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Experimental Determination of Wavelength : Diffraction
Experimental Determination of Wavelength : Diffraction
Experimental Determination of Wavelength : Diffraction
Introduction
Consider a plane wave incident on along narrow slit. According to geometrical optics one
expects the one region to be illuminated and the remaining portion (known as the geometrical
shadow) to be absolutely dark. However, if the slit is not very large compared to the
wavelength, then the light intensity in the region AB is not uniform and there is also some
intensity inside the geometrical shadow. Further, if the width of the slit is made smaller, large
amount of energy reaches the geometrical shadow. This spreading out of a wave when it
passes through a narrow opening is known as the diffraction pattern.
The diffraction phenomena are usually divided into two categories: (i) Fresnel diffraction
and (ii) Fraunhofer diffraction.
In Fresnel class of diffraction the source of light and the screen are, in general, at a finite
distance from the diffracting aperture. In the Fraunhofer class of diffraction, the source and
the screen are at infinite distances from the aperture: This is achieved by placing the source
on the focal plane of a convex lens and placing the screen on the focal plane of another
convex lens.
Fraunhofer Diffraction
We will study the Fraunhofer diffraction pattern produced by a slit of width b . A plane wave
is assumed to fall normally on the slit and we wish to calculate the intensity distribution on
the focal plane of the lens.
We assume the slit consists of a large number of equally spaced point sources and that each
point on the slit is a source of Huygen’s secondary wavelets which interfere with the wavelets
emanating from other points. Let the point sources be at A1, A1 , A 1 … … …. And let the
distance between two consecutive points be ∆ . Thus if the number of point sources be n then
b=(n−1) ∆
2π
φ= ∆ sinθ
λ
Thus if the field at the point P is due to disturbance emanating from the point A2 is
acos (ωt −φ). The difference in the phases of the disturbance reaching from the points A2and
A3 will also be φ . Thus the resultant field at P
E=a ¿
¿a
sin nφ/2
sinφ / 2 [
cos ωt−
n−1
2
φ
]
[
¿ Eθ cos ωt−
n−1
2
φ
]
sin nφ/2
Eθ =a
sinφ/2
In the limit n → ∞, ∆ → 0 , n ∆ → b
nφ π π
= n ∆ sinθ→ bsinθ
2 λ λ
2π 2 π bsinθ
φ= ∆ sinθ= would tend to zero
λ λ n
π
sin bsinθ
sin nφ/2 λ sinβ
Eθ =a =na =A
φ /2 π β
bsinθ
λ
sinβ π
Thus , E= A cos [ ωt −β ] β= bsinθ; A=na
β λ
sin 2 β
The intensity I =I 0 2 I 0 is the intensity at θ=0
β
The position of maxima and minima for a single slit
sinβ
[ β=0 , =1, I=I 0 corresponds to maximum intensity]
β
π mλ
β= bsinθ=mπ∨sinθ=
λ b
2
sin β
In order to determine the positions of maxima, we differentiate intensity equation I =I 0 2
β
with respect to β and equate it to zero.
2
sin β
In order to determine the position of maxima, we differentiate intensity equation I =I 0 2
β
with respect to β and equate it to zero.
[ ]
2
dI 2 sinβcosβ 2 sin β
=I 0 − =0
dβ β
2
β
3
Or sin 2 β [ β−tanβ ] =0
β=tanβ