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Low-Thermal-Budget Photonic Processing of Highly Conductive Cu Interconnects Based On Cuo Nanoinks: Potential For Flexible Printed Electronics
Low-Thermal-Budget Photonic Processing of Highly Conductive Cu Interconnects Based On Cuo Nanoinks: Potential For Flexible Printed Electronics
Low-Thermal-Budget Photonic Processing of Highly Conductive Cu Interconnects Based On Cuo Nanoinks: Potential For Flexible Printed Electronics
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■ INTRODUCTION
Recent advancements in ink-jet printing have introduced a new
their high conductivity and high oxidation resistance. However,
these inks are not economical and typically require long
era in the fabrication of thin, flexible electronics using metal sintering times that are not conducive for applications requiring
nanoparticle (NP)-based inks. Inkjet technology enables low-temperature compatible substrates.12 In contrast, Cu-based
printing of finely detailed patterns, down to the micrometer NP inks offer a cost-effective alternative at only a few percent of
scale, onto a variety of flexible substrates including plastic,1 the cost of silver inks,13 but the issues related to oxidation of
paper,2,3 rubber, and fabric for applications in sensor Cu before and/or during printing make it essential to store and
technology,4 RFID tag antennas,5 solar cells,6 and many other sinter the ink under inert atmospheres.14 Solutions to this
fields.7 In addition, as an additive technology, ink-jet printing critical issue have been explored by encapsulating Cu particles
shows promise for green manufacturing with significantly in protective metal shells (e.g., silver and gold)15 or organic
reduced material waste and is a cost-effective alternative to capping agents16 and/or by using CuO NPs dispersed in
fabrication methods such as sputtering, screen printing, and solvents containing a reducing agent.17 The former approach
lithography.8 Moreover, it can be readily implemented into requires complicated and expensive processing steps, whereas
large-scale production methods (e.g., roll-to-roll manufacturing, relatively easily formulated organically shelled inks have not yet
R2R), for the rapid fabrication of high-definition electronic reached conductivity levels high enough to satisfy application
components.9,10 In fact, a recent IDTechEx report, in which the requirements. Of the approaches cited above, the last (i.e., CuO
innovations in ink formulations, printing technology, and NPs dispersed in reducing solvents) offers a unique solution to
manufacturing practices were highlighted, forecasts that the
worth of printed, flexible, and organic electronics industries will Received: December 13, 2015
more than double by 2025.11 Currently, silver-based NP inks Accepted: December 31, 2015
are commonly preferred in printed technologies because of Published: December 31, 2015
not only circumvent the oxidation problem but also, when of satellite droplets, which create inconsistent droplet volumes and
coupled with photonic sintering techniques such as pulse- have been shown to cause issues in print uniformity.23
thermal-processing (PTP), enable relatively facile implementa- Pulse Thermal Processing. A PulseForge 3300 (Novacentrix)
system was employed to reduce insulating CuO prints to conductive
tion into industrial-scale fabrication.
Cu interconnects. The R2R compatible PulseForge system uses an
Conventional postprinting processing of silver inks is intense-pulse lamp that irradiates samples with a high-energy light
typically achieved by thermal sintering using a hot plate or an mapping the UV−vis spectrum. The curing conditions of the CuO
oven at temperatures reaching 300 °C and durations up to a inks were systematically optimized by adjusting the system parameters
few hours. However, this conventional approach is not feasible including capacitor bank voltage, number of pulses, and pulse duration.
for CuO-based inks because the rate of oxidation is higher than These parameters control the peak power and energy exposure output
the rate of chemical reduction to elemental Cu, which of the system. The samples are processed in a stationary configuration
necessitates that sintering be performed in an inert atmos- (i.e., not in R2R mode) because of a wide exposure zone covering the
phere.18 In addition, polymer-based substrates having low glass entire sample. An illustration of the CuO nanoink sintering in an
envisioned R2R PTP configuration is shown in Figure 1. For curing
transition temperatures, such as polyethylene terephthalate
(PET) or polyethylene naphthalate (PEN), easily degrade
during the thermal processing.19 To overcome these common
problems, more selective sintering approaches such as laser-
beam and PTP methods have been developed. In both cases,
printed samples are irradiated with high-intensity photons by
flashing light in successive pulses at a given frequency. The
duration of light exposure per pulse typically ranges from
microsecond to a few milliseconds. The combination of high
intensity and short duration irradiation heats the thin print
pattern (typically <5 μm in thickness) to the desired sintering
temperatures, while simultaneously preventing disintegration of
the substrate and enabling chemical reduction of CuO ink.20
Among these methods, the PTP technique is especially Figure 1. Schematic of R2R pulse thermal processing of CuO
attractive for mass production because of its ability to sinter nanoparticle inks for the production of highly conductive Cu prints.
large-scale prints at high speeds (when coupled with R2R
design) in comparison to complex, expensive, and relatively
smaller area limited laser-sintering approach.21
the inks, bank voltages, number of pulses, and pulse durations were
In the present study, we have investigated the chemical varied in the range of 150−300 V, 2−30 pulses, and 1.5−6 ms,
reduction and sintering of CuO NP inks using a high-intensity respectively. The repetition rate for multiple pulses was set at 1.8 Hz,
flash lamp PTP system to obtain conductive Cu interconnects corresponding to a 0.555 s delay between each pulse. The upper power
on flexible polymer substrates. The PTP operating parameters limit for curing the CuO patterns was defined by the damage threshold
such as pulse intensity, pulse duration, and the number of of the silica-coated PET substrates.
pulses were systematically screened to control the energy and Characterization. The electrical resistance measurements were
power output of the system for the optimization of print taken with a Fluke multimeter, and the sheet resistance measurements
performance while maintaining the substrate integrity. The were acquired with a Jandel RM3 four-point unit using a probing
influence of the processing protocols on the reoxidation current of 1 mA. Discrete samples were used to obtain data points in
evolution of sintered samples as well as the importance of a various plots. The print dimensions, unless stated otherwise, consisted
drying step prior to sintering on the electrical performance of of two 3 mm × 3 mm contact pads that are separated by a 10 mm long
printed patterns was reported. The viability of the present and 2 mm wide interconnect. The surface morphology of the samples
was analyzed using a Hitachi S-4100 high-resolution field-emission-
approach has also been demonstrated through fabrication of a
type scanning electron microscope. X-ray photoelectron spectroscopy
Cu resistor pattern to function as a temperature sensor device. (XPS) data was collected to examine the reduction of CuO phase to
■ EXPERIMENTAL DETAILS
Ink-Jet Printing. A Dimatix DMP-2831 ink-jet printer (Fujifilm)
Cu using a PHI 3056 spectrometer with an Al anode source operated
at 15 kV and an applied power of 350 W. Adventitious carbon and the
carbon from the PET substrate was used to calibrate the binding
was used to print 16 wt % CuO ink (Novacentrix, ICI-002HV) with an energy shifts of the samples (C 1s = 284.4 eV). High-resolution data
average particle size of 126 nm onto silica-coated PET substrates was collected at pass energy of 23.5 eV with 0.05 eV step sizes and a
(Novacentrix, Novele IJ-220, thickness ≈ 150 μm), on which the silica minimum of 60 scans were acquired to improve the signal-to-noise
coating provides a porous morphology for improved droplet ratio. The thicknesses of the prints before (∼1.3 μm) and after
absorption and wetting.22 Although the exact chemical ink formulation sintering (∼0.7 μm) were determined by a surface profilometer
is proprietary, Novacentrix provided that the CuO nanoparticles were (Alpha-Step IQ). Temperature profiles of the CuO films were
dispersed in a solution consisting of water and ethylene glycol. The simulated using the SimPulse software provided by Novacentrix.
viscosity of the ink was around 9−12 cPs, which fits the recommended Resistive Temperature Sensor Fabrication. Copper resistor
viscosity parameters (10−12 cPs) provided by the printer patterns were printed onto a PET substrate to function as a flexible
manufacturer. The printer cartridge utilizes a microelectro−mechanical temperature sensor. The sample was placed in an environmental
system based piezo-controlled nozzle to jet out highly controlled chamber to conduct resistance measurements. The resistance of the
droplet volumes. In the present study, we have used a 10 pL ink device was documented at room temperature before the oven
cartridge that produces ∼30 μm diameter droplets. Nozzle voltages temperature was manually raised from 30 to 100 °C at increments
and jetting waveforms were adjusted to achieve a drop velocity of 7−8 of 10 °C. Silver epoxy contacts were used to reduce the contact
m/s. Drop spacing was kept constant at 20 μm to produce slightly resistance between the wiring attachment and the copper print.
overlapping print lines to eliminate the potential gaps between the Resistance values were recorded 10 min after the temperature
tracks. We engineered the jetting waveform to eradicate the formation stabilized at each set-point.
Figure 5. Sheet resistance and energy exposure values for varying number of pulses at two different peak power values: (a and b),0.89 ± 0.04 kW/
cm2; (c and d), 1.2 ± 0.1 kW/cm2. The peak power was kept constant by controlling capacitor bank voltage and pulse width settings: 200 V and 2
ms (panels a and b); 175 V and 2 ms (panels c and d).
power of 0.89 ± 0.04 kW/cm2, the sheet resistance values first SEM images shown in Figure 6 display a clear correlation
showed a gradual drop with an increase in the number of pulses between the peak power and surface morphology. Although an
reaching a lowest value of 144 mΩ/□ (resistivity ∼10 μΩ cm; undefined porous grain structure is evident at low Ppeak (0.7
corresponding to a total Eexposure of 27.9 J/cm2) before showing kW/cm2, left panel inset), the sample processed at the optimal
a rising trend with further increase in number of pulses (Figures power levels (middle panel inset) showed reduced porosity,
5a,b). Note that the samples processed for less than 10 pulses well-defined grain growth and neck formation. Clearly, a
or more than 30 pulses were typically under- or oversintered, percolative network is established where the highest con-
respectively, demonstrating excessively high sheet resistance ductivity was achieved at a Ppeak of 1.3 kW/cm2. These
values. In contrast, significantly fewer pulses and lower total conditions can be put into perspective for commercial
energy exposure were needed to reach comparable sheet manufacturing practices considering two pulses with milli-
resistance values when the peak power was slightly increased to second-long duration, and a delay of 0.555 s in between them
1.2 ± 0.1 kW/cm2 (Figures 5c,d). At this higher power level, leads to a subsecond sintering time that is well-suited for
the samples processed with 3−8 pulses (5.06−24.7 J/cm2) were integration into high-throughput R2R manufacturing.
well-sintered and showed similar sheet resistance values. This Next, the influence of pulse duration on the electrical
indicates that as few as 3 pulses are sufficient to properly sinter performance of the Cu prints was investigated (Figure 7a).
samples compared to the ∼15 pulses needed in the case of the
lower power level. The observed sintering characteristics
demonstrate a wide process window available with the PTP
technique depending on the ink and substrate characteristics. It
would be possible to reduce the thermal budget further by
optimizing the Ppeak in combination with the number of
photonic pulses required to achieve high electrical performance.
However, although the total Eexposure budget decreases as the
Ppeak increases, there is a limit to operation at a material specific
maximum power before substantial damage to the specimens
occurs. That is, pulsing too much energy in a short amount of
time results in complete delamination of the ink layer from the
substrate. Because it was realized that the fine-tuning of the
Ppeak is crucial for optimization of the PTP sintering conditions,
its effect on the electrical performance of the samples was
studied in detail to gauge the sintering threshold further (Figure
6). During the measurements, Ppeak was varied from 0.7 to 2
Note that the number of pulses allows the user to change the
Eexposure in large steps, whereas the pulse duration enables fine-
tuning of the energy exposure. Referring back to Figure 6,
optimum print conductivity was achieved with 2 pulses at a
Figure 6. Change in resistivity as a function of peak power for CuO Ppeak value of 1.3 kW/cm2. Using these parameters for the
ink samples sintered using 2 pulses at a constant Eexposure of 10 J/cm2. investigated pulse duration range of 2−3 ms, patterns exposed
Inset SEM images show the surface morphology of the samples at Ppeak to 2 ms radiation showed very high resistivity values (>107 μΩ
= 0.7, 1.3, and 2.0 kW/cm2. Prior to sintering, all samples were dried cm) consistent with incomplete reduction and sintering of the
for 1 h in ambient atmosphere. Note that O.L denotes the overloading CuO ink. Accordingly, this sample displays microstructural
of the voltmeter beyond its measuring capability. features that are very similar to that of the low Ppeak processed
pattern shown in Figure 6. In contrast, a slight increase in pulse
kW/cm2, whereas the Eexposure and number of pulses were kept duration to 2.5 ms (corresponding to an Eexposure of 6.7 J/cm2,
constant at 10 J/cm2 and 2, respectively. It is evident from Figure 7b) resulted in substantial drop in resistivity values by 5
Figure 6 that the optimal processing window of CuO prints orders of magnitude. The resistivity of the prints continually
mapped to a range of 1.0−1.8 kW/cm2. Patterns processed at decreased by another order of magnitude in the investigated
power levels below 0.7 kW/cm2 were not adequately sintered, pulse-width range from 2.5 to 3 ms (Figure 7a, inset),
whereas significant delamination and loss of conductivity is eventually reaching a low value of 13 μΩ cm (corresponding
observed for samples processed above 2 kW/cm2 (right panel to 13% the IACS (International Annealed Copper Standard)
SEM inset) because of excessive irradiation power density. The conductivity) at a pulse duration of 3 ms (Eexposure of 7.54 J/
2445 DOI: 10.1021/acsami.5b12156
ACS Appl. Mater. Interfaces 2016, 8, 2441−2448
ACS Applied Materials & Interfaces Research Article
cm2). With increased duration of light exposure, growth in five peaks with binding energies of 933.6, 942.0, 944.1, 953.6,
grain structure accompanied by the development of a and 962.7 eV. This configuration of species is indicative of a
continuous conductive network is evident from the SEM Cu2+ layer, whereas the 933.6 and 952.6 eV moieties are due to
images, shown in Figure 7c−e for 2, 2.5, and 3 ms samples, the Cu 2p3/2 and Cu 2p1/2 photoelectrons, respectively. The
respectively. Consistent also with Figure 5c,d, the initial drop in three other peaks are shakeup lines from the 3d electrons going
sheet resistance at 6.7 J/cm2 indicates more or less complete to a 2p5−3d9 type of configuration (marked with “S”). The
reduction of CuO to Cu and partial sintering of the printed intensity ratio of the 942 and 944.1 eV shakeup lines are
pattern. Although reduction and sintering processes occur indicative of a Cu2O phase instead of a Cu2+−OH chemistry.26
nearly simultaneously, their optimal energy threshold values are After the PTP induced reduction, there is a 1 eV shift in the Cu
slightly different. In fact, simulated temperature profiles (Figure 2p3/2 species to 932.7 eV along with a complete loss of shakeup
S1) of the same samples reported in Figure 6 indicated that the lines indicating the formation of metallic Cu0. In addition, the
photothermal reduction of CuO takes place when the film separation between the Cu 2p3/2 and Cu 2p1/2 photoelectron
temperature reaches around 250−270 °C. These temperatures lines (19.8 eV) is also consistent with the presence of Cu0 in
are high enough to dehydrate ethylene glycol (C2H6O2) the sintered layer. To confirm the Cu−O decomposition
reaction agent to form acetaldehyde (C2H4O), which then further, normalized O 1s data is presented in Figure 8b.
Although the 531.2 eV signal is due to the C−O species in the
reduces the CuO nanoparticles to Cu through formation of
PET substrate, the 529.7 eV signal comes from the Cu−O
secondary biproducts of diacetyl (C4H6O2 and H2O).17 The
layer. After the decomposition, the 529.7 eV signal disappears
water in the ink solution is not involved in the reaction but
because of the loss of Cu−O bonds, whereas the 531.2 eV
mainly serves as to adjust the viscosity and is removed by signal remains from the underlying substrate.
evaporation during the ink-drying and sintering process. As the The sintering ability of PTP on the CuO patterns was further
irradiation time increases, the film absorbs more thermal energy characterized by SEM analysis. Figure 9a,b shows SEM images
by which the temperature rises to ∼290 °C, leading to a well-
sintered material (Figure 7c). These observations corroborate
well with the previous reports obtained on elemental Cu-based
inks.20 To gain further insight into the reduction mechanism,
XPS analysis was conducted on as-printed and sintered films
(processed at Eexposure of 10 J/cm2, Ppeak= 1.3 kW/cm2). The
data collected shown in Figure 8a for both samples (in Cu 2p
region) clearly verifies the complete reduction of CuO into Cu
phase. Before sintering, the printed film shows the presence of
the radiation pulses heats the film to temperatures high enough bulk counterparts, for which the grain size is usually much
to only sinter the nanoparticles but not to the level of melting larger than the electron mean free path. The observed printed
or decomposing the substrate.20 In fact, a comparison of the sensor performance underscores the viability and potential of
SEM images of the uncoated PET substrate before (Figures 9c) nanoparticle-based reactive inks coupled with R2R-compatible
and after (Figure 9d) PTP using the same sintering parameters high-intensity photonic sintering technique for low-cost, large-
reveals virtually no change in their surface structures, further scale production of thin film sensors and devices, especially on
signifying the excellent suitability of the PTP technique for polymeric platforms.
printed electronics applications employing temperature-sensi-
tive flexible substrates.
Flexible and printed sensors based on conductive inks offer
■ CONCLUSIONS
Highly conductive printed Cu interconnects have been
to meet the cost/performance demands of R2R manufacturing processed on flexible PET substrates by exploiting ink-jet
technology. To illustrate the potential utility of the PTP printing and low-thermal-budget PTP technique. Efficient
sintered CuO inks in printed electronics applications, resistive reduction of reactive CuO nanoparticle inks to conductive
temperature sensors were printed and characterized on flexible Cu patterns as well as synergistic relationship between the
substrates (inset of Figure 10). Resistance temperature sensors sintering efficiency and the electrical performance of the
printed patterns has been achieved through detailed inves-
tigations of light irradiation conditions (energy density, pulse
number, pulse duration, Ppeak, and Eexposure). Among those, Ppeak
and Eexposure were the most dominant factors in influencing the
Cu-line conductivity and process thermal budget. In addition,
drying of excess solvents by introducing a pre-sintering drying
step, before curing/sintering, was also found to provide
significant enhancement in both the electrical conductivity
and the mechanical/environmental stability of the prints.
Through optimization of such parameters, it was possible to
obtain highly conductive prints in <1 s with resistivity values as
low as 10 μΩ cm (corresponding to ∼17% of the IACS
conductivity). The observed electrical performance of the
samples was corroborated with the XPS analysis, which
Figure 10. Dependence of ink-jet-printed Cu sensor resistance as a revealed an efficient reduction of CuO to Cu at low thermal
function of temperature. Inset shows the actual printed device on budgets. The device feasibility of printed Cu patterns was
flexible PET substrate. Scale bar, 500 μm. Dashed line represents the demonstrated through the design of a resistive temperature
linear fit to the data. sensor. The printed resistor showed a stable temperature
response with a temperature coefficient of resistance com-
work on the principle of resistance change in a metal when parable to that of the bulk Cu. Overall, the observed
heated because of increased collisions of electrons with the performances of the printed Cu patterns and the resistive
atomic vibrations. The relationship between resistance and temperature sensor element demonstrate a path toward the
temperature for different materials can be expressed in terms of realization of a flexible sensor platform exploiting a
the temperature coefficient of resistance (α) using the following combination of additive ink-jet printing and low-thermal-
budget PTP technology.
■
1 ΔR
equation: α = R · ΔT , where R0 is the resistance at a reference
0
temperature, ΔR is the change in resistance corresponding to a ASSOCIATED CONTENT
change in temperature ΔT. In the present study, the * Supporting Information
S
temperature dependence of resistance was evaluated in the The Supporting Information is available free of charge on the
range of 30−100 °C as shown in Figure 10. The sensor ACS Publications website at DOI: 10.1021/acsami.5b12156.
resistance values showed a linear dependence with respect to Simulated temperature profiles of CuO films at various
the temperature; which is consistent with the behavior of a bulk photonic pulse durations. (PDF)
■
Cu in the same temperature range. Accordingly, the calculated
temperature coefficient of resistance, αprinted Cu = 0.00329/°C, is AUTHOR INFORMATION
also on-par with that of bulk Cu(αbulk Cu = 0.00386/°C) at the
same R0 = 20 °C.28 The slightly lower α for the present ink-jet- Corresponding Authors
printed device can be attributed to electron scattering at grain *E-mail: aytugt@ornl.gov.
boundaries.29,30 Note that grain boundaries are structural *E-mail: joshipc@ornl.gov.
defects and can be very effective in scattering of electrons. Notes
The authors declare no competing financial interest.
■
Dislocations and/or secondary phase/impurity inclusions at
grain boundaries can act as scattering centers and effectively
disrupt the coherence of the electron wave traveling across the ACKNOWLEDGMENTS
boundary. In addition, for the case of thin film materials where Research (T.A. and P.J.) was sponsored by the Laboratory
the grain size becomes comparable to the mean free path of the Directed Research and Development Program of Oak Ridge
electrons, grain boundaries, rather than the bulk properties of National Laboratory, managed by UT-Battelle, LLC, for the
ingrains, can dominate the electron mobility of the films. U.S. Department of Energy under contract No. DE-AC05-
Therefore, for a given temperature change, it is expected that 00OR22725. A portion of this research was also supported
the change in resistance of Cu films to be smaller than their (G.M.V.) by the U.S. Department of Energy, Office of Science,
2447 DOI: 10.1021/acsami.5b12156
ACS Appl. Mater. Interfaces 2016, 8, 2441−2448
ACS Applied Materials & Interfaces Research Article
Office of Basic Energy Sciences, Materials Sciences and (18) Kang, J. S.; Kim, H. S.; Ryu, J.; Hahn, T. H.; Jang, S.; Joung, J.
Technology Division. Support for M.S.R. is provided in part W. Inkjet Printed Electronics Using Copper Nanoparticle Ink. J. Mater.
by the U.S. Department of Energy, Office of Science, Office of Sci.: Mater. Electron. 2010, 21, 1213−1220.
(19) Kang, H.; Sowade, E.; Baumann, R. R. Direct Intense Pulsed
Workforce Development for Teachers and Scientists (WDTS)
Light Sintering of Inkjet-Printed Copper Oxide Layers within Six
under the Science Undergraduate Laboratory Internship Milliseconds. ACS Appl. Mater. Interfaces 2014, 6, 1682−1687.
program. (20) Joo, S. J.; Hwang, H. J.; Kim, H. S. Highly Conductive Copper
■
Nano/Microparticles Ink via Flash Light Sintering for Printed
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