Difraction of X rays by Crystals

A crvstai lattice is made up of regular planes of atoms equal

distance apart. Since the wavelengths of X-rays is comparable to
the interatomic distances, Laue suggested that it might_be
possible to ditfract X-rays by crystals. This suggestion came out
to be true when Bragg succeeded in diffracting X-rays from sodium
chloride crystal.

Rragg's Eqúation: In 1983 W.L. Bragg and W.H. Eragg worked

out a relation to determine interatomic distances îrom X-ray
diifraction patterns. This reiation is known as Bragg's equation.
They showed that:

utheKray cdiffractedfrom atoms in crystalplanes obey thelaus

ofreflectior
 2/ 16 Principlos of Physical
Chemistry, Spectroscopy
and
arial Chemistry
Materiat

planes will be
reflected by successive
be in
in phas
tuo rays
fuhe integrall numbe
extia distance travelled by thesecond ray 1S an
the oer
ofuauelengths.)
REFLECTED
INCIDENT X-RAYS
X RAYS

E F
CRYSTAL
PLANES

Fig.10 Diffraction of X-rays from atoms in a crystal

(c
Consider two waves 1 and 2 incident on planes 1 and 2
respectively at an angle 6. Let the interplanar distance is d'
The initial part of the two waves in
are phase,
The wave 2 reflected
from plane 2 ravels a greater distance than wave 1 reflected
from plane 1/Drawing AC and AD perpendicular to the incident
and reflected
portions of the second wave, it can be seen that the
extra distance travelled by the second
wave=BC+BD. From the
figure, angle BAC=angle EAG=6, each
being 90-angle EAC.
Sinilarly, angle BAD =angle HAF=0 each
Since the two being,
right angled triangles BCA and BDA 90-angle DAF.
BC-BD are
congruent,
BC BC
Sin 0
BA d or
BC d sin6

BD=dsin 0
Thus, BC+ BD
d sin0+ dsin0=2d
sin e
ie., the extra
distance travelled
by the wave
According to Bragg, the extra 2=2
d sin 6
integral multiple of distance travelled should be
wavelength A, i.e., nà a
Crystalline State
2/17

Thus we have, na=2d sine... (18)

This is Bragg's equation. The reflection correspondington=1,
n-2, etc., are called first order, second order, etc., reflections

Example 9. Calculate the interplanar distance in a crystal

which give a first order reflection at an angle of 6.73° with X-rays
of wavelength 7.1x10"m

Solution:

n =1; 0=6.73° ;=7.1x10m

But, nl=2d sin 0

d
nn 1x7.1x10***m 1x7.1x10m
=3.018x10-10 m
2 sin 2xsin6.73 2x0.1176

SELF STUDY PROBLEMS

5. Find the interplanar distance in a crystal in which a series

of planes produce a first order reflection from a copper X-ray
Ans: 1.98 A
tubeh=1.539A) at an angle of 22.5.
6. At what angle would a first order reflecton be observed in the

X-ray diffraction of a set of crystal planes for which d-3.03

nm if the wavelength of X-rays is 0.071 nm. At what angle
Would a second order reflection from the set of planes be

observed? Ans:13.55

EXPERIMENTAL METHODS

The X-ray diffracton techniques used in the study of crystals

are of two types: (i) the rotating crystal method and (i) the powder
method.
The rotating crystal method (Braggs, 1913)
is shown
apparatus used in Bragg's
The rotating crystal method
in Fig.11.
 2 18 Principles of Physical Chemistry, Spectroscopy and Material c
X-RAY
Chemist
TUBE SLIT

DIFFRACTED
X-RAYS PATH OF
RECORDEER

INCIDENT
X-RAYS ONISATION
CHAMBER

TURN TABLE
CRYSTAL

SCALE TO MEASURE
ROTATION OF CRYSTAL

Fig. 11. Rotating crystal method for X-ray diffraction

A beam of X-rays of definite wavelength from an X-ray tube
are passed through a slit so as to obtain a narrow beam. This
beam is allowed to strike a single
crystal mounted on a graduated
turm table. The crystal is rotated
gradually by means of the turn-
tabie so as to increase the
glancing angle at which the X-rays
are incident at the
exposed face of the crystal. The diffracted rays
pass into the ionisation chamber of the recorder. Here
they ionit
the air and a current flows between the
chamber wall and anL
electrode inserted in it which is connected to an
The electrometer reading is
electromere
proportional to the intensity of *
rays. As the recorder along with the crystal is rotated, the
of maximum intensity are noted on
ane
the scale. The angles
which reflection are maximum give the ss
value of 6. The proce
is carried out for each plane of the at
crystal. The lowest angle
ingle.
which the maximnum reflection
occurs correspond to =1. This
n=1. This
called the first order reflection. The next
the maximum rellection occurs
higher angle
at whica
at w
corresponds to n=2. This is calle
is ca
second order reflection, and so on.
are used to calculate
The value of 0 forn=1, 2, 3,
3 etc.
,
the distance 'd' between the lattice anes

parallel tothe face of the crystalI pla