generate 3.3–4.05 GHz.
approach employing the fractional division of the VCO oper- At this point, we will compare the proposed frequency plan
ating frequency prevents both direct and harmonic pulling [5], with a conventional one as shown in Fig. 6. LO distribution
[7]–[10], [17]–[22]. We employ the division ratio of 4 for the based on a fractional division technique with a mixer usually
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2777

Fig. 6. Comparison of high-band LO signals distributed by (a) the conventional “fractional-then-distribute” plan and (b) the proposed “distribute-then-fractional”
plan.

suffers from the degraded LO signal integrity due to the un- then-fractional” plan where local 4/3 dividers are placed just
desired lower side-band spur of the mixer’s image tone [17]. before the passive mixers in the receivers and the transmitter.
Fig. 6(a) shows the LO signals distributed by the conventional In this plan, there are no lower side-band spurs in the distri-
plan, which we refer to as the “fractional-then-distribute” plan bution path at the nodes b1, b2, b3 and b5, which contributes
where a root 4/3 divider is placed just after the VCO. In this plan, to avoiding the degradation of the LO signal integrity in the
a large root 4/3 divider with an LC band-pass filter (LC-BPF) LO distribution path. Therefore, no LC-BPFs are required in
shall be required to reduce the lower side-band spur of 2/3 car- the LO distribution path, i.e. inductor-less LO distribution is
rier frequency at the node a2 in Fig. 6(a), otherwise area- achieved. Though higher side-band spurs such as harmonics of
consuming digital-calibration circuits to suppress the spur are the LO signal are generated at the output of the divider right
used [7], [17], [19]. Besides, in order to distribute the LO signal, after VCO, the harmonics are sufficiently suppressed by the
additional LC-BPFs are also to be added for suppressing the re- low-pass response of the buffers. This plan takes advantage of
growing spur at the nodes a3 and a5. As the power consumption scaled CMOS devices for low-power, high-speed and small-area
of the buffers inserted in the LO distribution path is reduced for integration since the LO distribution path is composed of only
minimizing the power consumption of the MIMO transceiver, simple CMOS inverter buffers [18]. It also provides high flex-
the cutoff frequency of the buffers becomes low. As a result, the ibility for the floor planning of the LO distribution path, and
gain for the lower side-band spur becomes larger than the gain the proposed plan can be scalable to larger integrated
for the desired LO signal. The low-pass response of the buffers MIMO systems. However, the issue here is that this plan re-
has a large impact on the spur re-growth in a long LO distribu- quires as many local 4/3 dividers as the number of the receiver
tion path for the MIMO transceiver. Therefore, the conventional and the transmitter paths. Conventional large 4/3 dividers with
“fractional-then-distribute” plan requires the LC-BPFs. LC-BPFs are not usable in this case. In this work, we resolve
The LO signals distributed by the proposed frequency plan the issue by proposing a novel dual-mode fractional divider. The
are depicted in Fig. 6(b), which we refer to as the “distribute- circuit details are described in the next section.
2778 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010

Fig. 8. Block diagrams of (a) basic TIA, (b) noise-shaping TIA and (c) noise-
shaping TIA with feedback capacitance.

op-amp, the required noise performance is not obtained while


maintaining other aspects of performance. In this section, we
propose a novel method to suppress the flicker noise from the
op-amp.
Fig. 7. Schematic diagrams of (a) basic TIA, (b) noise-shaping TIA and (c) As a starting point, the schematic diagram of the basic TIA
noise-shaping TIA with feedback capacitance. is shown in Fig. 7(a). By solving the Kirchhoff equations in the
TIA, the signal transfer function (STF) from the input to the
output of the TIA and the noise transfer function (NTF) from
IV. CIRCUIT DESIGN the input of the op-amp to the output of the TIA are derived as,
In this section, the three key circuits in the transceiver are
described. The first one is a noise-shaping TIA for mitigating
the flicker noise of scaled CMOS devices. The second one is the (1)
dual-mode fractional divider employed in the inductor-less LO
distribution path. The third one is the wide-band passive mixer
employed in the transmitter. (2)

A. Noise-Shaping Transimpedance Amplifier where is the conductance seen from the mixer output,
In the receiver design, the passive mixer topology is adopted is the feedback conductance of the TIA, is the voltage gain
to reduce the flicker noise as described in Section II. Thus, the of the op-amp and is the input-referred noise of the op-amp.
reducing the flicker noise from the TIA becomes very important. From (1) and (2), the equivalent block diagram of the basic TIA
Enlarging the input transistors of the op-amp in the TIA is a is derived as shown in Fig. 8(a).
straightforward approach to mitigate the flicker noise. However, For suppressing the flicker noise from the op-amp in the
it may make it much more difficult to design the op-amp, which closed loop, it is a natural idea to place an additional gain
is already constrained by stringent specifications such as those component before the op-amp, because the input-referred noise
for gain, bandwidth, linearity, and stability. In our case, actually, of the op-amp is suppressed by that gain. Consequently, we
even with larger input devices to decrease the flicker noise of the focus on the block in Fig. 8(a) that contains .
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2779

It represents the effective impedance at node in Fig. 7(a),


which converts the current through and into the input
voltage of the op-amp. We utilize this impedance, although its
usefulness is often overlooked behind the large voltage gain
of the subsequent op-amp. In this work, we add a negative
conductance cell at node as shown in Fig. 7(b). It results in
the increase of the impedance at node as shown by the block
in Fig. 8(b). When the block is divided into the original
impedance without the negative conductance cell and
as shown in Fig. 8(b) , we regard as an additional gain
component. We describe as,

(3)
Fig. 9. Block diagram of dual-mode fractional divider.
which physically means the mismatch between the original con-
ductance at node and the absolute value of the added nega-
tive conductance. If the values were perfectly matched, the ad- In practice, the noise from the negative conductance cell
ditional gain would become infinity. Thus, the magnitude of the shown as in Fig. 8 should also be con-
additional gain is determined not by device parameters such as sidered. The transfer function of the input-referred noise of the
the gm but only by the relative accuracy of , and . negative conductance cell is derived as follows:
Therefore we can manage or the magnitude of the addi-
tional gain flexibly.
Since the actual implementation of the TIA has 1st order
LPF characteristics, we need to consider the influence of the
feedback capacitance as shown in Fig. 7(c). The effective
impedance at node is modified by the capacitance as (7)
shown in Fig. 8(c). Although the reduces the impedance
at node and the suppression of the noise from the op-amp Even if the circuit is ideally designed ( is zero) and the noise
at high frequencies, the noise suppression effect is maintained from the op-amp becomes zero as predicted in (5), the noise
at low frequencies. It means that the noise is selectively from the negative conductance cell appears at the TIA output. It
suppressed only at low frequencies and the NTF is shaped is important to design the noise of the negative conductance cell
into a high-pass characteristic. The STF and the NTF of the to be low enough to satisfy the noise specification of the TIA,
noise-shaping TIA with the feedback capacitance are derived which is the case in our design.
as follows:
B. Dual-Mode Fractional Divider
Fig. 9 shows the block diagram of the proposed dual-mode
fractional divider. It is composed of the divide-by-2 circuit, the
gm-cell and the mixer. In order to eliminate the LC-BPFs used
for suppressing the lower side-band spur generated by the mixer
(4)
in the high-band operation, we have adopted single side-band
(SSB) mixer architecture. The divide-by-2 circuit is stacked on
the gm-cell and the mixer. Current-mode connection eliminates
the buffer and LC-BPFs placed often between the divide-by-2
circuit and the mixer. In addition, the power consumption for the
(5) high-band operation is reduced by sharing the biasing current in
the divide-by-2 circuit and the mixer.
(6) The schematic diagram of the dual-mode fractional divider is
depicted in Fig. 10. For the low-band operation, the dual-mode
With the aid of the additional gain boost by , the STF of the fractional divider is configured as shown in Fig. 10(a). It com-
noise-shaping TIA becomes closer to the ideal low-pass char- prises a conventional divide-by-2 circuit based on a flip-flop
acteristics than the one without the gain boost. Since the nega- topology, where the transistors M1 through M4 work as the
tive conductance cell is placed between the virtual ground nodes gm-cells. Meanwhile, for the high-band operation, four sets
of the TIA, linearity of the negative conductance cell itself is of four single-gate mixers (4-SGMs) take the place of four
not critical. Linearity of the proposed TIA is better than a con- gm-cells to compose the SSB mixer topology as shown in
ventional one without the negative conductance cell because the Fig. 10(b). If we utilize a conventional Gilbert-cell mixer
open loop gain of the TIA is larger owing to the additional gain here, it is very difficult to stack the divide-by-2 circuit on the
boost by . mixer. Thus, the single-gate mixer topology [23] is employed to
2780 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010

Fig. 12. Measured (a) receiver output noise and (b) receiver gain.

Fig. 10. Schematic diagram of dual-mode fractional divider for (a) low-band
V. MEASUREMENT RESULTS
operation and (b) high-band operation. Fig. 12 shows the measured output noise and gain of the re-
ceiver with or without the noise-shaping function. By enabling
the noise-shaping function, 4 dB improvement of the receiver
output noise at 7 kHz is achieved as shown in Fig. 12(a). In con-
trast, as shown in Fig. 12(b), the difference of STF is negligibly
small with or without the noise-shaping function. Fig. 13 shows
the measured and simulated noise suppression ratio at 1 kHz,
which is the ratio of the noise with the noise-shaping to that
Fig. 11. Simplified schematic diagram of wide-band passive mixer employed without the noise-shaping, where the total noise from LNA to
in transmitter.
the noise-shaping TIA is compared. It proves that, by making
small, we can improve the noise suppression ratio as predicted
in (5). Notice that we cannot make too small. When be-
achieve low-voltage and low-power operation. In the single-gate
comes larger than , the polarity of turns negative
mixer, two LO signals are applied together to the gate of the
and the feedback loop becomes unstable. In this implementa-
transistor, and the mixing function is achieved by the squaring
tion, are estimated by circuit simulation while con-
function of the transistor’s second-order non-linearity. Because
necting LNA, mixer and TIA with varying process, voltage, and
the proposed dual-mode fractional divider has no LC-BPFs and
temperature (PVT) conditions. The nominal value of is de-
is shared by both the low-band and the high-band operations, it
termined so that does not become negative in the worst case.
is applicable to the proposed “distribute-then-fractional” plan.
is set to 0.3, or is . About 4.6 dB improve-
ment of the noise is achieved at the design point. The deviation
C. Wide-Band Passive Mixer in Transmitter
between the measurement and the simulation in Fig. 13 is within
Fig. 11 shows the simplified schematic diagram of the wide- the expected range of process variation.
band passive mixer employed in the transmitter. Actual imple- The layout of the compact dual-mode fractional divider is
mentation is the double-balanced topology for both I/Q paths. shown in Fig. 14. The size is 56 um by 118 um. It is laid out
The mixer is composed of resistors , a capacitor for AC to minimize the lower side-band spur of caused by the
coupling and a switching transistor . The resistor is the device mismatches and layout asymmetry of the single-gate
termination resistor as a load of the mixer, which is also used for mixers employed in the dual-mode fractional divider. Further-
biasing the following programmable gain stage. Wideband char- more, the non-linearity of the single-gate mixer, which also
acteristics are achieved by making small enough to exclude causes the spur, is low in spite of the low-voltage operation
the effect of parasitic capacitance on impedance at the node X. [23]. Thus, the spur of is low enough to be filtered out
DEGUCHI et al.: A FULLY INTEGRATED 2 1 DUAL-BAND DIRECT-CONVERSION MOBILE WiMAX TRANSCEIVER 2781

Fig. 13. Measured and simulated noise suppression ratio at 1 kHz.

Fig. 15. Wide-band spectrum measured at transmitter output.

Fig. 14. Layout of dual-mode fractional divider.

by the LC-BPFs in the receiver and the transmitter paths, as is


the case for the conventional “fractional-then-distribute” plan
[17]. As a result, the spurs of , and caused Fig. 16 Spur levels measured at transmitter output in 40 samples.
by the non-linearity of the passive mixers in the transmitter
path also become very low. The wide-band spectrum measured
at the transmitter output is shown in Fig. 15. All the spur levels
are below 60 dBc. Furthermore, the design is robust to the
process variation, resulting in the levels of the spurs in 40
samples being less than 60 dBc as shown in Fig. 16. The
results satisfy the spurious specification of mobile WiMAX
with a sufficient margin. Fig. 17 shows the measured phase
noise at the transmitter output. In this measurement, the VCO
is operating at 10 GHz which is then divided by two. The LO
signal of 5 GHz is distributed through the inductor-less LO
distribution path. For the high-band operation, the LO signal of
5 GHz is divided by 4/3 at the proposed divider and the carrier
Fig. 17. Measured phase noise at high-band and low-band of 3.75 GHz and 2.5
frequency becomes 3.75 GHz. For the low-band operation, the GHz.
LO signal of 5 GHz is divided by 2 at the proposed divider and
then the carrier frequency becomes 2.5 GHz. The integrated
phase noise from 1 kHz to 5 MHz is 38.8 dBc and 42.5 dBc of 10 MHz. The two receivers consume 214.1 mW and 247.7
in the high-band and the low-band operations, respectively. mW at the low-band and the high-band operations, respec-
The difference of the integrated phase noise is 3.7 dB. It is the- tively. The transmitter consumes 214.8 mW and 229.7 mW at
oretically equal to 3.5 dB which corresponds to the difference the low-band and the high-band operations, respectively. The
of the frequency division ratio. It is calculated by of 3.75 power consumption includes the PLL, the inductor-less LO
over 2.5. It proves that the noise contribution of the proposed distribution path, the dual-mode fractional dividers and ADCs
dual-mode fractional divider is negligible. The constellation or DACs. The power consumption of the receiver per path is
plots measured at 1 dBm transmitter output are shown in lower than that of the mobile WiMAX transceivers reported
Fig. 18. The error vector magnitudes (EVM) in 2.5 GHz and previously [4], [7], [8]. In spite of such low power consump-
3.5 GHz bands are 34.0 dB and 31.0 dB, respectively. tion, the receiver achieves the total NF of 3.8 dB and 4.5 dB
Table I summarizes the measured total performance of the in the low-band and the high-band operations by virtue of the
transceiver. The results are measured at the channel bandwidth proposed noise-shaping TIA. Fig. 19 shows the die micrograph
2782 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010

Fig. 18. TX constellation plots measured at +1 dBm output.

TABLE I
PERFORMANCE SUMMARY OF MOBILE WIMAX TRANSCEIVERS

1 Analog I/Q mode


2 External local mode

long LO distribution path. Furthermore, in order to mitigate the


flicker noise of scaled CMOS devices, the noise-shaping TIA
with the negative conductance cell is proposed. By enabling the
noise-shaping function, while the signal transfer function of the
TIA remains the same, the flicker noise from the op-amp is sup-
pressed. Although the power consumption of the receiver em-
Fig. 19. Die micrograph of test chip. ploying the noise-shaping TIA is lower than that of the mobile
WiMAX transceivers reported previously, total NF of 3.8 dB
and 4.5 dB is achieved in the low-band and the high-band oper-
of the test chip. The transceiver occupies 2.3 mm 6.72 mm. ations, respectively.
The on-chip inductors are used only in the RF front-end circuits
of the transceiver. REFERENCES
[1] IEEE 802.16e [Online]. Available: http://www.ieee802.org/16/tge/
[2] WiMAX Forum [Online]. Available: http://www.wimaxforum.org/
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2
R. Lin, and S. Gross, “A 1 2 MIMO multi-band CMOS transceiver no. 12, pp. 2232–2238, Dec. 2003.
with an integrated front-end in 90 nm CMOS for 802.11a/g/n WLAN [21] S. Khorram, H. Darabi, Z. Zhou, Q. Li, B. Marholev, J. Chiu, J. Cas-
applications,” in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, taneda, H. M. Chien, S. B. Anand, S. Wu, M. A. Pan, R. Roofougaran,
Feb. 2008, pp. 356–357. H. J. Kim, P. Lettieri, B. Ibrahim, J. J. Rael, L. H. Tran, E. Geronaga, H.
[6] D. G. Rahn, M. S. Cavin, F. F. Dai, N. H. W. Fong, R. Griffith, J. Yeh, T. Frost, J. Trachewsky, and A. Rofougaran, “A fully integrated
Macedo, A. D. Moore, J. W. M. Rogers, and M. Toner, “A fully in- m
SOC for 802.11b in 0.18-  CMOS,” IEEE J. Solid-State Circuit,
tegrated multiband MIMO WLAN transceiver RFIC,” IEEE J. Solid- vol. 40, no. 12, pp. 2492–2501, Dec. 2005.
State Circuit, vol. 40, no. 8, pp. 1629–1641, Aug. 2005. [22] A. R. Behzad, Z. M. Shi, S. B. Anand, L. Lin, K. A. Carter, M. S.
[7] L. Lin, N. Wongkomet, D. Yu, C. Lin, M. He, B. Nissim, S. Lyuee, P. Kappes, T. H. Lin, T. Nguyen, D. Yuan, S. Wu, Y. C. Wong, V. Fong,
Yu, T. Sepke, S. Shekarchian, L. Tee, P. Muller, J. Tam, and T. Cho, and A. Rofougaran, “A 5-GHz direct-conversion CMOS transceiver
2
“A fully integrated 2 2 MIMO dual-band dual- mode direct-conver- utilizing automatic frequency control for the IEEE 802.11a wireless
sion CMOS transceiver for WiMAX/WLAN applications,” in IEEE Int. LAN standard,” IEEE J. Solid-State Circuit, vol. 38, no. 12, pp.
Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2009, pp. 416–417. 2209–2220, Dec. 2003.
[8] F. Beaudoin, T. Zortea, G. Deliyannides, M. Hiebert, M. McAdam, [23] J. Deguchi, D. Miyashita, and M. Hamada, “A 0.6 V 380  W0 14
M. Venditti, V. Choudary, B. Guay, H. Djahanshahi, T. McKeen, and dBm LO-input 2.4 GHz double-balanced current-reusing single-gate
A. Hafez, “A fully integrated tri-band, MIMO transceiver RFIC for CMOS mixer with cyclic passive combiner,” in IEEE Int. Solid-State
802.16e,” in Proc. IEEE RFIC Symp., Jun. 2008, pp. 113–116. Circuits Conf. Dig. Tech. Papers, Feb. 2009, pp. 224–225.
[9] A. Behzad, K. A. Carter, H. M. Chien, S. Wu, M. A. Pan, C. P. Lee,
Q. Li, J. C. Leete, S. Au, M. S. Kappes, Z. Zhou, D. Ojo, L. Zhang, A.
Zolfaghari, J. Castanada, H. Darabi, B. Yeung, A. Rofougaran, M. Ro-
fougaran, J. Trachewsky, T. Moorti, R. Gaikwad, A. Bagchi, J. S. Ham- Jun Deguchi (M’10) received the B.S. and M.S.
merschmidt, J. Pattin, J. J. Rael, and B. Marholev, “A fully integrated degrees in machine intelligence and systems engi-
MIMO multiband direct conversion CMOS transceiver for WLAN ap- neering, and Ph.D. degree in bioengineering and
plications (802.11n),” IEEE J. Solid-State Circuit, vol. 42, no. 12, pp. robotics from Tohoku University, Sendai, Japan, in
2795–2808, Dec. 2007. 2001, 2003 and 2006, respectively.
[10] M. Zargari, L. Y. Nathawad, H. Samavati, S. S. Mehta, A. Kheirkhahi, In 2006, he joined the Center for Semiconductor
P. Chen, K. Gong, B. Vakili-Amini, J. A. Hwang, S. W. M. Chen, M. Research and Development, Toshiba Corporation,
Terrovitis, B. J. Kaczynski, S. Limotyrakis, M. P. Mack, H. Gan, M. Kawasaki, Japan. Since then he has been engaged
Lee, R. T. Chang, H. Dogan, S. Abdollahi-Alibeik, B. Baytekin, K. in the design of analog and RF circuits for wireless
Onodera, S. Mendis, A. Chang, Y. Rajavi, S. H. M. Jen, D. K. Su, communications. In 2004, he was a Visiting Scholar
and B. A. Wooley, “A dual-band CMOS MIMO radio SoC for IEEE at the University of California, Santa Cruz.
802.11n wireless LAN,” IEEE J. Solid-State Circuit, vol. 43, no. 12,
pp. 2882–2895, Dec. 2008.
[11] G. Chien, P. B. Leong, S. W. Son, M. Tsai, and L. Tse, “A fully-inte-
grated dual-band MIMO transceiver IC,” in Proc. IEEE RFIC Symp., Daisuke Miyashita (M’10) received the B.E. and
Jun. 2006, pp. 81–84. M.E. degrees in electronic engineering from the
[12] J. Deguchi, J. D. Miyashita, Y. Ogasawara, G. Takemura, M. Iwanaga, University of Tokyo, Tokyo, Japan, in 2001 and
K. Sami, R. Ito, J. Wadatsumi, Y. Tsuda, S. Oda, S. Kawaguchi, N. Itoh, 2003, respectively.
2
and M. Hamada, “A fully integrated 2 1 dual-band direct-conversion In 2003, he joined the Center for Semiconductor
transceiver with dual-mode fractional divider and noise-shaping TIA Research and Development, Toshiba Corporation,
for mobile WiMAX SoC in 65 nm CMOS,” in IEEE Int. Solid-State Kawasaki, Japan, where he has been engaged in
Circuits Conf. Dig. Tech. Papers, Feb. 2010, pp. 456–457. the design of RF and analog circuits for wireless
[13] D. Kurose, T. Ito, T. Ueno, T. Yamaji, and T. Itakura, “55-mW 200- communications.
MSPS 10-bit pipeline ADCs for wireless receivers,” IEEE J. Solid-
State Circuit, vol. 41, no. 7, pp. 1589–1595, Jul. 2006.
[14] T. Maeda, H. Yano, T. Yamase, N. Yoshida, N. Matsuno, S. Hori, K.
Numata, R. Walkington, T. Tokairin, Y. Takahashi, M. Fujii, and H.
Hida, “A direct-conversion CMOS transceiver for 4.9–5.95 GHz multi-
standard WLANs,” in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Yosuke Ogasawara received the B.E degree from
Papers, Feb. 2004, pp. 90–91. Chuo University, Tokyo, Japan, in 2003.
[15] M. Simon, P. Laaser, V. Filimon, H. Geltinger, D. Friedrich, Y. Raman, From 2003 to 2006, he was with 1st SoC Design
and R. Weigel, “An 802.11a/b/g RF transceiver in an SoC,” in IEEE Int. Division, NEC Micro Systems, Ltd., Kanagawa,
Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2007, pp. 562–563. Japan, as an Analog RFIC Designer. In 2006, he
[16] D. Miyashita, H. Ishikuro, T. Shimada, T. Tanzawa, S. Kousai, H. joined the Analog Device Design Department,
Kobayashi, H. Majima, K. Agawa, M. Hamada, and F. Hatori, “A Semiconductor Company, Toshiba Corporation,
low-if CMOS single-chip bluetooth EDR transmitter with digital I/Q Kawasaki, Japan, where he is working on the design
mismatch trimming circuit,” in VLSI Circuits Symp. Dig. Tech. Papers, of RF front circuit for wireless communications.
Jun. 2005, pp. 298–301.
[17] H. Darabi, S. Khorram, H. M. Chien, M. A. Pan, S. Wu, S. Moloudi, J.
C. Leete, J. J. Rael, M. Syed, R. Lee, B. Ibrahim, M. Rofougaran, and
A. Rofougaran, “A 2.4-GHz CMOS transceiver for bluetooth,” IEEE
J. Solid-State Circuit, vol. 36, no. 12, pp. 2016–2024, Dec. 2001.
[18] Y. Palaskas, A. Ravi, S. Pellerano, B. R. Carlton, M. A. Elmala, R. Gaku Takemura received the B.E. degree in elec-
Bishop, G. Banerjee, R. B. Nicholls, S. K. Ling, N. Dinur, S. S. Taylor, trical engineering and the M.E. degree in electronic
and K. Soumyanath, “A 5-GHz 108-Mb/s 2 2 2 MIMO transceiver communication engineering from Kyoto University,
Kyoto, Japan, in 1995 and 1997, respectively.
RFIC with fully integrated 20.5-dBm P1 dB power amplifiers in 90-nm
CMOS,” IEEE J. Solid-State Circuit, vol. 41, no. 12, pp. 2746–2756, In 1997, he joined the Wireless and Multimedia
Dec. 2006. LSI Development Department, Semiconductor
[19] S. Pellerano, P. Madoglio, and Y. Palaskas, “A 4.75-GHz fractional Company, Toshiba Corporation, Kawasaki, Japan.
frequency divider-by-1.25 with TDC-based all-digital spur calibration Since then, he has been engaged in the development
in 45-nm CMOS,” IEEE J. Solid-State Circuit, vol. 44, no. 12, pp. of wireless communication circuits.
3422–3433, Dec. 2009.
2784 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 45, NO. 12, DECEMBER 2010

Masaomi Iwanaga received the B.E. and the M.E. Shoko Oda received the B.E. and the M.E. degrees
degrees in electrical and electronic engineering from in electrical engineering from Kyushu University,
Kobe University, Kobe, Japan, in 1996 and 1998, re- Fukuoka, Japan, in 2005 and 2007, respectively.
spectively. In 2007, she joined the Center for Semiconductor
In 1998, he joined the Wireless & Multimedia LSI Research and Development, Toshiba Corporation,
Development Department, Semiconductor Company, Kawasaki, Japan. Since then, she has been engaged
Toshiba Corporation, Kawasaki, Japan. Since then, in the design of RF and analog circuits for wireless
he has been engaged in the development of wireless communications.
communication circuits.

Kenichi Sami received the B.E. degree in electrical Shunji Kawaguchi was born in Hyogo, Japan, in
engineering from Tokyo University, Tokyo, Japan, in 1959. He received the B.S. degree in electronic
1997. engineering from Kobe University, Kobe, Japan, in
Since then, he joined the Toshiba Corporation, 1983.
Kawasaki, Japan, in 1997 and has been engaged in In 1983, he joined the Toshiba Corporation,
the development of wireless communication circuits. Kawasaki, Japan, where he has been engaged in the
design and development of bipolar LSI’s, especially
for wireless communications. He is currently the
Chief Specialist of the Analog Device Design
Department, Toshiba Corporation Semiconductor
Company.

Rui Ito received the B.E and M.E degrees from


Kanagawa University, Yokohama, Japan, in 2000 Nobuyuki Itoh (M’03) was born in Tokyo, Japan,
and 2002, respectively. in 1960. He received the B.S. and M.S. degrees in
In 2002, he joined the Corporate Research & De- chemistry from Tokyo University of Science, Tokyo,
velopment Center, Toshiba Corporation, Kanagawa. Japan, in 1983 and 1985 respectively, and the Ph.D.
He is now with the Toshiba Corporation Semicon- degree in physical electronics from Tokyo Institute of
ductor Company, Kawasaki, Japan. His research in- Technology, Tokyo, Japan, in 2006.
terests include analog IC design for telecommunica- In 1985, he joined the Research and Development
tion and LCD driver ICs. Center, Toshiba Corporation, Kawasaki, Japan,
where he was engaged in the research and develop-
ment of CMOS device technologies, bipolar device
technologies, bipolar circuits design and RFCMOS
circuit design. He had been a Visiting Scientist at Katholieke Universiteit
Leuven, ESAT-MICAS, Leuven, Belgium, from 1996 to 1998, where he had
Junji Wadatsumi received the B.E. and M.E. de- worked on design of fully integrated VCOs and PLLs using RFCMOS. He has
grees from the Tokyo Institute of Technology, Tokyo, been engaged in the research and development of high-frequency analog circuit
Japan, in 2003 and 2005, respectively. at Semiconductor Company of Toshiba Corporation since 1998. He is also a
In 2005, he joined the Center for Semiconductor part-time lecturer of Chuo University, Tokyo, Japan, since 2009. His current
Research and Development, Toshiba Corporation, research interests are high-frequency integrated circuit for telecommunications.
Kawasaki, Japan, where he has been engaged in Dr. Itoh is a member of the Institute of Electronics and Communication En-
the design of RF and analog circuits for wireless gineers (IEICE). He received the Asia-Pacific Microwave Conference (APMC)
communications. Prize in 2007. He has been a member of TPC of CICC, BCTM, and ESSCIRC,
was a secretary of IEEE MTT-S Japan Chapter, is a secretary of URSI-C Japan
Committee, and is the Publicity Chair of APMC 2010.

Mototsugu Hamada (M’03) was born in Nara,


Yuki Tsuda received the B.E. degree and the M.E. Japan, in 1968. He received the B.S., M.S., and
degree in electrical engineering from Kyushu Univer- Ph.D. degrees in electronic engineering from the
sity, Fukuoka, Japan, in 2003 and 2005, respectively. University of Tokyo, Tokyo, Japan, in 1991, 1993,
In 2005, he joined the Wireless & Multimedia LSI and 1996, respectively.
Development Department, Semiconductor Company, In 1996, he joined Toshiba Corporation and has
Toshiba Corporation, Kawasaki, Japan. Since then, been engaged in wireless and low-power electronic
he has been engaged in the development of wireless circuits design with Toshiba’s Center for Semicon-
communication circuits. ductor Research and Development, Kawasaki, Japan.
From 2002 to 2004, he was a Visiting Scholar with
Stanford University.
Dr. Hamada was the recipient of the 2007 IEEE International Conference on
Computer Design (ICCD) Best Paper Award and the co-recipient of the Design
Automation Conference (DAC) 2010 Best User Track Poster Award. He has
served as a member of the technical program committee of International Solid-
State Circuits Conference (2003–2009, 2011) and Asian Solid-State Circuits
Conference (2005–2010). He was the Technical Program Committee Vice-Chair
of A-SSCC2009.

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